Assessing the stability of p+ and n+ polysilicon passivating contacts with various capping layers on p-type wafers (English)
Free access
- New search for: Madumelu, Chukwuka
- New search for: Cai, Yalun
- New search for: Hollemann, Christina
- New search for: Peibst, Robby
- New search for: Hoex, Bram
- New search for: Hallam, Brett J..
- New search for: Soeriyadi, Anastasia H..
- New search for: Madumelu, Chukwuka
- New search for: Cai, Yalun
- New search for: Hollemann, Christina
- New search for: Peibst, Robby
- New search for: Hoex, Bram
- New search for: Hallam, Brett J..
- New search for: Soeriyadi, Anastasia H..
2023
- Book / Electronic Resource
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Title:Assessing the stability of p+ and n+ polysilicon passivating contacts with various capping layers on p-type wafers
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Contributors:Madumelu, Chukwuka ( author ) / Cai, Yalun ( author ) / Hollemann, Christina ( author ) / Peibst, Robby ( author ) / Hoex, Bram ( author ) / Hallam, Brett J.. ( author ) / Soeriyadi, Anastasia H.. ( author )
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Publisher:
- New search for: Gottfried Wilhelm Leibniz Universität Hannover
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Place of publication:Hannover
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Publication date:2023
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Size:1 Online-Ressource
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DOI:
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Type of media:Book
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Type of material:Electronic Resource
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Language:English
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Source: