Temperature‐dependent x‐ray photoemission studies of metastable Co/polyimide interface formation (English)
- New search for: Anderson, Steven G.
- New search for: Meyer, H. M.
- New search for: Weaver, J. H.
- New search for: Anderson, Steven G.
- New search for: Meyer, H. M.
- New search for: Weaver, J. H.
In:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
;
6
, 4
;
2205-2212
;
1988
- Article (Journal) / Electronic Resource
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Title:Temperature‐dependent x‐ray photoemission studies of metastable Co/polyimide interface formation
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Additional title:Temperature‐dependent x‐ray photoemission studies
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Contributors:
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Published in:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films ; 6, 4 ; 2205-2212
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Publisher:
- New search for: American Vacuum Society
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Publication date:1988-07-01
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Size:8 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 6, Issue 4
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2175
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Semiconductor/polyimide interface formation: An x‐ray photoelectron spectroscopy study of germanium chemical bondingAtanasoska, Lj. / Meyer, H. M. / Anderson, Steven G. / Weaver, J. H. et al. | 1988
- 2182
-
Reflection extended x‐ray absorption fine‐structure measurements on Ni/C and NixSiy/C multilayered reflection coatingsvan Brug, H. / van der Wiel, M. J. / van der Pol, R. / Verhoeven, J. / van der Laan, G. / Goedkoop, J. B. et al. | 1988
- 2188
-
Complex formation and growth at the Cr– and Cu–polyimide interfaceHaight, R. / White, R. C. / Silverman, B. D. / Ho, P. S. et al. | 1988
- 2200
-
The microstructure of metal–polyimide interfacesLeGoues, F. K. / Silverman, B. D. / Ho, P. S. et al. | 1988
- 2205
-
Temperature‐dependent x‐ray photoemission studies of metastable Co/polyimide interface formationAnderson, Steven G. / Meyer, H. M. / Weaver, J. H. et al. | 1988
- 2213
-
Argon and oxygen sputter etching of polystyrene, polypropylene, and poly(ethylene terephthalate) thin filmsGrant, J. L. / Dunn, D. S. / McClure, D. J. et al. | 1988
- 2221
-
The radiation chemistry of poly(methyl methacrylate) polymer resistsLehockey, E. M. / Reid, I. / Hill, I. et al. | 1988
- 2226
-
X‐ray photoelectron and Auger electron spectroscopy studies of photochemical vapor deposition silicon nitridesPadmanabhan, R. / Saha, N. C. et al. | 1988
- 2232
-
Surface characterization of various graphites by x‐ray photoelectron, secondary ion mass, and Raman spectroscopiesAshida, K. / Kanamori, K. / Watanabe, K. et al. | 1988
- 2238
-
State identification of GaAs(1̄1̄1̄) oxidized surfaces by an x‐ray photoemission decomposition methodGomez‐Goñi, J. / Muñoz, M. C. / Lopez de Ceballos, I. / Sacedon, J. L. et al. | 1988
- 2243
-
Secondary ion mass spectrometry quantification of Be in AlxGa1−xAs/GaAs multilayer structuresGao, Y. / Harmand, J. C. et al. | 1988
- 2248
-
Positron annihilation spectroscopy of AlGaAs/GaAs interfaces in metalorganic chemical vapor deposition grown GaAs heterojunction solar cellsDeWald, A. B. / Frost, R. L. / Ringel, S. A. / Schaffer, J. P. / Rohatgi, A. / Nielsen, B. / Lynn, K. G. et al. | 1988
- 2253
-
Calibration of Auger spectra and equilibrium surface composition in a dilute copper–gold alloyHoffmann, M. A. / Bronner, S. W. / Wynblatt, P. et al. | 1988
- 2260
-
X‐ray photoelectron spectroscopy, scanning Auger microprobe, and scanning electron microscopy study of the Ti–6Al–4V surface irradiated with a pulsed Nd:YAG laser in airHagans, Patrick L. / DeKoven, Benjamin M. et al. | 1988
- 2265
-
Relative elemental sensitivity factors in secondary neutral mass spectrometryWucher, A. / Novak, F. / Reuter, W. et al. | 1988
- 2271
-
Quantitative depth profile and bulk analysis with high dynamic range by electron gas sputtered neutral mass spectrometryJede, R. / Peters, H. / Dünnebier, G. / Ganschow, O. / Kaiser, U. / Seifert, K. et al. | 1988
- 2280
-
A method for rapid collection of high‐energy‐resolution Auger electron spectroscopy data: The digital‐derivative‐generation techniqueGilbert, Richard E. / Hoflund, Gar B. / Asbury, Douglas A. / Davidson, Mark R. et al. | 1988
- 2287
-
Calculation of postionization probabilities as a function of plasma parameters in electron gas secondary neutral mass spectrometryWucher, A. et al. | 1988
- 2293
-
Plasma studies on the Leybold–Heraeus INA3 secondary neutral mass spectrometry systemWucher, A. et al. | 1988
- 2299
-
NbN thin films reactively sputtered with a high‐field direct‐current magnetronDeen, M. J. / Landheer, D. / Wade, J. D. / Sproule, G. I. / Denhoff, M. D. et al. | 1988
- 2304
-
Effect of radio‐frequency‐induced substrate biasing on the microstructure of palladium filmsSullivan, Brian T. / Parsons, R. R. et al. | 1988
- 2307
-
Structure and properties of sputtered carbon overcoats on rigid magnetic media disksTsai, Hsiao‐chu / Bogy, D. B. / Kundmann, M. K. / Veirs, D. K. / Hilton, M. R. / Mayer, S. T. et al. | 1988
- 2316
-
Angular distribution of particles sputtered from metals and alloysWucher, A. / Reuter, W. et al. | 1988
- 2319
-
Physicochemical properties in tungsten films deposited by radio‐frequency magnetron sputteringCollot, P. / Agius, B. / Estrache, P. / Hugon, M. C. / Froment, M. / Bessot, J. / Crassin, Y. et al. | 1988
- 2326
-
Effects of oxygen pressure in reactive ion beam sputter deposition of zirconium oxidesYoshitake, Masaaki / Takiguchi, Katsumi / Suzuki, Yoshihiko / Ogawa, Soichi et al. | 1988
- 2333
-
Plastic flow in ion‐assisted deposition of refractory metalsWindow, B. / Sharples, F. / Savvides, N. et al. | 1988
- 2341
-
Structure of chromium thin films prepared by plasma depositionAgarwal, Vandna / Vankar, V. D. / Chopra, K. L. et al. | 1988
- 2344
-
Hollow cathode discharge deposition of titanium with substrate biasYoon, H.‐J. / Carter, W. B. / Moriyama, K. et al. | 1988
- 2348
-
An electron cyclotron resonance plasma deposition technique employing magnetron mode sputteringTakahashi, Chiharu / Kiuchi, Mikiho / Ono, Toshiro / Matsuo, Seitaro et al. | 1988
- 2353
-
Mercury lamp induced molybdenum depositionKovall, G. A. / Matthews, J. C. / Solanki, R. et al. | 1988
- 2356
-
Molecular‐beam epitaxially grown spatial light modulators with charge‐coupled‐device addressingGoodhue, W. D. / Burke, B. E. / Aull, B. F. / Nichols, K. B. et al. | 1988
- 2361
-
Synthesis and structure of chromium nitride films by evaporation in an ammonia plasmaAgarwal, Vandna / Vankar, V. D. / Chopra, K. L. et al. | 1988
- 2366
-
Coevaporation of Cr–Cu and Mo–AgKim, J. / Wen, S. H. / Yee, D. et al. | 1988
- 2371
-
Analytical and numerical modeling of columnar evolution in thin filmsSrolovitz, D. J. / Mazor, A. / Bukiet, B. G. et al. | 1988
- 2381
-
Effects of thermal annealing on superconducting Nb and NbN filmsHatano, M. / Nishino, T. / Kawabe, U. et al. | 1988
- 2386
-
Determining optical properties of thin films by modified attenuated total reflection with a charge coupled deviceWilson, P. W. et al. | 1988
- 2390
-
Theory of ripple topography induced by ion bombardmentBradley, R. Mark / Harper, James M. E. et al. | 1988
- 2396
-
Ion bombardment and titanium film growth on polyimideBodö, P. / Sundgren, J.‐E. et al. | 1988
- 2403
-
Ion mixing of Ti and TiOy films on SiOxGaluska, A. A. / Uht, J. C. / Adams, P. M. / Coggi, J. M. et al. | 1988
- 2410
-
On the surface modification of oxygen‐exposed molybdenum during sputteringSaidoh, Masahiro / Yamada, Reiji et al. | 1988
- 2415
-
The degradation of fluorine doped tin oxide films in a hydrogen plasmaMajor, S. / Bhatnagar, M. C. / Kumar, S. / Chopra, K. L. et al. | 1988
- 2421
-
Reduction of outgassing from stainless‐steel surfaces by glow discharge cleaningItoh, A. / Ishikawa, Y. / Kawabe, T. et al. | 1988
- 2426
-
Displacement of CO by more weakly adsorbed hydrogen on the Ni(100) surfaceGland, John L. / Shen, Shikong / Zaera, Francisco / Fischer, Dan A. et al. | 1988
- 2431
-
Photon and electron beam induced chemical solubility changes in amorphous P–Ge–Se thin filmsKumar, Ajay / Malhotra, L. K. / Chopra, K. L. et al. | 1988
- 2434
-
Simulation of surface evolution during ion bombardmentKatardjiev, I. V. et al. | 1988
- 2443
-
Precision modeling of the mask–substrate evolution during ion etchingKatardjiev, I. V. / Carter, G. / Nobes, M. J. / Smith, R. et al. | 1988
- 2451
-
Characteristics of Penning ionization gauge type compact microwave metal ion sourceYoshida, Yoshikazu / Ohnishi, Teruhito / Hirofuji, Yuichi et al. | 1988
- 2457
-
Phosphorus liquid metal ion source using a Pt–P–Sb alloyUmemura, K. / Madokoro, Y. / Shukuri, S. / Ohnishi, T. / Ishitani, T. et al. | 1988
- 2462
-
Sliding and thermal effects on sulfur segregation to palladium alloy contact surfacesLloyd, J. N. / Vook, R. W. / Pope, L. E. et al. | 1988
- 2467
-
Sliding and thermal effects on sulfur segregation to gold alloy contact surfacesLloyd, J. N. / Vook, R. W. / Pope, L. E. et al. | 1988
- 2474
-
Microstructural and electrical properties of gadolinium silicideYoun, Chang‐joo / Jungling, Kenneth / Grannemann, W. W. et al. | 1988
- 2482
-
Kinetic ellipsometry study of the hydrogen plasma etching of hydrogenated amorphous silicon filmsGodet, C. / Drevillon, B. et al. | 1988
- 2490
-
On the stability of a tip and flat at very small separationsPethica, J. B. / Sutton, A. P. et al. | 1988
- 2495
-
Highly dispersed heterogeneous catalysts by physical vapor depositionBucher, J. P. / Flüeli, M. / van der Klink, J. J. et al. | 1988
- 2499
-
The anodic vacuum arc. II. Experimental study of arc plasmaEhrich, H. / Hasse, B. / Müller, K. G. / Schmidt, R. et al. | 1988
- 2504
-
Particulate contamination in atomic and molecular‐beam deposition systemsMatteson, S. / Bowling, R. A. et al. | 1988
- 2508
-
Measurement of the effective pressure distribution in axial direction in a dynamic vacuum systemSharma, J. K. N. / Sharma, D. R. et al. | 1988
- 2514
-
Static gas analysis by a transient flow techniqueLeckey, J. H. / Boeckmann, M. D. et al. | 1988
- 2518
-
Development of a new type of oil‐free turbo vacuum pumpMase, M. / Gyoubu, I. / Nagaoka, T. / Taniyama, M. et al. | 1988
- 2522
-
Stepped linear piston displacement fundamental leak calibration systemThornberg, Steven M. et al. | 1988
- 2528
-
Room‐temperature pumping characteristics of a Zr–Al nonevaporable getter for individual gasesBenvenuti, C. / Francia, F. et al. | 1988
- 2535
-
A further exploration of an important factor affecting the pumping performance of turbomolecular pumpsTu, J. Y. / Yang, N. H. / Pang, S. J. / Zu, Y. et al. | 1988
- 2541
-
Absorption/desorption of hydrogen isotopes and isotopic waters by Zr‐alloy gettersIchimura, Kenji / Matsuyama, Masao / Watanabe, Kuniaki / Takeuchi, Toyosaburo et al. | 1988
- 2546
-
GAMMA 10 vacuum system and study of wall conditionsYatsu, K. / Nakashima, Y. / Moriyama, S. / Cho, T. / Ichimura, M. / Imai, Y. / Inutake, M. / Miyoshi, S. / Yamaguchi, N. et al. | 1988
- 2552
-
Fabrication of large‐diameter, high‐aspect‐ratio glass microballoon targets for laser fusion researchNorimatsu, T. / Tajima, H. / Takagi, M. / Nakai, S. / Yamanaka, C. et al. | 1988
- 2556
-
High‐speed pellet injection with a two‐stage pneumatic gunReggiori, A. / Carlevaro, R. / Riva, G. / Daminelli, G. B. / Scaramuzzi, F. / Frattolillo, A. / Martinis, L. / Cardoni, P. / Mori, L. et al. | 1988
- 2559
-
Low‐density resorcinol–formaldehyde aerogels for direct‐drive laser inertial confinement fusion targetsHair, L. M. / Pekala, R. W. / Stone, R. E. / Chen, C. / Buckley, S. R. et al. | 1988
- 2564
-
Hα studies on the Tokamak Fusion Test ReactorHeifetz, D. H. / Ehrhardt, A. B. / Ramsey, A. T. / Dylla, H. F. / Budny, R. / McNeill, D. / Medley, S. / Ulrickson, M. et al. | 1988
- 2568
-
Vacuum‐assisted contaminated‐particulate removalWatson, W. et al. | 1988
- 2570
-
The use of surface profilometers for the measurement of wafer curvatureThomas, M. E. / Hartnett, M. P. / McKay, J. E. et al. | 1988
- 2572
-
Analysis of area‐ratio effect for radio‐frequency diodeKaufman, H. R. / Rossnagel, S. M. et al. | 1988
- 2574
-
A modified sample introduction system for the Perkin–Elmer 545 scanning Auger microprobePotter, T. J. / Baird, R. J. et al. | 1988
- 2575
-
Auger analyzer translation using ball bushingsReuter, M. C. / Tromp, R. M. et al. | 1988
- 2576
-
Reduction of charging effects in Auger electron spectroscopyWei, William et al. | 1988
- 2582
-
Improved ion source for use with oxygenGuarnieri, C. Richard / Ramanathan, K. V. / Yee, D. S. / Cuomo, J. J. et al. | 1988
- 2583
-
Construction of pierced hemispherical gridsTaylor, Patrick A. et al. | 1988
- 2584
-
Ultrahigh vacuum leak sealing with a silicon resin productEgelhoff, William F. et al. | 1988
- 2586
-
Data acquisition system for an electron beam welderMilewski, J. O. / Dixon, R. D. et al. | 1988
- 2597
-
Electronic structure and stability of II–VI semiconductors and their alloys: The role of metal d bandsWei, S.‐H. / Zunger, Alex et al. | 1988
- 2612
-
Nuclear magnetic resonance studies of II–VI semiconductor alloysZamir, D. / Beshah, K. / Becla, P. / Wolff, P. A. / Griffin, R. G. / Zax, D. / Vega, S. / Yellin, N. et al. | 1988
- 2614
-
Electrical studies of single‐barrier Hg1−xCdxTe heterostructuresChow, D. H. / McCaldin, J. O. / Bonnefoi, A. R. / McGill, T. C. / Sou, I. K. / Faurie, J. P. / Shirland, F. A. / Wu, O. K. et al. | 1988
- 2619
-
Resonant tunneling in HgCdTe heterostructuresReed, M. A. / Koestner, R. J. / Goodwin, M. W. / Schaake, H. F. et al. | 1988
- 2623
-
Mercury cadmium telluride junctions grown in situ by molecular‐beam epitaxyBoukerche, M. / Yoo, S. / Sou, I. K. / De Souza, M. / Faurie, J. P. et al. | 1988
- 2627
-
Properties of substitutionally doped Cd1−xMnxTe films and Cd1−xMnxTe–CdTe quantum well structuresHarper, R. L. / Hwang, S. / Giles, N. C. / Bicknell, R. N. / Schetzina, J. F. / Lee, Y. R. / Ramdas, A. K. et al. | 1988
- 2631
-
Interdiffusion study of HgTe–HgCdTe superlattice. I. Low‐temperature Auger sputter depth profilingCirlin, Eun‐Hee / Ireland, Philip / Buckingham, Steve / Wu, Owen et al. | 1988
- 2637
-
Low‐temperature Auger depth profile study of HgCdTe double‐layer heterojunctionCirlin, Eun‐Hee / Buckingham, Steve / Ireland, Philip / Rosbeck, Joe / Crosson, Carol et al. | 1988
- 2640
-
Summary Abstract: Natural band lineups in II–VI compound semiconductors and their alloys: A study using core level photoemission measurement in the alloyShih, C. K. / Wahi, A. K. / Lindau, I. / Spicer, W. E. et al. | 1988
- 2643
-
Phase diagrams and microscopic structures of (Hg,Cd)Te, (Hg,Zn)Te, and (Cd,Zn)Te alloysPatrick, R. S. / Chen, A.‐B. / Sher, A. / Berding, M. A. et al. | 1988
- 2650
-
Diffusion studies in the Hg1−xCdxTe systemTang, Mei‐Fan S. / Stevenson, David A. et al. | 1988
- 2655
-
Dark current generation mechanisms and spectral noise current in long‐wavelength infrared photodiodesDeWames, R. E. / Pasko, J. G. / Yao, E. S. / Vanderwyck, A. H. B. / Williams, G. M. et al. | 1988
- 2664
-
Luminescence study of copper‐implanted and rapid‐thermal‐annealed cadmium tellurideJames, K. M. / Merz, J. L. / Jones, C. E. et al. | 1988
- 2670
-
Deep interstitial levels in Hg1−xCdxTeGoettig, S. / Morgan‐Pond, C. G. et al. | 1988
- 2675
-
Charge state splittings of deep levels in Hg1−xCdxTeMyles, Charles W. et al. | 1988
- 2681
-
Magneto‐optical spectra of donor impurities in Hg0.7Cd0.3TePerez, J. M. / Furneaux, J. E. / Wagner, R. J. et al. | 1988
- 2685
-
Metal–insulator–semiconductor properties of HgTe–CdTe superlatticesGoodwin, M. W. / Kinch, M. A. / Koestner, R. J. et al. | 1988
- 2693
-
Optical nonlinearity in Hg0.84Cd0.16Te and Hg0.97Mn0.03TeAuyang, S. Y. / Wolff, P. A. / Harris, K. A. / Cook, J. W. / Schetzina, J. F. et al. | 1988
- 2696
-
Optical nonlinearity due to resonant impurity scattering of electrons in HgCdSe:FeWolff, P. A. / Auyang, S. Y. / Galazka, R. R. / Mycielski, A. et al. | 1988
- 2699
-
Depth‐compositional analyses (angle‐resolved x‐ray photoelectron spectroscopy) of degradations on etched mercury cadmium tellurideSeelmann‐Eggebert, M. / Richter, H. J. et al. | 1988
- 2710
-
Admittance measurements of metal–insulator–semiconductor devices in p‐type HgCdTeNemirovsky, Y. / Bloom, I. et al. | 1988
- 2716
-
Electron transport and localization in HgCdTe metal–insulator semiconductor field effect transistorsPalm, E. C. / Szott, W. / Kobiela, P. S. / Kirk, W. P. / Schiebel, R. A. / Reed, M. A. et al. | 1988
- 2722
-
Electrical properties of CdTe metal–semiconductor field effect transistorsDreifus, D. L. / Kolbas, R. M. / Tassitino, J. R. / Harper, R. L. / Bicknell, R. N. / Schetzina, J. F. et al. | 1988
- 2725
-
HgMnTe light emitting diodes and laser heterostructuresBecla, P. et al. | 1988
- 2728
-
Light emission from HgCdTe diodesZucca, R. / Bajaj, J. / Blazejewski, E. R. et al. | 1988
- 2732
-
Interfacial reactions between (HgCd)Te and intermediate reactivity overlayersDavis, G. D. / Beck, W. A. / Kelly, M. K. / Kilday, D. G. / Mo, Y. W. / Margaritondo, G. et al. | 1988
- 2736
-
Use of low temperature to reduce intermixing at metal:HgCdTe contactsCarey, G. P. / Friedman, D. J. / Wahi, A. K. / Shih, C. K. / Spicer, W. E. et al. | 1988
- 2741
-
Diffusion barriers at mercury–cadmium–telluride/metal interfaces: The case of Hg1−xCdxTe(110)/Yb/AlRaisanen, A. / Wall, A. / Chang, S. / Philip, P. / Troullier, N. / Franciosi, A. / Peterman, D. J. et al. | 1988
- 2746
-
The electrical properties of metallic contacts on Hg1−xCdxTeSpicer, W. E. / Friedman, D. J. / Carey, G. P. et al. | 1988
- 2752
-
Interfacial deep‐level formation and its effect on band bending at metal/CdTe interfacesShaw, J. L. / Viturro, R. E. / Brillson, L. J. / Kilday, D. / Kelly, M. K. / Margaritondo, G. et al. | 1988
- 2757
-
Laser beam induced current imaging of surface nonuniformity at the HgCdTe/ZnS interfaceBajaj, J. / Tennant, W. E. / Newman, P. R. et al. | 1988
- 2760
-
Cyclotron resonance studies of metal–insulator–semiconductor HgCdTe capacitorsWaterman, J. R. / Perez, J. M. / Wagner, R. J. / Furneaux, J. E. / Schmidt, W. A. et al. | 1988
- 2765
-
The characterization of anodic fluoride films on Hg1−xCdxTe and their interfacesWeiss, Eliezer / Mainzer, Nili et al. | 1988
- 2772
-
Analysis of multiband conduction in HgTe by magnetic‐field‐dependent Hall techniquesBeck, W. A. / Crowne, F. / Anderson, J. R. / Gorska, M. / Dziuba, Z. et al. | 1988
- 2775
-
Magnetotransport and far‐infrared magneto‐optical studies of molecular‐beam epitaxially grown HgTeMeyer, J. R. / Hoffman, C. A. / Bartoli, F. J. / Perez, J. M. / Furneaux, J. E. / Wagner, R. J. / Koestner, R. J. / Goodwin, M. W. et al. | 1988
- 2779
-
Characterization of molecular‐beam epitaxially grown HgTe films by Shubnikov–de Haas measurementsJustice, R. J. / Seiler, D. G. / Zawadzki, W. / Koestner, R. J. / Goodwin, M. W. / Kinch, M. A. et al. | 1988
- 2785
-
Free‐carrier transport in HgTe/CdTe superlatticesHoffman, C. A. / Meyer, J. R. / Youngdale, E. R. / Lindle, J. R. / Bartoli, F. J. / Han, J. W. / Harris, K. A. / Cook, J. W. / Schetzina, J. F. et al. | 1988
- 2790
-
Band‐to‐band tunnel processes in HgCdTe: Comparison of experimental and theoretical studiesBlanks, D. K. / Beck, J. D. / Kinch, M. A. / Colombo, L. et al. | 1988
- 2795
-
Growth of Hg‐based alloys by the traveling heater methodColombo, L. / Chang, R. R. / Chang, C. J. / Baird, B. A. et al. | 1988
- 2800
-
Highly uniform, large‐area HgCdTe layers on CdTe and CdTeSe substratesBhat, Ishwara B. / Fardi, Hamid / Ghandhi, Sorab K. / Johnson, C. J. et al. | 1988
- 2804
-
Annealing and electrical properties of organometallic vapor phase epitaxy–interdiffused multilayer process grown HgCdTeWhiteley, J. S. / Koppel, P. / Conger, V. L. / Owens, K. E. et al. | 1988
- 2808
-
Excimer laser‐assisted metalorganic vapor phase epitaxy of CdTe and HgTe on (100) GaAsJensen, J. E. / Brewer, P. D. / Olson, G. L. / Tutt, L. W. / Zinck, J. J. et al. | 1988
- 2813
-
Molecular‐beam epitaxy of CdxHg1−xTe at D.LETI/LIRMillion, A. / Di Cioccio, L. / Gailliard, J. P. / Piaguet, J. et al. | 1988
- 2821
-
Properties of doped CdTe films grown by photoassisted molecular‐beam epitaxyHwang, S. / Harper, R. L. / Harris, K. A. / Giles, N. C. / Bicknell, R. N. / Cook, J. W. / Schetzina, J. F. / Chu, M. et al. | 1988
- 2826
-
Controlled p‐type impurity doping of Hg1−xCdxTe during growth by molecular‐beam epitaxyWroge, M. L. / Peterman, D. J. / Morris, B. J. / Leopold, D. J. / Broerman, J. G. / Feldman, B. J. et al. | 1988
- 2830
-
The doping of mercury cadmium telluride grown by molecular‐beam epitaxyBoukerche, M. / Wijewarnasuriya, P. S. / Sivananthan, S. / Sou, I. K. / Kim, Y. J. / Mahavadi, K. K. / Faurie, J. P. et al. | 1988
- 2834
-
Kinetics of molecular‐beam epitaxial HgCdTe growthKoestner, R. J. / Schaake, H. F. et al. | 1988