Examples of electrostatic electron optics: The Farrand and Elektros microscopes and electron mirrors (English)
- New search for: Hawkes, P. W.
- New search for: Hawkes, P. W.
In:
ULTRAMICROSCOPY
;
119
;
9-17
;
2012
-
ISSN:
- Article (Journal) / Print
-
Title:Examples of electrostatic electron optics: The Farrand and Elektros microscopes and electron mirrors
-
Contributors:Hawkes, P. W. ( author )
-
Published in:ULTRAMICROSCOPY ; 119 ; 9-17
-
Publisher:
- New search for: Elsevier Science B.V., Amsterdam.
-
Publication date:2012-01-01
-
Size:9 pages
-
ISSN:
-
Type of media:Article (Journal)
-
Type of material:Print
-
Language:English
- New search for: 502.82
- Further information on Dewey Decimal Classification
-
Classification:
DDC: 502.82 -
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 119
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
-
Introduction to the special issue: In memoriam Professor Gertrude Fleming Rempfer on the occasion of her 100th birthdayKönenkamp, Rolf / Rouvimov, Sergei et al. | 2012
- 5
-
Gertrude Rempfer and the development of high resolution focused ion beam technologyOrloff, Jon et al. | 2011
- 9
-
Examples of electrostatic electron optics: The Farrand and Elektros microscopes and electron mirrorsHawkes, P.W. et al. | 2011
- 18
-
LEEM and UHV-PEEM: A retrospectiveBauer, Ernst et al. | 2011
- 24
-
TEM-EELS: A personal perspectiveEgerton, R.F. et al. | 2011
- 33
-
Aberrations of the cathode objective lens up to fifth orderTromp, R.M. / Wan, W. / Schramm, S.M. et al. | 2011
- 40
-
Aberrations in asymmetrical electron lensesFitzgerald, J.P.S. / Word, R.C. / Könenkamp, R. et al. | 2011
- 45
-
Effect of sample tilt on PEEM resolutionOral, Martin / Radlička, Tomáš / Lencová, Bohumila et al. | 2011
- 51
-
Localization of inelastic electron scattering in the low-loss energy regimeZhou, Wu / Pennycook, Stephen J. / Idrobo, Juan-Carlos et al. | 2011
- 57
-
A surprise in the first Born approximation for electron scatteringTreacy, M.M.J. / Van Dyck, D. et al. | 2011
- 63
-
Improved multislice calculations for including higher-order Laue zones effectsLobato, I. / Van Dyck, D. et al. | 2012
- 72
-
Electrons for single molecule diffraction and imagingRan, Ke / Zuo, Jian-Min / Chen, Qing / Shi, Zujin et al. | 2011
- 78
-
A method of imaging ultrathin foils with very low energy electronsMüllerová, Ilona / Hovorka, Miloš / Frank, Luděk et al. | 2012
- 82
-
Prospects for electron microscopy characterisation of solar cells: Opportunities and challengesMendis, B.G. / Durose, K. et al. | 2011
- 97
-
Complementary microscopy techniques applied for optimizing the structure and performance of graphene-based hybridsQian, Wen / Chen, Zhiqiang / Eastman, Micah / Cottingham, Steven / Manhat, Beth A. / Goforth, Andrea M. / Jiao, Jun et al. | 2011
- 102
-
Photoelectron spectromicroscopy at chalcopyrite filmsPettenkofer, C. / Hofmann, A. / Bremsteller, W. / Lehmann, C. / Kelleter, F. et al. | 2011
- 106
-
Scandium oxide coated polycrystalline tungsten studied using emission microscopy and photoelectron spectroscopyWan, Congshang / Vaughn, Joel M. / Sadowski, Jerzy T. / Kordesch, Martin E. et al. | 2011
- IFC
-
IFC (Editorial Board)| 2012
- iv
-
Contents| 2012