Electrical and structural properties of p‐n junctions in cw laser annealed silicon (English)
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- New search for: Maier, M.
- New search for: Bimberg, D.
- New search for: Fernholz, G.
- New search for: Baumgart, H.
- New search for: Phillipp, F.
- New search for: Maier, M.
- New search for: Bimberg, D.
- New search for: Fernholz, G.
- New search for: Baumgart, H.
- New search for: Phillipp, F.
In:
Journal of Applied Physics
;
53
, 8
;
5904-5907
;
1982
- Article (Journal) / Electronic Resource
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Title:Electrical and structural properties of p‐n junctions in cw laser annealed silicon
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Contributors:Maier, M. ( author ) / Bimberg, D. ( author ) / Fernholz, G. ( author ) / Baumgart, H. ( author ) / Phillipp, F. ( author )
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Published in:Journal of Applied Physics ; 53, 8 ; 5904-5907
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Publisher:
- New search for: American Institute of Physics
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Publication date:1982-08-01
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 53, Issue 8
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2761
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Magnetic ptopertiec of a non-stoichiometrie Zn-Mn-Fe spinelStadnik, Z.M. / Kawai, I. et al. | 1984
- 5377
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Quantitative study of recurrence in Korteweg de Vries systemsWedding, Berthold / Ja¨ger, Dieter et al. | 1982
- 5382
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Thermodynamic limits to the conversion of blackbody radiation by quantum systemsBuoncristiani, A. M. / Byvik, C. E. / Smith, B. T. et al. | 1982
- 5387
-
On hyperfine frequency shifts caused by buffer gases: Application to the optically pumped passive rubidium frequency standardVanier, J. / Kunski, R. / Cyr, N. / Savard, J. Y. / Teˆtu, M. et al. | 1982
- 5392
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A generalized model of photothermal radiometryTom, Roderick D. / O’Hara, Ellen P. / Benin, David et al. | 1982
- 5401
-
Theoretical and experimental studies of electron deposition in thin targetsPeugnet, C. / Bailly‐Salins, R. / Devin, A. / Duborgel, B. / Gouard, Ph. / Fedotoff, M. et al. | 1982
- 5408
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Generation of a cold, intense relativistic electron beam using a magnetized foilless diodeSheffield, R. L. / Montgomery, M. D. / Parker, J. V. / Riepe, K. B. / Singer, S. et al. | 1982
- 5414
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Operating characteristics of a magnetically insulated reflex ion diodeStrobel, George L. et al. | 1982
- 5420
-
Time domain photoacoustic relaxation measurements: Vibrational energy transfer for HD in v = 4, 5, and 6Rohlfing, Eric A. / Gelfand, Jack / Miles, Richard B. et al. | 1982
- 5427
-
Absolute experimental cross sections for the electron impact single, double, triple, and quadruple ionization of Cs+ ionsHertling, D. R. / Feeney, R. K. / Hughes, D. W. / Sayle II, W. E. et al. | 1982
- 5435
-
Electron momentum modulation by the stimulated Cerenkov interactionKimura, W. D. et al. | 1982
- 5440
-
A diagnostic for intense focused proton beams using the 11B (p,α)2α reactionMiyamoto, S. / Ozaki, T. / Imasaki, K. / Higaki, S. / Nakai, S. / Yamanaka, C. et al. | 1982
- 5444
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Observation of microscopic distribution of magnetic fields by electron holographyMatsuda, Tsuyoshi / Tonomura, Akira / Zuzuki, Ryo / Endo, Junji / Osakabe, Nobuyuki / Umezaki, Hiroshi / Tanabe, Hideo / Sugita, Yutaka / Fujiwara, Hideo et al. | 1982
- 5447
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A study of cathode edge emissionZhao, Yong‐xiang et al. | 1982
- 5453
-
Madey’s gain‐spread theorem for the free‐electron laser and the theory of stochastic processesKrinsky, S. / Wang, J. M. / Luchini, P. et al. | 1982
- 5459
-
Saturation effects in three‐level laser systems with constant lossReuven, Yakir / Baer, Michael et al. | 1982
- 5469
-
Improved performance of a ballast resistance helical transversely excited CO2 laser with water vapor and low ionization potential additives instead of heliumNath, A. K. / Biswas, D. J. et al. | 1982
- 5471
-
Thermal behavior of NdP5O14 lasersChinn, S. R. / Zwicker, W. K. / Colak, S. et al. | 1982
- 5479
-
An iterative solution to Chandrasekhar X and Y equations for isotropic scatteringCaldwell, J. et al. | 1982
- 5484
-
GeO2‐ZnO‐K2O glass as the cladding material of 940‐cm−1 CO2 laser‐light transmitting hollow‐core waveguideHidaka, T. / Kumada, K. / Shimada, J. / Morikawa, T. et al. | 1982
- 5491
-
Single‐crystal CsBr infrared fibersMimura, Y. / Okamura, Y. / Ota, C. et al. | 1982
- 5498
-
Analysis of thermal phase noise in fiber‐optic sensorsSeiler, Milton R. / Leach, Eugene R. et al. | 1982
- 5509
-
Measurements of acoustic properties for thin filmsKushibiki, Jun‐ichi / Maehara, Hiroyuki / Chubachi, Noriyoshi et al. | 1982
- 5514
-
Shear modulus gradients in adhesive interfaces as determined by means of ultrasonic Rayleigh waves (II)Knollman, G. C. / Hartog, J. J. et al. | 1982
- 5518
-
Shear waves and ’’internal viscosity’’ in cylindrical gelsNossal, R. / Jolly, M. et al. | 1982
- 5526
-
Radiative cooling with selectively infrared‐emitting ammonia gasLushiku, E. M. / Hjortsberg, A. / Granqvist, C. G. et al. | 1982
- 5531
-
Plasma etching of sputtered Mo and MoSi2 thin films in NF3 gas mixturesChow, T. P. / Steckl, A. J. et al. | 1982
- 5541
-
The influence of molecular nitrogen upon plasma channel formation by laser resonance saturationMeasures, R. M. / Wong, S. K. / Cardinal, P. G. et al. | 1982
- 5552
-
The dynamics of imploding argon plasmasClark, W. / Richardson, R. / Brannon, J. / Wilkinson, M. / Katzenstein, J. et al. | 1982
- 5557
-
Calculation of sparking potentials in industrially important insulating electronegative gasesGovinda Raju, G. R. / Hackam, R. et al. | 1982
- 5565
-
Stability of glow dischargeWasserstrom, E. / Crispin, Y. et al. | 1982
- 5578
-
Enhanced photoemission from fluorine atoms in SF6 and CF4 arc dischargeMatsuzawa, Hidenori / Suganomata, Shinji et al. | 1982
- 5584
-
Homogeneous electric field threshold switching phenomena in a multiplexible bistable liquid crystal displayCheng, Julian et al. | 1982
- 5596
-
Computer molecular‐dynamics studies of grain‐boundary structures. I. Observations of coupled sliding and migration in a three‐dimensional simulationBishop, George H. / Harrison, Ralph J. / Kwok, Thomas / Yip, Sidney et al. | 1982
- 5609
-
Computer molecular dynamics simulation studies of grain‐boundary structures. II. Migration, sliding, and annihilation in a two‐dimensional solidBishop, George H. / Harrison, Ralph J. / Kwok, Thomas / Yip, Sidney et al. | 1982
- 5617
-
The wavelength modulation spectrum of ion‐implanted siliconLue, J. T. / Shaw, S. Y. et al. | 1982
- 5621
-
The material state of ion‐implanted Cr in GaAsPronko, P. P. / Rai, A. K. / Holland, O. W. / Appleton, B. R. / Narayan, J. et al. | 1982
- 5630
-
Hydrogen content of a variety of plasma‐deposited silicon nitridesChow, Ray / Lanford, W. A. / Ke‐Ming, Wang / Rosler, Richard S. et al. | 1982
- 5634
-
CO2 laser annealing of siliconNaukkarinen, K. / Tuomi, T. / Blomberg, M. / Luomaja¨rvi, M. / Rauhala, E. et al. | 1982
- 5641
-
Ion channeling in GaAs: Be, Mg, Zn, and Cd, and calculations of electronic stopping powersWilson, R. G. et al. | 1982
- 5645
-
Dislocation‐free zone model of fracture comparison with experimentsOhr, S. M. / Chang, S.‐J. et al. | 1982
- 5652
-
Shear waves in soft gels with fixed rectangular boundariesAyant, Y. / Durand, M. / Geissler, E. / Hecht, A. M. et al. | 1982
- 5660
-
Determination of dynamic fracture parameters for HF‐1 steelMock, Willis / Holt, William H. et al. | 1982
- 5669
-
X‐ray diffraction from high pressure Ge using synchrotron radiationBaublitz, M. / Ruoff, A. L. et al. | 1982
- 5672
-
Grain‐boundary diffusion in some Pb‐Sn alloysOberschmidt, J. / Kim, K. K. / Gupta, D. et al. | 1982
- 5678
-
Diffusion in intermetallic compound with the CaF2 structureD'heurle, F. / Petersson, S. / Stolt, L. / Strizker, B. et al. | 1982
- 5678
-
Diffusion in intermetallic compounds with the CaF2 structure: A marker study of the formation of NiSi2 thin filmsd’Heurle, F. / Petersson, S. / Stolt, L. / Strizker, B. et al. | 1982
- 5682
-
An analysis of solitons in surface acoustic wave devicesEwen, J. F. / Gunshor, R. L. / Weston, V. H. et al. | 1982
- 5689
-
Diffusion controlled ledge growth in a medium of finite extentAtkinson, C. et al. | 1982
- 5697
-
Properties of CdTe‐Te alloy films prepared using molecular beamsMyers, T. H. / Waltner, A. W. / Schetzina, J. F. et al. | 1982
- 5703
-
Characterization of NbSi2 thin filmsRude, Curtiss D. / Chow, T. Paul / Steckl, Andrew J. et al. | 1982
- 5710
-
Quantum efficiency of internal photoeffects in narrow‐gap semiconductor: A modelScharoch, Pawel / Szatkowski, Jan / Pawlikowski, Janusz M. et al. | 1982
- 5715
-
Transient capacitance studies of an electron trap at Ec−ET = 0.105 eV in phosphorus‐doped siliconJellison, G. E. et al. | 1982
- 5720
-
Defect production and lifetime control in electron and γ‐irradiated siliconBrotherton, S. D. / Bradley, P. et al. | 1982
- 5733
-
Influence of carbon and oxygen on donor formation at 700 °C in Czochralski‐grown siliconOhsawa, Akira / Takizawa, Ritsuo / Honda, Kouichirou / Shibatomi, Akihiro / Ohkawa, Shinzi et al. | 1982
- 5738
-
Deep levels in In0.53Ga0.47 As/InP heterostructuresForrest, S. R. / Kim, O. K. et al. | 1982
- 5746
-
Improved varistor nonlinearity via donor impurity dopingCarlson, W. G. / Gupta, T. K. et al. | 1982
- 5754
-
Degradation mechanism of zinc oxide varistors under dc biasHayashi, Masahiko / Haba, Masanori / Hirano, Shinji / Okamoto, Masako / Watanabe, Misuzu et al. | 1982
- 5763
-
Thermally stimulated currents in polyethylene irradiated by γ rays at low temperatureLapke, G. / Schmidt, W. F. / Rabe, J. G. et al. | 1982
- 5771
-
Effects of stoichiometry on thermal stability of undoped, semi‐insulating GaAsTa, L. B. / Hobgood, H. M. / Rohatgi, A. / Thomas, R. N. et al. | 1982
- 5776
-
Geometrical effects in contact resistance measurements: Finite element modeling and experimental resultsNatan, M. / Purushothaman, S. / Dobrowolski, R. et al. | 1982
- 5783
-
Barrier heights of sputter deposited Fe contacts to n and p siliconKoshy, J. et al. | 1982
- 5785
-
Rutherford backscattering analysis of electroless gold contacts on cadmium tellurideMancini, A. M. / Quirini, A. / Vasanelli, L. / Perillo, E. / Rosato, E. / Spadaccini, G. / Barbarino, E. et al. | 1982
- 5789
-
Plasma‐enhanced chemical vapor deposited SiO2/InP interfaceWager, J. F. / Wilmsen, C. W. et al. | 1982
- 5798
-
Self‐field effects in superconductor‐normal metal‐superconductor junctionsNagata, Shoichi / Yang, H. C. / Finnemore, D. K. et al. | 1982
- 5802
-
Effect of boundary conditions upon the phase distribution in two‐ dimensional Josephson junctionsBarone, A. / Esposito, F. / Likharev, K. K. / Semenov, V. K. / Todorov, B. N. / Vaglio, R. et al. | 1982
- 5810
-
Ne´el walls and line transitions in a (100) garnet filmKryder, M. H. / Gallagher, T. J. / Scranton, R. A. et al. | 1982
- 5815
-
Charged wall formation and propagation analysis in ion‐implanted contiguous disk bubble devicesHidaka, Y. et al. | 1982
- 5823
-
Dielectric heatingRoss, David et al. | 1982
- 5828
-
Electrical breakdown of insulators by one‐carrier impact ionizationKlein, N. et al. | 1982
- 5840
-
Electrical breakdown of aluminum oxide films flanked by metallic electrodesKlein, N. / Albert, M. et al. | 1982
- 5840
-
Electrical breakdown of aluminium oxide films by metallic electrodesKlein, N. / Albert, M. et al. | 1982
- 5851
-
Infrared studies of isothermal annealing of ion‐implanted silicon: Refractive indices, regrowth rates, and carrier profilesWaddell, C. N. / Spitzer, W. G. / Hubler, G. K. / Fredrickson, J. E. et al. | 1982
- 5863
-
Refractive indices of III–V compounds: Key properties of InGaAsP relevant to device designAdachi, Sadao et al. | 1982
- 5870
-
Raman spectra from Si and Sn implanted GaAsNakamura, T. / Katoda, T. et al. | 1982
- 5873
-
Treatment of thermostimulated luminescence, phosphorescence, and photostimulated luminescence with a tunneling theoryChang, I. F. / Thioulouse, P. et al. | 1982
- 5876
-
Luminescence study of a deep level in N‐free GaP light‐emitting diodesNishizawa, J. / Jin, C. C. / Suto, K. / Koike, M. et al. | 1982
- 5882
-
Coupling of pulsed 0.35‐μm laser radiation to titanium alloysRosen, D. I. / Hastings, D. E. / Weyl, G. M. et al. | 1982
- 5882
-
Coupling of pulsed 0.35 mym laser radiation to titanium alloysRosen, D.I. / Hastings, D.E. / Weyl, G.M. et al. | 1982
- 5891
-
Emission characteristics of single‐crystal LaB6 electron gunTakigawa, T. / Sasaki, I. / Meguro, T. / Motoyama, K. et al. | 1982
- 5898
-
Growth of eutectic thin film structuresCline, H. E. et al. | 1982
- 5904
-
Electrical and structural properties of p‐n junctions in cw laser annealed siliconMaier, M. / Bimberg, D. / Fernholz, G. / Baumgart, H. / Phillipp, F. et al. | 1982
- 5908
-
Carbon tetrachloride plasma etching of GaAs and InP: A kinetic study utilizing nonperturbative optical techniquesGottscho, Richard A. / Smolinsky, Gerald / Burton, Randolph H. et al. | 1982
- 5920
-
Particle deposition in a burnerGourdin, William H. / Andrejco, Matthew J. et al. | 1982
- 5926
-
On the cause of the flat‐spot phenomenon observed in silicon solar cells at low temperatures and low intensitiesWeizer, V. G. / Broder, J. D. et al. | 1982
- 5931
-
Current and magnetic field penetration into a plasma: Application to high power‐density flow in transmission linesBaker, Louis et al. | 1982
- 5936
-
Stray magnetic coupling between neighboring superconducting memory cells in dense arrays of Josephson interferometersJaeckel, H. / Moore, D. F. et al. | 1982
- 5947
-
Interfacial layer‐thermionic‐diffusion theory for the Schottky barrier diodeWu, Ching‐Yuan et al. | 1982
- 5951
-
Normally‐on and normally‐off camel diode gate GaAs field effect transistors for large scale integrationThorne, R. E. / Su, S. L. / Kopp, W. / Fischer, R. / Drummond, T. J. / Morkoc¸, H. et al. | 1982
- 5959
-
Bragg reflection of millimeter waves by a corrugated ferrite slabTsutsumi, Makoto / Kumagai, Nobuaki et al. | 1982
- 5964
-
Comment on ‘‘Thermocouple temperature measurements in shock‐compressed solids’’Rosenberg, Z. / Partom, Y. et al. | 1982
- 5966
-
Reply to ‘‘Comment on ‘Thermocouple Temperature measurements in shock‐compressed solids’ ’’Bloomquist, D. D. / Sheffield, S. A. et al. | 1982
- 5968
-
The determination of grain‐boundary recombination rates by scanned spot excitation methodsSeager, C. H. et al. | 1982
- 5972
-
Chromium and iron impurities in liquid encapsulated Czochralski gallium arsenideClegg, J. B. et al. | 1982
- 5975
-
Transmission electron microscope study of ion and electron beam induced structural changes in a‐Ge0.25 Se0.75 inorganic resist thin filmsBalasubramanyam, K. / Chen, L. J. / Ruoff, A. L. / Wolf, E. D. et al. | 1982
- 5979
-
Experimental investigation of magnetostatic surface wave amplification in GaAs‐yttrium iron garnet layered structureYamada, S. / Chang, N. S. / Matsuo, Y. et al. | 1982
- 5982
-
Determination of optimum load for a solar cellKothari, L. S. / Mathur, P. C. / Kapoor, Avinashi / Saxena, P. / Sharma, R. P. et al. | 1982
- 5985
-
Addendum: New model of electron free path in multiple layers for Monte Carlo simulationHawryluk, R. J. / Hawryluk, A. M. / Smith, H. I. et al. | 1982
- 5986
-
Erratum: Argon‐oxygen interaction in rf sputtering glow discharges [J. Appl. Phys. 52, 6584 (1981)]Aita, C. R. / Marhic, M. E. et al. | 1982
- R81
-
Electron channeling patterns in the scanning electron microscopeJoy, David C. / Newbury, Dale E. / Davidson, David L. et al. | 1982