Oxides: Treasure Island of New Functionalities (Unknown)
- New search for: Koinuma, H.
- New search for: Koinuma, H.
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JOURNAL- SURFACE SCIENCE SOCIETY OF JAPAN
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21
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2000
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Title:Oxides: Treasure Island of New Functionalities
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Contributors:Koinuma, H. ( author )
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- New search for: SURFACE SCIENCE SOCIETY OF JAPAN
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Publication date:2000-01-01
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Type of media:Article (Journal)
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Type of material:Print
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Language:Unknown
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Table of contents – Volume 21
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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21st Century Surface Science Innovated by Nano-spaceIchikawa, M. et al. | 2000
- 1
-
Importance of Developing Experimental Methods in the Study of Organic Surfaces and InterfacesSeki, K. et al. | 2000
- 1
-
Solar Cells! Everybody says, "Yes", butMotohiro, T. et al. | 2000
- 1
-
Oxides: Treasure Island of New FunctionalitiesKoinuma, H. et al. | 2000
- 1
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The Importance of Interface Control in Crystal Growth of Nitride SemiconductorsAkasaki, I. et al. | 2000
- 2
-
Ordered Structure Formation Dynamics of Monolayers Studied by Using Probe MicroscopesKato, T. et al. | 2000
- 2
-
Structures and Properties of Atoms and Molecules Confined in Nanoporous SpacesKaneko, K. et al. | 2000
- 2
-
Effect of Low-temperature Deposited Layer on the Growth of Group-III Nitrides on SapphireAmano, H. / Akasaki, I. et al. | 2000
- 2
-
Potential and Technical Problems of Silicon Solar Cells as One of the Most Promising Next Generation Solar CellsYamaguchi, M. et al. | 2000
- 2
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Present and Future of Surfaces of Double Oxides Viewed from Theorist's AngleTerakura, K. / Fang, Z. et al. | 2000
- 9
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The Application of the X-ray Reflectometry to the Monolayer Adsorbed at the Air-Water InterfaceKago, K. / Mouri, E. / Matsuoka, H. / Yamaoka, H. et al. | 2000
- 10
-
Atomic Structures of GaN(0001) Reconstructed Surfaces: Approach Using First-Principles Simulation and STM MeasurementOhno, T. / Xue, Q.-K. / Sakurai, T. et al. | 2000
- 10
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Amorphous Silicon Solar Cells and Surface ScienceKiyama, S. / Yagi, H. et al. | 2000
- 10
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Adsorption Behavior in Confined Space in ZeolitesTsutsumi, K. et al. | 2000
- 11
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Characterization and Application of the Ultrasmooth Surface Nanostructure of Metal OxidesYoshimoto, M. / Ohnishi, T. / Takakura, M. / Hishitani, Y. / Furusawa, M. / Mizuno, K. / Miyahara, T. et al. | 2000
- 16
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Issues Upon Surface and Interface of Microcrystalline Silicon Thin Film as a Solar Cell MaterialKondo, M. / Matsuda, A. et al. | 2000
- 17
-
Novel Electronic Properties of Alkali Metal Clusters Stabilized in Zeolite CagesNozue, Y. et al. | 2000
- 17
-
Ripplon Spectroscopy and Physics of Molecular FilmSakai, K. et al. | 2000
- 18
-
Characterization of the Polarity of GaN Semiconductor Films by Coaxial Impact Collision Ion Scattering Spectroscopy: Correlation between GaN Growth Process and the Polar DirectionSumiya, M. / Ohnishi, T. / Ito, T. / Fuke, S. et al. | 2000
- 21
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Surfaces and Interfaces of Metal Oxides: A Molecular Simulation StudyKubo, M. / Takami, S. / Miyamoto, A. et al. | 2000
- 24
-
Surface Plasmon Resonance Measurement for Organic Ultrathin FilmsKajikawa, K. et al. | 2000
- 24
-
In-Situ Monitoring of GaN MOVPE by Optical ReflectanceKobayashi, N. / Kobayashi, Y. et al. | 2000
- 25
-
Molecular Layering in Ultrathin Liquid Film: Effect on the Tribological CharacteristicsKato, T. et al. | 2000
- 26
-
Thin Film Si Solar Cell Fabricated at Low TemperaturesYamamoto, K. et al. | 2000
- 29
-
Surface Structure and Surface Mechanical Properties of Organosilane MonolayersTakahara, A. / Kojio, K. / Kajiyama, T. et al. | 2000
- 29
-
Surface and Interface Study on a Superconducting Cuprate (Nd, Ce)~2CuO~4 by Photoemission Spectroscopy: Redox Reaction and Oxygen Nonstoichiometry on Cuprate Surface/InterfaceYamamoto, H. / Naito, M. / Sato, H. et al. | 2000
- 31
-
Epitaxial Growth and Dislocation Formation in Crystals of Nitride SemiconductorsKuwano, N. / Oki, K. / Hiramatsu, K. et al. | 2000
- 32
-
Preparation of Ultra-Large Grain Silicon Thin-Films by Excimer-LaserMatsumura, M. et al. | 2000
- 32
-
Dynamic Behavior of Molecules in Nano-structured Materials as Investigated by Computer SimulationMizukami, K. / Kobayashi, Y. / Takami, S. / Kubo, M. / Miyamoto, A. et al. | 2000
- 37
-
Surface Characterization of Monolayers by the Wilhelmy-type Dynamic Contact Angle MeasurementAbe, K. / Ohnishi, S. / Akiyama, H. / Takiguchi, H. / Tamada, K. et al. | 2000
- 37
-
AFM Observation of Single-Crystal Surface of High-Tc Superconducting CupratesZama, H. / Tanaka, N. / Morishita, T. et al. | 2000
- 38
-
Characterization of Initial Growth Stage of GaInN Multilayered Structure by X-ray CTR Scattering and X-ray Reflectivity MethodTabuchi, M. / Takeda, Y. / Takeuchi, T. / Amano, H. / Akasaki, I. et al. | 2000
- 39
-
Proton Relay Dissociation of Water Molecules on a Si(001) SurfaceAkagi, K. / Tsukada, M. et al. | 2000
- 42
-
Measurement of Diffusion Coefficient of Sulfur Adsorbed on Ni(111) SurfaceTsukawaki, S. / Hatano, Y. / Hashizume, K. / Sugisaki, M. et al. | 2000
- 42
-
Dye-sensitized Solar Cells for the Next GenerationKitamura, T. / Wada, Y. / Yanagida, S. et al. | 2000
- 45
-
Inference of Ga Ion TOF-SIMS Fragments of Metal-chlorides and -oxidesZhanping, L. / Hoshi, T. / Hirokawa, K. et al. | 2000
- 45
-
Surface Structure of MBE-grown III-nitride SemiconductorsOkumura, H. / Shen, X.-Q. / Ide, T. / Shimizu, M. / Hara, S. / Sonoda, S. / Shimizu, S. et al. | 2000
- 47
-
Fabrication of InGaAs Quantum Dots by SPEED Method and Its Photoluminescence PropertiesMano, T. / Watanabe, K. / Tsukamoto, S. / Imanaka, Y. / Takamasu, T. / Fujioka, H. / Kido, G. / Oshima, M. / Koguchi, N. et al. | 2000
- 48
-
Polarization-Dependent Total Reflection Fluorescence EXAFS Study on the 3-Dimensional Structural Analysis of Surface Active SitesAsakura, K. et al. | 2000
- 49
-
The 27th Surface Science Lecture CourseHayashi, Y. et al. | 2000
- 50
-
The 8th European Conference on Surface and Interface Analysis (ECASIA 99)Yoshihara, K. et al. | 2000
- 53
-
Sample Cooling System for SIMS ApparatusHayashi, S.-i. et al. | 2000
- 54
-
The Design of the Cold Head of an Atom Probe Field Ion MicroscopeHono, K. et al. | 2000
- 54
-
Surface Technology of Pre-Sensitized PlateTomiyasu, H. et al. | 2000
- 55
-
International Symposium on Surface Science for Micro- and Nano-Device Fabrication (ISSS-3)Kawazu, A. et al. | 2000
- 58
-
The 20th Surface Science Seminar: Materials Evaluation by Surface AnalysisYoshihara, K. et al. | 2000
- 59
-
Symposium on Surface Physics 2000 (SSP'00)Ichimiya, A. et al. | 2000
- 60
-
Study on Catalysts for Partial Oxidation of MethaneUeno, A. et al. | 2000
- 67
-
The Design of Low Temperature STMAmakusa, T. / Kondo, Y. et al. | 2000
- 72
-
Third International Sanken SymposiumMatsumoto, T. et al. | 2000
- 187
-
Stage for Surface ScienceYoshihara, K. et al. | 2000
- 188
-
Tight-binding Molecular Dynamics Simulation of Silicon Plasma OxidationYamada, A. / Sugisako, K. / Endou, A. / Takami, S. / Kubo, M. / Miyamoto, A. / Kitajima, M. et al. | 2000
- 193
-
Inference and Re-classification of TOF-SIMS Fragments for the Identification of Organic CompoundsTakahashi, M. / Hirokawa, K. / Shimada, S. et al. | 2000
- 203
-
Interpretation of TEM Images of Impurities in Electrodeposited FilmsNakahara, S. et al. | 2000
- 217
-
Recent Progress in the Surface Science Approach to Hydrodesulfurization Catalyst DevelopmentSakashita, Y. / Yoshimoto, M. et al. | 2000
- 226
-
Effect of Interfacial Tension on the Structure and Properties of Polymer BlendsYamaguchi, M. et al. | 2000
- 232
-
Atomic-Layer Etching and Electron-Stimulated Desorption of Br-Chemisorbed Si(111) SurfacesMochiji, K. / Ichikawa, M. et al. | 2000
- 239
-
The 29th Surface Science Technical Meeting: Recent Progress of Scanning Probe MicroscopyIwatsuki, M. et al. | 2000
- 319
-
Importance of Interface ScienceKoma, A. et al. | 2000
- 320
-
Hetero-epitaxy with Large Lattice Mismatch and Microchannel Epitaxy of Compound SemiconductorNishinaga, T. et al. | 2000
- 326
-
Heteroepitaxy of Ionic Crystals and Its Interfacial StrainSaiki, K. et al. | 2000
- 332
-
Epitaxy and Lattice Distortion in Metallic MultilayersShinjo, T. / Nakayama, N. et al. | 2000
- 340
-
Increase in Transition Temperature by Lattice-mismatch Strain in High-temperature SuperconductorsSato, H. / Naito, M. / Yamamoto, H. / Tsukada, A. / Matsuda, A. et al. | 2000
- 348
-
Heteroepitaxy of 3C-SiC on Si Using SiGeC Buffer LayerFuyuki, T. / Hatayama, T. et al. | 2000
- 355
-
Formation of Heterovalent II-VI/III-V InterfacesHanada, T. / Yao, T. et al. | 2000
- 361
-
Role of Strain in Si/SiO~2 Interface FormationKageshima, H. / Shiraishi, K. / Uematsu, M. et al. | 2000
- 367
-
Ultra-Trace-Element Analysis Used with Total-Reflection X-ray Photoelectron SpectroscopyIijima, Y. / Miyoshi, K. et al. | 2000
- 376
-
Bitterness InhibitorKatsuragi, Y. et al. | 2000
- 391
-
The Special Issue and the Annual Meeting of SSSJKudo, M. et al. | 2000
- 392
-
Growth Process of Self-Assembled Monolayers of Poly-3-DodecylthiopheneOnodera, O. / Sakaguchi, H. / Shimoyama, Y. et al. | 2000
- 398
-
STM Observation of Atomic H Adsorption on Ag/SiC(0001) SurfaceKobayashi, T. / Kubo, O. / Harada, T. / Ryu, J.-T. / Katayama, M. / Oura, K. et al. | 2000
- 405
-
Study of the Surface Morphology of Titanium Oxide Films Epitaxially Grown on MgO(100) by Non-contact AFMKubo, T. / Nozoye, H. et al. | 2000
- 413
-
Effects of Spherical Wave Thermal Factor on ARXPS Spectrum of Ge(111) SurfaceNakayama, K. / Konishi, T. / Fujikawa, T. / Rennert, P. et al. | 2000
- 420
-
Determination of the Acid-Base Properties of Surfaces by Contact Angle Titration with Small Drops of Unbuffered SolutionsSakai, H. et al. | 2000
- 426
-
Surface Core-Level Shift as Assessed by Using the Voigt FunctionMinato, R. / Eguchi, T. / Furuta, S. / Miura, Y. / Kato, R. / Morita, H. / Funaki, T. / Sato, H. / Osaka, T. et al. | 2000
- 434
-
Effect of Surface Properties on the Vacuum Friction Characteristics of the Stainless SteelTosa, M. / Kasahara, A. / Kim, Y.-S. / Yoshihara, K. et al. | 2000
- 438
-
IRAS Study of Adsorbed Formic Acid on a Chromium Oxide Film Grown on Cr(110)Kato, M. / Matsumoto, T. / Kubota, J. / Kondo, J. N. / Hirose, C. / Domen, K. et al. | 2000
- 440
-
Synthesis of ZnO Thin Films on Glass Substrate Using an Oxygen-Radical Beam SourceSugisawa, T. / Miki, H. / Katsura, K. / Nozoye, H. et al. | 2000
- 444
-
Influence of Translational Energy for Surface Reaction of Silicon with Oxygen MoleculesTeraoka, Y. / Yoshigoe, A. / Sano, M. et al. | 2000
- 448
-
12th Symposium on Surface Science '2000 (3 S '00)Koshikawa, T. et al. | 2000
- 455
-
Today and the Future of the Surface Science Society of JapanNihei, Y. et al. | 2000
- 456
-
Effects of Cooling Rates on Crystal Orientation of Sputtered PbTiO~3 and (Pb, La)TiO~3 Thin FilmsAi, R. / Wasa, K. / Ichikawa, Y. et al. | 2000
- 462
-
Geometric and Electronic Structures of V and Cr ClustersKondo, R. / Sekine, R. / Onoe, J. / Nakamatsu, H. et al. | 2000
- 468
-
Adsorption States for Alkylammonium Ion on Cleaved Mica SurfacesHasegawa, T. / Fujii, M. et al. | 2000
- 473
-
Observation of CaF~2 Growth on Si(111)7x7 Surface by RHEEDHorio, Y. / Satoh, S. / Iwama, S. et al. | 2000
- 481
-
XPS and X-ray AES (XAES) Study of Various Aluminate CompoundsKameshima, Y. / Yasumori, A. / Okada, K. et al. | 2000
- 488
-
Observation of Initial Stage of Co and Co-Ni Alloy Film Formation by Pulsed Current ElectrodepositionMaruyama, K.-i. / Matsushita, A. / Numata, H. / Nittono, O. et al. | 2000
- 496
-
Observation of Zincphthalocyanine One-dimensional pi-staking StructuresNaitoh, Y. / Matsumoto, T. / Sugiura, K.-i. / Sakata, Y. / Kawai, T. et al. | 2000
- 502
-
Influence of Interface Metal on Field Emission from Carbon FilmIkuno, T. / Kawano, Y. / Baek, Y.-G. / Ryu, J.-T. / Katayama, M. / Oura, K. et al. | 2000
- 507
-
In Reevaporation during Molecular Beam Epitaxial Growth of InGaAs Layers on GaAs SubstratesHiyama, Y. / Arai, K. / Koo, B.-H. / Yao, T. / Mashita, M. et al. | 2000
- 511
-
Development of Nano-scale FIB SIMS ApparatusNojima, M. / Tomiyasu, B. / Shibata, T. / Owari, M. / Nihei, Y. et al. | 2000
- 527
-
Future of Carbon Nanotube ResearchIijima, S. et al. | 2000
- 528
-
Nano-technology of Carbon NanotubesSaito, R. et al. | 2000
- 534
-
Field Emission of Electrons and Field Evaporation of C~2~0 from Carbon NanotubesSaito, Y. et al. | 2000
- 540
-
Development of Carbon-Nanotube Probes for Scanning Probe MicroscopyNakayama, Y. et al. | 2000
- 546
-
Nanomechanics of Carbon NanotubeAkita, S. / Nakayama, Y. et al. | 2000
- 553
-
Gas Storage of Carbon NanotubesAchiba, Y. et al. | 2000
- 560
-
EELS Diagnoses of the Multi-phase Nanotubes and Nanoparticles in the B-C-N Ternary SystemSuenaga, K. et al. | 2000
- 569
-
Surface and Thin Film Analysis by Spectroscopic EllipsometryYamaguchi, T. et al. | 2000
- 576
-
Atomic Force Microscopy Observations of Zeolite (010) Surface Atoms and Adsorbed MoleculesKomiyama, M. et al. | 2000
- 584
-
Migration Behavior of Sodium in Silicon Dioxide Films during Secondary Ion Mass Spectrometry Analysis with a Sample Cooling SystemSaito, R. / Hayashi, S.-i. / Kudo, M. et al. | 2000
- 590
-
Growth Process of Self-assembled Monolayer of ThiopheneNakajima, M. / Onodera, O. / Matsuura, T. / Takamura, T. / Shimoyama, Y. et al. | 2000
- 688
-
Machining and Processing Technologies and Quality of Silicon Wafer SurfacesKasai, T. et al. | 2000
- 696
-
Surface Flatness of III-V Compound SemiconductorsOsaka, J. et al. | 2000
- 702
-
Atomic Scale Surface Control of Metal Oxide Substrates towards Perfect EpitaxyKawasaki, M. / Lippmaa, M. / Nakamura, M. / Takahashi, K. / Koinuma, H. et al. | 2000
- 710
-
Metallic Single Crystal SubstratesGotoh, Y. / Kawanowa, H. / Jo, S. et al. | 2000
- 716
-
Layered Material SubstratesUeno, K. / Koma, A. et al. | 2000
- 724
-
Fabrication of Au(111) Single Crystalline Substrate on MicaHara, M. et al. | 2000
- 731
-
Comparative Study on Surfaces of Single-Crystalline Substrates: Concluding RemarksYamamoto, H. / Watanabe, S. et al. | 2000
- 734
-
Work Function of GaAs(001) Surface Obtained by in-situ Scanning Electron MicroscopyHigashino, T. / Tanahashi, K. / Kawamura, Y. / Inoue, N. / Osaka, J. / Homma, Y. et al. | 2000
- 738
-
Halogen Etching on Si(100)-2x1Nakayama, K. S. / Aldao, C. M. / Weaver, J. H. et al. | 2000
- 764
-
Aspects and Prospects of the Researches on the Development of SiC DevicesYoshida, S. et al. | 2000
- 771
-
SiC Epitaxial Growth by Vertical Hot-Wall Type Chemical Vapor DepositionTakahashi, K. / Kitabatake, M. et al. | 2000
- 778
-
Impurity Doping into SiC Semiconductor by Means of Ion ImplantationItoh, H. / Ohshima, T. et al. | 2000
- 784
-
The Effects of H~2 and HF Treatments on SiC SurfacesTsuchida, H. / Jikimoto, T. / Kamata, I. / Izumi, K. et al. | 2000
- 791
-
The Schottky Limit and a Charge Neutrality Level Found on Metal/6H-SiC InterfacesHara, S. et al. | 2000
- 800
-
Fabrication and Structure of Langmuir-Blodgett Films of NitrostilbeneKaji, H. / Shimoyama, Y. et al. | 2000
- 806
-
Inference of TOF-SIMS Fragments of a Few Organic PolymersTozu-Sekiya, M. / Takahashi, M. / Hoshi, T. / Hirokawa, K. et al. | 2000