Native defects in the AlxGa1−xSb alloy semiconductor (English)
National licence
- New search for: Ichimura, M.
- New search for: Higuchi, K.
- New search for: Hattori, Y.
- New search for: Wada, T.
- New search for: Kitamura, N.
- New search for: Ichimura, M.
- New search for: Higuchi, K.
- New search for: Hattori, Y.
- New search for: Wada, T.
- New search for: Kitamura, N.
In:
Journal of Applied Physics
;
68
, 12
;
6153-6158
;
1990
- Article (Journal) / Electronic Resource
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Title:Native defects in the AlxGa1−xSb alloy semiconductor
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Contributors:Ichimura, M. ( author ) / Higuchi, K. ( author ) / Hattori, Y. ( author ) / Wada, T. ( author ) / Kitamura, N. ( author )
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Published in:Journal of Applied Physics ; 68, 12 ; 6153-6158
-
Publisher:
- New search for: American Institute of Physics
-
Publication date:1990-12-15
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ISSN:
-
DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 68, Issue 12
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 5963
-
Canonical aberration theory in electron opticsXimen, Jiye et al. | 1990
- 5968
-
Canonical aberration theory in electromagnetic multipolesXimen, Jiye et al. | 1990
- 5976
-
Dependence of luminescence in five membered heterocyclic conducting polymers on molecular structure and temperatureYoshino, Katsumi / Manda, Yasuhisa / Takahashi, Hiroyuki / Nishioka, Yoshinori / Kawai, Tsuyoshi / Ohmori, Yutaka / Onoda, Mitsuyoshi et al. | 1990
- 5981
-
Collision‐induced resonant amplification of electromagnetic waves by electrons in circular orbitsFelsteiner, J. / Rosenberg, A. et al. | 1990
- 5985
-
Foil focusing of electron beamsFernsler, R. F. / Hubbard, R. F. / Slinker, S. P. et al. | 1990
- 5995
-
Electromagnetic induction (eddy currents) in a conducting half‐space in the absence and presence of inhomogeneities: A new formalismNair, Satish M. / Rose, James H. et al. | 1990
- 6010
-
Radiation from a disk and loop of charge in a cylindrical pipe with multiple step changes in wall radiusPham, Tan / Schill, Robert A. et al. | 1990
- 6024
-
Second‐order nonlinearity of a novel diazo‐dye‐attached polymerAmano, Michiyuki / Kaino, Toshikuni et al. | 1990
- 6029
-
First design and characterization of HgZnTe optical waveguidesAzema, A. / Gaucherel, P. / Roustan, J. C. / Granger, R. / Triboulet, R. et al. | 1990
- 6033
-
Field analysis of the Cerenkov doubling of infrared coherent radiation utilizing an organic crystal core bounded by a glass capillaryHayata, K. / Yanagawa, K. / Koshiba, M. et al. | 1990
- 6044
-
On the saturation of Tb phosphors under cathode‐ray excitation. I. Excited‐state absorption in Tb‐activated phosphor powdersNieuwesteeg, K. J. B. M. / Raue, R. / Busselt, W. et al. | 1990
- 6058
-
On the saturation of Tb phosphors under cathode‐ray excitation. II. Upconversion processes in the excited‐activator bathNieuwesteeg, K. J. B. M. / Raue, R. et al. | 1990
- 6066
-
Effect of magnetostatic field on the second‐order optical susceptibility of III‐V semiconductorsSen, P. / Sen, P. K. et al. | 1990
- 6072
-
Evaluation of friction‐welded aluminum‐steel bonds using dispersive guided modes of a layered substrateAdler, Laszlo / de Billy, Michel / Quentin, Gerard / Talmant, Maryline / Nagy, Peter B. et al. | 1990
- 6077
-
Laser ultrasonic monitoring of ceramic sinteringTelschow, K. L. / Walter, J. B. / Garcia, G. V. et al. | 1990
- 6083
-
Verification of the localized‐wave transmission effectZiolkowski, Richard W. / Lewis, D. Kent et al. | 1990
- 6087
-
Analysis of characteristic thermal transit times for time‐resolved infrared radiometry studies of multilayered coatingsAamodt, L. C. / Spicer, J. W. Maclachlan / Murphy, J. C. et al. | 1990
- 6099
-
Particle size statistics in dynamic fragmentationGrady, Dennis E. et al. | 1990
- 6106
-
Boundary‐condition refinement of the Child–Langmuir law for collisionless dc plasma sheathsFarouki, Rida T. / Dalvie, Manoj / Pavarino, Luca F. et al. | 1990
- 6117
-
Electron‐beam probe measurements of electric fields in rf dischargesSato, A. H. / Lieberman, M. A. et al. | 1990
- 6125
-
Pressure and frequency dependence of ion bombardment energy distributions from rf dischargesToups, M. F. / Ernie, D. W. et al. | 1990
- 6133
-
Grazing x‐ray reflection analysis of nanometric scale structuresBoher, Pierre / Houdy, Philippe / Schiller, Claude et al. | 1990
- 6143
-
Radiation‐induced charge trapping in implanted buried oxidesBrady, Frederick T. / Li, Sheng S. / Krull, Wade A. et al. | 1990
- 6149
-
Experimental study of the effect of the ion‐implanted dose on the resistance‐area product of Hg0.8Cd0.2Te n+p photodiodesCenteno, J. M. / Gonzalez, C. / Sangrador, J. / Rodriguez, T. et al. | 1990
- 6153
-
Native defects in the AlxGa1−xSb alloy semiconductorIchimura, M. / Higuchi, K. / Hattori, Y. / Wada, T. / Kitamura, N. et al. | 1990
- 6159
-
Effect of variations in water content on sub‐Tg aging of glassJewell, John M. / Shelby, James E. et al. | 1990
- 6170
-
Optically detected magnetic resonance of cubic SiC grown by chemical vapor deposition on SiKennedy, T. A. / Freitas, J. A. / Bishop, S. G. et al. | 1990
- 6174
-
Si incorporation in laser‐melted AlxGa1−xAs‐GaAs quantum well heterostructures from a dielectric sourceKish, F. A. / Hsieh, K. C. / Major, J. S. / Sugg, A. R. / Plano, W. E. / Baker, J. E. / Holonyak, N. et al. | 1990
- 6179
-
Implantation and diffusion of noble gas atoms during ion‐beam etching of siliconSawyer, W. D. / Weber, J. / Nabert, G. / Schma¨lzlin, J. / Habermeier, H.‐U. et al. | 1990
- 6187
-
Plasma properties of a hydrocarbon arcjet used in the plasma deposition of diamond thin filmsStalder, K. R. / Sharpless, R. L. et al. | 1990
- 6191
-
Transient diffusion of ion‐implanted B in Si: Dose, time, and matrix dependence of atomic and electrical profilesCowern, N. E. B. / Janssen, K. T. F. / Jos, H. F. F. et al. | 1990
- 6199
-
Si impurity‐induced layer disordering of Alx Ga1−x ‐GaAs quantum‐well heterostructures by As‐free open‐tube rapid thermal annealingMajor, J. S. / Kish, F. A. / Richard, T. A. / Sugg, A. R. / Baker, J. E. / Holonyak, N. et al. | 1990
- 6207
-
Interactions of Cu with CoSi2, CrSi2 and TiSi2 with and without TiNx barrier layersOlowolafe, J. O. / Li, Jian / Mayer, J. W. et al. | 1990
- 6213
-
Oxidation and formation mechanisms in disilicides: VSi2 and CrSi2, inert marker experiments and interpretationThomas, O. / Stolt, L. / Buaud, P. / Poler, J. C. / d’Heurle, F. M. et al. | 1990
- 6224
-
Shape‐memory properties in Ni‐Ti sputter‐deposited filmBusch, J. D. / Johnson, A. D. / Lee, C. H. / Stevenson, D. A. et al. | 1990
- 6229
-
Assessment of the structural quality of CdTe/Cd1−xZnxTe strained superlattices by high‐resolution x‐ray diffraction and photoluminescence studiesPonchet, A. / Lentz, G. / Tuffigo, H. / Magnea, N. / Mariette, H. / Gentile, P. et al. | 1990
- 6234
-
Surface‐force‐induced deformations of monodisperse polystyrene spheres on planar silicon substratesRimai, D. S. / DeMejo, L. P. / Bowen, R. C. et al. | 1990
- 6241
-
Characterization of rf‐sputtered SnOx thin films by electron microscopy, Hall‐effect measurement, and Mo¨ssbauer spectrometryStjerna, Bertil / Granqvist, Claes G. / Seidel, Agneta / Ha¨ggstro¨m, Lennart et al. | 1990
- 6246
-
Low‐temperature reaction of thin‐film platinum (≤300 A˚) with (100) siliconTsui, Bing‐Yue / Chen, Mao‐Chieh et al. | 1990
- 6253
-
Boron contamination and antimony segregation at the interface of directly bonded silicon wafersWiddershoven, F. P. / Haisma, J. / Naus, J. P. M. et al. | 1990
- 6259
-
Observation of recombination center‐assisted tunneling current in Al(Cu)‐penetrated PtSi Schottky barrier diodesBindal, A. / Wachnik, R. / Ma, W. et al. | 1990
- 6263
-
Hole transport in tri‐p‐tolylamine‐doped bisphenol‐A‐polycarbonateBorsenberger, P. M. et al. | 1990
- 6274
-
Semi‐insulating epitaxial GaAsCastenedo, R. / Mimila‐Arroyo, J. / Bourgoin, J. C. et al. | 1990
- 6279
-
Fluctuating deep‐level trap occupancy model for 1/f noise in semiconductor resistorsFolkes, P. A. et al. | 1990
- 6289
-
Electron‐optical‐phonon interaction in binary/ternary heterostructuresKim, K. W. / Stroscio, M. A. et al. | 1990
- 6293
-
Large nonlinear elastoresistivity of epitaxial thin silver filmsGaballa, H. E. / Juretschke, H. J. et al. | 1990
- 6299
-
Tunneling‐injection‐induced turnaround behavior of threshold voltage in thermally nitrided oxide n‐channel metal‐oxide‐semiconductor field‐effect transistorsMa, Z. J. / Lai, P. T. / Liu, Z. H. / Fleischer, S. / Cheng, Y. C. et al. | 1990
- 6304
-
Effects of oxidation conditions on electrical properties of SiC‐SiO2 interfacesZaima, S. / Onoda, K. / Koide, Y. / Yasuda, Y. et al. | 1990
- 6309
-
Electric microwave absorption for the study of GaAs/AlGaAs heterostructure systemsZappe, Hans P. / Jantz, Wolfgang et al. | 1990
- 6315
-
rf residual losses, surface impedance, and granularity in superconducting cupratesHalbritter, J. et al. | 1990
- 6327
-
Radiation effects in superconducting NbN/AlN multilayer filmsHerzog, R. / Weber, H. W. / Gray, K. E. / Kampwirth, R. T. / Miller, D. J. / Murduck, J. M. et al. | 1990
- 6331
-
Superconductivity and crystallinity of Ba2Y1Cu3O7−δ thin films prepared by pulsed laser deposition with substrate bias voltageIzumi, H. / Ohata, K. / Hase, T. / Suzuki, K. / Morishita, T. / Tanaka, S. et al. | 1990
- 6336
-
Characterization of the Ag/YBa2Cu3O7−x contact in thin filmsJia, Q. X. / Anderson, W. A. / Zheng, J. P. / Zhu, Y. Z. / Patel, S. / Kwok, H. S. / Shaw, D. T. et al. | 1990
- 6341
-
Analysis of orientation distribution in YBa2Cu3O7−x polycrystals by electron channeling patternsKang, W. J. / Yoshimi, K. / Hanada, S. / Saito, S. / Murayama, Y. / Hayashi, S. / Nagata, A. et al. | 1990
- 6347
-
Simultaneous dysprosium‐ and lead‐substituted high‐Tc superconductor bismuth cupratesSchieber, M. / Friedman, M. / Levinsky, M. / Zhou, B. L. / Gasga, J. Reyes / Van Tendeloo, G. / Amelinckx, S. et al. | 1990
- 6353
-
Optimization of annealing parameters for the growth of epitaxial Ba2YCu3O7−x films on LaAlO3(100)Siegal, Michael P. / Phillips, Julia M. / van Dover, R. B. / Tiefel, T. H. / Marshall, J. H. et al. | 1990
- 6361
-
A method for the measurement of the thermal, dielectric, and pyroelectric properties of thin pyroelectric films and their applications for integrated heat sensorsBauer, Siegfried / Ploss, Bernd et al. | 1990
- 6368
-
Charge‐to‐mass separation in a current coaxial lensBrown, I. G. / Kelly, J. C. et al. | 1990
- 6372
-
Site‐selection spectroscopy, energy transfer, and laser emission in Nd3+‐doped Ba2MgGe2O7Ferry, Michael J. / Kliewer, Michael L. / Reeves, Roger J. / Powell, Richard C. / Allik, Toomas H. et al. | 1990
- 6380
-
One‐dimensional hetero‐junction structure in polysilaneIsaka, Hiroaki / Matsumoto, Nobuo et al. | 1990
- 6383
-
Effects of trimethylantimonide/triethylgallium ratios on epilayer properties of gallium antimonide grown by low‐pressure metalorganic chemical vapor depositionJuang, F. S. / Su, Y. K. / Li, N. Y. / Gan, K. J. et al. | 1990
- 6388
-
Modulation effects near the GaAs absorption edgeTober, Richard L. / Bruno, John D. et al. | 1990
- 6393
-
Numerical modeling of the filament‐assisted diamond growth environmentGoodwin, D. G. / Gavillet, G. G. et al. | 1990
- 6401
-
The synthesis of high‐quality diamond in combustion flamesHirose, Yoichi / Amanuma, Shuji / Komaki, Kunio et al. | 1990
- 6406
-
Ion‐assisted doping of p‐CdTe filmsSharps, Paul / Fahrenbruch, Alan L. / Lopez‐Otero, Adolfo / Bube, Richard H. et al. | 1990
- 6415
-
GaAs pattern etching with little damage by a combination of Ga+focused‐ion‐beam irradiation and subsequent Cl2 gas etchingSugimoto, Y. / Taneya, M. / Akita, K. / Hidaka, H. et al. | 1990
- 6420
-
Thermal oxidation of reactively sputtered amorphous W80N20 filmsVu, Q. T. / Pokela, P. J. / Garden, C. L. / Kolawa, E. / Raud, S. / Nicolet, M‐A. et al. | 1990
- 6424
-
Silicon epitaxy by hot wall plasma enhanced chemical vapor depositionWilliams, L. M. / O’Hara, P. A. / Bohrer, M. P. et al. | 1990
- 6428
-
Influence of water vapor in the chemically excited oxygen flow generated from the reaction of Cl2 with alkaline H2O2Tokuda, T. / Fujii, N. / Yoshida, S. / Sawano, T. / Shimizu, K. / Tanaka, I. et al. | 1990
- 6434
-
Defect clustering in silicon emitter junctionsAndersson, Gert I. / Engstro¨m, Olof et al. | 1990
- 6442
-
Crystalline anisotropy and loss effects on magnetostatic waves in layered yttrium iron garnet filmsBuris, N. E. et al. | 1990
- 6447
-
A thyristor model of switching in metal‐thin insulator‐semiconductor‐semiconductor devices: The influence of insulating layer and illuminationChoi, W. K. / Owen, A. E. et al. | 1990
- 6453
-
Electro‐optic imaging of the internal fields in a GaAs photoconductive switchDonaldson, W. R. / Kingsley, L. / Weiner, M. / Kim, A. / Zeto, R. et al. | 1990
- 6458
-
Alloying of Ni/In/Ni/n‐GaAs ohmic contacts induced by Ga‐Ni‐As ternary eutectic reactionsJan, C.‐H. / Swenson, D. / Chang, Y. A. et al. | 1990
- 6463
-
Device modeling of ferroelectric capacitorsMiller, S. L. / Nasby, R. D. / Schwank, J. R. / Rodgers, M. S. / Dressendorfer, P. V. et al. | 1990
- 6472
-
Determination of proximity effect parameters in electron‐beam lithographyMisaka, Akio / Harafuji, Kenji / Nomura, Noboru et al. | 1990
- 6480
-
Magnetic refrigeration in the low‐temperature rangeTishin, A. M. et al. | 1990
- 6485
-
3D‐resolved determination of minority‐carrier lifetime in planar silicon solar cells by photocurrent decayVerhoef, L. A. / Stroom, J. C. / Bisschop, F. J. / Liefting, J. R. / Sinke, W. C. et al. | 1990
- 6495
-
Grain‐boundary interface electron traps in commercial zinc oxide varistorsWinston, R. A. / Cordaro, J. F. et al. | 1990
- 6501
-
An efficient self‐consistent model for resonant tunneling structuresAlam, Muhammad A. / Khondker, A. N. et al. | 1990
- 6504
-
Micromagnetic calculations of 180° surface domain‐wall magnetization profiles with comparison to measurementsBlue, James L. / Scheinfein, M. R. et al. | 1990
- 6507
-
Texture analysis of smooth in situ laser ablated YBa2Cu3O7 thin films on (100) SrTiO3Cillessen, J. F. M. / de Leeuw, D. M. / Kinneging, A. J. / Zalm, P. C. / Bongers, P. F. et al. | 1990
- 6510
-
Grain size dependence of the thermal conductivity of polycrystalline chemical vapor deposited β‐SiC at low temperaturesCollins, A. K. / Pickering, M. A. / Taylor, R. L. et al. | 1990
- 6513
-
Refractive indices of InGaAlAs grown by molecular beam epitaxyDe Bernardi, C. / Meliga, M. / Morasca, S. / Rigo, C. / Sordo, B. / Stano, A. et al. | 1990
- 6515
-
Determination of the elastic constants of a cobalt disilicide intermetallic compoundGue´nin, G. / Ignat, M. / Thomas, O. et al. | 1990
- 6517
-
Photoquenching phenomenon enhanced by proton irradiation in semi‐insulating GaAsKuriyama, K. / Takahashi, H. / Kawahara, H. / Hayashi, N. / Watanabe, H. / Sakamoto, I. / Kohno, I. et al. | 1990
- 6520
-
Observation of gold evaporated on graphite (00.1) cleaved surfacesKuwabara, M. / Smith, D. A. / Clarke, D. R. et al. | 1990
- 6523
-
Design and construction of 1064‐nm liquid‐crystal laser cavity end mirrorsLee, Jae‐Cheul / Jacobs, Stephen D. et al. | 1990
- 6526
-
Transient spectroscopy of deep levels in thin semiconductor filmsNg, K. / Chao, I.‐W. / Hunt, C. E. / Churchill, J. N. et al. | 1990
- 6529
-
All‐optical modulation using an n‐doped quantum‐well structureNoda, Susumu / Uemura, Tetsuya / Yamashita, Takao / Sasaki, Akio et al. | 1990
- 6532
-
Temperature dependence of boron neutralization in silicon by atomic hydrogenPankove, J. I. et al. | 1990
- 6535
-
Polarized memory effect in the device including the organic charge‐transfer complex, copper‐tetracyanoquinodimethaneSato, Chiaki / Wakamatsu, Seiichi / Tadokoro, Kaoru / Ishii, Kikujiro et al. | 1990
- 6538
-
Oxygen diffusion in carbon‐doped siliconWijaranakula, W. et al. | 1990