Experimental stopping powers of Al, Mg, F and O ions in ZrO2 in the 0.1-0.6MeV/u energy range (English)
- New search for: Msimanga, M.
- New search for: Comrie, C. M.
- New search for: Pineda-Vargas, C. A.
- New search for: Murray, S.
- New search for: Msimanga, M.
- New search for: Comrie, C. M.
- New search for: Pineda-Vargas, C. A.
- New search for: Murray, S.
In:
NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION B
;
268
, 11-12
;
1772-1775
;
2010
-
ISSN:
- Article (Journal) / Print
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Title:Experimental stopping powers of Al, Mg, F and O ions in ZrO2 in the 0.1-0.6MeV/u energy range
-
Contributors:Msimanga, M. ( author ) / Comrie, C. M. ( author ) / Pineda-Vargas, C. A. ( author ) / Murray, S. ( author )
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Published in:NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION B ; 268, 11-12 ; 1772-1775
-
Publisher:
- New search for: Elsevier Science B.V., Amsterdam.
-
Publication date:2010-01-01
-
Size:4 pages
-
ISSN:
-
Type of media:Article (Journal)
-
Type of material:Print
-
Language:English
- New search for: 539.7
- Further information on Dewey Decimal Classification
-
Classification:
DDC: 539.7 -
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 268, Issue 11-12
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1703
-
Evaluated differential cross-sections for IBAGurbich, A.F. et al. | 2010
- 1711
-
Grazing angle 2MeV RBS on the surface of a liquid with atomic layer depth resolutionHess, M. / Krieger, U.K. / Weers, U. / Hausammann, E. / Peter, Th. / Lanford, W.A. et al. | 2010
- 1714
-
Surface analysis with high energy time-of-flight secondary ion mass spectrometry measured in parallel with PIXE and RBSJones, Brian N. / Palitsin, Vladimir / Webb, Roger et al. | 2010
- 1718
-
Monte Carlo simulations of ion channeling in crystals containing extended defectsTuros, A. / Nowicki, L. / Stonert, A. / Pagowska, K. / Jagielski, J. / Muecklich, A. et al. | 2010
- 1723
-
Stopping power of GaAs for swift protons: Dielectric function and optical-data model calculationsSathish, N. / Kyriakou, I. / Emfietzoglou, D. / Pathak, A.P. et al. | 2010
- 1727
-
A pre-sample charge measurement system for quantitative NMP-analysisKristiansson, P. / Borysiuk, M. / Arteaga-Marrero, N. / Elfman, M. / Nilsson, E.J.C. / Nilsson, C. / Pallon, J. et al. | 2010
- 1731
-
Energy and depth resolution in elastic recoil coincidence spectrometrySzilágyi, E. et al. | 2010
- 1736
-
MeV-energy probe SIMS imaging of major components in animal cells etched using large gas cluster ionsYamada, Hideaki / Ichiki, Kazuya / Nakata, Yoshihiko / Ninomiya, Satoshi / Seki, Toshio / Aoki, Takaaki / Matsuo, Jiro et al. | 2010
- 1741
-
SHI induced re-crystallization of Ge implanted SiO2 filmsRao, N. Srinivasa / Pathak, A.P. / Sathish, N. / Devaraju, G. / Khan, S.A. / Saravanan, K. / Panigrahi, B.K. / Nair, K.G.M. / Avasthi, D.K. et al. | 2010
- 1744
-
Skewness of energy-loss straggling and multiple-scattering energy distributionsMayer, M. / Arstila, K. / von Toussaint, U. et al. | 2010
- 1749
-
Stopping cross-section and energy straggling of protons in SiC obtained by nuclear resonant reaction of protons with 12C and 28SiTosaki, Mitsuo / Itoh, Hiroyuki / Isozumi, Yasuhito et al. | 2010
- 1754
-
Effects of the projectile electronic structure on Bethe–Bloch stopping parameters for AgMoussa, D. / Damache, S. / Ouichaoui, S. et al. | 2010
- 1759
-
Stopping of ∼0.2–3.4MeV/amu 1H+ and 4He+ ions in polyvinyl formalDamache, S. / Moussa, D. / Ouichaoui, S. et al. | 2010
- 1763
-
Effect of the Bethe surface description on the electronic excitations induced by energetic proton beams in liquid water and DNAAbril, Isabel / Denton, Cristian D. / de Vera, Pablo / Kyriakou, Ioanna / Emfietzoglou, Dimitris / Garcia-Molina, Rafael et al. | 2010
- 1768
-
Stopping power of 11B in Si and TiO2 measured with a bulk sample method and Bayesian inference data analysisSiketić, Z. / Bogdanović Radović, I. / Alves, E. / Barradas, N.P. et al. | 2010
- 1772
-
Experimental stopping powers of Al, Mg, F and O ions in ZrO2 in the 0.1–0.6MeV/u energy rangeMsimanga, M. / Comrie, C.M. / Pineda-Vargas, C.A. / Murray, S. et al. | 2010
- 1776
-
Stopping power in a cylindrical system by the modified Bessel function’s methodKitagawa, M. et al. | 2010
- 1781
-
Energy loss of protons in carbon nanotubes: Experiments and calculationsKyriakou, I. / Celedón, C. / Segura, R. / Emfietzoglou, D. / Vargas, P. / Valdés, J.E. / Abril, I. / Denton, C.D. / Kostarelos, K. / Garcia-Molina, R. et al. | 2010
- 1786
-
Stopping force and straggling of 0.6–4.7MeV H, He and Li ions in the polyhydroxybutyrate foilHsu, J.Y. / Yu, Y.C. / Chen, K.M. et al. | 2010
- 1790
-
Effect of vacancy de-excitation parameters on L X-rays of Pb using H+ beamJain, Arvind Kumar / Mohan, Harsh / Sharma, Sunita et al. | 2010
- 1793
-
Elastic scattering of 7Li+27Al at several angles in the 7–11MeV energy rangeAbriola, D. / Carnelli, P. / Arazi, A. / Figueira, J.M. / Capurro, O.A. / Cardona, M.A. / Fernández Niello, J.O. / Hojman, D. / Fimiani, L. / Grinberg, P. et al. | 2010
- 1797
-
Determination of differential cross-sections for the natK(p,p0) and 39K(p,α0) reactions in the backscattering geometryKokkoris, M. / Tsaris, A. / Misaelides, P. / Sokaras, D. / Lagoyannis, A. / Harissopulos, S. / Vlastou, R. / Papadopoulos, C.T. et al. | 2010
- 1797
-
Determination of differential cross-sections for the natK(p,p0) and 39K(p,a0) reactions in the backscattering geometryKokkoris, M. / Tsaris, A. / Misaelides, P. / Sokaras, D. / Lagoyannis, A. / Harissopulos, S. / Vlastou, R. / Papadopoulos, C. T. et al. | 2010
- 1802
-
Simulation of L X-ray yields induced by He ionsTaborda, A. / Chaves, P.C. / Reis, M.A. et al. | 2010
- 1806
-
PIGE analysis of magnesium and berylliumFonseca, M. / Jesus, A.P. / Luís, H. / Mateus, R. / Cruz, J. / Gasques, L. / Galaviz, D. / Ribeiro, J.P. et al. | 2010
- 1809
-
Positron annihilation lifetime and Doppler broadening study in 50MeV Li3+ ion irradiated polystyrene filmsAsad Ali, S. / Kumar, Rajesh / Nambissan, P.M.G. / Singh, F. / Prasad, Rajendra et al. | 2010
- 1813
-
Study of modifications in Lexan polycarbonate induced by swift O6+ ion irradiationAsad Ali, S. / Kumar, Rajesh / Singh, F. / Kulriya, P.K. / Prasad, Rajendra et al. | 2010
- 1818
-
SRIM – The stopping and range of ions in matter (2010)Ziegler, James F. / Ziegler, M.D. / Biersack, J.P. et al. | 2010
- 1824
-
A new ion beam analysis data formatBarradas, N.P. / Mayer, M. / Thompson, M. et al. | 2010
- 1829
-
Thin film depth profiling using simultaneous particle backscattering and nuclear resonance profilingBarradas, N.P. / Mateus, R. / Fonseca, M. / Reis, M.A. / Lorenz, K. / Vickridge, I. et al. | 2010
- 1833
-
Nuclear micro-beam analysis of deuterium distribution in carbon fibre composites for controlled fusion devicesPetersson, P. / Kreter, A. / Possnert, G. / Rubel, M. et al. | 2010
- 1838
-
Ion beam micro analysis of deposits at tokamak divertor surfacesPetersson, P. / Bergsåker, H. / Possnert, G. / Coad, J.P. / Koivuranta, S. / Likonen, J. et al. | 2010
- 1842
-
Damage recovery in ZnO by post-implantation annealingAudren, A. / Hallén, A. / Linnarsson, M.K. / Possnert, G. et al. | 2010
- 1847
-
The structure of ion beam amorphised zirconolite studied by grazing angle X-ray absorption spectroscopyReid, D.P. / Stennett, M.C. / Ravel, B. / Woicik, J.C. / Peng, N. / Maddrell, E.R. / Hyatt, N.C. et al. | 2010
- 1853
-
Evolution of Zr/Hf/Zr trilayers during annealing studied by RBSKling, A. / Soares, J.C. et al. | 2010
- 1857
-
Lithium concentration dependence of implanted helium retention in lithium silicatesSzőcs, D.E. / Szilágyi, E. / Bogdán, Cs. / Kótai, E. / Horváth, Z.E. et al. | 2010
- 1862
-
DIADDHEM set-up: New IBA facility for studying the helium behavior in nuclear glassesChamssedine, F. / Sauvage, T. / Peuget, S. et al. | 2010
- 1867
-
RBS study of diffusion under strong centrifugal force in bimetallic Au/Cu thin filmsHao, T. / Ono, M. / Okayasu, S. / Sakai, S. / Narumi, K. / Hiraiwa, Y. / Naramoto, H. / Maeda, Y. et al. | 2010
- 1871
-
Determination of tetragonal distortion of Al0.69In0.09Ga0.22N/GaN heterostructure by RBS/C and HRXRDFa, T. / Chen, T.X. / Yao, S.D. et al. | 2010
- 1875
-
Ion beam mixing in uranium nitride thin films studied by Rutherford Backscattering SpectroscopyKim-Ngan, N.-T.H. / Balogh, A.G. / Havela, L. / Gouder, T. et al. | 2010
- 1880
-
Study of xenon thermal migration in sintered titanium nitride using nuclear micro-probeBes, R. / Millard-Pinard, N. / Gavarini, S. / Cardinal, S. / Garnier, V. / Khodja, H. / Malchère, A. / Martin, P. / Peaucelle, C. et al. | 2010
- 1884
-
Limited angle STIM and PIXE tomography of single cellsAndrea, T. / Rothermel, M. / Werner, R. / Butz, T. / Reinert, T. et al. | 2010
- 1889
-
Ion-scattering analysis of self-assembled monolayers of silanes on organic semiconductorsWielunski, Leszek S. / Katalinic, S. / Lee, B. / Connors, M. / Garfunkel, E. / Feldman, L.C. / Podzorov, V. et al. | 2010
- 1893
-
ERD analysis and modification of TiO2 thin films with heavy ionsJensen, J. / Martin, D. / Surpi, A. / Kubart, T. et al. | 2010
- 1899
-
The Maia 384 detector array in a nuclear microprobe: A platform for high definition PIXE elemental imagingRyan, C.G. / Kirkham, R. / Siddons, D.P. / Dunn, P.A. / Laird, J.S. / Kuczewski, A. / Moorhead, G. / De Geronimo, G. / Davey, P. / Jensen, M. et al. | 2010
- 1903
-
Impurity mapping in sulphide minerals using Time-resolved Ion Beam Induced Current imagingLaird, Jamie S. / Johnson, Brett C. / Ganesan, Kumaravelu / Kandasamy, Sasikaran / Davidson, Garry / Borg, Stacey / Ryan, Chris G. et al. | 2010
- 1911
-
Preliminary experiments: High-energy alpha PIXE in archaeometryDupuis, Thomas / Chêne, G. / Mathis, F. / Marchal, A. / Philippe, M. / Garnir, H.-P. / Strivay, D. et al. | 2010
- 1916
-
Quality control of coins mint using PIXE and RBS analysisRoumie, M. / Nsouli, B. / Chalhoub, G. / Hamdan, M. et al. | 2010
- 1920
-
A comparative study of PIXE and XRF corrected by Gamma-Ray Transmission for the non-destructive characterization of a gilded roman railingOrtega-Feliu, I. / Moreno-Suárez, A.I. / Gómez-Tubío, B. / Ager, F.J. / Respaldiza, M.A. / García-Dils, S. / Rodríguez-Gutiérrez, O. et al. | 2010
- 1924
-
Identification and characterization of fine and coarse particulate matter sources in a middle-European urban environmentKertész, Zs. / Szoboszlai, Z. / Angyal, A. / Dobos, E. / Borbély-Kiss, I. et al. | 2010
- 1929
-
Depth profiling of fingerprint and ink signals by SIMS and MeV SIMSBailey, M.J. / Jones, B.N. / Hinder, S. / Watts, J. / Bleay, S. / Webb, R.P. et al. | 2010
- 1933
-
The influence of stray DC magnetic fields in MeV ion nanobeam systemsMerchant, M.J. / Grime, G.W. / Palitsin, V. et al. | 2010
- 1938
-
A new cluster-ion-beam source for secondary ion mass spectrometry (SIMS) using the electrospray of a pure ionic liquid under high vacuumFujiwara, Yukio / Saito, Naoaki / Nonaka, Hidehiko / Nakanaga, Taisuke / Ichimura, Shingo et al. | 2010
- 1942
-
Site identification of GaN using preferential scattering effect along Formula Not Shown axisNishimura, T. / Satoh, M. / Nomoto, K. / Nakamura, T. / Mishima, T. et al. | 2010
- 1942
-
Site identification of GaN using preferential scattering effect along axisNishimura, T. / Satoh, M. / Nomoto, K. / Nakamura, T. / Mishima, T. et al. | 2010
- 1945
-
External scanning micro-PIXE for the characterization of a polycapillary lens: Measurement of the collected X-ray intensity distributionGrassi, N. / Guazzoni, C. / Alberti, R. / Klatka, T. / Bjeoumikhov, A. et al. | 2010
- 1949
-
Development of laboratory standards for AMS measurement of 237NpWang, Xianggao / Jiang, Shan / Dong, Kejun / He, Ming / He, Guozhu / Li, Chaoli / Li, Shizhuo / Gong, Jie / Lu, Liyuan et al. | 2010
- 1954
-
The French accelerator mass spectrometry facility ASTER: Improved performance and developmentsArnold, Maurice / Merchel, Silke / Bourlès, Didier L. / Braucher, Régis / Benedetti, Lucilla / Finkel, Robert C. / Aumaître, Georges / Gottdang, Andreas / Klein, Matthias et al. | 2010
- 1960
-
Precise nitrogen depth profiling by high-resolution RBS in combination with angle-resolved XPSKimura, Kenji / Nakajima, Kaoru / Conard, Thierry / Vandervorst, Wilfried / Bergmaier, Andreas / Dollinger, Günther et al. | 2010
- 1964
-
Ion beam analysis of high pressure deposition of epitaxial PZT thin filmsAndrade, E. / Blanco, O. / de Lucio, O.G. / Solis, C. / Rocha, M.F. / Zavala, E.P. et al. | 2010
- 1967
-
Nanoscale metal-silicide films prepared by surfactant sputtering and analyzed by RBSZhang, K. / Hofsäss, H. / Zutz, H. et al. | 2010
- 1972
-
Characterisation of annealed Fe/Ag bilayers by RBS and XRDTunyogi, A. / Tanczikó, F. / Bogdán, Cs. / Horváth, Z.E. / Szilágyi, E. et al. | 2010
- 1976
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Effect of ion irradiation on structure and thermal evolution of the Ni–C60 hybrid systemsVacik, J. / Lavrentiev, V. / Vorlicek, V. / Bacakova, L. / Narumi, K. et al. | 2010
- 1980
-
High Resolution and Differential PIXE combined with RBS, EBS and AFM analysis of magnesium titanate (MgTiO3) multilayer structuresReis, M.A. / Alves, L.C. / Barradas, N.P. / Chaves, P.C. / Nunes, B. / Taborda, A. / Surendran, K.P. / Wu, A. / Vilarinho, P.M. / Alves, E. et al. | 2010
- 1986
-
UHV-ERDA investigation of NEG coatingsBender, M. / Kollmus, H. / Bellachioma, M.C. / Assmann, W. et al. | 2010
- 1991
-
Erosion and re-deposition processes in JET tiles studied with ion beamsAlves, L.C. / Alves, E. / Barradas, N.P. / Mateus, R. / Carvalho, P. / Coad, J.P. / Widdowson, A.M. / Likonen, J. / Koivuranta, S. et al. | 2010
- 1997
-
Investigation of hydrogen concentration and hardness of ion irradiated organically modified silicate thin filmsQi, Y. / Prenzel, T. / Harriman, T.A. / Wang, Y.Q. / Lucca, D.A. / Williams, D. / Nastasi, M. / Dong, J. / Mehner, A. et al. | 2010
- 2001
-
First results on ion micro-tomography at LIPSIONRothermel, M. / Reinert, T. / Andrea, T. / Butz, T. et al. | 2010
- 2006
-
External beamline setup for plated target investigationJezeršek, David / Šmit, Žiga / Pelicon, Primož et al. | 2010
- 2010
-
CdTe detector use for PIXE characterization of TbCoFe thin filmsChaves, P.C. / Taborda, A. / Barradas, N.P. / Reis, M.A. et al. | 2010
- 2015
-
Towards calibration and characterization of high-energy beams using charged particle retrodiffusion on a double thin carbon foil systemChêne, G. / Mathis, F. / Dupuis, T. / Marchal, A. / Philippe, M. / Clar, M. / Strivay, D. / Garnir, H.P. et al. | 2010
- 2019
-
Study on time resolution of single event TOF-RBS measurementAbo, Satoshi / Kumano, Shunya / Murakami, Katsuhisa / Wakaya, Fujio / Lohner, Tivadar / Takai, Mikio et al. | 2010
- 2023
-
Development of a TOF-ERDA measurement system for analysis of light elements using a He beamYasuda, K. / Batchuluun, C. / Ishigami, R. / Hibi, S. et al. | 2010
- 2028
-
A new mapping acquisition and processing system for simultaneous PIXE-RBS analysis with external beamPichon, L. / Beck, L. / Walter, Ph. / Moignard, B. / Guillou, T. et al. | 2010
- 2034
-
Investigation of avalanche silicon detectors for low energy single ion implantation applicationsYang, Changyi / Jamieson, David et al. | 2010
- 2038
-
Detection of beryllium treatment of natural sapphires by NRAGutiérrez, P.C. / Ynsa, M.-D. / Climent-Font, A. / Calligaro, T. et al. | 2010
- 2042
-
Study of Er+ ion-implanted lithium niobate structure after an annealing procedure by RBS and RBS/channellingMackova, A. / Malinsky, P. / Svecova, B. / Nekvindova, P. / Grötzschel, R. et al. | 2010
- 2046
-
Contribution of ion beam analysis methods to the development of second generation high temperature superconducting wiresUsov, I.O. / Arendt, P.N. / Foltyn, S.R. / Stan, L. / DePaula, R.F. / Holesinger, T.G. et al. | 2010
- 2051
-
On artefacts in the secondary ion mass spectrometry profiling of high fluence H+ implants in GaAsBailey, M.J. / Jeynes, C. / Sealy, B.J. / Webb, R.P. / Gwilliam, R.M. et al. | 2010
- 2056
-
Defect studies in ion irradiated AlGaNJagielski, J. / Thomé, L. / Zhang, Y. / Wang, C.M. / Turos, A. / Nowicki, L. / Pagowska, K. / Jozwik, I. et al. | 2010
- 2060
-
Ion beam characterization of Fe-implanted GaNGasparotto, A. / Cesca, T. / Bisognin, G. / Vangelista, S. / Berti, M. et al. | 2010
- 2064
-
Determination of lattice orientation in aluminium alloy grains by low energy gallium ion-channellingSilk, Jonathan R. / Dashwood, Richard J. / Chater, Richard J. et al. | 2010
- 2069
-
Boron lattice site location in (BGa)As and (BGa)P thin films studied using RBS and NRA with a channeled He+ ion beamSpemann, D. / Gottschalch, V. et al. | 2010
- 2074
-
Evaluation of soft error rates using nuclear probes in bulk and SOI SRAMs with a technology node of 90nmAbo, Satoshi / Masuda, Naoyuki / Wakaya, Fujio / Onoda, Shinobu / Hirao, Toshio / Ohshima, Takeshi / Iwamatsu, Toshiaki / Takai, Mikio et al. | 2010
- 2078
-
Combined PIXE/PIGE and IBIL with external beam applied to the analysis of Merovingian glass beadsMathis, F. / Othmane, G. / Vrielynck, O. / Calvo del Castillo, H. / Chêne, G. / Dupuis, T. / Strivay, D. et al. | 2010
- 2083
-
Annealing of ion implanted 4H–SiC in the temperature range of 100–800°C analysed by ion beam techniquesUsman, M. / Nour, M. / Azarov, A.Yu. / Hallén, A. et al. | 2010
- 2083
-
Annealing of ion implanted 4H-SiC in the temperature range of 100-800degreeC analysed by ion beam techniquesUsman, M. / Nour, M. / Azarov, A. Y. / Hallen, A. et al. | 2010
- 2086
-
New approaches for investigating paintings by ion beam techniquesBeck, L. / de Viguerie, L. / Walter, Ph. / Pichon, L. / Gutiérrez, P.C. / Salomon, J. / Menu, M. / Sorieul, S. et al. | 2010
- 2092
-
Nuclear microbeam studies of silicon–germanium heterojunction bipolar transistors (HBTs)Vizkelethy, G. / Phillips, S.D. / Najafizadeh, L. / Cressler, J.D. et al. | 2010
- 2099
-
Determination of 13C/12C ratios with (d,p) nuclear reactionsWang, Y.Q. / Zhang, J. / Tesmer, J.R. / Li, Y.H. / Greco, R. / Grim, G.P. / Obst, A.W. / Rundberg, R.S. / Wilhelmy, J.B. et al. | 2010
- 2104
-
Evaluation of zinc interstitial in Si-ion implanted ZnO bulk single crystals by a Rutherford backscattering study: An origin of low resistivityIzawa, Y. / Matsumoto, K. / Kuriyama, K. / Kushida, K. et al. | 2010
- 2107
-
Depth-profiling of implanted 28Si by (a,a) and (a,p0) reactionsDemarche, J. / Yedji, M. / Terwagne, G. et al. | 2010
- 2107
-
Depth-profiling of implanted 28.Si by (alpha,alpha) and (alpha,p0) reactionsDemarche, J. / Yedji, M. / Terwagne, G. et al. | 2010
- 2107
-
Depth-profiling of implanted 28Si by (α,α) and (α,p0) reactionsDemarche, J. / Yedji, M. / Terwagne, G. et al. | 2010
- 2111
-
Argon plasma irradiation of polypropyleneSlepička, P. / Vasina, A. / Kolská, Z. / Luxbacher, T. / Malinský, P. / Macková, A. / Švorčík, V. et al. | 2010
- 2115
-
Optimizing NRA depth profiling using Bayesian experimental designvon Toussaint, U. / Schwarz-Selinger, T. / Mayer, M. / Gori, S. et al. | 2010
- 2119
-
Polymer tribology by combining ion implantation and radionuclide tracingTimmers, Heiko / Gladkis, Laura G. / Warner, Jacob A. / Byrne, Aidan P. / del Grosso, Mariela F. / Arbeitman, Claudia R. / Garcia-Bermudez, Gerardo / Geruschke, Thomas / Vianden, Reiner et al. | 2010
- 2124
-
Influence of temperature and plasma composition on deuterium retention in refractory metalsAlves, E. / Alves, L.C. / Barradas, N.P. / Mateus, R. / Carvalho, P.A. / Wright, G.M. et al. | 2010
- 2129
-
Mapping elemental distributions in submarine hydrothermal sulfide smokers using proton induced X-ray emissionYeats, Chris / Belton, David / Laird, Jamie S. / Ryan, Chris G. et al. | 2010
- 2133
-
Helium release in uranium dioxide in relation to grain boundaries and free surfacesMartin, G. / Garcia, P. / Sabathier, C. / Carlot, G. / Sauvage, T. / Desgardin, P. / Raepsaet, C. / Khodja, H. et al. | 2010
- 2138
-
Trace elements of soil samples from mining areaOswal, Mumtaz / Bedi, Harneet / Hajivaliei, M. / Kumar, Ashok / Singh, K.P. et al. | 2010
- 2141
-
Aging of ErT2 thin films: ERD analysis and mechanical property changesKnapp, J.A. / Browning, J.F. / Bond, G.M. et al. | 2010
- 2144
-
PIXE–PIGE analysis of some Indian medicinal plantsNomita Devi, K. / Nandakumar Sarma, H. et al. | 2010
- 2148
-
Influence of trajectory-dependent Stark and Zeeman effects on resonant coherent excitation of relativistic hydrogen-like ions channeled in a crystalBabaev, A.A. / Pivovarov, Yu.L. et al. | 2010
- 2152
-
Micro-PIXE study of whole otolith of Anguilla japonica at elver stageZheng, Y. / Guo, H. / Wei, K. / Tang, W. / Satoh, T. / Ohkubo, T. / Yamazaki, A. / Takano, K. / Kamiya, T. / Shen, H. et al. | 2010
- 2156
-
Trace element mapping in Parkinsonian brain by quantitative ion beam microscopyBarapatre, Nirav / Morawski, Markus / Butz, Tilman / Reinert, Tilo et al. | 2010
- 2160
-
Nuclear microprobe investigation of the penetration of ultrafine zinc oxide into intact and tape-stripped human skinSzikszai, Z. / Kertész, Zs. / Bodnár, E. / Major, I. / Borbíró, I. / Kiss, Á.Z. / Hunyadi, J. et al. | 2010
- 2164
-
Analysis of human hair cross sections from two different population groups by Nuclear MicroscopyPineda-Vargas, C.A. / Eisa, M.E.M. et al. | 2010
- 2168
-
Microbeam PIXE analysis of platinum resistant and sensitive ovarian cancer cellsJeynes, J.C.G. / Bailey, M.J. / Coley, H. / Kirkby, K.J. / Jeynes, C. et al. | 2010
- 2172
-
Significant improvement of the osseointegration of zirconia dental implants by HS-LEIS analysisBeekmans, H. / Breitenstein, D. / Brongersma, H.H. / de Ridder, M. / Tromp, Th.J. et al. | 2010
- 2177
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Structural investigations in helium implanted cubic zirconia using grazing incidence XRD and EXAFS spectroscopyKuri, G. / Degueldre, C. / Bertsch, J. / Döbeli, M. et al. | 2010
- 2181
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Solvent-free polymer lithography via the Kirkendall effectThompson, Richard L. et al. | 2010
- 2185
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Perturbed angular correlation studies of the MAX phases Ti2AlN and Cr2GeC using ion implanted111In as probe nucleiJürgens, Daniel / Uhrmacher, Michael / Hofsäss, Hans / Mestnik-Filho, Jose / Barsoum, Michel W. et al. | 2010
- 2189
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150MeV Nickel ion beam irradiation effects on polytetrafluoroethylene (PTFE) polymerDhillo, Ramandeep Kaur / Singh, Surinder / Kumar, Rajesh et al. | 2010
- 2193
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A TEM investigation of retained defects in Si wafer by 1MeV Si ions bombardmentHsu, J.Y. / Huang, R.T. / Hung, M.J. / Yu, Y.C. et al. | 2010
- 2197
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Investigation of hydrogen depletion of organic materials upon ion beam irradiation by simultaneous micro-RBS and micro-ERDA techniquesSimon, A. / Huszank, R. / Novák, M. / Pintye, Z. et al. | 2010
- 2202
-
Uptake of nitric acid on NaCl single crystals measured by backscattering spectrometryHess, Maurus / Krieger, Ulrich K. / Marcolli, Claudia / Peter, Thomas / Lanford, William A. et al. | 2010
- 2205
-
Cd induced redistribution of elements within leaves of the Cd/Zn hyperaccumulator Thlaspi praecox as revealed by micro-PIXEPongrac, Paula / Vogel-Mikuš, Katarina / Vavpetič, Primož / Tratnik, Janja / Regvar, Marjana / Simčič, Jurij / Grlj, Nataša / Pelicon, Primož et al. | 2010
- 2211
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Study of Cl-containing urban aerosol particles by ion beam analytical methodsAngyal, A. / Kertész, Zs. / Szikszai, Z. / Szoboszlai, Z. et al. | 2010
- I
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Author Index Proceedings| 2010
- IFC
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Editorial board| 2010
- v
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19th International Conference on Ion Beam AnalysisWebb, Roger / Bailey, Melanie / Jeynes, Chris / Grime, Geoff et al. | 2010
- vi
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Committees| 2010
- vii
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Sponsorships| 2010