Fluorescence resonance energy transfer detected by scanning near-field optical microscopy (English)
- New search for: Kirsch, A. K.
- New search for: Subramaniam, V.
- New search for: Jenei, A.
- New search for: Jovin, T. M.
- New search for: Kirsch, A. K.
- New search for: Subramaniam, V.
- New search for: Jenei, A.
- New search for: Jovin, T. M.
In:
JOURNAL OF MICROSCOPY
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194
, 2/3
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448-454
;
1999
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ISSN:
- Article (Journal) / Print
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Title:Fluorescence resonance energy transfer detected by scanning near-field optical microscopy
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Contributors:Kirsch, A. K. ( author ) / Subramaniam, V. ( author ) / Jenei, A. ( author ) / Jovin, T. M. ( author )
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Published in:JOURNAL OF MICROSCOPY ; 194, 2/3 ; 448-454
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Publisher:
- New search for: BLACKWELL SCIENTIFIC
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Publication date:1999-01-01
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Size:7 pages
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ISSN:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 502.82
- Further information on Dewey Decimal Classification
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Classification:
DDC: 502.82 -
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 194, Issue 2/3
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 229
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EditorialKawata, Satoshi et al. | 1999
- 230
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Applicability of deconvolution and nonlinear optimization for reconstructing optical images from near‐field optical microscope imagesHatano, H. / Kawata, S. et al. | 1999
- 235
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3D simulations of the experimental signal measured in near‐field optical microscopyMartin, O. J. F. et al. | 1999
- 240
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Theoretical comparison of illumination and collection mode images of magneto‐optical dotsVial, A. / Van Labeke, D. et al. | 1999
- 249
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Quantum theoretical approach to a near‐field optical systemKobayashi, K. / Ohtsu, M. et al. | 1999
- 255
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Near‐field optical excitation as a dipole–dipole energy transfer processSekatskii, S. K. / Dietler, G. et al. | 1999
- 260
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Evanescent‐wave scattering in near‐field optical microscopyWannemacher, R. / Quinten, M. / Pack, A. et al. | 1999
- 265
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Spectroscopic study of the image formation in near‐field microscopy, near an evanescent–homogeneous switchingVial, A. / Barchiesi, D. / Parent, G. et al. | 1999
- 271
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Polarization properties of the near‐field intensity reflected by metallic and dielectric one‐dimensional structuresWang, S. / Méndez, E. R. et al. | 1999
- 281
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Surface imaging in near‐field optical microscopy by using the fluorescence decay rate: a theoretical studyParent, G. / Van Labeke, D. / Barchiesi, D. et al. | 1999
- 291
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Fluorescence imaging with a laser trapping scanning near‐field optical microscopeSugiura, T. / Kawata, S. / Okada, T. et al. | 1999
- 295
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Apertureless scanning near‐field magneto‐optical microscopy of magnetic multilayersAigouy, L. / Grésillon, S. / Lahrech, A. / Boccara, A. C. / Rivoal, J. C. / Mathet, V. / Chappert, C. / Jamet, J. P. / Ferré, J. et al. | 1999
- 299
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Characterization of reflection scanning near‐field optical microscopy and scanning tunnelling optical microscopy/photon scanning tunnelling microscopy working in preliminary approach constant height scanning modeBarchiesi, D. et al. | 1999
- 307
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The tuning fork as sensor for dynamic force distance control in scanning near‐field optical microscopyNaber, A. et al. | 1999
- 311
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Optical characterization of probes for photon scanning tunnelling microscopyVohnsen, B. / Bozhevolnyi, S. I. et al. | 1999
- 317
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The height regulation of a near‐field scanning optical microscope probe tipWang, K. / Wang, X. / Jin, N. / Huang, W. / Xu, J. et al. | 1999
- 321
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Optical‐fibre scanning near‐field optical microscope for cryogenic operationTokizaki, T. / Sugiyama, K. / Onuki, T. / Tani, T. et al. | 1999
- 325
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High‐speed scanning by dual feedback control in SNOM/AFMEgawa, A. / Chiba, N. / Homma, K. / Chinone, K. / Muramatsu, H. et al. | 1999
- 329
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Femtosecond near‐field scanning optical microscopyNechay, B. A. / Siegner, U. / Achermann, M. / Morier‐Genaud, F. / Schertel, A. / Keller, U. et al. | 1999
- 335
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Nano‐slit probes for near‐field optical microscopy fabricated by focused ion beamsDanzebrink, H. U. / Dziomba, TH. / Sulzbach, T. / Ohlsson, O. / Lehrer, C. / Frey, L. et al. | 1999
- 340
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A novel fabrication method for fluorescence‐based apertureless scanning near‐field optical microscope probesKramper, P. / Jebens, A. / Müller, T. / Mlynek, J. / Sandoghdar, V. et al. | 1999
- 344
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Modified fabrication process for aperture probe cantileversVollkopf, A. / Rudow, O. / Leinhos, T. / Mihalcea, C. / Oesterschulze, E. et al. | 1999
- 349
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Coaxial probes for scanning near‐field microscopyLeinhos, T. / Rudow, O. / Stopka, M. / Vollkopf, A. / Oesterschulze, E. et al. | 1999
- 353
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Diffraction of circularly polarized light from near‐field optical probesShin, D. J. / Chavez‐Pirson, A. / Lee, Y. H. et al. | 1999
- 360
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Detection of an infrared near‐field optical signal by attaching an infrared‐excitable phosphor to the end of a photocantileverTanaka, Y. / Fukuzawa, K. / Ohwaki, J. et al. | 1999
- 365
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Towards better scanning near‐field optical microscopy probes — progress and new developmentsHeinzelmann, H. / Freyland, J. M. / Eckert, R. / Huser, TH. / Schürmann, G. / Noell, W. / Staufer, U. / De Rooij, N. F. et al. | 1999
- 369
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Evaluation of nano‐optical probe from scanning near‐field optical microscope imagesHosaka, S. / Shintani, T. / Kikukawa, A. / Itoh, K. et al. | 1999
- 374
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Polarization properties of bent‐type optical fibre probe for magneto‐optical imagingIshibashi, T. / Yoshida, T. / Iijima, A. / Sato, K. / Mitsuoka, Y. / Nakajima, K. et al. | 1999
- 378
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Brighter near‐field optical probes by means of improving the optical destruction thresholdStöckle, R. M. / Schaller, N. / Deckert, V. / Fokas, C. / Zenobi, R. et al. | 1999
- 383
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Dynamic etching method for fabricating a variety of tip shapes in the optical fibre probe of a scanning near‐field optical microscopeMuramatsu, H. / Homma, K. / Chiba, N. / Yamamoto, N. / Egawa, A. et al. | 1999
- 388
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Optical microcantilever consisting of channel waveguide for scanning near‐field optical microscopy controlled by atomic forceNiwa, T. / Mitsuoka, Y. / Kato, K. / Ichihara, S. / Chiba, N. / Shin‐Ogi, M. / Nakajima, K. / Muramatsu, H. / Sakuhara, T. et al. | 1999
- 393
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Time‐resolved near‐field optics: exciton transport in semiconductor nanostructuresRichter, A. / Süptitz, M. / Lienau, CH. / Elsaesser, T. / Ramsteiner, M. / Nötzel, R. / Ploog, K. H. et al. | 1999
- 401
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Photocurrent near‐field microscopy of Schottky barriersColuzza, C. / Di Claudio, G. / Davy, S. / Spajer, M. / Courjon, D. / Cricenti, A. / Generosi, R. / Faini, G. / Almeida, J. / Conforto, E. et al. | 1999
- 407
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Inducing superconductivity at a nanoscale: photodoping with a near‐field scanning optical microscopeDecca, R. S. / Drew, H. D. / Maiorov, B. / Guimpel, J. / Osquiguil, E. J. et al. | 1999
- 412
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Spectrally resolved cathodoluminescence analyses in the optical near‐fieldCramer, R. M. / Sergeev, O. V. / Heiderhoff, R. / Balk, L. J. et al. | 1999
- 415
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Photoluminescence imaging of phosphor particles using near‐field optical microscope with UV light excitationNishikawa, S. / Isu, T. et al. | 1999
- 421
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Polarization effects in near‐field excitation — collection probe optical microscopy of a single quantum dotChavez‐Pirson, A. / Chu, S. T. et al. | 1999
- 426
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Near‐field second harmonic imaging of lead zirconate titanate piezoceramicSmolyaninov, I. I. / Lee, C. H. / Davis, C. C. et al. | 1999
- 434
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Thickness measurement of thin dielectric films by evanescent total reflection fluorescenceBenešová, M. / Tománek, P. et al. | 1999
- 439
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Near‐field mapping of the emission distribution in semiconductor microdiscsZhu, X. / Zhang, Y. / Xin, Y. / Wang, G. / Wang, R. / Ling, Y. / Zhou, H. / Yin, Y. / Zhang, B. / Dai, L. et al. | 1999
- 445
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Interactions between hydrophobic and hydrophilic silicon surfaces using a tapered probe in near‐field scanning optical microscopyWei, P. K. / Fann, W. S. et al. | 1999
- 448
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Fluorescence resonance energy transfer detected by scanning near‐field optical microscopyKirsch, A. K. / Subramaniam, V. / Jenei, A. / Jovin, T. M. et al. | 1999
- 455
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Domain formation in thin lipid films probed with near‐field scanning optical microscopyShiku, H. / Dunn, R. C. et al. | 1999
- 461
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Near-field scanning optical microscopy studies of l-a-dipalmitoylphosphatidylcholine monolayers at the air-liquid interfaceShiku, H. et al. | 1999
- 461
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Near‐field scanning optical microscopy studies of l‐α‐dipalmitoylphosphatidylcholine monolayers at the air–liquid interfaceShiku, H. / Dunn, R. C. et al. | 1999
- 467
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Imaging of various surface properties of fluorescently labelled phospholipid Langmuir–Blodgett films with a combined scanning probe microscopeHoriuchi, Y. / Yagi, K. / Hosokawa, T. / Yamamoto, N. / Muramatsu, H. / Fujihira, M. et al. | 1999
- 472
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Evanescent field excitation and measurement of dye fluorescence in a metallic probe near‐field scanning optical microscopeHayazawa, N. / Inouye, Y. / Kawata, S. et al. | 1999
- 477
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Single molecule mapping of the optical field distribution of probes for near‐field microscopyVeerman, J. A. / Garcia‐Parajo, M. F. / Kuipers, L. / Van Hulst, N. F. et al. | 1999
- 483
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Laser scanning gradient index optics microscope: submicrometre scale spectroscopy and imaging at cryogenic temperaturesVacha, M. / Hashizume, K. / Tani, T. et al. | 1999
- 486
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Field enhancement and apertureless near‐field optical spectroscopy of single moleculesAzoulay, J. / Débarre, A. / Richard, A. / Tchénio, P. et al. | 1999
- 491
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The depolarization near‐field scanning optical microscope: comparison of experiment and theoryVon Freymann, G. / Adelmann, CH. / Scheiber, G. / Schimmel, TH. / Wegener, M. et al. | 1999
- 495
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Magneto‐optical contrast in near‐field opticsChen, Y. / Kottler, V. / Chappert, C. / Essaidi, N. et al. | 1999
- 500
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Polarization contrast in reflection near‐field optical microscopy with uncoated fibre tipsBozhevolnyi, S. I. / Langbein, W. / Hvam, J. M. et al. | 1999
- 507
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Magnetic domain imaging with a scanning near‐field optical microscope using a modified Sagnac interferometerBauer, A. / Petersen, B. L. / Crecelius, T. / Meyer, G. / Wegner, D. / Kaindl, G. et al. | 1999
- 512
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Mid‐infrared scanning near‐field optical microscope resolves 30 nmKnoll, B. / Keilmann, F. et al. | 1999
- 516
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Interferometric measurement of femtosecond optical pulses emitted from a fibre probeKawashima, H. / Furuki, M. / Tani, T. et al. | 1999
- 519
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Spectroscopy with scanning near‐field optical microscopy using photon tunnelling modeTakahashi, S. / Futamata, M. / Kojima, I. et al. | 1999
- 523
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Ultrafast nonlinear sub‐wavelength solid immersion spectroscopy at T = 8 K: an alternative to nonlinear scanning near‐field optical microscopyVollmer, M. / Giessen, H. / Stolz, W. / Rühle, W. W. / Knorr, A. / Koch, S. W. / Ghislain, L. / Elings, V. et al. | 1999
- 528
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Real‐time imaging of two‐photon‐induced fluorescence with a microlens‐array scanner and a regenerative amplifierFujita, K. / Nakamura, O. / Kaneko, T. / Kawata, S. / Oyamada, M. / Takamatsu, T. et al. | 1999
- 532
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Near‐field imaging of surface‐enhanced second harmonic generationSmolyaninov, I. I. / Lee, C. H. / Davis, C. C. / Rudin, S. et al. | 1999
- 537
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Near‐field optical photomask repair with a femtosecond laserLieberman, K. / Shani, Y. / Melnik, I. / Yoffe, S. / Sharon, Y. et al. | 1999
- 542
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Reflection mode scanning near‐field optical microscopy analyses of integrated devicesCramer, R. M. / Chin, R. / Balk, L. J. et al. | 1999
- 545
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Nanometric patterning of zinc by optical near‐field photochemical vapour depositionPolonski, V. V. / Yamamoto, Y. / Kourogi, M. / Fukuda, H. / Ohtsu, M. et al. | 1999
- 552
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Imaging of optical disc using reflection‐mode scattering‐type scanning near‐field optical microscopyYamaguchi, M. / Sasaki, Y. / Sasaki, H. / Konada, T. / Horikawa, Y. / Ebina, A. / Umezawa, T. / Horiguchi, T. et al. | 1999
- 558
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Fabrication and observation ora standard sample for near-field optical microscopyKato, M. / Kiguchi, M. / Ishibashi, M. / Heike, S. et al. | 1999
- 558
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Fabrication and observation of a standard sample for near‐field optical microscopyKato, M. / Kiguchi, M. / Ishibashi, M. / Heike, S. et al. | 1999
- 561
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Near‐field optical microscopy of localized excitations on rough surfaces: influence of a probeBozhevolnyi, S. I. et al. | 1999
- 567
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Surface‐polariton propagation for scanning near‐field optical microscopy applicationKeilmann, F. et al. | 1999
- 571
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Plasmon transmissivity and reflectivity of narrow grooves in a silver filmBouhelier, A. / Huser, TH. / Freyland, J. M. / Güntherodt, H.‐J. / Pohl, D. W. et al. | 1999
- 574
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Near‐field optical studies of local photomodification in nanostructured materialsBragg, W. D. / Safonov, V. P. / Kim, W. / Banerjee, K. / Young, M. R. / Zhu, J. G. / Ying, Z. C. / Armstrong, R. L. / Shalaev, V. M. et al. | 1999
- 578
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The interaction of surface plasmon polaritons with a silver film edgeDawson, P. / Puygranier, B. A. F. / Cao, W. / De Fornel, F. et al. | 1999
- 584
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Concluding remarksShimoda, Koichi et al. | 1999