Photoreflectance study of crystalline silicon (English)
- New search for: Moriya, H.
- New search for: Kaneta, A.
- New search for: Adachi, S.
- New search for: Moriya, H.
- New search for: Kaneta, A.
- New search for: Adachi, S.
In:
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B
;
76
, 3
;
232 - 236
;
2000
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ISSN:
- Article (Journal) / Print
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Title:Photoreflectance study of crystalline silicon
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Contributors:
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Published in:MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 76, 3 ; 232 - 236
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Publisher:
- New search for: Elsevier
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Publication date:2000-01-01
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Size:5 pages
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ISSN:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 620.11
- Further information on Dewey Decimal Classification
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Classification:
DDC: 620.11 -
Source:
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Table of contents – Volume 76, Issue 3
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 173
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Microstructural evolution of duplex grain structure and interpretation of the mechanism for NiO scales grown on pure Ni- and Cr-doped substrates during high temperature oxidationKyung, H. et al. | 2000
- 184
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Electrical properties of Li1+xYyTi2-y(PO4)3 (where x,y=0.3; 0.4) ceramics at high frequenciesSobiestianskas, R. et al. | 2000
- 193
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Densification of hybrid silica-titania sol-gel films studied by ellipsometry and FTIRSeco, A.M. et al. | 2000
- 200
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Thermoelectric properties of thermoelectric modules consisted of porous FeSi2 based compounds fabricated by pressureless sinteringCho, W.-S. et al. | 2000
- 206
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Gallium nitride quantum dots in a silica xerogel matrixMurali, A.K. et al. | 2000
- 211
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Design of amorphous magnetic materials for high frequency sensors based upon permalloy characteristicsKim, C.K. et al. | 2000
- 217
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Low temperature chemical vapor deposition of 3C-SiC on 6H-SiC - high resolution X-ray diffractometry and synchrotron X-ray topography studyChaudhuri, J. et al. | 2000
- 225
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Calculations of cobalt silicide and carbide formation on SiC using the Gibbs free energySeng, W.F. et al. | 2000
- 232
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Photoreflectance study of crystalline siliconMoriya, H. et al. | 2000
- 237
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Optical properties of spark-processed GeChang, S.-S. et al. | 2000
- 241
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Physical Properties of Carbon Nanotubes, Edited by R. Saito, G. Dresselhaus and M.S. Dresselhaus, Imperial College Press, London, 1998.Balkanski, M. et al. | 2000