Calibrated work function mapping by Kelvin probe force microscopy (English)
- New search for: Fernández Garrillo, Pablo A.
- New search for: Grévin, Benjamin
- New search for: Chevalier, Nicolas
- New search for: Borowik, Łukasz
- New search for: Fernández Garrillo, Pablo A.
- New search for: Grévin, Benjamin
- New search for: Chevalier, Nicolas
- New search for: Borowik, Łukasz
In:
Review of Scientific Instruments
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89
, 4
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7
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2018
- Article (Journal) / Electronic Resource
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Title:Calibrated work function mapping by Kelvin probe force microscopy
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Additional title:Fernández Garrillo et al.
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Contributors:Fernández Garrillo, Pablo A. ( author ) / Grévin, Benjamin ( author ) / Chevalier, Nicolas ( author ) / Borowik, Łukasz ( author )
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Published in:Review of Scientific Instruments ; 89, 4 ; 7
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Publisher:
- New search for: AIP Publishing LLC
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Publication date:2018-04-01
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Size:7 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 89, Issue 4
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
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