Hybrid White Light-Emitting Diodes Utilizing Radiative or Nonradiative Energy Transfer for Wavelength Conversion (English)
- New search for: Cao, X. A.
- New search for: Li, S.
- New search for: Li, X. M.
- New search for: Liu, L. Y.
- New search for: Cao, X. A.
- New search for: Li, S.
- New search for: Li, X. M.
- New search for: Liu, L. Y.
In:
IEEE TRANSACTIONS ON ELECTRON DEVICES
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65
, 11
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4891-4896
;
2018
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ISSN:
- Article (Journal) / Print
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Title:Hybrid White Light-Emitting Diodes Utilizing Radiative or Nonradiative Energy Transfer for Wavelength Conversion
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Contributors:
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Published in:IEEE TRANSACTIONS ON ELECTRON DEVICES ; 65, 11 ; 4891-4896
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Publisher:
- New search for: IEEE INSTITUTE OF ELECTRICAL AND ELECTRONICS
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Publication date:2018-01-01
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Size:6 pages
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ISSN:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 621.3 / 621
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Classification:
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Table of contents – Volume 65, Issue 11
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 4740
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Source-to-Drain Tunneling Analysis in FDSOI, DGSOI, and FinFET Devices by Means of Multisubband Ensemble Monte CarloMedina-Bailon, Cristina / Padilla, Jose L. / Sampedro, Carlos / Godoy, Andres / Donetti, Luca / Gamiz, Francisco et al. | 2018
- 4747
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Assessment of THz Performance for a Lateral SiGe HBT on SOI With a Laterally Graded BaseDerrickson, Alexander / Peterson, Amelia H. / English, Kurt / Haslam, Andrew / Nath, Sagnik / McDonald, John F. et al. | 2018
- 4755
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Challenges & Physical Insights Into the Design of Fin-Based SCRs and a Novel Fin-SCR for Efficient On-Chip ESD ProtectionPaul, Milova / Sampath Kumar, B. / Russ, Christian / Gossner, Harald / Shrivastava, Mayank et al. | 2018
- 4764
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Voltage-Dependent Activation Energy Maps for Analytic Lifetime Modeling of NBTI Without Time ExtrapolationPuschkarsky, Katja / Reisinger, Hans / Schlunder, Christian / Gustin, Wolfgang / Grasser, Tibor et al. | 2018
- 4772
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The First Compact Model to Determine $V_{T}$ Distribution for DG-FinFET Due to LERAmita / Mittal, S. / Ganguly, U. et al. | 2018
- 4780
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Impact of the Metal-Gate Material Properties in FinFET (Versus FD-SOI MOSFET) on High- $\kappa$ /Metal-Gate Work-Function VariationNam, Hyohyun / Shin, Changhwan / Park, Jung-Dong et al. | 2018
- 4786
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Determination of Surface Recombination Velocity From Current–Voltage Characteristics in SiC p-n DiodesAsada, Satoshi / Suda, Jun / Kimoto, Tsunenobu et al. | 2018
- 4792
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Accurate Measurement of Channel Temperature for AlGaN/GaN HEMTsWu, Mei / Ma, Xiao-Hua / Yang, Ling / Zhu, Qing / Zhang, Meng / Yang, Lin-An / Hao, Yue et al. | 2018
- 4800
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Theoretical Evaluation of the Effects of Isolation-Feature Size and Geometry on the Built-In Strain and 2-D Electron Gas Density of AlGaN/GaN HeterostructuresGosselin, Jean-Lou / Valizadeh, Pouya et al. | 2018
- 4807
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TCAD Simulation for Nonresonant Terahertz Detector Based on Double-Channel GaN/AlGaN High-Electron-Mobility TransistorMeng, Qingzhi / Lin, Qijing / Jing, Weixuan / Han, Feng / Zhao, Man / Jiang, Zhuangde et al. | 2018
- 4814
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Fabrication of High-Uniformity and High-Reliability Si3N4/AlGaN/GaN MIS-HEMTs With Self-Terminating Dielectric Etching Process in a 150-mm Si FoundrySun, Hui / Wang, Maojun / Chen, Jianguo / Liu, Peng / Kuang, Wenteng / Liu, Meihua / Hao, Yilong / Chen, Dongmin et al. | 2018
- 4820
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High Uniformity Normally-OFF p-GaN Gate HEMT Using Self-Terminated Digital Etching TechniqueChiu, Hsien-Chin / Chang, Yi-Sheng / Li, Bo-Hong / Wang, Hsiang-Chun / Kao, Hsuan-Ling / Chien, Feng-Tso / Hu, Chih-Wei / Xuan, Rong et al. | 2018
- 4826
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Transient Response of 0.18- ${\mu}$ m SOI MOSFETs and SRAM Bit-Cells to Heavy-Ion Irradiation for Variable SOI Film ThicknessAditya, Kritika / Jha, Chandan K. / Basra, Sanjeev / Jatana, H. S. / Dixit, Abhisek et al. | 2018
- 4834
-
The Demonstration of High-Performance Multilayer BaTiO3/BiFeO3 Stack MIM CapacitorsLien, Chin / Hsieh, Cho-Fan / Wu, Hung-Sen / Wu, Teng-Chun / Wei, Syu-Jhih / Chu, Yu-Heng / Liao, Ming-Han / Lee, Min-Hung et al. | 2018
- 4839
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New Method for Reduction of the Capacitor Leakage Failure Rate Without Changing the Capacitor Structure or Materials in DRAM Mass ProductionLee, Jong-Min / Choi, Pyung-Ho / Kim, Soon-Kon / Oh, Jung-Hwan / Shin, Soo-Ho / Noh, Jun-Yong / Kim, Hyoung-Sub / Choi, Byoung-Deog et al. | 2018
- 4846
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NBTI-Related Variability Impact on 14-nm Node FinFET SRAM Performance and Static Power: Correlation to Time Zero FluctuationsMishra, Subrat / Parihar, Narendra / R, Anandkrishnan / Dabhi, Chetan K. / Chauhan, Yogesh S. / Mahapatra, Souvik et al. | 2018
- 4854
-
Achieving High Mobility in IGTO Thin-Film Transistors at a Low Temperature via Film DensificationKim, Hyeon-A. / Kim, Jeong Oh / Hur, Jae Seok / Son, Kyoung-Seok / Lim, Jun Hyung / Cho, Johann / Jeong, Jae Kyeong et al. | 2018
- 4861
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2-D Smart Surface Object Localization by Flexible 160-nW Monolithic Capacitively Coupled 12-b Identification Tags Based on Metal–Oxide TFTsPapadopoulos, Nikolas / Smout, Steve / Willegems, Myriam / Nag, Manoj / Ameys, Marc / Myny, Kris et al. | 2018
- 4868
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Effects of Parasitic Source/Drain Field Plates on Performances of Channel-Passivated Amorphous InGaZnO Thin-Film TransistorsHsu, Chih-Chieh / Huang, Po-Hao et al. | 2018
- 4875
-
A Surface-Potential-Based Drain Current Compact Model of Dynamic-Depletion Polysilicon Thin-Film TransistorsYu, Fei / Xu, Chuanzhong / Huang, Gongyi et al. | 2018
- 4883
-
Data Transmission Capabilities of Silicon Avalanche Mode Light-Emitting DiodesAgarwal, Vishal / Annema, Anne-Johan / Hueting, Raymond J.E. / Dutta, Satadal / Nanver, Lis K. / Nauta, Bram et al. | 2018
- 4891
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Hybrid White Light-Emitting Diodes Utilizing Radiative or Nonradiative Energy Transfer for Wavelength ConversionCao, X. A. / Li, S. / Li, X. M. / Liu, L. Y. et al. | 2018
- 4897
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Experimental and Theoretical Study of the Optical Properties Optimization of an OLED in a MicrocavityChakaroun, M. / Diallo, A. T. / Hamdad, S. / Khadir, S. / Fischer, A. P. A. / Boudrioua, A. et al. | 2018
- 4905
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NIR Photodetector Based on Nanosecond Laser-Modified SiliconZhao, Ji-Hong / Li, Chun-Hao / Li, Xian-Bin / Chen, Qi-Dai / Chen, Zhan-Guo / Sun, Hong-Bo et al. | 2018
- 4910
-
Light Sensing Enhancement and Energy Saving Improvement in Concentric Double-MIS(p) Tunnel Diode Structure With Inner Gate Outer Sensor OperationChen, Yu-Hsuan / Hwu, Jenn-Gwo et al. | 2018
- 4916
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A Partially Pixel-Parallel DROIC for MWIR Imagers With Columnwise Residue QuantizationAbbasi, Shahbaz / Shafique, Atia / Ceylan, Omer / Yazici, Melik / Gurbuz, Yasar et al. | 2018
- 4924
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Monte Carlo Simulation of Photoelectric Characteristics of Mercury–Cadmium–Tellurium- Based Infrared Focal-Plane-Array DetectorsPolovinkin, Vladimir G. / Stuchinsky, Victor A. / Vishnyakov, Aleksey V. / Lee, Irlam I. et al. | 2018
- 4931
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SOI-LDMOS Transistors With Optimized Partial n+ Buried Layer for Improved Performance in Power Amplifier ApplicationsNikhil, KrishnanNadar Savithry / DasGupta, Nandita / DasGupta, Amitava / Chakravorty, Anjan et al. | 2018
- 4938
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Optimization for Cell Arrangement Design of Gate-Commutated Thyristors Based on Whole Wafer Model and Tabu SearchLyu, Gang / Zhuang, Chijie / Liu, Jiapeng / Zhao, Biao / Yu, Zhanqing / Zeng, Rong / Zhang, Xueqiang et al. | 2018
- 4947
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Modeling Power Vertical High-k MOS Device With Interface Charges via Superposition Methodology-Breakdown Voltage and Specific ON-ResistanceWang, Zhigang / Wang, Xi / Kuo, James B. et al. | 2018
- 4955
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Variability Study of MWCNT Local Interconnects Considering Defects and Contact Resistances—Part I: Pristine MWCNTChen, Rongmei / Liang, Jie / Lee, Jaehyun / Georgiev, Vihar P. / Ramos, Raphael / Okuno, Hanako / Kalita, Dipankar / Cheng, Yuanqing / Zhang, Liuyang / Pandey, Reetu R. et al. | 2018
- 4963
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Variability Study of MWCNT Local Interconnects Considering Defects and Contact Resistances—Part II: Impact of Charge Transfer DopingChen, Rongmei / Liang, Jie / Lee, Jaehyun / Georgiev, Vihar P. / Ramos, Raphael / Okuno, Hanako / Kalita, Dipankar / Cheng, Yuanqing / Zhang, Liuyang / Pandey, Reetu R. et al. | 2018
- 4971
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Fabrication of Low-Resistance Ni Ohmic Contacts on n+-Ge1−xSnxZheng, Jun / Zhang, Yongwang / Liu, Zhi / Zuo, Yuhua / Li, Chuanbo / Xue, Chunlai / Cheng, Buwen / Wang, Qiming et al. | 2018
- 4975
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Layout Study of Strained Ge-Based pMOSFETs Integrated With S/D GeSn Alloy and CESL by Using Process-Oriented Stress SimulationsLee, Chang-Chun / Huang, Pei-Chen et al. | 2018
- 4982
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Universal Metal–Interlayer–Semiconductor Contact Modeling Considering Interface-State Effect on Contact Resistivity DegradationKim, Jeong-Kyu / Kim, Seung-Hwan / Kim, Taikyu / Yu, Hyun-Yong et al. | 2018
- 4988
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A Fully Analytical Current Model for Tunnel Field-Effect Transistors Considering the Effects of Source Depletion and Channel ChargesLyu, Zhijun / Lu, Hongliang / Zhang, Yuming / Zhang, Yimen / Lu, Bin / Cui, Xiaoran / Zhao, Yingxiang et al. | 2018
- 4995
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Mobility of Two-Electron Conduction in Narrow-Gap n-type Hg1–xCdxTe StructuresJozwikowska, Alina / Jozwikowski, krzysztof / Antoszewski, Jarek / Faraone, Lorenzo / Suligowski, Mariusz et al. | 2018
- 5002
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Experimental Characterization of the Influence of Transverse Prestrain on the Piezoresistive Coefficients of Heavily Doped n-Type SiliconBalbola, Amr A. / Kayed, Mohammed O. / Moussa, Walied A. et al. | 2018
- 5009
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Electrical Study of Pentacene-Based Metal–Semiconductor–Metal Structure: Schottky Barrier and Active Layer Thickness EffectsKhaldi, Wassim / Boubaker, Aimen / Nasri, Abdelghaffar / Lmimouni, Kamal / Kalboussi, Adel et al. | 2018
- 5014
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Radiation Analysis of N-Channel TGRC-MOSFET: An X-Ray DosimeterKumar, Ajay / Tiwari, Balark / Singh, Samarth / Mohan Tripathi, Madan / Chaujar, Rishu et al. | 2018
- 5021
-
3-D Interfacial Stress Decoupling Method Based on Graphene FoamYang, Jiayi / Lu, Xiaozhou / Li, Xiaoping / Bao, Weimin / Chen, Renjie et al. | 2018
- 5029
-
Dielectric Breakdown-Based Gas Leakage Detector Using Poly-Si MicrotipsMukherjee, Tania / Paul, Ambarish et al. | 2018
- 5038
-
Flexible Lightweight CMOS-Enabled Multisensory Platform for Plant Microclimate MonitoringKhan, Sherjeel M. / Shaikh, Sohail F. / Qaiser, Nadeem / Hussain, Muhammad Mustafa et al. | 2018
- 5045
-
Selective Reduction of Oxygen Functional Groups to Improve the Response Characteristics of Graphene Oxide-Based Formaldehyde Sensor Device: A First Principle StudyManna, Bibhas / Raha, Himadri / Chakrabarti, Indrajit / Guha, Prasanta Kumar et al. | 2018
- 5053
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Influence of the Cathode Material Properties in Reducing the Back-Bombardment Effect in Thermionic RF GunBakr, Mahmoud / Ohgaki, Hideaki et al. | 2018
- 5062
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Study the Mechanism and Suppression of AM/PM Conversion of Traveling-Wave Tubes Using Eulerian Hydrodynamic AnalysisQiu, Hai-Jian / Hu, Yu-Lu / Hu, Quan / Zhu, Xiao-Fang / Li, Bin et al. | 2018
- 5068
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Theoretical and Cold-Test Investigation of a Four-Port High-Frequency System for a 0.14-THz Dual-Sheet-Beam Backward-Wave OscillatorTang, Xiaopin / Yang, Ziqiang / Khan, Karim / Muhammad, Naseer / Ouyang, Zhengbiao et al. | 2018
- 5075
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Efficient Heat Dissipation Study of High-Power ${W}$ -Band Sheet Beam Extended Interaction OscillatorTian, Qizhi / Wang, Jianxun / Li, Xiaoxiao / Li, Hao / Fang, Chao / Chen, Kaiwen / Liu, Guo / Luo, Yong et al. | 2018
- 5082
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Investigations into Helix Slow-Wave Structure Assisted by Double-Negative MetamaterialGuha, Raktim / Bandyopadhyay, Ayan K. / Varshney, Amit K. / Datta, Subrata K. / Basu, Baidyanath et al. | 2018
- 5089
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RF Coupling and Beam-Wave Interaction Study in a Periodically Loaded ${X}$ -band 25-MW Gyro-TwystronSingh, Anshu Sharan / Thottappan, Muthiah et al. | 2018
- 5097
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A ${W}$ -Band Backward-Wave Oscillator Based on Planar Helix Slow Wave StructureAjith Kumar, M. M. / Aditya, Sheel / Wang, Shaomeng et al. | 2018
- 5103
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3-D Nonlinear Theory for Sheet-Beam Folded-Waveguide Traveling-Wave TubesLu, Fengying / Grieser, Manfred / Zhang, Changing / Wang, Yong et al. | 2018
- 5111
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A Novel Method of Discrete-Time Signal Amplification Using NEMS DevicesSankar, Sivaneswaran / Goel, Mayank / Baghini, Maryam Shojaei / Rao, V. Ramgopal et al. | 2018
- 5118
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High-Quality Reconfigurable Black Phosphorus p-n JunctionsTian, He / Li, Linsen / Mohammad, Mohammad Ali / Wang, Xuefeng / Yang, Yi / Ren, Tian-Ling et al. | 2018
- 5123
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Fabrication and Sensitivity Analysis of Guided Beam Piezoelectric Energy HarvesterSaxena, Shanky / Sharma, Ritu / Pant, B. D. et al. | 2018
- 5130
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Numerical Investigation of Short-Channel Effects in Negative Capacitance MFIS and MFMIS Transistors: Subthreshold BehaviorPahwa, Girish / Agarwal, Amit / Chauhan, Yogesh Singh et al. | 2018
- 5137
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Transient Variability in SOI-Based LIF Neuron and Impact on Unsupervised LearningDutta, Sangya / Bhattacharya, Tinish / Mohapatra, Nihar R. / Suri, Manan / Ganguly, Udayan et al. | 2018
- 5145
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First Demonstration of Vertically Stacked Gate-All-Around Highly Strained Germanium Nanowire pFETsCapogreco, E. / Witters, L. / Arimura, H. / Sebaai, F. / Porret, C. / Hikavyy, A. / Loo, R. / Milenin, A. P. / Eneman, G. / Favia, P. et al. | 2018
- 5151
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All-Electrical Control of a Hybrid Electron Spin/Valley Quantum Bit in SOI CMOS TechnologyBourdet, Leo / Hutin, Louis / Bertrand, Benoit / Corna, Andrea / Bohuslavskyi, Heorhii / Amisse, Anthony / Crippa, Alessandro / Maurand, Romain / Barraud, Sylvain / Urdampilleta, Matias et al. | 2018
- 5157
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Modeling Transient Negative Capacitance in Steep-Slope FeFETsObradovic, Borna / Rakshit, Titash / Hatcher, Ryan / Kittl, Jorge A. / Rodder, Mark S. et al. | 2018
- 5165
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3-D Sequential Stacked Planar Devices Featuring Low-Temperature Replacement Metal Gate Junctionless Top Devices With Improved ReliabilityVandooren, A. / Franco, J. / Parvais, B. / Wu, Z. / Witters, L. / Walke, A. / Li, W. / Peng, L. / Deshpande, V. / bufler, F. M. et al. | 2018
- 5172
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A Study on OTS-PCM Pillar Cell for 3-D Stackable MemoryChien, Wei-Chih / Yeh, Chiao-Wen / Bruce, Robert L. / Cheng, Huai-Yu / Kuo, I. T. / Yang, Chih-Hsiang / Ray, A. / Miyazoe, Hiroyuki / Kim, W. / Carta, Fabio et al. | 2018
- 5180
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Modeling, Simulation, Fabrication, and Characterization of a 10- $\mu$ W/cm2 Class Si-Nanowire Thermoelectric Generator for IoT ApplicationsTomita, Motohiro / Oba, Shunsuke / Himeda, Yuya / Yamato, Ryo / Shima, Keisuke / Kumada, Takehiro / Xu, Mao / Takezawa, Hiroki / Mesaki, Kohhei / Tsuda, Kazuaki et al. | 2018
- 5189
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From Memory to Sensor: Ultralow Power and High Selectivity Hydrogen Sensor Based on ReRAM TechnologyWei, Zhiqiang / Homma, Kazunari / Katayama, Koji / Kawai, Ken / Fujii, Satoru / Naitoh, Yasuhisa / Shima, Hisashi / Akinaga, Hiroyuki / Ito, Satoru / Yoneda, Shinichi et al. | 2018
- 5195
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Hot-Carrier Degradation in Power LDMOS: Drain Bias Dependence and Lifetime EvaluationTallarico, Andrea Natale / Reggiani, Susanna / Depetro, Riccardo / Manzini, Stefano / Torti, Andrea Mario / Croce, Giuseppe / Sangiorgi, Enrico / Fiegna, Claudio et al. | 2018
- 5199
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High-Source–Drain Voltage-Induced Reliability Issues of Sub-28-nm Node MOSFET’s Application in Resistive-Type Nonvolatile Memory ArrayChen, Bing / Cheng, Ran / Zhao, Yi et al. | 2018
- 5203
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AlGaN/GaN MIS-HEMT With AlN Interface Protection Layer and Trench Termination StructureYang, Chao / Luo, Xiaorong / Zhang, Anbang / Deng, Siyu / Ouyang, Dongfa / Peng, Fu / Wei, Jie / Zhang, Bo / Li, Zhaoji et al. | 2018
- 5208
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A Comprehensive Study of a Single-Transistor Latch in Vertical Pillar-Type FETs With Asymmetric Source and DrainLee, Seung-Wook / Kim, Seong-Yeon / Hwang, Kyu-Man / Jin, Ik Kyeong / Hur, Jae / Kim, Do-Hyun / Son, Jun Woo / Kim, Wu-Kang / Choi, Yang-Kyu et al. | 2018
- 5213
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A Full-Range Analytical Current Model for Heterojunction TFET With Dual Material GateGuan, Yunhe / Li, Zunchao / Zhang, Wenhao / Zhang, Yefei / Liang, Feng et al. | 2018
- 5218
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A Novel Lateral DMOS Transistor With H-Shape Shallow-Trench-Isolation StructureLiu, Siyang / Ye, Ran / Sun, Weifeng / Shi, Longxing et al. | 2018
- 5222
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Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices| 2018
- 5223
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- 5224
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