Ordering of ethylidyne on clean and adsorbate covered Pd(111): Influence of the coadsorption of oxygen (Unknown)
- New search for: Nascente, P. A. P.
- New search for: Van Hove, M. A.
- New search for: Somorjai, G. A.
- New search for: Nascente, P. A. P.
- New search for: Van Hove, M. A.
- New search for: Somorjai, G. A.
In:
JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY A VACUUMS SURFACES AND FILMS
;
10
, 4//3
;
2342
;
1992
-
ISSN:
- Article (Journal) / Print
-
Title:Ordering of ethylidyne on clean and adsorbate covered Pd(111): Influence of the coadsorption of oxygen
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Contributors:
-
Published in:JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY A VACUUMS SURFACES AND FILMS ; 10, 4//3 ; 2342
-
Publisher:
- New search for: SLACK INCORPORATED
-
Publication date:1992-01-01
-
Size:2342 pages
-
ISSN:
-
Type of media:Article (Journal)
-
Type of material:Print
-
Language:Unknown
- New search for: 621.55
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Classification:
DDC: 621.55 -
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 10, Issue 4//3
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2143
-
Structure of the Ni-p(1 x 2)-H surface from time-of-flight scattering and recoiling spectrometryRoux, C. D. / Bu, H. / Rabalais, J. W. et al. | 1992
- 2148
-
Structural investigation of Rb adsorption on Ai(111) using normal incidence standing x-ray wavefield absorption triangulationKerkar, M. / Fisher, D. / Woodruff, D. P. / Jones, R. G. et al. | 1992
- 2154
-
Low-energy electron diffraction studies of atomic step transitions on a Ni(111) vicinal surfaceChang, J. P. / Blakely, J. M. et al. | 1992
- 2160
-
Electron energy loss spectroscopy of H-terminated Si(111) and Si(100) prepared by chemical etchingDumas, P. / Chabal, Y. J. et al. | 1992
- 2166
-
Adsorption and decomposition of hydrides on Ge(100)Cohen, S. M. / Yang, Y. L. / Rouchouze, E. / Jin, T. et al. | 1992
- 2172
-
Interaction of atomic hydrogen with native oxides on GaAs(100)Petit, E. J. / Houzay, F. / Moison, J. M. et al. | 1992
- 2178
-
Self-diffusion on reconstructed and nonreconstructed Ir surfacesChen, C.-L. / Tsong, T. T. et al. | 1992
- 2185
-
Carbon-carbon bond forming reactions on Cu(110) surfacesChiang, C.-M. / Wentzlaff, T. H. / Jenks, C. J. / Bent, B. E. et al. | 1992
- 2191
-
Role of substrate excitation in the photochemistry of dioxygen on Ag(110)Hatch, S. R. / Campion, A. et al. | 1992
- 2197
-
Ion scattering study of the adatom induced missing-row reconstructions of Ni(110) and Au(113)Jiang, Q. T. / Statiris, P. / Gustafsson, T. / Haeberle, P. et al. | 1992
- 2202
-
Iodomethane dissociation on Cu(111): Bonding and chemistry of adsorbed methyl groupsLin, J.-L. / Bent, B. E. et al. | 1992
- 2210
-
Adsorbate-promoted mass flow on the gold(111) surface observed by scanning tunneling microscopyPeale, D. R. / Cooper, B. H. et al. | 1992
- 2216
-
Electron- and photon-stimulated desorption as a probe of the dynamics of molecules on surfacesXu, J. / Barnes, A. / Tolk, N. et al. | 1992
- 2222
-
Surface lattice dynamics of NiO(001) by inelastic He atom scatteringBrug, W. P. / Chern, G. / Duan, J. / Bishop, G. G. et al. | 1992
- 2227
-
Phase transitions of ethylene monolayers on graphiteEden, V. L. / Fain, S. C. et al. | 1992
- 2231
-
Kinetics of coverage loss for H~2, HD, and D~2 physisorbed on graphiteLiu, W. / Fain, S. C. et al. | 1992
- 2237
-
Stability of the SnO~2(111) surfaceBlanchard, D. L. / Baer, D. R. et al. | 1992
- 2243
-
Orientation of methyl iodide adsorbed on MgO(100): Results from 257-nm photodissociation studiesFairbrother, D. H. / Trentelman, K. A. / Strupp, P. G. / Stair, P. C. et al. | 1992
- 2248
-
CO interaction with ultrathin MgO films on a Mo(100) surface studied by infrared reflection-absorption spectroscopy, temperature programmed desorption, and x-ray photoelectron spectroscopyHe, J.-W. / Corneille, J. S. / Estrada, C. A. / Wu, M.-C. et al. | 1992
- 2253
-
X-ray photoelectron spectroscopy characterization of the oxidation and reduction of polycrystalline ZrPt~3 and Hflr~3 from 300 to 1700 KFisher, R. F. / Alvey, M. D. / George, P. M. et al. | 1992
- 2261
-
Electron emission holography of small clusters and surfacesThevuthasan, S. / Herman, G. S. / Kaduwela, A. P. / Tran, T. T. et al. | 1992
- 2271
-
Alkane activation by single-crystalline transition metal surfacesWeinberg, W. H. et al. | 1992
- 2277
-
Synthesis and hydrogenation of formate on Cu(100) at high pressuresChorkendorff, I. / Taylor, P. A. / Rasmussen, P. B. et al. | 1992
- 2282
-
Dynamical studies of the interaction of D~2 with a Cu(111) surfaceRettner, C. T. / Auerbach, D. J. / Michelsen, H. A. et al. | 1992
- 2287
-
State-specific study of hydrogen desorption from Si(100)-(2 x 1): Comparison of disilane and hydrogen adsorptionShane, S. F. / Kolasinski, K. W. / Zare, R. N. et al. | 1992
- 2292
-
C-H bond activation on metals: A quantum dynamics model of direct and precursor mediated dissociationLuntz, A. C. / Harris, J. et al. | 1992
- 2299
-
Electronic structure of borane cage molecules adsorbed on Si(111)Lee, S. / Li, D. / Cendrowski-Guillaume, S. M. / Dowben, P. A. et al. | 1992
- 2303
-
Atomic layer epitaxy of silicon by dichlorosilane studied with core level spectroscopyYarmoff, J. A. / Shuh, D. K. / Durbin, T. D. / Lo, C. W. et al. | 1992
- 2308
-
Thermal decomposition of very thin oxide layers on Si(111)Kobayashi, Y. / Sugii, K. et al. | 1992
- 2314
-
Thermal decomposition of ultrathin oxide layers on Si(100)Sun, Y.-K. / Bonser, D. J. / Engel, T. et al. | 1992
- 2322
-
Initial stage oxidation of the Ge:Si(111)-(5 x 5) and Ge:Si(111)-(7 x 7) surfacesCao, R. / Bozso, F. / Avouris, P. et al. | 1992
- 2327
-
Adsorption and electron stimulated desorption of NH~3/TiO~2(110)Diebold, U. / Madey, T. E. et al. | 1992
- 2336
-
Comparison of ethylene oxide and propylene oxide chemisorbed on clean and oxygen precovered Ag(110)Bare, S. R. et al. | 1992
- 2342
-
Ordering of ethylidyne on clean and adsorbate covered Pd(111): Influence of the coadsorption of oxygenNascente, P. A. P. / Van Hove, M. A. / Somorjai, G. A. et al. | 1992
- 2347
-
Hydrogen and CO spillover at Cu/Rh(100) bimetallic surfaces studied by high-resolution electron energy-loss spectroscopyEstrada, C. A. / He, J.-W. / Goodman, D. W. et al. | 1992
- 2351
-
Studies of interactions between NO and CO on a Pd surface by thermal programmed desorption and molecular beam relaxation spectrometryXi, G. / Bao, J. / Shao, S. / Li, S. et al. | 1992
- 2355
-
Effect of sulfur on oxygen adsorption and oxidation of the Ni(111) surfaceLiu, J. / Lu, J. P. / Chu, P. W. / Blakely, J. M. et al. | 1992
- 2361
-
Electronic structure and relative stability of the MgO(001) and (111) surfacesGibson, A. / Haydock, R. / LaFemina, J. P. et al. | 1992
- 2367
-
Oxidation of Mg adsorbed on Ru(001): A photoemission studyMalik, I. J. / Hrbek, J. / Shek, M.-L. / Bzowski, A. et al. | 1992
- 2371
-
Room temperature oxidation of ultrathin deposits of tin on the Au(111) surfaceZhang, Y. / Slavin, A. J. et al. | 1992
- 2377
-
Dispersionless vibrational mode of a chemisorbed adsorbate observed with inelastic helium scattering: Hg on Cu(001)Moses, C. / Zeng, H. / Lin, J. S. / Li, W. et al. | 1992
- 2383
-
Detailed x-ray photoelectron spectroscopy valence band and core level studies of select metals oxidationsBarr, T. L. / Yin, M. / Varma, S. et al. | 1992
- 2391
-
Pd, Ni, and Cu overlayers on polycrystalline ReBaer, D. R. / Hubbard, C. W. / Gordon, R. L. et al. | 1992
- 2396
-
Alloy formation energetics and dynamics in the Ni/Cu(100) and Ni/Cu(111) systemsRaeker, T. J. / DePristo, A. E. et al. | 1992
- 2400
-
Complementary scanning tunneling microscopy and scanning electron microscopy studies of electroplated gold surfacesSiperko, L. M. / Hurban, S. S. / Spalik, J. M. / Katnani, A. D. et al. | 1992
- 2404
-
Growth parameters affecting the formation of buried CoSi~2 by endotaxy of Co on Si(111)Fathauer, R. W. / George, T. et al. | 1992
- 2407
-
Influence of the defects of a thin NiO(100) film on the adsorption of NOBaeumer, M. / Cappus, D. / Illing, G. / Kuhlenbeck, H. et al. | 1992
- 2412
-
Characterization of ultrathin sputtered SiO films on alumina by inelastic electron tunneling spectroscopy and atomic force microscopyMallik, R. R. / Henriksen, P. N. / Butler, T. / Kulnis, W. J. et al. | 1992
- 2419
-
Surface studies of solvent-cast poly(vinyl alcohol-co-vinyl acetate) copolymer filmsMazzanti, J. B. / Reamey, R. H. / Helfand, M. A. / Lindley, P. M. et al. | 1992
- 2425
-
Radial dependence of silicon KVV and L~2~3VV Auger matrix elementsJennison, D. R. / Weightman, P. et al. | 1992
- 2429
-
Semiconductor surface and interface dynamics from tight-binding molecular dynamics simulationsSchenter, G. K. / LaFemina, J. P. et al. | 1992
- 2436
-
Nucleation and growth of elongated Si islands on Si(100)Kleban, P. et al. | 1992
- 2440
-
Kinetic oscillations in the Pt(100)/NO+CO system: Bifurcation analysisFink, T. / Krischer, K. / Imbihl, R. et al. | 1992
- 2445
-
Local site identification for NO on Ni(111) in vibrationally distinct adsorption statesAsensio, M. C. / Woodruff, D. P. / Robinson, A. W. / Schindler, K.-M. et al. | 1992
- 2451
-
Thermal desorption from hydrogenated and oxygenated diamond (100) surfacesThomas, R. E. / Rudder, R. A. / Markunas, R. J. et al. | 1992
- 2458
-
Scanning tunneling microscopy study of the adsorption and recombinative desorption of hydrogen from the Si(100)-2 x 1 surfaceBoland, J. J. et al. | 1992
- 2465
-
Surface reactions of Ge containing organometallics on Si(100)Greenlief, C. M. / Wankum, P. C. / Klug, D.-A. / Keeling, L. A. et al. | 1992
- 2470
-
Interaction of water, oxygen, and hydrogen with TiO~2(110) surfaces having different defect densitiesPan, J.-M. / Maschhoff, B. L. / Diebold, U. / Madey, T. E. et al. | 1992
- 2477
-
Studies of bimetallic surfaces using infrared reflection absorption spectroscopyKuhn, W. K. / He, J.-W. / Goodman, D. W. et al. | 1992
- 2487
-
Oscillatory reduction of nitric oxide with hydrogen over Pt(100)Cobden, P. D. / Siera, J. / Nieuwenhuys, B. E. et al. | 1992
- 2495
-
Spirals and propagating reaction fronts during catalytic CO oxidation on a cylindrical Pt single crystalSander, M. / Veser, G. / Imbihl, R. et al. | 1992
- 2501
-
Surface haze after heat treatment in hydrogen prior to Si epitaxyOrner, C. H. / Lewis, R. K. / Aumick, S. et al. | 1992
- 2507
-
Coverage dependent interaction of N~2O and O~2 with Si(001)2 x 1 as monitored by the O KLL Auger intensity ratioKeim, E. G. / Wormeester, H. et al. | 1992
- 2511
-
Relaxation of the ZnTe and CuCl (110) surfacesTsai, M.-H. / Hu, W.-M. / Dow, J. D. / Sankey, O. F. et al. | 1992
- 2515
-
X-ray photoelectron spectroscopy study on InP treated by sulfur containing compoundsKwok, R. W. M. / Lau, W. M. et al. | 1992
- 2521
-
Low-energy electron diffraction study of a disordered monolayer of H~2O on Pt(111) and an ordered thin film of ice grown on Pt(111)Starke, U. / Heinz, K. / Materer, N. / Wander, A. et al. | 1992
- 2529
-
Chemical interaction of thin Cr films with the MoS~2(0001) surface studied by x-ray photoelectron spectroscopy and scanning Auger microscopyDurbin, T. D. / Lince, J. R. / Yarmoff, J. A. et al. | 1992
- 2535
-
Surface structure of the disordered Cl/Ti(0001) system determined by diffuse low-energy electron diffractionRi, C.-S. / Watson, P. R. et al. | 1992
- 2540
-
Electron donor-electron acceptor interactions in surface metal-metal bonds: The Cu/Re(0001) and Pd/Re(0001) systemsRodriguez, J. A. / Campbell, R. A. / Goodman, D. W. et al. | 1992
- 2546
-
Trends in the bonding of CO to the surfaces of Pt~3M alloys (M = Ti, Co, and Sn)Ross, P. N. et al. | 1992
- 2551
-
Study of palladium mono- and multilayers on Ta(110) between 300 and 1500 KRuckman, M. W. / Jiang, L. Q. / Strongin, M. et al. | 1992
- 2556
-
Bismuth postdosing thermal desorption mass spectroscopy: Performance and limitationsHugenschmidt, M. B. / Domagala, M. E. / Campbell, C. T. et al. | 1992
- 2560
-
Interaction of hydrogen with Zr(0001) at room temperatureZhang, C. S. / Flinn, B. J. / Griffiths, K. / Norton, P. R. et al. | 1992
- 2565
-
Very high atomic oxygen coverages on Ru(001)Malik, I. J. / Hrbek, J. et al. | 1992
- 2570
-
Carbon dioxide chemistry on Cu(100)Taylor, P. A. / Rasmussen, P. B. / Chorkendorff, I. et al. | 1992
- 2576
-
Infrared study of the coadsorption of PF~3 and CO on the Pt(111) surfaceFan, J. / Trenary, M. et al. | 1992
- 2581
-
Atomic structure of the LaB~6(100) surface as observed with scanning tunneling microscopyOzcomert, J. S. / Trenary, M. et al. | 1992
- 2585
-
Low-energy positron diffraction from GaAs(110)Lessor, D. L. / Duke, C. B. / Chen, X. M. / Brandes, G. R. et al. | 1992
- 2591
-
Inverse photoemission study of the defective TiO~2(110) surfaceSee, A. K. / Bartynski, R. A. et al. | 1992
- 2597
-
Frizzed appearance of steps in tunnel microscopy on Cu(100) and vicinal Cu(11n) surfacesGiesen, M. / Frohn, J. / Poensgen, M. / Wolf, J. F. et al. | 1992
- 2600
-
Step doubling and related transitions on vicinal surfacesEinstein, T. L. / Jung, T. M. / Bartelt, N. C. / Williams, E. D. et al. | 1992
- 2606
-
Observed ion mixing of Au with GaAs(001) during low-energy ion scatteringCharatan, R. M. / Williams, R. S. et al. | 1992
- 2609
-
Historical perspective of vacuum system application at the Nevada Test SiteWilson, N. G. / Still, G. J. / Ward, C. O. et al. | 1992
- 2619
-
Combination of turbomolecular pumping stages and molecular drag stagesLevi, G. et al. | 1992
- 2623
-
Testing of turbomolecular pumpsBasford, J. A. et al. | 1992
- 2629
-
Prevention of overload in high-vacuum systemsHablanian, M. H. et al. | 1992
- 2633
-
Report on plenary meeting of the International Standards Organization Technical Committee 112 on vacuum standardsHauschulz, D. S. et al. | 1992
- 2639
-
Pumping behavior of sputtering ion pumpChou, T. S. / Bittner, J. / Schuchman, J. et al. | 1992
- 2642
-
Ultralow density plume measurements using a helium mass spectrometerJafry, Y. / Vanden Beukel, J. et al. | 1992
- 2650
-
Innovations in helium leak detector systemsBergquist, L. E. / Sasaki, Y. T. et al. | 1992
- 2655
-
Rotating disc gauge for absolute total pressure measurement in high vacuumChambers, A. / Chew, A. D. / Troup, A. P. et al. | 1992
- 2661
-
Mass spectrometry of fusion-plasma gasesDobrozemsky, R. / Schwarzinger, G. W. et al. | 1992
- 2665
-
Measurement of residual currents in ionization gauges and residual gas analyzersRedhead, P. A. et al. | 1992
- 2674
-
Measurement of x-ray currents in Bayard-Alpert type gaugesPeacock, N. T. et al. | 1992
- 2679
-
Three-dimensional characterization of conducting polymer arrays using secondary ion mass spectrometryGray, K. H. / Gould, S. / Leasure, R. M. / Musselman, I. H. et al. | 1992
- 2685
-
Ion beam analysis for depth profilingKnapp, J. A. / Barbour, J. C. / Doyle, B. L. et al. | 1992
- 2691
-
X-ray photoelectron microscopy applied to metal/epoxy laminatesKinzler, M. / Grunze, M. / Blank, N. / Schenkel, H. et al. | 1992
- 2698
-
Analysis of native and anodic oxides of n-doped Al films by Auger and photoemission spectroscopyAvila, J. / Sacedon, J. L. et al. | 1992
- 2704
-
Decomposition pathway for model fluorinated ethers on the clean iron surfaceNapier, M. E. / Stair, P. C. et al. | 1992
- 2709
-
Two-dimensional phase transitions associated with surface miscibility gapsWynblatt, P. / Liu, Y. et al. | 1992
- 2718
-
Surface composition determination of Pt-Sn alloys by chemical titration with carbon monoxideHaner, A. H. / Ross, P. N. / Bardi, U. / Atrei, A. et al. | 1992
- 2723
-
High temperature air-annealing behavior of sputter deposited amorphous yttria films on fused silicaMukherjee, S. N. / Aita, C. R. et al. | 1992
- 2729
-
Supported catalyst characterizationWu, X. / Bhatia, S. / King, T. S. et al. | 1992
- 2737
-
Surface chemistry of catalyst preparation studied by using flat alumina model supportsBorg, H. J. / Van den Oetelaar, L. C. A. / Van Ijzendoorn, L. J. / Niemantsverdriet, J. W. et al. | 1992
- 2742
-
Surface analysis of an alumina based supported catalyst by means of dynamic secondary ion mass spectrometryNagase, S. / Martin, J. R. et al. | 1992
- 2746
-
X-ray photoelectron spectroscopy study of the stability of Fomblin Z25 on the native oxide of aluminumHerrera-Fierro, P. / Pepper, S. V. / Jones, W. R. et al. | 1992
- 2752
-
Copper deposition onto polyetherimide: Interface composition and adhesionBurrell, M. C. / Porta, G. M. / Karas, B. R. / Foust, D. F. et al. | 1992
- 2758
-
Structure of self-organizing organic films: A near edge x-ray absorption fine structure investigation of thiol layers adsorbed on goldHaehner, G. / Kinzler, M. / Thuemmler, C. / Woell, C. et al. | 1992
- 2764
-
Secondary ion mass spectroscopic characterization of silver and aluminum diffusion in paryleneDabral, S. / Yang, G.-R. / Lu, T.-M. / McDonald, J. F. et al. | 1992
- 2767
-
Interaction of aliphatic acids and alcohols with aluminum surfacesUnderhill, R. / Timsit, R. S. et al. | 1992
- 2775
-
Behavior of rigid macromolecules in self-assembly at an interfaceEnriquez, E. P. / Gray, K. H. / Guarisco, V. F. / Linton, R. W. et al. | 1992
- 2783
-
Carbon, functionalized carbon, and hydrocarbons studied by valence band photoemissionSherwood, P. M. A. et al. | 1992
- 2788
-
Concerted x-ray photoelectron spectroscopy study of the character of select carbonaceous materialsBarr, T. L. / Yin, M. et al. | 1992
- 2796
-
Properties of plasma assisted chemical vapor deposited coatings of titanium boride on Ti-6Al-4V alloy substratesOtter, F. A. / Amisola, G. B. / Roman, W. C. / Hay, S. O. et al. | 1992
- 2802
-
Core level x-ray photoelectron spectroscopy of Au~xGa~y alloysJayne, D. T. / Fatemi, N. S. / Weizer, V. G. et al. | 1992
- 2806
-
Improving the interpretation of x-ray photoelectron and Auger electron spectra using numerical methodsStickle, W. F. / Watson, D. G. et al. | 1992
- 2810
-
Structural and geometrical features of copper seed cones observed by high-resolution electron microscopyMori, Y. / Fujimoto, Y. / Okuyama, F. et al. | 1992
- 2816
-
Variable angle spectroscopic ellipsometry studies of oriented phthalocyanine films. II. Copper phthalocyanineDebe, M. K. et al. | 1992
- 2822
-
Auger electron spectroscopy, x-ray photoelectron spectroscopy, and electron energy-loss spectroscopy studies of MoSi~2Rastogi, R. S. / Vankar, V. D. / Chopra, K. L. et al. | 1992
- 2826
-
Nondestructive determination of composition depth profiles on subnanometer scales using angle resolved Auger spectroscopyDerry, G. N. / Vanderlinde, W. E. et al. | 1992
- 2832
-
Ion beam analysis of Li diffused Ge-Li interfacesJen, C. K. C. / Kegel, G. H. R. / Jen, K.-P. et al. | 1992
- 2839
-
L~3M~4~,~5M~4~,~5 Auger transitions and valence hole screening of the 4d metalsKleiman, G. G. / Landers, R. / De Castro, S. G. C. / Nascente, P. A. P. et al. | 1992
- 2843
-
Secondary ion mass spectrometry analysis of Be doped GaAs/AlGaAs heterostructuresHopkins, L. C. / Nagle, J. / Malik, R. J. et al. | 1992
- 2846
-
Take-off angle dependent x-ray photoelectron spectroscopy, secondary ion mass spectrometry, and scanning electron microscopy for determining the thickness and composition of passivation layers on technical aluminum foilsGunter, P. L. J. / Borg, H. J. / Niemantsverdriet, J. W. / Rheiter, H. J. H. et al. | 1992
- 2852
-
Field emission from hafnium carbideMackie, W. A. / Morrissey, J. L. / Hinrichs, C. H. / Davis, P. R. et al. | 1992
- 2857
-
Surface studies of (0001) Al~2O~3 and the growth of thin films of Cu on Al~2O~3Varma, S. / Chottiner, G. S. / Arbab, M. et al. | 1992
- 2863
-
Thermally and optically stimulated exoelectron emission from an electron-beam irradiated glass-ceramic materialCarroll, D. L. / Doering, D. L. / Blais, B. S. et al. | 1992
- 2869
-
New ways of using tests on statistical properties of randomly real rough surfacesVarnier, F. / Rasigni, G. / Llebaria, A. et al. | 1992
- 2875
-
Surface roughness analysis by scanning tunneling microscopy and atomic force microscopyFiles-Sesler, L. A. / Hogan, T. / Taguchi, T. et al. | 1992
- 2880
-
Test structures for secondary ion mass spectrometry analysis of patterned silicon wafersStevie, F. A. / Cochran, G. W. / Kahora, P. M. / Russell, W. A. et al. | 1992
- 2887
-
Secondary ion mass spectrometry test structures for analyses of semiconductor product wafersHarris, W. C. / Smith, H. E. / Pelillo, A. J. / Beagle, J. L. et al. | 1992
- 2892
-
Evidence of Si-OH species at the surface of aged silicaPaparazzo, E. / Fanfoni, M. / Severini, E. / Priori, S. et al. | 1992
- 2897
-
High-resolution depth profiling of semiconductor structures: Preliminary resultsDrummond, I. W. / Dowsett, M. G. / James, D. M. / Street, F. J. et al. | 1992
- 2902
-
Orientation and structure of monolayer ->-> multilayer phthalocyanine thin films on layered semiconductor (MoS~2 and SnS~2) surfacesCollins, G. E. / Nebesny, K. W. / England, C. D. / Chau, L.-K. et al. | 1992
- 2913
-
Moisture-induced interfacial oxidation of chromium on polyimideFurman, B. K. / Childs, K. D. / Clearfield, H. / Davis, R. et al. | 1992
- 2921
-
Angularly resolved x-ray photoelectron spectroscopy investigation of PTFE after prolonged space exposureDalins, I. / Karimi, M. et al. | 1992
- 2926
-
X-ray photoelectron spectroscopy analysis of ion-beam-induced oxidation of GaAs and AlGaAsAlay, J. L. / Vandervorst, W. et al. | 1992
- 2931
-
Monte Carlo simulation of Auger electron spectroscopy and x-ray photoelectron spectroscopy spectraYoshikawa, H. / Shimizu, R. et al. | 1992
- 2938
-
Inelastic peak shape method applied to quantitative surface analysis of inhomogeneous samplesHansen, H. S. / Jansson, C. / Tougaard, S. et al. | 1992
- 2945
-
Evaluation of surface analysis methods for characterization of trace metal surface contaminants found in silicon integrated circuit manufacturingDiebold, A. C. / Maillot, P. / Gordon, M. / Baylis, J. et al. | 1992