The hemispherical deflector analyser revisited:II. Electron-optical properties (English)
- New search for: Benis, E. P.
- New search for: Zouros, T. J.
- New search for: Benis, E. P.
- New search for: Zouros, T. J.
In:
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
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163
, 1-3
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28-39
;
2008
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ISSN:
- Article (Journal) / Print
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Title:The hemispherical deflector analyser revisited:II. Electron-optical properties
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Contributors:Benis, E. P. ( author ) / Zouros, T. J. ( author )
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Published in:JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA ; 163, 1-3 ; 28-39
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Publisher:
- New search for: Elsevier Science B.V., Amsterdam.
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Publication date:2008-01-01
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Size:12 pages
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ISSN:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 543.0858
- Further information on Dewey Decimal Classification
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Classification:
DDC: 543.0858 -
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 163, Issue 1-3
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Two-dimensional states in the electronic structure of Au/ -4H-SiC(0001)Stoltz, D. / Stoltz, S.E. / Johansson, L.S.O. et al. | 2007
- 1
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Two-dimensional states in the electronic structure of Au/ Formula Not Shown -4H-SiC(0001)Stoltz, D. / Stoltz, S. E. / Johansson, L. S. et al. | 2008
- 7
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A simple statistical model for quantitative analysis of plasmon structures in XPS and Auger spectra of free-electron-like materialsNovák, M. / Kövér, L. / Egri, S. / Cserny, I. / Tóth, J. / Varga, D. / Drube, W. et al. | 2007
- 15
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XPS study of nitrogen-implanted ZnO thin films obtained by DC-Magnetron reactive plasmaTabet, N. / Faiz, M. / Al-Oteibi, A. et al. | 2007
- 19
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From tungsten hexacarbonyl adsorption on TiO2(110) surface to supported tungsten oxide phasesDomenichini, B. / Prunier, J. / Petukov, M. / Li, Z. / Møller, P.J. / Bourgeois, S. et al. | 2008
- 28
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The hemispherical deflector analyser revisited:II. Electron-optical propertiesBenis, E. P. / Zouros, T. J. et al. | 2008
- 28
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The hemispherical deflector analyser revisitedBenis, E.P. / Zouros, T.J.M. et al. | 2008
- 40
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Negative ion formation from photoexcited carbon tetrachloride and silicon tetrachloride studied by negative-ion mass spectrometry in the range of 12.4–31.0eVBoo, Bong Hyun / Koyano, Inosuke et al. | 2008
- 45
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Improvement of display-type spherical mirror analyzer for real space mapping of electronic and atomic structuresTakahashi, Nobuaki / Matsui, Fumihiko / Matsuda, Hiroyuki / Hamada, Yoji / Nakanishi, Koji / Namba, Hidetoshi / Daimon, Hiroshi et al. | 2008
- 51
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Neutralization kinetics of charged polymer surfaceMukherjee, S. / Mukherjee, M. et al. | 2008
- 59
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High-resolution photoelectron spectroscopy of self-assembled mercaptohexanol monolayers on gold surfacesKummer, Kurt / Vyalikh, Denis V. / Gavrila, Gianina / Kade, Andreas / Weigel-Jech, Michael / Mertig, Michael / Molodtsov, Serguei L. et al. | 2008
- 65
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Quantitative analysis of the directional elastic peak electron spectroscopy profilesMorawski, I. / Nowicki, M. et al. | 2008
- 69
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Author Index| 2008
- 70
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Subject Index| 2008
- CO2
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Editorial Board| 2008