Absolute calibration of the ^1^6O(,)^1^6O elastic scattering resonance at 7.30-7.65 MeV and applications to oxygen depth profiling (Unknown)
- New search for: Almeida, F. J. D.
- New search for: Davies, J. A.
- New search for: Jackman, T. E.
- New search for: Almeida, F. J. D.
- New search for: Davies, J. A.
- New search for: Jackman, T. E.
- New search for: Andersen, H. H.
- New search for: Rehn, L. E.
In:
Beam Interactions with Materials and Atoms
3
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393
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1993
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ISSN:
- Article (Journal) / Print
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Title:Absolute calibration of the ^1^6O(,)^1^6O elastic scattering resonance at 7.30-7.65 MeV and applications to oxygen depth profiling
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Contributors:Almeida, F. J. D. ( author ) / Davies, J. A. ( author ) / Jackman, T. E. ( author ) / Andersen, H. H. / Rehn, L. E.
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Published in:
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Publisher:
- New search for: ELSEVIER
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Publication date:1993-01-01
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Size:393 pages
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ISSN:
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Type of media:Article (Journal)
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Type of material:Print
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Language:Unknown
- New search for: 539.7
- Further information on Dewey Decimal Classification
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Classification:
DDC: 539.7 -
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 82, Issue 3
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 389
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Single electron capture in He+ on SF6, collisions at low keV energiesMartínez, H. / Alvarez, I. / Cisneros, C. / de Urquijo, J. et al. | 1993
- 393
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Absolute calibration of the 16O((a,a)16O elastic scattering resonance at 7.30-7.65 MeV and applications to oxygen depth profilingAlmeida, F.J.D. et al. | 1993
- 393
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Absolute calibration of the 16O(α,α)16O elastic scattering resonance at 7.30–7.65 MeV and applications to oxygen depth profilingAlmeida, F.J.D. / Davies, J.A. / Jackman, T.E. et al. | 1993
- 399
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On 10Be standards and the half-life of 10BeMiddleton, Roy / Brown, Louis / Dezfouly-Arjomandy, Bijan / Klein, Jeffrey et al. | 1993
- 404
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Systematics of scaling of heavy ion blocking in thin silicon crystalsNanal, Vandana / Apte, P.R. / Kurup, M.B. / Prasad, K.G. et al. | 1993
- 409
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A new method to calculate the characteristics of radiation and pair production under high energies and arbitrary angles of particle incidence relative to the crystal planesTikhomirov, V.V. et al. | 1993
- 417
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A mechanism of ion bombardment induced ripple topographyProtsenko, A.N. et al. | 1993
- 421
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Penetration of high energy ions in semiconductors through tracks: simulation with transport equationsZaitsev, A.M. / Fedotov, S.A. / Melnikov, A.A. / Komarov, F.F. / Fahrner, W.R. / Varichenko, V.S. / te Kaat, E.H. et al. | 1993
- 431
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Spatial localization of the buried ion-beam synthesized layer of silicon dioxide inclusions in siliconDanilin, A.B. / Malinin, A.A. / Mordkovich, V.N. / Saraikin, V.V. / Vyletalina, O.I. et al. | 1993
- 435
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Irradiation induced texture of Ag and Fe grains in Ag/Fe multilayersLiu, B.X. / Pan, F. / Yang, T. / Tao, K. et al. | 1993
- 442
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A new parameter in the electrochemical etching of polymer track detectorsSohrabi, M. / Katouzi, M. et al. | 1993
- 447
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On the effect of beam spatial broadening in ion microtomography (IMT) image qualityBench, G.S. / Antolak, A.J. / Morse, D.H. / Pontau, A.E. / Saint, A. / Legge, G.J.F. et al. | 1993
- 459
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Multiple scattering and inelasticity distortions in neutron scattering from an infinite plane slabDawidowski, J. / Cuello, G.J. / Granada, J.R. et al. | 1993
- 465
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Nuclear microprobe analysis of 14N and 15N in soybean leavesMassiot, P. / Michaud, V. / Sommer, F. / Grignon, N. / Gojon, A. / Ripoll, C. / Thellier, M. et al. | 1993
- 474
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Precise determination of H recoil cross sections for 1.5–3.0 MeV He ionsKido, Y. / Miyauchi, S. / Takeda, O. / Nakayama, Y. / Sato, M. / Kusao, K. et al. | 1993
- 481
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X-ray beam profile measurements with CCD detectorsAttaelmanan, A. / Rindby, A. / Voglis, P. / Shermeat, A. et al. | 1993
- 489
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Calendar| 1993