Interferometry XI / [Interferometry Conference]. Sponsored and publ. by SPIE, the International Society for Optical Engineering ; 1: Techniques and analysis (English)
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2002
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ISBN:
- Conference Proceedings / Print
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Title:Interferometry XI / [Interferometry Conference]. Sponsored and publ. by SPIE, the International Society for Optical Engineering ; 1: Techniques and analysis
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Contributors:
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Conference:Interferometry Conference ; 11 ; 2002 ; San Diego, Calif.
Conference on Interferometric Techniques and Analysis ; 2002 ; San Diego, Calif. -
Published in:SPIE proceedings series ; 4777
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Publisher:
- New search for: SPIE
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Place of publication:Bellingham, Wash.
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Publication date:2002
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Size:XII, 426 S
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Remarks:Ill., graph. Darst
Literaturangaben -
ISBN:
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Type of media:Conference Proceedings
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Type of material:Print
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Language:English
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Source:
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Quantitative Zernike phase-contrast microscopy by use of structured birefringent pupil-filters and phase-shift evaluationTotzeck, Michael / Kerwien, Norbert / Tavrov, Alexander V. / Rosenthal, Eva / Tiziani, Hans J. et al. | 2002
- 1
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Quantitative Zernike phase-contrast microscopy by use of structured birefringent pupil-filters and phase-shift evaluation [4777-03]Totzeck, M. / Kerwien, N. / Tavrov, A. V. / Rosenthal, E. / Tiziani, H. J. / SPIE et al. | 2002
- 12
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Task-based assessment of phase-shifting interferometer/ellipsometerRogala, Eric W. et al. | 2002
- 12
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Task-based assessment of phase-shifting interferometer/ellipsometer [4777-05]Rogala, E. W. / SPIE et al. | 2002
- 27
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Histogram equalization of Young's fringes in speckle photography [4777-06]Singh, T. / Vikram, C. S. / SPIE et al. | 2002
- 27
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Histogram equalization of Young's fringes in speckle photographySingh, Tushar / Vikram, Chandra S. et al. | 2002
- 31
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Interferometer design for writing Bragg gratings in optical fibersde Groot, Peter J. / Colonna de Lega, Xavier / Dawson, Jay W. / MacDougall, Trevor W. / Lu, Minfu / Troll, John R. et al. | 2002
- 31
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Interferometer design for writing Bragg gratings in optical fibers [4777-07]de Groot, P. J. / de Lega, X. C. / Dawson, J. W. / MacDougall, T. W. / Lu, M. / Troll, J. R. / SPIE et al. | 2002
- 39
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Technique for surface reconstruction using colored fringe patterns [4777-08]Skydan, O. A. / Lalor, M. J. / Burton, D. R. / SPIE et al. | 2002
- 39
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Technique for surface reconstruction using colored fringe patternsSkydan, Oleksandr A. / Lalor, Michael J. / Burton, David R. et al. | 2002
- 49
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Coaxial type of self-mixing interferometer equipped with a wavelength stabilizing systemSuzuki, Takamasa / Irisawa, Tsutomu / Yokoyama, Kazuhiro / Sasaki, Osami et al. | 2002
- 49
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Coaxial type of self-mixing interferometer equipped with a wavelength stabilizing system [4777-09]Suzuki, T. / Irisawa, T. / Yokoyama, K. / Sasaki, O. / SPIE et al. | 2002
- 57
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Digital complex holography using a shearing interferometer: principles and early resultsAlbertazzi, Armando / Vieira Fantin, Analucia et al. | 2002
- 57
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Digital complex holography using a shearing interferometer: principles and early results (Invited Paper) [4777-10]Albertazzi, A. / Fantin, A. V. / SPIE et al. | 2002
- 69
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Aperture synthesis in digital holographyKreis, Thomas M. / Adams, Mike / Jueptner, Werner P. O. et al. | 2002
- 69
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Aperture synthesis in digital holography [4777-11]Kreis, T. M. / Adams, M. / Juptner, W. P. O. / SPIE et al. | 2002
- 77
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Sensitivity, accuracy, and precision issues in opto-electronic holography based on fiber optics and high-spatial- and high-digitial-resolution camerasFurlong, Cosme / Yokum, Jeffrey S. / Pryputniewicz, Ryszard J. et al. | 2002
- 77
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Sensitivity, accuracy, and precision issues in opto-electronic holography based on fiber optics and high-spatial- and high-digital-resolution cameras [4777-12]Furlong, C. / Yokum, J. S. / Pryputniewicz, R. J. / SPIE et al. | 2002
- 85
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Quasi-real-time digital holographic interferometryPasko, Slawomir / Sutkowski, Marek / Kujawinska, Malgorzata et al. | 2002
- 85
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Quasi-real-time digital holographic interferometry [4777-13]Pasko, S. / Sutkowski, M. / Kujawinska, M. / SPIE et al. | 2002
- 90
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White-light interferometry via an endoscope [4777-14]Lindner, M. W. / SPIE et al. | 2002
- 90
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White-light interferometry via an endoscopeLindner, Michael W. et al. | 2002
- 102
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White-light interferometry with reference signal [4777-15]Schmit, J. / Olszak, A. G. / McDermed, S. D. / SPIE et al. | 2002
- 102
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White-light interferometry with reference signalSchmit, Joanna / Olszak, Artur G. / McDermed, Shawn D. et al. | 2002
- 110
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Synthetic spatial coherence function for optical tomography and profilometry: simultaneous realization of longitudinal coherence scan and phase shift [4777-16]Duan, Z. H. / Gokhler, M. / Rosen, J. / Kozaki, H. / Ishii, N. / Takeda, M. / SPIE et al. | 2002
- 110
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Synthetic spatial coherence function for optical tomography and profilometry: simultaneous realization of longitudinal coherence scan and phase shiftDuan, Zhihui / Gokhler, Mark / Rosen, Joseph / Kozaki, Hirokazu / Ishii, Nobuo / Takeda, Mitsuo et al. | 2002
- 118
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Challenges in white-light phase-shifting interferometry [4777-17]Schmit, J. / Olszak, A. G. / SPIE et al. | 2002
- 118
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Challenges in white-light phase-shifting interferometrySchmit, Joanna / Olszak, Artur G. et al. | 2002
- 128
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Compensation for phase change on reflection in white-light scanning interferometryPark, Min-Cheol / Kang, MinGu / Kim, Seung-Woo et al. | 2002
- 128
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Compensation for phase change on reflection in white-light scanning interferometry [4777-18]Park, M.-C. / Kang, M. / Kim, S.-W. / SPIE et al. | 2002
- 136
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Digital demodulation algorithm for white-light fiber optic interferometric sensors [4777-19]Miridonov, S. V. / Shlyagin, M. G. / Khomenko, A. V. / Spirin, V. V. / SPIE et al. | 2002
- 136
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Digital demodulation algorithm for white-light fiber optic interferometric sensorsMiridonov, Serguei V. / Shlyagin, Mikhail G. / Khomenko, Anatolii V. / Spirin, Vasilii V. et al. | 2002
- 143
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High-precision optical metrology system for the SMART-2 mission as precursor for the DARWIN satellite constellation (Invited Paper) [4777-20]Haupt, C. / Kudielka, K. H. / Fischer, E. / Johann, U. / SPIE et al. | 2002
- 143
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High-precision optical metrology system for the SMART-2 mission as precursor for the DARWIN satellite constellationHaupt, Christoph / Kudielka, Klaus H. / Fischer, Edgar / Johann, Ulrich et al. | 2002
- 159
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Advances in digital speckle radiography [4777-21]Grantham, S. G. / Field, J. E. / SPIE et al. | 2002
- 159
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Advances in digital speckle radiographyGrantham, Stephen G. / Field, John E. et al. | 2002
- 168
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Numerical phase front propagation for the laser interferometer space antenna [4777-22]Papalexandris, M. V. / Waluschka, E. / SPIE et al. | 2002
- 168
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Numerical phase front propagation for the laser interferometer space antennaPapalexandris, Miltiadis V. / Waluschka, Eugene et al. | 2002
- 177
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Optical thickness measurement of substrates using a transmitted wavefront test at two wavelengths to average out multiple reflection errorsde Groot, Peter J. et al. | 2002
- 177
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Optical thickness measurement of substrates using a transmitted wavefront test at two wavelengths to average out multiple reflection errors [4777-24]de Groot, P. J. / SPIE et al. | 2002
- 184
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Three-dimensional step-height measurement using Mirau-type spectral interference microscope with acousto-optic tunable filter as frequency scanning deviceMehta, Dalip S. / Saito, Shohei / Hinosugi, Hideki / Takeda, Mitsuo / Kurokawa, Takashi et al. | 2002
- 184
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Three-dimensional step-height measurement using Mirau-type spectral interference microscope with acousto-optic tunable filter as frequency scanning device [4777-25]Mehta, D. S. / Saito, S. / Hinosugi, H. / Takeda, M. / Kurokawa, T. / SPIE et al. | 2002
- 194
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3Lambda-metrology [4777-26]Pfortner, A. / Schwider, J. / SPIE et al. | 2002
- 194
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Three-lambda metrologyPfoertner, Andreas / Schwider, Johannes et al. | 2002
- 202
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Twin-rainbow metrologyAdler, Charles L. / Lock, James A. / Keating, Brian R. et al. | 2002
- 202
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Twin-rainbow metrology [4777-27]Adler, C. L. / Lock, J. A. / Keating, B. R. / SPIE et al. | 2002
- 212
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Improved algorithms for wavelength scanning interferometry: application to the simultaneous measurement of surface topography and optical thickness variation in a transparent parallel plate [4777-28]Hibino, K. / Oreb, B. F. / Fairman, P. S. / SPIE et al. | 2002
- 212
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Improved algorithms for wavelength scanning interferometry: application to the simultaneous measurement of surface topography and optical thickness variation in a transparent parallel plateHibino, Kenichi / Oreb, Bozenko F. / Fairman, Philip S. et al. | 2002
- 220
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Some metrological issues in optical full-field techniquesSurrel, Yves et al. | 2002
- 220
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Some metrological issues in optical full-field techniques (Invited Paper) [4777-29]Surrel, Y. / SPIE et al. | 2002
- 232
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CMOS-ESPI system with in-line digital phase stabilization using unresolved specklesHelmers, Heinz / Carl, Daniel D. / Sievers, Thorsten et al. | 2002
- 232
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CMOS-ESPI system with in-line digital phase stabilization using unresolved speckles [4777-30]Helmers, H. / Carl, D. D. / Sievers, T. / SPIE et al. | 2002
- 242
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Scaled multisensor inspection of extended surfaces for industrial quality controlKayser, Daniel / Bothe, Thorsten / Osten, Wolfgang et al. | 2002
- 242
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Scaled multisensor inspection of extended surfaces for industrial quality control [4777-31]Kayser, D. / Bothe, T. / Osten, W. / SPIE et al. | 2002
- 251
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New adaptive phase-shifting algorithm for temporal phase evaluationRuiz, Pablo D. / Kaufmann, Guillermo H. / Huntley, Jonathan M. et al. | 2002
- 251
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New adaptive phase-shifting algorithm for temporal phase evaluation [4777-32]Ruiz, P. D. / Kaufmann, G. H. / Huntley, J. M. / SPIE et al. | 2002
- 259
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Noncontinuous fringe pattern demodulation using a digital phase-locked loop algorithm [4777-33]Gdeisat, M. A. / Burton, D. R. / Lalor, M. J. / SPIE et al. | 2002
- 259
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Noncontinuous fringe pattern demodulation using a digital phase-locked loop algorithmGdeisat, Munther A. / Burton, David R. / Lalor, Michael J. et al. | 2002
- 271
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Speckle noise reduction in quantitative optical metrology techniques by application of the discrete wavelet transformation [4777-34]Furlong, C. / Pryputniewicz, R. J. / SPIE et al. | 2002
- 271
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Speckle noise reduction in quantitative optical metrology techniques by application of the discrete wavelet transformationFurlong, Cosme / Pryputniewicz, Ryszard J. et al. | 2002
- 279
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Evaluation of the continuous wavelet transform method for phase measurement in digital speckle pattern interferometry [4777-35]Federico, A. / Kaufmann, G. H. / SPIE et al. | 2002
- 279
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Evaluation of the continuous wavelet transform method for phase measurement in digital speckle pattern interferometryFederico, Alejandro / Kaufmann, Guillermo H. et al. | 2002
- 288
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Phase unwrapping of subsampled phase-shifted interferogramsMunoz, Jesus / Paez, Gonzalo / Strojnik, Marija et al. | 2002
- 288
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Phase unwrapping of subsampled phase-shifted interferograms [4777-36]Munoz, J. / Paez, G. / Strojnik, M. / SPIE et al. | 2002
- 300
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Improved hybrid phase unwrapping algorithm in speckle interferometry [4777-37]Schwarz, O. / SPIE et al. | 2002
- 300
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Improved hybrid phase unwrapping algorithm in speckle interferometrySchwarz, Oliver et al. | 2002
- 311
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Interferometer for testing in vibration environments [4777-57]Freischlad, K. R. / Eng, R. / Hadaway, J. B. / SPIE et al. | 2002
- 311
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Interferometer for testing in vibration environmentsFreischlad, Klaus R. / Eng, Ron / Hadaway, James B. et al. | 2002
- 323
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In-line optical surface roughness determination by laser scanning (Invited Paper) [4777-38]Toker, G. / Brunfeld, A. / Shamir, J. / Spektor, B. / Cromwell, E. F. / Adam, J. F. / SPIE et al. | 2002
- 323
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In-line optical surface roughness determination by laser scanningToker, Gregory / Brunfeld, Andrei / Shamir, Joseph / Spektor, Boris / Cromwell, Evan F. / Adam, Johann F. et al. | 2002
- 330
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Inspection of subwavelength structures and zero-order gratings using polarization interferometry (Invited Paper) [4777-39]Totzeck, M. / Tavrov, A. V. / Kerwien, N. / Tiziani, H. J. / SPIE et al. | 2002
- 330
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Inspection of subwavelength structures and zero-order gratings using polarization interferometryTotzeck, Michael / Tavrov, Alexander V. / Kerwien, Norbert / Tiziani, Hans J. et al. | 2002
- 345
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High-resolution surface feature evaluation using multiwavelength optical transforms [4777-40]Spektor, B. / Toker, G. / Shamir, J. / Friedman, M. / Brunfeld, A. / SPIE et al. | 2002
- 345
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High-resolution surface feature evaluation using multiwavelength optical transformsSpektor, Boris / Toker, Gregory / Shamir, Joseph / Friedman, Michael / Brunfeld, Andrei et al. | 2002
- 352
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Alternating grazing incidence dark-field scanning optical microscopy for dimensional measurementsBodermann, Bernd / Michaelis, Wilfried / Diener, Alexander / Mirande, Werner et al. | 2002
- 352
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Alternating grazing incidence dark-field scanning optical microscopy for dimensional measurements [4777-41]Bodermann, B. / Michaelis, W. / Diener, A. / Mirande, W. / SPIE et al. | 2002
- 362
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Polarization-dependent effects on phase singularities in the vicinity of sub-lambda structuresEberler, Manfred / Quabis, Susanne / Dorn, Ralf / Leuchs, Gerd et al. | 2002
- 362
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Polarization-dependent effects on phase singularities in the vicinity of sub-Lambda structures [4777-42]Eberler, M. / Quabis, S. / Dorn, R. / Leuchs, G. / SPIE et al. | 2002
- 371
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Optical processing for the detection of faults in interferometric patternsKallmeyer, Frank / Krueger, Sven / Wernicke, Guenther K. / Gruber, Hartmut / Demoli, Nazif / Osten, Wolfgang / Kayser, Daniel et al. | 2002
- 371
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Optical processing for the detection of faults in interferometric patterns [4777-43]Kallmeyer, F. / Krueger, S. / Wernicke, G. K. / Gruber, H. / Demoli, N. / Osten, W. / Kayser, D. / SPIE et al. | 2002
- 382
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Correlative stitching interferometer and its key techniquesYu, Yingjie / Chen, Mingyi et al. | 2002
- 382
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Correlative stitching interferometer and its key techniques [4777-46]Yu, Y. J. / Chen, M. Y. / SPIE et al. | 2002
- 394
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Fiber optic diffraction interferometer for testing spherical mirrors [4777-47]Kihm, H. Y. / Kim, S.-W. / SPIE et al. | 2002
- 394
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Fiber optic diffraction interferometer for testing spherical mirrorsKihm, Hagyong / Kim, Seung-Woo et al. | 2002
- 401
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Super-heterodyning phase measurement for heterodyne interferometry [4777-50]Kim, M.-S. / Lee, J.-Y. / Kim, S.-W. / SPIE et al. | 2002
- 401
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Super-heterodyning phase measurement for heterodyne interferometryKim, Min Seok / Lee, Jun Young / Kim, Seung-Woo et al. | 2002
- 409
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Novel C/T technique in LDA System [4777-51]Li, C. X. / Zhang, Y. F. / Liu, C. W. / Wang, S. K. / Liu, J. / SPIE et al. | 2002
- 409
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Novel C/T technique in LDA SystemLi, Chongxiang / Zhang, Yan F. / Liu, Chang W. / Wang, Shikang / Liu, Jie et al. | 2002
- 415
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Novel heterometer for measuring surface roughness [4777-55]Wu, Z. X. / Ren, R. / Li, Z. Q. / SPIE et al. | 2002
- 415
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Novel heterometer for measuring surface roughnessWu, Zhaoxia / Ren, Rui / Li, Zhiquan et al. | 2002
- 420
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Interferometric method to characterize thermal elongation of near-field optics probesLa Rosa, Andres H. / Biehler, Bjorn / Sinharay, Arijit / Hallen, Hans D. et al. | 2002
- 420
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Interferometric method to characterize thermal elongation of near-field optics probes [4777-56]La Rosa, A. H. / Biehler, B. / Sinharay, A. / Hallen, H. D. / SPIE et al. | 2002