XPS characterization of different thermal treatments in the ITO-Si interface of a carbonate-textured monocrystalline silicon solar cell (English)
- New search for: Montesdeoca-Santana, A.
- New search for: Jimenez-Rodriguez, E.
- New search for: Marrero, N.
- New search for: Gonzalez-Diaz, B.
- New search for: Borchert, D.
- New search for: Guerrero-Lemus, R.
- New search for: Montesdeoca-Santana, A.
- New search for: Jimenez-Rodriguez, E.
- New search for: Marrero, N.
- New search for: Gonzalez-Diaz, B.
- New search for: Borchert, D.
- New search for: Guerrero-Lemus, R.
In:
NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION B
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268
, 3-4
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374-378
;
2010
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ISSN:
- Article (Journal) / Print
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Title:XPS characterization of different thermal treatments in the ITO-Si interface of a carbonate-textured monocrystalline silicon solar cell
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Contributors:Montesdeoca-Santana, A. ( author ) / Jimenez-Rodriguez, E. ( author ) / Marrero, N. ( author ) / Gonzalez-Diaz, B. ( author ) / Borchert, D. ( author ) / Guerrero-Lemus, R. ( author )
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Published in:NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION B ; 268, 3-4 ; 374-378
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Publisher:
- New search for: Elsevier Science B.V., Amsterdam.
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Publication date:2010-01-01
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Size:5 pages
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ISSN:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 539.7
- Further information on Dewey Decimal Classification
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Classification:
DDC: 539.7 -
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 268, Issue 3-4
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 231
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Investigation of InAs/GaSb-based superlattices by diffraction methodsAshuach, Y. / Kauffmann, Y. / Lakin, E. / Zolotoyabko, E. / Grossman, S. / Klin, O. / Weiss, E. et al. | 2009
- 236
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Properties of InAs grown on misoriented GaAs substrates by atmospheric pressure metal–organic vapor phase epitaxyBen Naceur, H. / Mzoughi, T. / Moussa, I. / Rebey, A. / El Jani, B. et al. | 2009
- 241
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Dose-dependent bonding environment of oxygen implanted in GaNKatsikini, M. / Boscherini, F. / Paloura, E.C. et al. | 2009
- 246
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Soft X-ray spectroscopy of oxide-embedded and functionalized silicon nanocrystalsKelly, Joel A. / Henderson, Eric J. / Hessel, Colin M. / Cavell, Ronald G. / Veinot, Jonathan G.C. et al. | 2009
- 251
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Optical measurements of nanoporous anodic alumina formed on Si using novel X-ray spectroscopy set up CLASSIXNasir, Mazhar E. / Hamilton, Bruce / Allsop, Duncan W.E. et al. | 2009
- 254
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XBIC/micro-XRF/micro-XAS analysis of metals precipitation in block-cast solar siliconTrushin, M. / Seifert, W. / Vyvenko, O. / Bauer, J. / Martinez-Criado, G. / Salome, M. / Kittler, M. et al. | 2010
- 254
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XBIC/μ-XRF/μ-XAS analysis of metals precipitation in block-cast solar siliconTrushin, M. / Seifert, W. / Vyvenko, O. / Bauer, J. / Martinez-Criado, G. / Salome, M. / Kittler, M. et al. | 2009
- 254
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XBIC/m-XRF/m-XAS analysis of metals precipitation in block-cast solar siliconTrushin, M. / Seifert, W. / Vyvenko, O. / Bauer, J. / Martinez-Criado, G. / Salome, M. / Kittler, M. et al. | 2010
- 259
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GISAXS and GIWAXS analysis of amorphous–nanocrystalline silicon thin filmsJuraić, K. / Gracin, D. / Šantić, B. / Meljanac, D. / Zorić, N. / Gajović, A. / Dubček, P. / Bernstorff, S. / Čeh, M. et al. | 2009
- 263
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In situ investigation of wet chemical processes for chalcopyrite solar cells by L-edge XAS under ambient conditionsGreil, Stefanie M. / Lauermann, Iver / Ennaoui, Ahmed / Kropp, Timo / Lange, Kathrin M. / Weber, Matthieu / Aziz, Emad F. et al. | 2009
- 268
-
Comparative study of structural and morphological properties of CuIn3S5 and CuIn7S11 materialsKhemiri, N. / Kanzari, M. et al. | 2009
- 273
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Effect of antimony incorporation on structural properties of CuInS2 crystalsBen Rabeh, M. / Chaglabou, N. / Kanzari, M. et al. | 2009
- 277
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Elemental depth profiling of Cu(In,Ga)Se2 thin films by reference-free grazing incidence X-ray fluorescence analysisStreeck, C. / Beckhoff, B. / Reinhardt, F. / Kolbe, M. / Kanngießer, B. / Kaufmann, C.A. / Schock, H.W. et al. | 2009
- 282
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Determination of global and local residual stresses in SOFC by X-ray diffractionVillanova, Julie / Sicardy, Olivier / Fortunier, Roland / Micha, Jean-Sébastien / Bleuet, Pierre et al. | 2009
- 287
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X-ray and microstructural investigation of NiTiPt alloys homogenised at intermediate to high temperaturesO’Donoghue, L. / Gandhi, A.A. / Butler, J. / Redington, W. / Tiernan, P. / McGloughlin, T. / Carlson, J.C. / Lavelle, S. / Tofail, S.A.M. et al. | 2009
- 291
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Non-destructive analysis of micro texture and grain boundary character from X-ray diffraction contrast tomographyKing, A. / Herbig, M. / Ludwig, W. / Reischig, P. / Lauridsen, E.M. / Marrow, T. / Buffière, J.Y. et al. | 2009
- 297
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Investigation on a corrosion product deposit layer on a boiling water reactor fuel claddingOrlov, A.V. / Restani, R. / Kuri, G. / Degueldre, C. / Valizadeh, S. et al. | 2009
- 306
-
Effect of aluminium addition on the structural properties of nanostructured Fe50Co50 alloyDjebbari, C. / Alleg, S. / Greneche, J.M. et al. | 2009
- 311
-
Erbium environment on Er-doped silica and alumino-silicate glass films: An EXAFS studyCattaruzza, E. / Maurizio, C. / Visentin, L. / Trave, E. / Martucci, A. / Ali, S. / Battaglin, G. / Gonella, F. et al. | 2009
- 316
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Core–shell nanowires: From the ensemble to single-wire characterizationKeplinger, Mario / Kriegner, Dominik / Stangl, Julian / Ma˚rtensson, Thomas / Mandl, Bernhard / Wintersberger, Eugen / Bauer, Günther et al. | 2009
- 320
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Submicron beam X-ray diffraction of nanoheteroepitaxily grown GaN: Experimental challenges and calibration proceduresBonanno, P.L. / Gautier, S. / Sirenko, A.A. / Kazimirov, A. / Cai, Z.-H. / Goh, W.H. / Martin, J. / Martinez, A. / Moudakir, T. / Maloufi, N. et al. | 2009
- 325
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On revealing the vertical structure of nanoparticle films with elemental resolution: A total external reflection X-ray standing waves studyZargham, Ardalan / Schmidt, Thomas / Flege, Jan Ingo / Sauerbrey, Marc / Hildebrand, Radowan / Röhe, Sarah / Bäumer, Marcus / Falta, Jens et al. | 2009
- 329
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Experimental set-up for time resolved small angle X-ray scattering studies of nanoparticles formation using a free-jet micromixerMarmiroli, Benedetta / Grenci, Gianluca / Cacho-Nerin, Fernando / Sartori, Barbara / Laggner, Peter / Businaro, Luca / Amenitsch, Heinz et al. | 2009
- 334
-
Total pattern fitting for the combined size–strain–stress–texture determination in thin film diffractionLutterotti, Luca et al. | 2009
- 341
-
Structural distortion of biogenic aragonite in strongly textured mollusc shell layersChateigner, D. / Ouhenia, S. / Krauss, C. / Belkhir, M. / Morales, M. et al. | 2009
- 346
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Combined Rietveld refinement of Zn2SiO4:Mn2+ using X-ray and neutron powder diffraction dataKim, Yong-Il / Im, Won Bin / Ryu, Kwon-Sang / Kim, Ki-Bok / Lee, Yun-Hee / Lee, Jeong Soon et al. | 2009
- 352
-
Planar irregularities of texture and stress field in Ti detected by X-ray diffraction techniqueTarkowski, L. / Bonarski, J. / Alexandrov, I. et al. | 2009
- 356
-
Micro-XRF and micro-XAFS studies of an Al matrix Fe–Ni compositePinakidou, F. / Katsikini, M. / Paloura, E.C. / Vourlias, G. / Stergouidis, G. et al. | 2009
- 361
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Depth-dependent magnetic characterization of Fe films on NiO(001)Luches, P. / Benedetti, S. / Pasquini, L. / Boscherini, F. / Zając, M. / Korecki, J. / Rüffer, R. / Valeri, S. et al. | 2009
- 365
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Elastic behaviour of titanium dioxide films on polyimide substrates studied by in situ tensile testing in a X-ray diffractometerBontempi, Elza / Zanola, Paolo / Gelfi, Marcello / Zucca, Marcello / Depero, Laura E. / Girault, Baptiste / Goudeau, Philippe / Geandier, Guillaume / Bourhis, Eric Le / Renault, Pierre-Olivier et al. | 2009
- 370
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GIXRF–NEXAFS investigations on buried ZnO/Si interfaces: A first insight in changes of chemical states due to annealing of the specimenPagels, M. / Reinhardt, F. / Pollakowski, B. / Roczen, M. / Becker, C. / Lips, K. / Rech, B. / Kanngießer, B. / Beckhoff, B. et al. | 2009
- 374
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XPS characterization of different thermal treatments in the ITO–Si interface of a carbonate-textured monocrystalline silicon solar cellMontesdeoca-Santana, A. / Jiménez-Rodríguez, E. / Marrero, N. / González-Díaz, B. / Borchert, D. / Guerrero-Lemus, R. et al. | 2009
- 379
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X-ray microtomography analysis and Molecular Dynamics calculations to understand the dynamic damage process in metalsBontaz-Carion, J. / Soulard, L. et al. | 2009
- 383
-
Observation of nano-indent induced strain fields and dislocation generation in silicon wafers using micro-Raman spectroscopy and white beam X-ray topographyAllen, D. / Wittge, J. / Zlotos, A. / Gorostegui-Colinas, E. / Garagorri, J. / McNally, P.J. / Danilewsky, A.N. / Elizalde, M.R. et al. | 2009
- 388
-
3D strain imaging in sub-micrometer crystals using cross-reciprocal space measurements: Numerical feasibility and experimental methodologyVaxelaire, N. / Labat, S. / Chamard, V. / Thomas, O. / Jacques, V. / Picca, F. / Ravy, S. / Kirchlechner, C. / Keckes, J. et al. | 2009
- 394
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Application of synchrotron X-ray radiography to the study of dendritic equiaxed microstructure formation in Al–Cu alloysBogno, A. / Nguyen-Thi, H. / Bergeon, N. / Mangelinck-Noël, N. / Schenk, T. / Billia, B. / Boller, E. / Baruchel, J. et al. | 2009
- 399
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Dislocation generation related to micro-cracks in Si wafers: High temperature in situ study with white beam X-ray topographyDanilewsky, A. / Wittge, J. / Hess, A. / Cröll, A. / Allen, D. / McNally, P. / Vagovič, P. / Cecilia, A. / Li, Z. / Baumbach, T. et al. | 2009
- 403
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Determination of the local gold contact morphology on a photoactive polymer film using nanobeam GISAXSRuderer, M.A. / Körstgens, V. / Metwalli, E. / Al-Hussein, M. / Vainio, U. / Roth, S.V. / Döhrmann, R. / Gehrke, R. / Gebhardt, R. / Burghammer, M. et al. | 2009
- 411
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Monitoring the crystallization process of nano-confined organic molecules by synchrotron X-ray diffractionMilita, S. / Dionigi, C. / Borgatti, F. / Porzio, W. / Biscarini, F. et al. | 2009
- 414
-
A thin film approach to protein crystallographyBirkholz, M. et al. | 2009
- 420
-
Fe distribution and speciation in human nailsKatsikini, M. / Pinakidou, F. / Mavromati, E. / Paloura, E.C. / Gioulekas, D. / Grolimund, D. et al. | 2009
- 425
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Synchrotron radiation photoionization mass spectrometry of laser ablated speciesAlvarez Ruiz, J. / Casu, A. / Coreno, M. / de Simone, M. / Hoyos Campo, L.M. / Juarez-Reyes, A.M. / Kivimäki, A. / Orlando, S. / Sanz, M. / Spezzani, C. et al. | 2009
- I
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Author Index| 2010
- IFC
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Editorial board| 2010
- v
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EditorialBoscherini, Federico / Birkholz, Mario / Buffière, Jean-Yves / Chateigner, Daniel / Fewster, Paul F. / Heun, Stefan et al. | 2009
- vii
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Contents| 2010