Comparison of electron diffraction data from non-linear optically active organic DMABC crystals obtained at 100 and 300kV (English)
- New search for: Voigt-Martin, I. G.
- New search for: Kothe, H.
- New search for: Yakimansky, A. V.
- New search for: Tenkovtsev, A. V.
- New search for: Zandbergen, H.
- New search for: Jansen, J.
- New search for: Gilmore, C.
- New search for: Voigt-Martin, I. G.
- New search for: Kothe, H.
- New search for: Yakimansky, A. V.
- New search for: Tenkovtsev, A. V.
- New search for: Zandbergen, H.
- New search for: Jansen, J.
- New search for: Gilmore, C.
In:
ULTRAMICROSCOPY
;
83
, 1-2
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33-59
;
2000
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ISSN:
- Article (Journal) / Print
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Title:Comparison of electron diffraction data from non-linear optically active organic DMABC crystals obtained at 100 and 300kV
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Contributors:Voigt-Martin, I. G. ( author ) / Kothe, H. ( author ) / Yakimansky, A. V. ( author ) / Tenkovtsev, A. V. ( author ) / Zandbergen, H. ( author ) / Jansen, J. ( author ) / Gilmore, C. ( author )
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Published in:ULTRAMICROSCOPY ; 83, 1-2 ; 33-59
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Publisher:
- New search for: ELSEVIER
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Publication date:2000-01-01
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Size:27 pages
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ISSN:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 502.82
- Further information on Dewey Decimal Classification
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Classification:
DDC: 502.82 -
Source:
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Table of contents – Volume 83, Issue 1-2
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Artefacts in iodine ion milling of some compound semiconductorsWright, A. C. et al. | 2000
- 9
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The orientation-dependent simulation of ELNESHebert-Souche, C. / Louf, P. H. / Blaha, P. / Nelhiebel, M. / Luitz, J. / Schattschneider, P. / Schwarz, K. / Jouffrey, B. et al. | 2000
- 17
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Shear force distance control in near-field optical microscopy: experimental evidence of the frictional probe-sample interactionLapshin, D. A. / Kobylkin, E. E. / Letokhov, V. S. et al. | 2000
- 25
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A storage Dewar near-field scanning optical microscopeEytan, G. / Yayon, Y. / Bar-Joseph, I. / Rappaport, M. L. et al. | 2000
- 33
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Comparison of electron diffraction data from non-linear optically active organic DMABC crystals obtained at 100 and 300kVVoigt-Martin, I. G. / Kothe, H. / Yakimansky, A. V. / Tenkovtsev, A. V. / Zandbergen, H. / Jansen, J. / Gilmore, C. et al. | 2000
- 61
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Preparation of damage-free glass TEM specimensKestel, B. J. et al. | 2000
- 67
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Quantitative phase-sensitive imaging in a transmission electron microscopeBajt, S. / Barty, A. / Nugent, K. A. / McCartney, M. / Wall, M. / Paganin, D. et al. | 2000
- 75
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Incoherent imaging with the soft X-ray microscopeBurge, R. E. / Yuan, X. C. / Morrison, G. R. / Charalambous, P. / Browne, M. T. / An, Z. et al. | 2000
- 93
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International telemicroscopy with a 3MV ultrahigh voltage electron microscopeTakaoka, A. / Yoshida, K. / Mori, H. / Hayashi, S. / Young, S. J. / Ellisman, M. H. et al. | 2000
- 103
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A practical simulated annealing program and its application to quantitative CBED pattern matchingLi, S. Y. / Wu, M. Y. / Zhu, J. et al. | 2000
- 111
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Impact of column bending in high-resolution transmission electron microscopy on the strain evaluation of GaAs/InAs/GaAs heterostructuresTillmann, K. / Lentzen, M. / Rosenfeld, R. et al. | 2000
- 129
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Charging phenomena in PEEM imaging and spectroscopyGilbert, B. / Andres, R. / Perfetti, P. / Margaritondo, G. / Rempfer, G. / De Stasio, G. et al. | 2000