Metrology for Inclusive Growth of India — 1st ed. 2020. (English)
- New search for: Aswal, Dinesh K.
2020
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ISBN:
- Book / Electronic Resource
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Title:Metrology for Inclusive Growth of India
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Contributors:Aswal, Dinesh K. ( editor )
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Published in:
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Edition:1st ed. 2020.
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Publisher:
- New search for: Springer Singapore
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Place of publication:Singapore
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Publication date:2020
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Size:1 Online-Ressource(XXI, 1076 p. 498 illus., 442 illus. in color.)
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Remarks:Campusweiter Zugriff (Universität Hannover) - Vervielfältigungen (z.B. Kopien, Downloads) sind nur von einzelnen Kapiteln oder Seiten und nur zum eigenen wissenschaftlichen Gebrauch erlaubt. Keine Weitergabe an Dritte. Kein systematisches Downloaden durch Robots.
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ISBN:
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DOI:
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Type of media:Book
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Type of material:Electronic Resource
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Language:English
- New search for: 33.03 / 74.21
- Further information on Basic classification
- New search for: 530.8
- Further information on Dewey Decimal Classification
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Table of contents eBook
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Introduction: Metrology for All People for All TimeAswal, Dinesh K. et al. | 2020
- 2
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International Harmonization of MeasurementsYadav, Sanjay / Mandal, Goutam / Shivagan, Dilip D. / Sharma, Parag / Zafer, Afaqul / Aswal, Dinesh K. et al. | 2020
- 4
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Time and Frequency MetrologyVattikonda, Bharath / Das, Manoj / Bhardwaj, Trilok / Panja, Subhasis / Arora, Poonam / Gupta, Anurag / Aswal, D. K. et al. | 2020
- 6
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Physico-Mechanical MetrologyYadav, Sanjay / Sharma, Nita Dilawar / Titus, S. S. K. / Jaiswal, S. K. / Jaiswal, V. K. / Garg, Naveen / Bapna, Komal / Aswal, D. K. et al. | 2020
- 10
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Electrical and Electronics Metrology: From Quantum Standard to Applications in Industry and Strategic SectorsSomkuwar, Atul S. / Satish / Siwach, Praveen K. / Kumar, Ajeet / Shukla, Ajay K. / Kushvaha, Sunil S. / Rakshit, Rajib K. / Jain, Priyanka / Meena, R. S. / Sahoo, Sangeeta et al. | 2020
- 11
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Electromagnetic Metrology for Smart TechnologiesDubey, S. K. / Ahmad, Saood / Suman, C. K. / Patel, Sandhya M. / Husale, Sudhir / Reddy, Anurag G. / Gupta, Anurag / Aswal, D. K. et al. | 2020
- 13
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Metrology for Atmospheric EnvironmentSharma, Chhemendra / Mandal, Tuhin Kumar / Singh, Sachchidanand / Gupta, Govind / Kulshrestha, Monika J. / Johri, Prabha / Ranjan, Ashish / Upadhayaya, Arun Kumar / Das, Rupesh M. / Soni, Daya et al. | 2020
- 15
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Biomedical Metrology: Role in Nation’s Healthcare SectorRajesh / Gajjala, Sumana / Agrawal, Ved Varun / Aswal, D. K. et al. | 2020
- 16
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Materials Metrology and NanomaterialsDhakate, Sanjay R. / Singh, Bhanu P. / Gupta, Bipin Kumar / Kiran M. Subhedar / Vijaykumar Toutam / Srivastava, Sanjay K. / Kumar, Mahesh / Saini, Parveen / Kumar, Sushil / Prathap, P. et al. | 2020
- 17
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Advanced Materials for Strategic and Societal ApplicationsDhakate, Sanjay R. / Singh, Bhanu P. / Gupta, Bipin Kumar / Subhedar, Kiran M. / Srivastava, Sanjay Kumar / Saravanan, M. / Saini, Parveen / Kumar, Sushil / Prathap, P. / Kumari, Saroj et al. | 2020
- 18
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Bharatiya Nirdeshak Dravyas (BND®): Indian Certified Reference Materials.Pant, R. P. / Tripathy, S. Swarupa / Misra, D. K. / Singh, Vidya Nand / Gautam, Arvind / Vijayan, N. / Basheed, G. A. / Maurya, K. K. / Singh, S. P. / Singh, Nahar et al. | 2020
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Human Resources in Metrology for Skill IndiaSharma, Rina / Pulikkotil, J. J. / Singh, Nidhi / Aswal, D. K. et al. | 2020
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CSIR-NPL: Growth Driver for Effective Implementation of National PoliciesSharma, Nita Dilawar / Kumar, Sushil / Senguttuvan, T. D. / Sharma, Anjali / Pulikkotil, Jiji Thomas / Ragam Rao, S. / Chadha, Deepti / Singh, Nahar / Sengar, Anuradha / Aswal, D. K. et al. | 2020