γ-Al2O3 by Au 4f7/2-referenced XPS and XAES (English)
- New search for: Lippitz, A.
- New search for: Boese, O.
- New search for: Kemnitz, E.
- New search for: Unger, W. E. S.
- New search for: Lippitz, A.
- New search for: Boese, O.
- New search for: Kemnitz, E.
- New search for: Unger, W. E. S.
In:
Surface Science Spectra
;
8
, 3
;
214-219
;
2001
- Article (Journal) / Electronic Resource
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Title:γ-Al2O3 by Au 4f7/2-referenced XPS and XAES
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Contributors:
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Published in:Surface Science Spectra ; 8, 3 ; 214-219
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Publisher:
- New search for: American Vacuum Society
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Publication date:2001-07-01
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Size:6 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 8, Issue 3
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 163
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Analysis of Poly(amino acids) by Static Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)Samuel, Newton T. / Wagner, M. S. / Dornfeld, K. D. / Castner, David G. et al. | 2001
- 185
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Characterization of the Surface of Powder by XPSSchmitz, Peter J. et al. | 2001
- 190
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Characterization of the Surface of BaCO3 Powder by XPSSchmitz, Peter J. et al. | 2001
- 195
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Characterization of the Surface of Powder by XPSSchmitz, Peter J. et al. | 2001
- 200
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Manganese Dioxide by XPSMilitello, Maria C. / Gaarenstroom, Stephen W. et al. | 2001
- 207
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Lithium Manganese Oxide by XPSMilitello, Maria C. / Gaarenstroom, Stephen W. et al. | 2001
- 214
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γ-Al2O3 by Au 4f7/2-referenced XPS and XAESLippitz, A. / Boese, O. / Kemnitz, E. / Unger, W. E. S. et al. | 2001
- 220
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(0001) by XPSKanama, Daisuke / Oyama, S. Ted / Otani, Shigeki / Cox, David F. et al. | 2001
- 225
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CrO2 by XPS: Comparison of CrO2 Powder to CrO2 Films on TiO2(110) Single Crystal SurfacesBullen, Heather A. / Garrett, Simon J. et al. | 2001
- 234
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Thin Films Characterized by XPSBarreca, Davide / Battiston, Giovanni A. / Berto, Davide / Gerbasi, Rosalba / Tondello, Eugenio et al. | 2001
- 240
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Chemical Vapor Deposited Thin Films Analyzed by XPSBarreca, Davide / Battiston, Giovanni A. / Berto, Davide / Gerbasi, Rosalba / Tondello, Eugenio et al. | 2001