Some considerations in the use of quality control techniques in integrated circuit fabrication (Unknown)
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- New search for: Friedman, D. J.
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In:
Statistics in Industry
1
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97
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1993
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ISSN:
- Article (Journal) / Print
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Title:Some considerations in the use of quality control techniques in integrated circuit fabrication
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Contributors:
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Published in:Statistics in Industry , 1 ; 97INTERNATIONAL STATISTICAL REVIEW ; 61, 1 ; 97
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Publisher:
- New search for: INTERNATIONAL STATISTICAL INSTITUTE
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Publication date:1993-01-01
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Size:97 pages
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ISSN:
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Type of media:Article (Journal)
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Type of material:Print
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Language:Unknown
- New search for: 519.5
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Classification:
DDC: 519.5 -
Source:
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Table of contents – Volume 61, Issue 1
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 3
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Quality improvement - The new industrial revolutionBox, G. et al. | 1993
- 21
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Discussion of: George Box `Quality improvement - The new industrial revolution'Sandland, R. L. et al. | 1993
- 27
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Measurement assurance: Role of statistics and support from International Statistical StandardsCarey, M. B. et al. | 1993
- 41
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Statistical control schemes: Methods, applications and generalizationsYashchin, E. et al. | 1993
- 67
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Algorithmic statistical process control: Some practical observationsFaitin, F. W. / Hahn, G. J. / Tucker, W. T. / Vander Wiel, S. A. et al. | 1993
- 81
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An example of dynamic graphics for manufacturing process dataEddy, W. F. / Mockus, A. et al. | 1993
- 97
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Some considerations in the use of quality control techniques in integrated circuit fabricationFriedman, D. J. et al. | 1993
- 109
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Quality selection under sampling inspection with an exponential production cost functionCarlsson, O. / Rydin, S. et al. | 1993
- 121
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Variation reduction and designed experimentsAbraham, B. / MacKay, J. et al. | 1993
- 131
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A catalogue of two-level and three-level fractional factorial designs with small runsChen, J. / Sun, D. X. / Wu, C. F. J. et al. | 1993
- 147
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A Review of recent research and current issues in accelerated testingMeeker, W. Q. / Escobar, L. A. et al. | 1993
- 169
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Bounds for reliability estimation under dependent censoringNair, V. N. et al. | 1993
- 183
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Beyond analysis of variance techniques: Some applications in clinical trialsHirotsu, C. et al. | 1993