Scanning tunneling microscopy investigation of bainite in steel (Unknown)
- New search for: Yan, J.-J.
- New search for: Yu, H.-B.
- New search for: Ge, Z.
- New search for: Huang, Y.
- New search for: Yan, J.-J.
- New search for: Yu, H.-B.
- New search for: Ge, Z.
- New search for: Huang, Y.
In:
JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY B MICROELECTRONICS PROCESSING AND PHENOMENA
;
12
, 3
;
1793
;
1994
-
ISSN:
- Article (Journal) / Print
-
Title:Scanning tunneling microscopy investigation of bainite in steel
-
Contributors:
-
Published in:
-
Publisher:
-
Publication date:1994-01-01
-
Size:1793 pages
-
ISSN:
-
Type of media:Article (Journal)
-
Type of material:Print
-
Language:Unknown
- New search for: 621.22
- Further information on Dewey Decimal Classification
-
Classification:
DDC: 621.22 -
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 12, Issue 3
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1319
-
Photoluminescence of molecular beam epitaxial grown Al~0~.~4~8In~0~.~5~2AsFerguson, I. T. / Cheng, T. S. / Sotomayor Torres, C. M. / Murray, R. et al. | 1994
- 1328
-
Thin-film induced stress in GaAs ridge-waveguide structures integrated with sputter-deposited ZnO filmsHong Koo Kim / Kleemeier, W. / Li, Y. / Langer, D. W. et al. | 1994
- 1333
-
Comparison of multipolar and magnetic mirror electron cyclotron resonance sources for CH~4/H~2 dry etching of III-V semiconductorsPearton, S. J. / Abernathy, C. R. / Kopf, R. F. / Ren, F. et al. | 1994
- 1340
-
Comparison of advanced plasma sources for etching applications. IV. Plasma induced damage in a helicon and a multipole electron cyclotron resonance sourceBlayo, N. / Tepermeister, I. / Benton, J. L. / Higashi, G. S. et al. | 1994
- 1351
-
High frequency reactive ion etching of silylated photoresistKalpakjian, K. M. / Lieberman, M. A. / Oldham, W. G. et al. | 1994
- 1362
-
Resist heating effect in electron beam lithographyYasuda, M. / Kawata, H. / Murata, K. / Hashimoto, K. et al. | 1994
- 1367
-
Workpiece charging in electron beam lithographyIngino, J. / Owen, G. / Berglund, C. N. / Browning, R. et al. | 1994
- 1372
-
Fabrication of a multilevel structure for nanophysics in two-dimensional electron gasesSoh, Y.-A. / Snider, G. L. / Rooks, M. J. / Craighead, H. G. et al. | 1994
- 1377
-
Anneal technique to recover the electrical characteristics of the packaged bipolar junction transistors damaged by Co-60 radiationChang-Liao, K.-S. / Huang, C.-J. et al. | 1994
- 1384
-
Ion-assisted etching of Si with Cl~2: The effect of flux ratioCoburn, J. W. et al. | 1994
- 1390
-
Arsenic gas-phase doping of polysiliconRansom, C. M. / Jackson, T. N. / DeGelormo, J. F. / Kotecki, D. et al. | 1994
- 1394
-
Auger depth profiles of TiN/Ti films in submicron contact holes: A comparison of collimated and uncollimated deposition processesHoener, C. F. / Pylant, E. / Boden, E. G. / Wang, S.-Q. et al. | 1994
- 1402
-
Electron spectroscopy for chemical analysis on surface germylation processYoshida, Y. / Kubota, S. / Koezuka, H. / Fujioka, H. et al. | 1994
- 1407
-
Carbon filament source for p-type doping in molecular beam epitaxyMak, A. / Johnson, S. R. / Lavoie, C. / Mackenzie, J. et al. | 1994
- 1410
-
Reactive ion etching of InP via holesHur, K. Y. / Guerin, B. J. / Kazior, T. E. et al. | 1994
- 1413
-
Scanning tunneling microscopy observation of the growth evolution of gold films evaporated on highly oriented pyrolitic graphiteHammiche, A. / Webb, R. P. / Wilson, I. H. et al. | 1994
- 1416
-
Photoluminescence studies of interstitial Zn in InP due to rapid thermal annealingHsu, J. K. / Juang, C. / Lee, B. J. / Chi, G. C. et al. | 1994
- 1419
-
Formation of ohmic contacts to n-GaAs using (NH~4)~2S surface passivationFischer, V. / Kim, T.-J. / Holloway, P. H. / Ristolainen, E. et al. | 1994
- 1422
-
Some preliminary observations of the rapid thermal oxidation of porous silicon, and the rapid thermal nitriding of oxidized porous siliconShieh, S.-Y. / Evans, J. W. et al. | 1994
- 1441
-
Near-field optics: Light for the world of NANOPohl, D. W. / Novotny, L. et al. | 1994
- 1447
-
Real space imaging of electron scattering phenomena at metal surfacesAvouris, P. / Lyo, I.-W. / Walkup, R. E. / Hasegawa, Y. et al. | 1994
- 1456
-
Structural refinement and measurement of biomolecules using novel software algorithms and methodologiesWilliams, P. M. / Davies, M. C. / Jackson, D. E. / Roberts, C. J. et al. | 1994
- 1461
-
Topographical structure of pBR322 DNA studied by scanning tunneling microscope and atomic force microscopeZhang, P.-C. / Bai, C. / Cheng, Y.-J. / Fang, Y. et al. | 1994
- 1465
-
Atomic force microscopy of plasmid DNA and DNA polymeraseLi, M.-Q. / Hansma, H. G. / Hong, G.-F. / Yao, X.-W. et al. | 1994
- 1470
-
Imaging of neurons by atomic force microscopyUmemura, K. / Arakawa, H. / Ikai, A. et al. | 1994
- 1474
-
Exploring intermediate filament structure with the scanning force microscope: Comparison with transmission electron microscopy dataKarrasch, S. / Heins, S. / Aebi, U. / Engel, A. et al. | 1994
- 1478
-
Scanning tunneling microscopy/atomic force microscopy studies of bacteriophage T4 and its tail fibersIkai, A. / Imai, K. / Yoshimura, K. / Tomitori, M. et al. | 1994
- 1482
-
Exploring native nuclear pore complex structure and conformation by scanning force microscopy in physiological buffersGoldie, K. N. / Pante, N. / Engel, A. / Aebi, U. et al. | 1994
- 1486
-
Direct observation of human liver ferritin by scanning tunneling microscopyMosca, A. / Paleari, R. / Arosio, P. / Cricenti, A. et al. | 1994
- 1490
-
Scanning tunneling microscopy of proteins of the immunoglobulin super familyRocca-Serra, J. / Thimonier, J. / Chauvin, J.-P. / Barbet, J. et al. | 1994
- 1494
-
Sample preparation for scanning tunneling microscopy imaging of proteins: Characterization of gold surfaces chemically modified with a disulfide reagentCricenti, A. / Scarselli, M. A. / Paleari, R. / Mosca, A. et al. | 1994
- 1497
-
Investigation of C-phycocyanin from blue-green alga spirulina platensis with scanning tunneling microscopeZhang, Y. / Ma, Z. / Chu, X. / Hu, T. et al. | 1994
- 1500
-
Biological materials studied with dynamic force microscopyAnselmetti, D. / Dreier, M. / Luethi, R. / Richmond, T. et al. | 1994
- 1504
-
Scanning force microscopy of E. coli OmpF porin in buffer solutionSchabert, F. A. / Hoh, J. H. / Karrasch, S. / Hefti, A. et al. | 1994
- 1508
-
Imaging of uncoated tobacco mosaic virus by scanning tunneling microscopyGuckenberger, R. / Teran Arce, F. / Hillebrand, A. / Hartmann, T. et al. | 1994
- 1512
-
Tunneling microscopy verification of an x-ray scattering-derived molecular model of tyrosine-based melaninZajac, G. W. / Gallas, J. M. / Alvarado-Swaisgood, A. E. et al. | 1994
- 1517
-
Conformational differences in two mutant hinge IgG4 antibodies observed by scanning tunneling microscopyKreusel, K. M. / Adair, J. R. / Beeley, N. R. A. / Davies, M. C. et al. | 1994
- 1521
-
Scanning tunneling investigation of DNA structures involved in gene regulationPasero, P. / Blettry, C. / Marilley, M. / Jordan, B. et al. | 1994
- 1526
-
Visualization and identification of intracellular structures by force modulation microscopy and drug induced degradationFritz, M. / Radmacher, M. / Petersen, N. / Gaub, H. E. et al. | 1994
- 1530
-
Imaging of cells with atomic force microscopy operated at a "tapping" modeShibata-Seki, T. / Watanabe, W. / Masai, J. et al. | 1994
- 1535
-
Atomic force and scanning electron microscopy of Xenopus laevis oocytesSolletti, J.-M. / Kasas, S. / Bertrand, D. / Weisenhorn, A. L. et al. | 1994
- 1539
-
Probing by in situ scanning tunneling microscopy the influence of an organic additive on Si etching in NaOHAllongue, P. / Bertagna, V. / Kieling, V. / Gerischer, H. et al. | 1994
- 1543
-
In situ observation of anodic dissolution process of n-GaAs in HCl solution by electrochemical atomic force microscopeKoinuma, M. / Uosaki, K. et al. | 1994
- 1547
-
Ex situ scanning tunneling microscopy investigations of the modification of titanium surface due to corrosion processesEjov, A. A. / Savinov, S. V. / Yaminsky, I. V. / Pan, J. et al. | 1994
- 1551
-
In situ characterization of the liquid-solid interface by scanning tunneling microscopyKim, J. C. / Khang, Y. H. / Shim, T. E. / Lee, D. H. et al. | 1994
- 1555
-
Friction force microscopy of heavy-ion irradiated micaHagen, T. / Grafstroem, S. / Ackermann, J. / Neumann, R. et al. | 1994
- 1559
-
Analysis of lateral force effects on the topography in scanning force microscopyGrafstroem, S. / Ackermann, J. / Hagen, T. / Neumann, R. et al. | 1994
- 1565
-
Real-time imaging of enzymatic degradation of starch granules by atomic force microscopyThomson, N. H. / Miles, M. J. / Ring, S. G. / Shewry, P. R. et al. | 1994
- 1569
-
Imaging of surface electrostatic features in phase-separated phospholipid monolayers by scanning Maxwell stress microscopyInoue, T. / Yokoyama, H. et al. | 1994
- 1572
-
Measurement of Si wafer and SiO~2 layer microroughness by large sample atomic force microscopeYasutake, M. / Wakiyama, S. / Kato, Y. et al. | 1994
- 1577
-
Two-directional dynamic mode force microscopy: Detection of directional force gradientWatanabe, S. / Hane, K. / Ito, M. / Goto, T. et al. | 1994
- 1581
-
Scanning force microscope using a piezoelectric microcantileverItoh, T. / Suga, T. et al. | 1994
- 1586
-
Magnetic force microscopy on high-T~c superconductorsMoser, A. / Hug, H. J. / Fritz, O. / Parashikov, I. et al. | 1994
- 1591
-
Application of MHz-frequency detection to noncontact scanning force microscopyHug, H. J. / Moser, A. / Weller, D. / Parashikov, I. et al. | 1994
- 1596
-
Observation and surface modification of electropolymerized poly(N-methylpyrrole) using atomic force microscopyYano, T. / Nagahara, L. A. / Hashimoto, K. / Fujishima, A. et al. | 1994
- 1600
-
Charge deposition and imaging on a fluoride thin film using the scanning force microscopeUmeda, N. / Makino, K. / Takahashi, T. / Takayanagi, A. et al. | 1994
- 1604
-
Structural study of Langmuir-Blodgett films by scanning surface potential microscopyFujihira, M. / Kawate, H. et al. | 1994
- 1609
-
Atomic force microscopy and friction force microscopy of chemically modified surfacesFujihira, M. / Morita, Y. et al. | 1994
- 1614
-
Atomic force microscopy study of the fractal shape of residual barium cuprate/copper oxide flux on the surface of Y~2Ba~4Cu~7O~1~5 and YBa~2Cu~4O~8 single crystalsLang, H. P. / Karpinski, J. / Kaldis, E. / Ramseyer, J.-P. et al. | 1994
- 1618
-
Study of magnetic characteristics of tips for magnetic force microscopySueoka, K. / Sai, F. / Parker, K. / Arnoldussen, T. et al. | 1994
- 1623
-
Atomic force microscopy study of surface morphology of GaAs grown by atomic layer epitaxy using trimethylgallium and arsinePark, S.-J. / Jeong Sook Ha / Ro, J.-R. / Sim, J.-K. et al. | 1994
- 1627
-
Atomic force microscopy studies of contact-electrified charges on silicon oxide filmSugawara, Y. / Fukano, Y. / Uchihashi, T. / Okusako, T. et al. | 1994
- 1631
-
Effect of Mg(OH)~2 on YBa~2Cu~3O~7 thin film on MgO substrate studied by atomic force microscopeKim, B. I. / Hong, J. W. / Jeong, G. T. / Moon, S. H. et al. | 1994
- 1635
-
Study on the stick-slip phenomenon on a cleaved surface of the Muscovite mica using an atomic force/lateral force microscopeFujisawa, S. / Sugawara, Y. / Morita, S. / Ito, S. et al. | 1994
- 1638
-
Atomic force microscopy of ammonium perchlorateYoo, M. / Yoon, S. / De Lozanne, A. et al. | 1994
- 1642
-
Normal and lateral forces in scanning force microscopyAscoli, C. / Dinelli, F. / Frediani, C. / Petracchi, D. et al. | 1994
- 1646
-
Piezoelectric sliding-pushing micropositioner in a scanning tunneling microscopeYao, X. / Xu, L. / Zhang, L. / Hu, J. et al. | 1994
- 1648
-
Atomic force detection system with a differential heterodyne interferometer using an optical fiber arrayNakatani, N. / Oshio, T. et al. | 1994
- 1652
-
Observation of lattice defects using scanning tunneling microscopy/spectroscopy at low temperaturesEndo, T. / Yamada, H. / Sumomogi, T. / Kino, T. et al. | 1994
- 1655
-
New method to measure dIIdV and d^2IIdV^2 of the tunneling current-voltage characteristicsYamada, H. / Sumomogi, T. / Endo, T. et al. | 1994
- 1658
-
Scanning tunneling microscopy/scanning electron microscopy combined instrumentAsenjo, A. / Buendia, A. / Gomez-Rodriguez, J. M. / Baro, A. M. et al. | 1994
- 1662
-
Improved scanning tunneling microscope feedback performance by means of separate actuatorsTapson, J. / Greene, J. R. / Ball, A. et al. | 1994
- 1665
-
Capacitive sensors coupled to a scanning tunneling microscope piezoscanner for accurate measurements of the tip displacementsDesogus, S. / Lanyi, S. / Nerino, R. / Picotto, G. B. et al. | 1994
- 1669
-
Surface roughness observation by scanning tunneling microscopy using a monolithic parallel springZhang, H.-C. / Sasaki, A. / Fukaya, J. / Aoyama, H. et al. | 1994
- 1673
-
Progress in noncontact dynamic force microscopyLuethi, R. / Meyer, E. / Howald, L. / Haefke, H. et al. | 1994
- 1677
-
Combined scanning tunneling and force microscopyAnselmetti, D. / Baratoff, A. / Guentherodt, H.-J. / Gerber, C. et al. | 1994
- 1681
-
Comparison measurement in the hundred nanometer range with a crystalline lattice using a dual tunneling-unit scanning tunneling microscopeKawakatsu, H. / Higuchi, T. / Kougami, H. / Kawai, M. et al. | 1994
- 1686
-
Detecting and controlling forces in atomic force microscopy with multidegrees of freedomKawakatsu, H. / Saito, T. / Kougami, H. / Blanalt, P. et al. | 1994
- 1690
-
Local probing instrumentation at Advanced Technologies Center: Surface and force devices with tunneling sensorMoiseev, Y. N. / Panov, V. I. / Savinov, S. V. / Yaminsky, I. V. et al. | 1994
- 1694
-
Mica etch pits as a height calibration source for atomic force microscopyNagahara, L. A. / Hashimoto, K. / Fujishima, A. / Snowden-Ifft, D. et al. | 1994
- 1698
-
Calibration, drift elimination, and molecular structure analysisJoergensen, J. F. / Madsen, L. L. / Garnaes, J. / Carneiro, K. et al. | 1994
- 1702
-
Hysteresis correction of scanning tunneling microscope imagesJoergensen, J. F. / Carneiro, K. / Madsen, L. L. / Conradsen, K. et al. | 1994
- 1705
-
Ultrahigh vacuum atomic force microscope with sample cleaving mechanismOhta, M. / Sugawara, Y. / Morita, S. / Nagaoka, H. et al. | 1994
- 1708
-
Newly developed low-temperature scanning tunneling microscope and its application to the study of superconducting materialsGao, F. / Dai, C. / Chen, Z. / Huang, G. et al. | 1994
- 1712
-
Fabrication of diamond tips by the microwave plasma chemical vapor deposition techniqueLiu, N. / Ma, Z. / Chu, X. / Hu, T. et al. | 1994
- 1716
-
Cross-section X-scanning force microscopy analysis of different hard coatings and thin filmsPischow, K. A. / Adamik, M. / Barna, P. B. / Korhonen, A. S. et al. | 1994
- 1722
-
Scanning tunneling microscope observation of the cleavage fracture surfaces of titanium aluminideZhang, Y. / Chu, W. Y. / Wang, Y. B. / Qiao, L. J. et al. | 1994
- 1727
-
Studies of TiN nucleation and growth by scanning tunneling microscopy in waterSong, J. P. / Pryds, N. H. / Glejboel, K. / Moerch, K. A. et al. | 1994
- 1734
-
Surface characterization of sputtered niobium films by scanning tunneling microscopyLacquaniti, V. / Maggi, S. / Monticone, E. / Picotto, G. B. et al. | 1994
- 1738
-
Microhardness measurements by scanning tunneling microscopeBarbato, G. / Desogus, S. / Germak, A. / Picotto, G. B. et al. | 1994
- 1742
-
Deposition of Au on a sulfur covered Mo(100) surface: Adsorbate-adsorbate interaction and growthDunphy, J. C. / Chapelier, C. / Ogletree, D. F. / Salmeron, M. B. et al. | 1994
- 1747
-
Structure of Au on Ag(110) studied by scanning tunneling microscopyChiang, S. / Rousset, S. / Fowler, D. E. / Chambliss, D. D. et al. | 1994
- 1751
-
Scanning tunneling microscopy tip-dependent image contrast of S/Pt(111) by controlled atom transferMcIntyre, B. J. / Sautet, P. / Dunphy, J. C. / Salmeron, M. et al. | 1994
- 1754
-
Study of ion bombardment induced vacancy islands on Au(100) by scanning tunneling microscopyGauthier, S. / Samson, Y. / Girard, J. C. / Rousset, S. et al. | 1994
- 1758
-
Scanning tunneling microscopy studies of metal surfaces: Surface reactions, discrimination of chemically different elements, and surface alloyingBesenbacher, F. / Laegsgaard, E. / Pleth Nielsen, L. / Ruan, L. et al. | 1994
- 1764
-
Electromigration kinetics of gold on a carbon thin film surface studied by scanning tunneling microscopy and scanning tunneling potentiometryBesold, J. / Kunze, R. / Matz, N. et al. | 1994
- 1768
-
Scanning tunneling microscopy of Co on Pt(111)Gruetter, P. / Duerig, U. T. et al. | 1994
- 1772
-
Scanning tunneling microscopy study of S adsorption on Ni(111)Ruan, L. / Stensgaard, I. / Besenbacher, F. / Laegsgaard, E. et al. | 1994
- 1776
-
Scanning tunneling microscopy study of model catalysts obtained by cluster beam deposition of palladium onto highly oriented pyrolitic graphiteCadete Santos Aires, F. J. / Sautet, P. / Rousset, J.-L. / Fuchs, G. et al. | 1994
- 1780
-
Scanning tunneling microscope and atomic force microscope study of epitaxially grown palladium crystallites on graphiteKojima, I. / Kurahashi, M. et al. | 1994
- 1783
-
Growth of iron on iron whiskersStroscio, J. A. / Pierce, D. T. et al. | 1994
- 1789
-
Scanning tunneling microscopy study of the growth of Cr/Fe(001): Correlation with exchange coupling of magnetic layersStroscio, J. A. / Pierce, D. T. / Unguris, J. / Celotta, R. J. et al. | 1994
- 1793
-
Scanning tunneling microscopy investigation of bainite in steelYan, J.-J. / Yu, H.-B. / Ge, Z. / Huang, Y. et al. | 1994
- 1797
-
Observation of the relaxation processes that follow atom removal from the Au(111) surface with the scanning tunneling microscopeHasegawa, Y. / Avouris, P. et al. | 1994
- 1801
-
Atomic force microscope and scanning tunneling microscope studies of superlattices and density waves in Fe doped NbSe~2, TaSe~2, TaS~2 and in NbSe~3 doped with Fe, Co, Cr, and VColeman, R. V. / Dai, Z. / Gong, Y. / Slough, C. G. et al. | 1994
- 1805
-
Adsorbates in ambient operated scanning tunneling microscopy: Their appearance, mobility during scanning, and role in surface diffusion measurementsCampbell, P. A. / Davis, P. R. / Walmsley, D. G. et al. | 1994
- 1809
-
Vibrational and structural studies of oxygen adsorption on the Ag(110) surfaceHashizume, T. / Rowe, J. E. / Malic, R. A. / Motai, K. et al. | 1994
- 1813
-
Atomic force microscope study of thin-plate martensites in an Fe-Ni-C alloyYamamoto, M. / Nishikawa, K. / Noda, Y. / Saburi, T. et al. | 1994
- 1817
-
Scanning tunneling microscopy of silver and gold metal liquidlike filmsSmith, K. W. / Rigby, S. J. / Turner, R. J. / Walmsley, D. G. et al. | 1994
- 1823
-
Microstructures of nanosize hydrogenated crystalline silicon studied by scanning tunneling microscopyBai, C. L. / Wang, Z. H. / Dai, C. C. / Zhang, P. C. et al. | 1994
- 1827
-
Microstructure study by scanning tunneling microscopy of glassy carbons heat treated at different temperaturesLei, H. N. / Metrot, A. / Troyon, M. et al. | 1994
- 1832
-
Two-dimensional ordered Si~3N~4 nanoparticles observed by a scanning tunneling microscopeZheng, Z. J. / Zuo, D. L. / Li, D. H. et al. | 1994
- 1835
-
Nanometer characterization of single point diamond-turned mirrors on the micrometer and submicrometer scaleYu, J. / Hou, L. / Ma, W. S. / Cao, J. L. et al. | 1994
- 1839
-
Nanoscale lithography on Langmuir-Blodgett films of behinic acidGarnaes, J. / Bjoernholm, T. / Zasadzinski, J. A. N. et al. | 1994
- 1843
-
Atomic force microscopy study of Pd clusters on graphite and micaNie, H. Y. / Shimizu, T. / Tokumoto, H. et al. | 1994
- 1847
-
Nanostructure fabrication via direct writing with atoms focused in laser fieldsScholten, R. E. / McClelland, J. J. / Palm, E. C. / Gavrin, A. et al. | 1994
- 1851
-
Scanning tunneling microscope and tunneling stabilized magnetic force microscope characterization of magnetic nanocrystalline materialsNogues, J. / Rodell, B. / Rao, K. V. et al. | 1994
- 1856
-
Diamond-coated tips and their applicationsLiu, N. / Ma, Z. / Chu, X. / Hu, T. et al. | 1994
- 1860
-
Atomic force microscopy and friction force microscopy of Langmuir-Blodgett films for microlithographyFujihira, M. / Takano, H. et al. | 1994
- 1866
-
Tunneling-electron-induced adsorption of pyridine on a hydrogen-terminated silicon surfaceKomiyama, M. / Kirino, M. et al. | 1994
- 1869
-
Construction of model supported metal catalysts for scanning tunneling microscopy examinations: Platinum ultrafine particles on silica and on aluminaKomiyama, M. / Kirino, M. / Kurokawa, H. et al. | 1994
- 1872
-
Formation of nanometer-sized Au dots on Si substrate in airHosaka, S. / Koyanagi, H. / Kikukawa, A. / Maruyama, Y. et al. | 1994
- 1876
-
Micromachining of metal surfaces by scanning probe microscopeSumomogi, T. / Endo, T. / Kuwahara, K. / Kaneko, R. et al. | 1994
- 1881
-
Surface characterization of flexible magnetic disk with scanning probe microscopyMasai, J. / Shibata-Seki, T. / Seki, K. / Mori, K. et al. | 1994
- 1886
-
Surface structure of YBa~2Cu~3O~7~-~x probed by reversed-bias scanning tunneling microscopyEdwards, H. L. / Markert, J. T. / De Lozanne, A. L. et al. | 1994
- 1890
-
Manipulation of rectangular arrangement of Se-ring-type molecules on graphite (highly oriented pyrolytic graphite) surfacesCzajka, R. / Kasuya, A. / Horiguchi, N. / Nishina, Y. et al. | 1994
- 1894
-
Nanofabrication and rapid imaging with a scanning tunneling microscopeRubel, S. / Trochet, M. / Ehrichs, E. E. / Smith, W. F. et al. | 1994
- 1898
-
Scanning tunneling microscopy study of ZnS particles generated from a controlled chemical reactionWang, D. / Liu, Y. / Xu, G. / Bai, C. et al. | 1994
- 1901
-
Time-resolved atomic-scale modification of silicon with a scanning tunneling microscopeGrey, F. / Huang, D. H. / Kobayashi, A. / Snyder, E. J. et al. | 1994
- 1906
-
Interaction of C~6~0 with the Au(111) 23 x 3 reconstructionAltman, E. I. / Colton, R. J. et al. | 1994
- 1910
-
Formation of crystalline islands of C~6~0 on Si(111)Chen, D. M. / Xu, H. / Creager, W. N. / Burnett, P. et al. | 1994
- 1914
-
Scanning tunneling microscopy of liquid crystals, perylene-tetracarboxylic-dianhydride, and phthalocyanineFreund, J. / Probst, O. / Grafstroem, S. / Dey, S. et al. | 1994
- 1918
-
Scanning tunneling microscopy study of C~6~0 adsorption on 2H-MoS~2 (0001) surfaceChen, T. / Sarid, D. et al. | 1994
- 1923
-
Observation of the bottom surface of contact holes by hopping scanning atomic force microscopy with a ZnO whisker tipKado, H. / Yamamoto, S.-I. / Yokoyama, K. / Tohda, T. et al. | 1994
- 1927
-
Molecular mechanics calculation and scanning tunneling microscopic research of polyaniline doped with perchlorateBai, C. / Zhu, C. F. / Zhang, P. C. / Yu, T. et al. | 1994
- 1930
-
Scanning tunneling microscopy investigation of monolayer of metal complexes adsorbed on highly oriented pyrolytic graphiteMiyamura, K. / Kimura, M. / Okumura, A. / Gohshi, Y. et al. | 1994
- 1932
-
Electronic states of C~6~0 molecules on Si(001)2x1 and Si(111)7x7 surfacesYamaguchi, T. et al. | 1994
- 1936
-
Crystallization process of Langmuir-Blodgett films of octadecylthiobenzoquinoneGarnaes, J. / Bjoernholm, T. / Joergensen, M. / Zasadzinski, J. A. et al. | 1994
- 1942
-
Scanning tunneling microscopy of ordered C~5~0 and C~7~0 layers on Au(111), Cu(111), Ag(110), and Au(110) surfacesGimzewski, J. K. / Modesti, S. / David, T. / Schlittler, R. R. et al. | 1994
- 1947
-
Scanning tunneling microscopy study of the adsorption of C~6~0 molecules on Si(100)-(2x1) surfacesChen, D. / Gallagher, M. J. / Sarid, D. et al. | 1994
- 1952
-
Nanostructures or submicrostructures from gas/solid reactions as probed by atomic force microscopyKaupp, G. et al. | 1994
- 1957
-
Imaging molecular adsorbates: Resolution effects and determination of adsorption parametersChiang, S. / Hallmark, V. M. / Meinhardt, K.-P. / Hafner, K. et al. | 1994
- 1963
-
Epitaxy and scanning tunneling microscopy image contrast of copper-phthalocyanine on graphite and MoS~2Ludwig, C. / Strohmaier, R. / Petersen, J. / Gompf, B. et al. | 1994
- 1967
-
Inhomogeneities of phase separated Langmuir-Blodgett films studied by atomic force microscopyChi, L. F. / Fuchs, H. / Johnston, R. R. / Ringsdorf, H. et al. | 1994
- 1973
-
Elasticity, wear, and friction properties of thin organic films observed with atomic force microscopyOverney, R. M. / Bonner, T. / Meyer, E. / Rueetschi, M. et al. | 1994
- 1977
-
Structural study of poly(methylmethacrylate) Langmuir-Blodgett film on a graphite surface by scanning tunneling microscopeJeong Soo Ha / Roh, H.-S. / Jung, S.-D. / Park, S.-J. et al. | 1994
- 1981
-
Investigation of molecular chains structure of polyimide Langmuir-Blodgett films by atomic force microscopyYang, X.-M. / Min, G.-W. / Gu, N. / Lu, Z.-H. et al. | 1994
- 1984
-
Scanning tunneling microscope investigation of semiconductor nanometer particlesMin, G. W. / Yang, X. M. / Lu, Z. H. / Yu, W. et al. | 1994
- 1988
-
Scanning probe microscopy and spectroscopy study of the organic salt (ET)~2KHg(SCN)~4Dubois, J. G. A. / Gerritsen, J. W. / Van Kempen, H. / Campos, C. E. et al. | 1994
- 1992
-
C~6~0 adsorption on the Si(100)2x1 and Cu(111)1x1 surfacesHashizume, T. / Sakurai, T. et al. | 1994
- 2000
-
Observation of vacuum-deposited naphthalocyanine molecules using scanning tunneling microscopyManivannan, A. / Nagahara, L. A. / Yanagi, H. / Fujishima, A. et al. | 1994
- 2004
-
Scanning tunneling microscopy studies of self-assembled monolayers of alkanethiols on goldStranick, S. J. / Kamna, M. M. / Krom, K. R. / Parikh, A. N. et al. | 1994
- 2008
-
Scanning tunneling microscopy study of the reaction of AlCl~3 with the Si(111) surfaceUesugi, K. / Takiguchi, T. / Yoshimura, M. / Yao, T. et al. | 1994
- 2012
-
Local atomic structures near the domain boundary between the Al-3x3 and the 7x7 phases on Si(111): Substitutional defectsYoshimura, M. / Takaoka, K. / Yao, T. / Sueyoshi, T. et al. | 1994
- 2015
-
Scanning tunneling microscopy at low temperatures on the c(4x2)/(2x1) phase transition of Si(100)Badt, D. / Wengelnik, H. / Neddermeyer, H. et al. | 1994
- 2018
-
Scanning tunneling microscopy study of solid-phase epitaxy processes of argon ion bombarded silicon surface and recovery of crystallinity by annealingUesugi, K. / Yoshimura, M. / Yao, T. / Sato, T. et al. | 1994
- 2022
-
Scanning tunneling microscopy/scanning tunneling spectroscopy study of Ge and Si dimers on Si substratesTomitori, M. / Watanabe, K. / Kobayashi, M. / Nishikawa, O. et al. | 1994
- 2026
-
Restructuring process of the Si(111) surface upon Ag deposition studied by in situ high-temperature scanning tunneling microscopyShibata, A. / Kimura, Y. / Takayanagi, K. et al. | 1994
- 2030
-
Scanning tunneling microscopy of argon-ion bombarded GaAS (001) surfacesOhkouchi, S. / Ikoma, N. / Tanaka, I. et al. | 1994
- 2033
-
Surface structures of InP and InAs thermally cleaned in an arsenic fluxOhkouchi, S. / Ikoma, N. / Tanaka, I. et al. | 1994
- 2037
-
Atomic force microscopy studies of polysilicon growth during deposition on siliconVatel, O. / Andre, E. / Chollet, F. / Dumas, P. et al. | 1994
- 2040
-
Early stages of Cu growth on boron segregated Si(111) surfaces: A scanning tunneling microscopy studyRoge, T. P. / Thibaudau, F. / Mathiez, P. / Dumas, P. et al. | 1994
- 2044
-
Scanning tunneling microscopy of alkali metal-induced structures on the Si(111) surfaceJeon, D. / Hashizume, T. / Sakurai, T. et al. | 1994
- 2049
-
Strain relief and ordering of (2xn)-Bi structure on Si(100)Park, C. / Bakhtizin, R. Z. / Hashizume, T. / Sakurai, T. et al. | 1994
- 2052
-
Atomic structure of Bi on the Si(111) surfaceBakhtizin, R. Z. / Park, C. / Hashizume, T. / Sakurai, T. et al. | 1994
- 2055
-
Scanning tunneling microscopy/spectroscopy study of V~2O~5 surface with oxygen vacanciesOshio, T. / Sakai, Y. / Ehara, S. et al. | 1994
- 2060
-
Scanning probe microscopy on the surface of Si(111)Meyer, E. / Howald, L. / Luethi, R. / Haefke, H. et al. | 1994
- 2064
-
Photon spectroscopy, mapping, and topography of 85% porous siliconDumas, P. / Gu, M. / Syrykh, C. / Hallimaoui, A. et al. | 1994
- 2067
-
Nanostructuring of porous silicon using scanning tunneling microscopyDumas, P. / Gu, M. / Syrykh, C. / Hallimaoui, A. et al. | 1994
- 2070
-
Reconstructed structures in metal/Si(100) surfaces at high temperature observed by scanning tunneling microscopyIchinokawa, T. / Itoh, H. / Schmid, A. / Winau, D. et al. | 1994
- 2074
-
Evolution of visible photoluminescence and surface morphology of ultrathin porous Si films imaged by scanning tunneling microscopyEnachescu, M. / Hartmann, E. / Koch, F. et al. | 1994
- 2078
-
Dynamic observation of silicon homoepitaxial growth by high-temperature scanning tunneling microscopyHasegawa, T. / Kohno, M. / Hosaka, S. / Hosoki, S. et al. | 1994
- 2082
-
Ag on Si(001)(2x1) formation of a 2x3 superstructureWinau, D. / Itoh, H. / Schmid, A. K. / Ichinokawa, T. et al. | 1994
- 2086
-
Growth mode and surface structures of the Pb/Si(001) system observed by scanning tunneling microscopyItoh, H. / Tanabe, H. / Winau, D. / Schmid, A. K. et al. | 1994
- 2090
-
Au on the Si(001) surface: Room-temperature growthLin, X. F. / Nogami, J. et al. | 1994
- 2094
-
Structure of nickel silicide on Si(001): An atomic viewKhang, Y. / Kahng, S. J. / Mang, K. M. / Jeon, D. et al. | 1994
- 2097
-
Adsorption of Bi on Si(001) surface: An atomic viewNoh, H. P. / Park, C. / Jeon, D. / Cho, K. et al. | 1994
- 2100
-
Cross-sectional scanning tunneling microscopy of semiconductor vertical-cavity surface-emitting laser structureZheng, J. F. / Ogletree, D. F. / Walker, J. / Salmeron, M. et al. | 1994
- 2104
-
Si donors (Si~G~a) in GaAs observed by scanning tunneling microscopyZheng, J. F. / Liu, X. / Weber, E. R. / Ogletree, D. F. et al. | 1994
- 2107
-
Fine structure of the GaAs(001) surfaceHaga, Y. / Miwa, S. / Morita, E. et al. | 1994
- 2111
-
Scanning tunneling microscopy and spectroscopy of MoS~2 thin films prepared by an intercalation-exfoliation methodManivannan, A. / Santiago, Y. / Cabrera, C. R. et al. | 1994
- 2115
-
Spiral growth of GaAs by metalorganic vapor phase epitaxyHsu, C. C. / Lu, Y. C. / Xu, J. B. / Wong, T. K. S. et al. | 1994
- 2118
-
Wigner glass on the magnetite (001) surface observed by scanning tunneling microscopy with a ferromagnetic tipWiesendanger, R. / Shvets, I. V. / Coey, J. M. D. et al. | 1994
- 2122
-
Tunneling through an epitaxial oxide film: Al~2O~3 on NiAl(110)Bertrams, T. / Brodde, A. / Neddermeyer, H. et al. | 1994
- 2125
-
Potential distribution measurement of thin InGaAs resistors using scanning tunneling potentiometryTanimoto, M. / Arai, K. et al. | 1994
- 2129
-
Laser-frequency mixing in a scanning force microscope and its application to detect local conductivityVoelcker, M. / Krieger, W. / Walther, H. et al. | 1994
- 2133
-
Progress toward spin-sensitive scanning tunneling microscopy using optical orientation in GaASJansen, R. / Van der Wielen, M. C. M. M. / Prins, M. W. J. / Abraham, D. L. et al. | 1994
- 2136
-
Local transformation of C~6~0 fullerite into a new amorphous phase of carbon using a scanning tunneling microscopeLang, H. P. / Wiesendanger, R. / Thommen-Geiser, V. / Hofer, R. et al. | 1994
- 2140
-
Spatial variation of 1/f current noise in scanning tunneling microscopesMaeda, K. / Sugita, S. / Kurita, H. / Uota, M. et al. | 1994
- 2144
-
Matteucci effect of an amorphous alloy tip used for high-density magnetic recording with a scanning tunneling microscopeTsuji, S. / Watanuki, O. et al. | 1994
- 2148
-
Inelastic processes in time dependent tunneling in a scanning tunneling microscope junctionMiskovsky, N. M. / Park, S. H. / Cutler, P. H. / Sullivan, T. E. et al. | 1994
- 2153
-
Internal structure of C~6~0 on Au(110) as observed by low-temperature scanning tunneling microscopyGaisch, R. / Berndt, R. / Schneider, W.-D. / Gimzewski, J. K. et al. | 1994
- 2156
-
Proposal to study the thermopower produced by a vacuum-tunneling junctionXu, J. / Koslowski, B. / Moeller, R. / Laeuger, K. et al. | 1994
- 2161
-
Calculation of current contrasts in two-terminals atomic switchesVigneron, J. P. / Derycke, I. et al. | 1994
- 2164
-
Microscopic theory of scanning tunneling microscope for finite electric field and currentHirose, K. / Tsukada, M. et al. | 1994
- 2167
-
Effects of the tip shape on scanning tunneling microscope images: First-principles calculationsWatanabe, S. / Aono, M. / Tsukada, M. et al. | 1994
- 2171
-
Studies on the scanning tunneling microscopy images of adsorbates with the method of exciton dynamics and their applicationLi, Y. P. / Huang, X. / Zhang, H. / Huang, W. et al. | 1994
- 2175
-
Current characteristics for the scanning tunneling microscopeStamp, A. P. / McIntosh, G. C. / Liu, X.-W. et al. | 1994
- 2179
-
Interpretation of atomic force microscopy images: The mica (001) surface with a diamond tip apexTang, H. / Joachim, C. / Devillers, J. et al. | 1994
- 2184
-
Simulation and visualization of scanning probe microscope imagingPingali, G. S. / Jain, R. / Kong, L.-C. et al. | 1994
- 2189
-
Theory of scanning tunneling microscopyLiu, X.-W. / Stamp, A. P. et al. | 1994
- 2193
-
Corrugation reversal in scanning tunneling microscopyChen, C. J. et al. | 1994
- 2200
-
Theory of scanning tunneling microscopy of oxygen-adsorbed Ag(110) and Cu(110) surfacesSchimizu, T. / Tsukada, M. et al. | 1994
- 2205
-
Theory of scanning tunneling microscopy and spectroscopy on hydrogen-adsorbed Si(100) surfaceUchiyama, T. / Tsukada, M. et al. | 1994
- 2209
-
Influence of a ferromagnetic tip on the Abrikosov vortex lattice in NbSe~2 studied by low-temperature scanning tunneling microscopyBehler, S. / Pan, S. H. / Bernasconi, M. / Jess, P. et al. | 1994
- 2211
-
Measurement of nanomechanical properties of metals using the atomic force microscopeHues, S. M. / Draper, C. F. / Colton, R. J. et al. | 1994
- 2215
-
Atomic force microscope for chemical sensingNakagawa, T. / Ogawa, K. / Kurumizawa, T. et al. | 1994
- 2219
-
Accounting for the stiffnesses of the probe and sample in scanning probe microscopyBurnham, N. A. et al. | 1994
- 2222
-
Direct observation of the atomic force microscopy tip using inverse atomic force microscopy imagingMontelius, L. / Tegenfeldt, J. O. / Van Heeren, P. et al. | 1994
- 2227
-
Friction force microscopy on clean surfaces of NaCl, NaF, and AgBrHowald, L. / Luethi, R. / Meyer, E. / Gerth, G. et al. | 1994
- 2231
-
Study and control of molecule-surface interaction at the atomic level: Sb~4 on Si(001)Mo, Y. W. et al. | 1994
- 2237
-
Investigation of scanning tunneling microscopy tunneling barrier signals in air and waterSong, J. P. / Moerch, K. A. / Carneiro, K. / Thoelen, A. R. et al. | 1994
- 2243
-
Electric field influence on the observation of molecules with a scanning tunneling microscopeHoerber, J. K. H. / Haeberle, W. / Ruppersberg, P. / Niksch, M. et al. | 1994
- 2247
-
Systematic studies on the growth process of superconducting YBa~2Cu~3O~7~-~ and Bi~2Sr~2CuO~y thin films by scanning tunneling microscopyZhu, X. / Xiong, G. C. / Liu, R. / Li, Y. J. et al. | 1994
- 2251
-
Measurement and manipulation of van der Waals forces in atomic-force microscopyHutter, J. L. / Bechhoefer, J. et al. | 1994