On the Statistical Significance of Empirical Frequency Distributions (Unknown)
- New search for: Poech, M.-H.
- New search for: Poech, M.-H.
In:
PRACTICAL METALLOGRAPHY
;
31
, 6
;
284
;
1994
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ISSN:
- Article (Journal) / Print
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Title:On the Statistical Significance of Empirical Frequency Distributions
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Contributors:Poech, M.-H. ( author )
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Published in:PRACTICAL METALLOGRAPHY ; 31, 6 ; 284
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Publisher:
- New search for: CARL HANSER VERLAG
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Publication date:1994-01-01
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Size:284 pages
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ISSN:
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Type of media:Article (Journal)
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Type of material:Print
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Language:Unknown
- New search for: 669.95
- Further information on Dewey Decimal Classification
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Classification:
DDC: 669.95 -
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 31, Issue 6
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 273
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Inhalt / Contents| 1994
- 274
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Quantitative Gefügeanalyse von Aluminium-Silicium- Gußlegierungen / Quantitative Microstructural Analysis of Aluminium-Silicon Cast AlloysPompe, Oliver et al. | 1994
- 274
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Quantitative Microstructural Analysis of Aluminium-Silicon Cast AlloysPompe, O. et al. | 1994
- 274
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Quantitative Gefügeanalyse von Aluminium-Silicium-GußlegierungenPompe, O. et al. | 1994
- 284
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Zur statistischen Signifikanz empirischer Häufigkeitsverteilungen / On the Statistical Significance of Empirical Frequency DistributionsPoech, Max Hermann et al. | 1994
- 284
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On the Statistical Significance of Empirical Frequency DistributionsPoech, M.-H. et al. | 1994
- 289
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PROIMAGE - Digitale Bildarchivierung und automatische Berichterstellung| 1994
- 289
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Information| 1994
- 290
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Querschnittspräparation für die Untersuchung von dünnen Schichten, Grenzflächen, Pulvern und Fasern im Transmissionselektronenmikroskop / The Preparation of Cross Sections for the Examination of Thin Layers, Interfaces, Powders and Fibres in the Transmission Electron MicroscopeKlaar, Hans-Joachim / Huang, Ching-An et al. | 1994
- 290
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The Preparation of Cross Sections for the Examination of Thin Layers, Interfaces, Powders and Fibres in the Transmission Electron MicroscopeKlaar, H.-J. et al. | 1994
- 290
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Querschnittspräparation für die Untersuchung von dünnen Schichten, Grenzflächen, Pulvern und Fasern im TransmissionselektronenmikroskopKlaar, H.J. / Huang, Chin-An et al. | 1994
- 306
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Literatur-Notizen / Literature Reviews| 1994
- 306
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Literature Reviews| 1994
- 307
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Defekterscheinungen an oberflächenorientierten BauelementenWulff, F.W. / Ahrens, T. / Hieber, H. et al. | 1994
- 307
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Defects in Surface Mount InterconnectionsWulff, F.W. et al. | 1994
- 307
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Defekterscheinungen an oberflächenmontierten Bauelementen / Defects in Surface Mount InterconnectionsWulff, Frank Werner / Ahrens, Thomas / Hieber, Hartmann et al. | 1994
- 315
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100 Lehrgänge Metallographische Untersuchungsmethoden| 1994
- 322
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Meeting Diary| 1994
- 322
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Tagungskalender / Meeting Diary| 1994
- 324
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Impressum| 1994