X-ray scattering from polymer films (English)
- New search for: Tolan, M.
- New search for: Seeck, O. H.
- New search for: Wang, J.
- New search for: Sinha, S. K.
- New search for: Rafailovich, M. H.
- New search for: Sokolov, J.
- New search for: Tolan, M.
- New search for: Seeck, O. H.
- New search for: Wang, J.
- New search for: Sinha, S. K.
- New search for: Rafailovich, M. H.
- New search for: Sokolov, J.
In:
PHYSICA B
;
283
, 1-3
;
22-26
;
2000
-
ISSN:
- Article (Journal) / Print
-
Title:X-ray scattering from polymer films
-
Contributors:Tolan, M. ( author ) / Seeck, O. H. ( author ) / Wang, J. ( author ) / Sinha, S. K. ( author ) / Rafailovich, M. H. ( author ) / Sokolov, J. ( author )
-
Published in:PHYSICA B ; 283, 1-3 ; 22-26
-
Publisher:
-
Publication date:2000-01-01
-
Size:5 pages
-
ISSN:
-
Type of media:Article (Journal)
-
Type of material:Print
-
Language:English
- New search for: 530
- Further information on Dewey Decimal Classification
-
Classification:
DDC: 530 -
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 283, Issue 1-3
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
-
Protein insertion within a biological freestanding filmCuvillier, N. / Petkova, V. / Nedyalkov, M. / Millet, F. / Benattar, J. J. et al. | 2000
- 6
-
Role of interfacial correlation in melting of Langmuir-Blodgett filmsBasu, J. K. / Sanyal, M. K. / Banerjee, S. / Mukherjee, M. et al. | 2000
- 12
-
Interfacial structures of block and graft copolymers with lamellar microphase-separated structuresTorikai, N. / Matsushita, Y. / Langridge, S. / Bucknall, D. / Penfold, J. / Takeda, M. et al. | 2000
- 17
-
Structure of grafted polymers, investigated with neutron reflectometryCurrie, E. P. / Wagemaker, M. / Stuart, M. A. / van Well, A. A. et al. | 2000
- 22
-
X-ray scattering from polymer filmsTolan, M. / Seeck, O. H. / Wang, J. / Sinha, S. K. / Rafailovich, M. H. / Sokolov, J. et al. | 2000
- 27
-
Molecular layering in a liquid on a solid substrate: an X-ray reflectivity studyYu, C. J. / Richter, A. G. / Datta, A. / Durbin, M. K. / Dutta, P. et al. | 2000
- 32
-
Fully hydrated and highly oriented membranes: an experimental setup amenable to specular and diffuse X-ray scatteringVogel, M. / Munster, C. / Fenzl, W. / Thiaudiere, D. / Salditt, T. et al. | 2000
- 37
-
Organization of tethered polyoxazoline polymer brushes at the air/water interfaceGutberlet, T. / Wurlitzer, A. / Dietrich, U. / Politsch, E. / Cevc, G. / Steitz, R. / Losche, M. et al. | 2000
- 40
-
Roughness correlations in ultra-thin polymer blend filmsGutmann, J. S. / Muller-Buschbaum, P. / Schubert, D. W. / Stribeck, N. / Smilgies, D. / Stamm, M. et al. | 2000
- 45
-
X-ray scattering studies of imperfect manganese stearate Langmuir-Blodgett filmsHazra, S. / Gibaud, A. / Desert, A. / Gacem, V. / Cowlam, N. et al. | 2000
- 49
-
Adsorption of dodecahydroxylated-fullerene monolayers at the air-water interfaceLiu, W. J. / Jeng, U. / Lin, T. L. / Lai, S. H. / Shih, M. C. / Tsao, C. S. / Wang, L. Y. / Chiang, L. Y. / Sung, L. P. et al. | 2000
- 53
-
Dewetting of thin polymer-blend films examined with GISASMuller-Buschbaum, P. / Gutmann, J. S. / Stamm, M. / Cubitt, R. / Cunis, S. / von Krosigk, G. / Gehrke, R. / Petry, W. et al. | 2000
- 60
-
Morphology of off-specular neutron scattering pattern from islands on a lamellar filmToperverg, B. / Lauter-Pasyuk, V. / Lauter, H. / Nikonov, O. / Ausserre, D. / Gallot, Y. et al. | 2000
- 65
-
Lateral and vertical ordering of self-assembled PbSe quantum dots studied by high-resolution X-ray diffractionHoly, V. / Stangl, J. / Springholz, G. / Pinczolits, M. / Bauer, G. / Kegel, I. / Metzger, T. H. et al. | 2000
- 69
-
Grazing-incidence small-angle X-ray scattering applied to the characterization of aggregates in surface regionsNaudon, A. / Babonneau, D. / Thiaudiere, D. / Lequien, S. et al. | 2000
- 75
-
Phase-sensitive surface X-ray scattering study of a crystalline organic-organic heterostructureSchreiber, F. / Gerstenberg, M. C. / Edinger, B. / Toperverg, B. / Forrest, S. R. / Scoles, G. / Dosch, H. et al. | 2000
- 79
-
X-ray diffraction study of the 5-fold plane surface of a Al70.4Pd21.4Mn8.2 single-grainCapitan, M. J. / Calvayrac, Y. / Gratias, D. / Alvarez, J. et al. | 2000
- 84
-
Nonspecular scattering from extreme ultraviolet multilayer coatingsStearns, D. G. / Gullikson, E. M. et al. | 2000
- 92
-
Analysis of the strain distribution in lateral nanostructures for interpreting photoluminescence dataPietsch, U. / Darowski, N. / Ulyanenkov, A. / Grenzer, J. / Wang, K. H. / Forchel, A. et al. | 2000
- 97
-
Morphology of nanocermet thin films: X-ray scattering studyHazra, S. / Gibaud, A. / Desert, A. / Sella, C. / Naudon, A. et al. | 2000
- 103
-
Grazing incidence X-ray studies of twist-bonded Si/Si and Si/SiO2 interfacesButtard, D. / Eymery, J. / Rieutord, F. / Fournel, F. / Lubbert, D. / Baumbach, T. / Moriceau, H. et al. | 2000
- 108
-
Structural investigations of sputter deposited thin films: reflection mode EXAFS, specular and non specular X-ray scatteringLutzenkirchen-Hecht, D. / Frahm, R. et al. | 2000
- 114
-
Structural and morphological studies of Co/SiO2 discontinuous multilayersThiaudiere, D. / Proux, O. / Micha, J. S. / Revenant, C. / Regnard, J. R. / Lequien, S. et al. | 2000
- 119
-
Multilayers for the EUV/soft X-ray rangeSchafers, F. et al. | 2000
- 125
-
X-ray measurements of the depth dependence of stress in gold filmsBrennan, S. / Munkholm, A. / Leung, O. S. / Nix, W. D. et al. | 2000
- 130
-
In-plane strain and shape analysis of Si/SiGe nanostructures by grazing incidence diffractionZhuang, Y. / Pietsch, U. / Stangl, J. / Holy, V. / Darowski, N. / Grenzer, J. / Zerlauth, S. / Schaffler, F. / Bauer, G. et al. | 2000
- 135
-
X-ray scattering study of porous silicon layersChamard, V. / Dolino, G. / Stettner, J. et al. | 2000
- 139
-
Surface traveling X-rays from organic thin filmHayashi, K. / Kawai, J. et al. | 2000
- 143
-
Determination of the layered structure in Mo/Si multilayers by grazing incidence X-ray reflectometryYakshin, A. E. / Louis, E. / Gorts, P. C. / Maas, E. L. / Bijkerk, F. et al. | 2000
- 149
-
Grazing incidence neutron diffraction from large scale 2D structuresToperverg, B. P. / Felcher, G. P. / Metlushko, V. V. / Leiner, V. / Siebrecht, R. / Nikonov, O. et al. | 2000
- 153
-
Synchrotron X-ray study of the epitaxial Co/Pt multilayers on Al2O3(1120) substrates with Pt/Mo buffer layersLee, C. H. / Wu, L. C. / Yu, K. L. / Huang, J. C. / Jan, J. C. / Cheng, P. Y. et al. | 2000
- 157
-
Roughness in sputtered multilayers analyzed by transmission electron microscopy and X-ray diffuse scatteringMacrander, A. T. / Liu, C. / Csencsits, R. / Cook, R. / Kirk, M. / Headrick, R. et al. | 2000
- 162
-
Polarized neutron reflectivity characterization of weakly coupled Co/Cu multilayersBorchers, J. A. / Dura, J. A. / Majkrzak, C. F. / Hsu, S. Y. / Lolee, R. / Pratt, W. P. / Bass, J. et al. | 2000
- 167
-
Investigation of the magnetism in thin single Ho(00.1) films via neutron reflectivity measurementsLeiner, V. / Labergerie, D. / Siebrecht, R. / Sutter, C. / Zabel, H. et al. | 2000
- 171
-
Soft X-ray magnetic scattering from striped magnetic domain structuresvan der Laan, G. / Dudzik, E. / Collins, S. P. / Dhesi, S. S. / Durr, H. A. / Belakhovsky, M. / Chesnel, K. / Marty, A. / Samson, Y. / Gilles, B. et al. | 2000
- 175
-
Chemical and magnetization profile study of Ce in [CeLaCe/Fe] and [LaCeLa/Fe] multilayers by resonant X-ray reflectivityJaouen, N. / Tonnerre, J. M. / Bontempi, E. / Raoux, D. / Seve, L. / Bartolome, F. / Rogalev, A. / Muenzenberg, M. / Felsch, W. / Durr, H. A. et al. | 2000
- 180
-
Magnetism in lanthanide superlatticesGoff, J. P. / Sarthour, R. S. / McMorrow, D. F. / Yakhou, F. / Stunault, A. / Ward, R. C. / Wells, M. R. et al. | 2000
- 184
-
Hydrogen absorption in epitaxial W/Nb(001) and polycrystalline Fe/Nb(110) multilayers studied in situ by X-ray/neutron scattering techniques and X-ray absorption spectroscopyKlose, F. / Rehm, C. / Fieber-Erdmann, M. / Holub-Krappe, E. / Bleif, H. J. / Sowers, H. / Goyette, R. / Troger, L. / Maletta, H. et al. | 2000
- 189
-
Polarization analysis of neutron reflectometry on non-collinear magnetic media: polarized neutron reflectometry experiments on a thin cobalt filmvan de Kruijs, R. W. / Fredrikze, H. / Rekveldt, M. T. / van Well, A. A. / Nikitenko, Y. V. / Syromyatnikov, V. G. et al. | 2000
- 194
-
Magnetic off-specular neutron scattering from Fe/Cr multilayersLauter-Pasyuk, V. / Lauter, H. J. / Toperverg, B. / Nikonov, O. / Kravtsov, E. / Milyaev, M. A. / Romashev, L. / Ustinov, V. et al. | 2000
- 199
-
Roughness effects on magnetic properties of thin filmsPalasantzas, G. / Zhao, Y. P. / De Hosson, J. T. / Wang, G. C. et al. | 2000
- 203
-
Reflectivity and off-specular neutron scattering from ferrofluidToperverg, B. / Vorobyev, A. / Gordeyev, G. / Nickel, B. / Donner, W. / Dosch, H. / Rekveldt, T. et al. | 2000
- 208
-
Oxidation of NiAl(100) studied with surface sensitive X-ray diffractionStierle, A. / Formoso, V. / Comin, F. / Schmitz, G. / Franchy, R. et al. | 2000
- 212
-
Resonance X-ray scattering from Pt(1 1 1) surfaces under waterYou, H. / Chu, Y. S. / Lister, T. E. / Nagy, Z. / Ankudiniv, A. L. / Rehr, J. J. et al. | 2000
- 217
-
Transition between the 1x1 and (3x23)R30degree surface structures of GaN in the vapor-phase environmentMunkholm, A. / Thompson, C. / Stephenson, G. B. / Eastman, J. A. / Auciello, O. / Fini, P. / Speck, J. S. / DenBaars, S. P. et al. | 2000
- 223
-
Morphology of Au(1,1,1) vicinal surfaces studied by grazing incidence X-ray diffractionGarreau, Y. / Repain, V. / Berroir, J. M. / Rousset, S. / Etgens, V. H. / Lecoeur, J. et al. | 2000
- 228
-
Oxidation of Nb(110) thin films on a-plane sapphire substrates: an X-ray studyHellwig, O. / Zabel, H. et al. | 2000
- 232
-
X-ray scattering from freely suspended smectic films: resolution and other effectsSentenac, D. / Fera, A. / Opitz, R. / Ostrovskii, B. I. / Bunk, O. / de Jeu, W. H. et al. | 2000
- 237
-
The genetic algorithm: refinement of X-ray reflectivity data from multilayers and thin filmsUlyanenkov, A. / Omote, K. / Harada, J. et al. | 2000
- 242
-
Phase determination in neutron reflectionLipperheide, R. / Weber, M. / Leeb, H. et al. | 2000
- 248
-
Experimental demonstration of phase determination in neutron reflectometry by variation of the surrounding mediaMajkrzak, C. F. / Berk, N. F. / Silin, V. / Meuse, C. W. et al. | 2000
- 253
-
Use of advanced optics in a neutron liquids reflectometerAnkner, J. F. et al. | 2000
- 256
-
The ID01 beamline at the E.S.R.F.: the diffuse scattering technique applied to surface and interface studiesCapitan, M. J. / Thiaudiere, D. / Goirand, L. / Taffut, R. / Lequien, S. et al. | 2000
- 262
-
Selection of a model in reflectometry: use of the linear statistical inferenceSamoilenko, I. / Feigin, L. / Shchedrin, B. / Antolini, R. et al. | 2000
- 268
-
Bragg diffraction in a coherent X-ray scattering experimentKaganer, V. M. / Jenichen, B. / Ploog, K. H. et al. | 2000
- 273
-
Practical aspects of inverse scattering methods applied to specular reflectivity datavan der Lee, A. et al. | 2000
- 278
-
Overflowing cylinder for neutron reflection research at expanding surfacesWagemaker, M. / Boerboom, F. J. / Bos, H. J. / van Well, A. A. et al. | 2000
- 282
-
On the use of a multilayer monochromator in neutron reflectometryvan Well, A. A. / de Haan, V. O. / Fredrikze, H. / Clemens, D. et al. | 2000
- 285
-
Focusing of coherent X-rays in a tapered planar waveguideZwanenburg, M. J. / Bongaerts, J. H. / Peters, J. F. / Riese, D. / van der Veen, J. F. et al. | 2000