^5^6Fe^+-ion implantation effects in Al~2O~3 (English)
- New search for: Jang, H.-G.
- New search for: Kim, H.-B.
- New search for: Joo, J.-H.
- New search for: Whang, C.-N.
- New search for: Kim, H.-K.
- New search for: Moon, D.-W.
- New search for: Woo, J. J.
- New search for: Kim, S.-O.
- New search for: Jang, H.-G.
- New search for: Kim, H.-B.
- New search for: Joo, J.-H.
- New search for: Whang, C.-N.
- New search for: Kim, H.-K.
- New search for: Moon, D.-W.
- New search for: Woo, J. J.
- New search for: Kim, S.-O.
- New search for: Andersen, H. H.
- New search for: Rehn, L. E.
In:
Beam Interactions with Materials and Atoms
4
;
528-532
;
1997
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ISSN:
- Article (Journal) / Print
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Title:^5^6Fe^+-ion implantation effects in Al~2O~3
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Contributors:Jang, H.-G. ( author ) / Kim, H.-B. ( author ) / Joo, J.-H. ( author ) / Whang, C.-N. ( author ) / Kim, H.-K. ( author ) / Moon, D.-W. ( author ) / Woo, J. J. ( author ) / Kim, S.-O. ( author ) / Andersen, H. H. / Rehn, L. E.
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Published in:Beam Interactions with Materials and Atoms , 4 ; 528-532NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION B ; 124, 4 ; 528-532
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Publisher:
- New search for: ELSEVIER
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Publication date:1997-01-01
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Size:5 pages
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ISSN:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 539.7
- Further information on Dewey Decimal Classification
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Classification:
DDC: 539.7 -
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 124, Issue 4
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 447
-
Stopping powers of C, Al and Cu for use in ERDA analyses with probing MeV energy 197Au ionsJokinen, J. et al. | 1997
- 453
-
K X-ray production cross section of Ge and Ag by 3.7-11.1 MeV carbon ionsMitra, D. et al. | 1997
- 457
-
Thin-target bremsstrahlung at 0 from 50 keV electronsAmbrose, V. / Quarles, C. A. / Ambrose, R. et al. | 1997
- 457
-
Thin-target bremsstrahlung at O(degree) from 50 keV electronsAmbrose, V. et al. | 1997
- 464
-
Measurements of single electron capture cross sections in collisions of Kr+ with XeMartinez, H. et al. | 1997
- 469
-
Investigation of the 19F(p,a1e-e+) 16O reaction for use in ion beam analysisSjöland, K.A. et al. | 1997
- 469
-
Investigation of the ^1^9F(p, ~1e^- e^+)^1^6O reaction for use in ion beam analysisSjoeland, K. A. / Kristiansson, P. / Elfman, M. / Malmqvist, K. G. / Pallon, J. / Utui, R. J. / Yang, C. et al. | 1997
- 475
-
Determination of L3 subshell fluorescence yield of Nd with a Si(Li) detectorErtugrul, M. et al. | 1997
- 478
-
Distribution of implanted impurities and deposited energy in high-energy ion implantationKomarov, F.F. et al. | 1997
- 484
-
Crater formation due to grazing incidence C60 cluster ion impacts on mica: A tapping-mode scanning force microscopy studyBarlo Daya, D.D.N. et al. | 1997
- 490
-
Energy spread of ion beams passing a gas stripperHartmann, B. et al. | 1997
- 500
-
Single ion impacts on an In0.22Ga0.78As-GaAs(100) surface observed by atomic force microscopyWilson, I.H. et al. | 1997
- 506
-
Study of electronic properties and depth profiles of buried and near-surface silicon nitride layers produced by ion implantationMarkwitz, A. et al. | 1997
- 515
-
Effects of damage on diffusion of implanted helium in diamond measured by nuclear elastic scatteringOrwa, J.O. et al. | 1997
- 519
-
Low temperature growth of reactive partially ionized beam deposited AlN filmsXie, J. et al. | 1997
- 523
-
Irradiation-induced alloying in an immiscible Ta-Ti systemChen, Y.G. et al. | 1997
- 528
-
56Fe+-ion implantation effects in Al2O3Jang, H.-G. et al. | 1997
- 533
-
Formation of ternary (Fe1-xCox)Si2 structures by ion beam assisted deposition and ion implantationWieser, E. et al. | 1997
- 542
-
Study of resistivity and majority carrier concentration of silicon detectors damaged by neutron irradiation up to 1016 n-cm2Croitoru, N. et al. | 1997
- 549
-
The in-flight fission of 3.2 GeV uranium ions in polymer CR-39Qureshi, I.E. et al. | 1997
- 558
-
Trace determination of carbon, sodium, magnesium and aluminum in metals and ceramic materials by low energy deuteron activation analysisSastri, C.S. et al. | 1997
- 567
-
Rutherford backscattering spectroscopy of rough films: Theoretical considerationsMetzner, H. et al. | 1997
- 575
-
Rutherford backscattering analysis of contaminants in PETPierce, D.E. et al. | 1997
- 579
-
Laboratory studies of metal atomic beams produced by means of UV-laser radiationMattoo, S.K. et al. | 1997
- 591
-
Micro-distribution of heavy elements in highly inhomogeneous particles generated from m-beam XRF-XRD analysisRindby, A. et al. | 1997
- 591
-
Micro-distribution of heavy elements in highly inhomogeneous particles generated from -beam XRF/XRD analysisRindby, A. / Engstroem, P. / Janssens, K. / Osan, J. et al. | 1997
- 605
-
Macro- and microbeam analysis of lithium by the 7Li(p, a)a reaction, and STIM imaging of white blood cellsSjöland, K.A. et al. | 1997
- 605
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Macro- and microbeam analysis of lithium by the ^7Li(p,) reaction, and STIM imaging of white blood cellsSjoeland, K. A. / Kristiansson, P. / Elfman, M. / Malmqvist, K. G. / Pallon, J. / Utui, R. J. / Yang, C. et al. | 1997
- 611
-
Average atomic number of heterogeneous mixtures from the ratio of gamma to fast-neutron attenuationRasmussen, R.J. et al. | 1997
- 615
-
Investigating chemical structure in a silicon CCD using Extended X-Ray Absorption Fine StructureKeay, A. et al. | 1997
- 624
-
On the structure of X-ray glass capillary lens focal spotsOgnev, L.I. et al. | 1997
- 627
-
Development of a levitation cell for synchrotron radiation experiments at very high temperatureLandron, C. et al. | 1997
- 633
-
A genetic algorithm for fitting Lorentzian line shapes in Mössbauer spectraAhonen, H. et al. | 1997
- 633
-
A genetic algorithm for fitting Lorentzian line shapes in Moessbauer spectraAhonen, H. / De Souza, P. A. / Garg, V. K. et al. | 1997
- 639
-
A new detector for hydrogen analysis with a nuclear microprobeSjöland, K.A. et al. | 1997
- 646
-
Erratum to: "Stopping power measurements of 1H, 4He and 14N in Si in the energy range of 0.02-1 MeV-amu" (Nucl. Instr. and Meth. B 118 (1996) 11-18)Niemann, D. et al. | 1997
- 647
-
Book Review| 1997
- 649
-
Calendar| 1997
- 653
-
Author index| 1997
- 663
-
Subject index| 1997