Test Case Generation by Contract Mutation in Spec# (English)
- New search for: Krenn, W.
- New search for: Aichernig, B. K.
- New search for: Krenn, W.
- New search for: Aichernig, B. K.
In:
ELECTRONIC NOTES IN THEORETICAL COMPUTER SCIENCE
;
253
, 2
;
71-86
;
2009
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ISSN:
- Article (Journal) / Print
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Title:Test Case Generation by Contract Mutation in Spec#
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Contributors:Krenn, W. ( author ) / Aichernig, B. K. ( author )
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Published in:ELECTRONIC NOTES IN THEORETICAL COMPUTER SCIENCE ; 253, 2 ; 71-86
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Publisher:
- New search for: ELSEVIER SCIENCE B.V AMSTERDAM
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Publication date:2009-01-01
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Size:16 pages
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ISSN:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 004
- Further information on Dewey Decimal Classification
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Classification:
DDC: 004 -
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 253, Issue 2
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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PrefaceFinkbeiner, B. / Gurevich, Y. / Petrenko, A. K. et al. | 2009
- 3
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Automated Software Testing of Asynchronous SystemsSalas, P. P. / Krishnan, P. et al. | 2009
- 21
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Model-based Kernel Testing for Concurrency Bugs through Counter Example ReplayKim, M. / Hong, S. / Hong, C. / Kim, T. et al. | 2009
- 37
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On the Use of Uniform Random Generation of Automata for TestingDadeau, F. / Levrey, J. / Heam, P. C. et al. | 2009
- 53
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Conformance Testing of Hybrid Systems with Qualitative Reasoning ModelsAichernig, B. K. / Brandl, H. / Wotawa, F. et al. | 2009
- 71
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Test Case Generation by Contract Mutation in Spec#Krenn, W. / Aichernig, B. K. et al. | 2009
- 87
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Computing Optimal Tests for Non-deterministic Systems Using DNNF GraphsSchumann, A. / Sachenbacher, M. / Huang, J. et al. | 2009
- 101
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Model Based Testing of a Network-on-Chip ComponentTsiopoulos, L. / Satpathy, M. et al. | 2009
- 117
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jSynoPSys - A Scenario-Based Testing Tool based on the Symbolic Animation of B MachinesDadeau, F. / Tissot, R. et al. | 2009