Preparation of a magneto‐optical disk using a rare earth–transition metal alloy target (English)
- New search for: Asari, S.
- New search for: Asaka, T.
- New search for: Ota, Y.
- New search for: Nakamura, K.
- New search for: Itoh, A.
- New search for: Asari, S.
- New search for: Asaka, T.
- New search for: Ota, Y.
- New search for: Nakamura, K.
- New search for: Itoh, A.
In:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
;
5
, 4
;
1949-1951
;
1987
- Article (Journal) / Electronic Resource
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Title:Preparation of a magneto‐optical disk using a rare earth–transition metal alloy target
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Additional title:Preparation of a magneto‐optical disk using a RE–TM alloy target
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Contributors:Asari, S. ( author ) / Asaka, T. ( author ) / Ota, Y. ( author ) / Nakamura, K. ( author ) / Itoh, A. ( author )
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Published in:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films ; 5, 4 ; 1949-1951
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Publisher:
- New search for: American Vacuum Society
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Publication date:1987-07-01
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Size:3 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 5, Issue 4
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 405
-
History of the International Union for Vacuum Science, Technique, and ApplicationsLafferty, J. M. et al. | 1987
- 419
-
Surface vibrational studies with electron energy‐loss spectroscopyIbach, H. et al. | 1987
- 424
-
Theory of H bonding and vibration on close‐packed metal surfacesFeibelman, Peter J. / Hamann, D. R. et al. | 1987
- 427
-
Time dependence of the infrared spectrum of N2 adsorbed at low coverage on the Ni(110) surfaceBrubaker, Mary E. / Malik, Igor J. / Trenary, Michael et al. | 1987
- 431
-
Vibrational excitation of physisorbed CO2 on a Ag(111) surfaceSakurai, M. / Okano, T. / Tuzi, Y. et al. | 1987
- 435
-
High‐resolution low‐energy electron reflection from W(100) using the electron energy‐loss spectrometer: A step towards quantitative analysis of surface vibrational spectraWoods, J. P. / Erskine, J. L. et al. | 1987
- 440
-
Structure and dynamics of periodic and randomly distributed surface features by high resolution helium atom scatteringToennies, J. Peter et al. | 1987
- 448
-
Simple approximation to thermal attenuation in low‐energy atom–surface scatteringManson, J. R. / Armand, G. et al. | 1987
- 452
-
Summary Abstract: Correlation of surface resonances with nondipole excitations of hydrogen on Pd surfacesConrad, H. / Kordesch, M. E. / Stenzel, W. / Sunjic, M. et al. | 1987
- 453
-
Summary Abstract: Vibrational modes of hydrogen adsorbed on Rh(100) and their relevance to desorption kineticsRichter, Lee J. / Ho, W. et al. | 1987
- 454
-
Summary Abstract: The vibrational line shapes of CO on Pt(111) studied by infrared emission spectroscopyTobin, R. G. / Richards, P. L. et al. | 1987
- 455
-
Summary Abstract: Multiple CO bonding states on potassium‐dosed Cu(100)Dubois, L. H. / Zegarski, B. R. / Luftman, H. S. et al. | 1987
- 457
-
Summary Abstract: The influence of potassium on ethylene adsorption and decomposition on Pt(111)Windham, R. G. / Bartram, M. E. / Koel, B. E. et al. | 1987
- 459
-
Summary Abstract: Nitric oxide adsorption on Ru(001) at 78 and 120 K: Temperature dependence on the bonding geometrySchwalke, Udo / Weinberg, W. H. et al. | 1987
- 460
-
Summary Abstract: He atom beam scattering from W(001)/HErnst, H.‐J. / Hulpke, E. et al. | 1987
- 462
-
Summary Abstract: First principles calculation of surface phonons on Al surfacesBohnen, K. P. / Ho, K. M. et al. | 1987
- 464
-
Investigations of adsorption on Pt and Rh by laser‐induced desorptionSeebauer, E. G. / Kong, A. C. F. / Schmidt, L. D. et al. | 1987
- 469
-
Vibrational relaxation of adsorbed molecules: Comparison with relaxation rates of model compoundsCavanagh, R. R. / Casassa, M. P. / Heilweil, E. J. / Stephenson, J. C. et al. | 1987
- 473
-
Electronically excited photodissociation and desorption of molecules on surfacesChuang, T. J. / Domen, K. et al. | 1987
- 476
-
Dynamical processes at surfacesHolloway, S. et al. | 1987
- 485
-
Dissociative chemisorption of H2 on Ni surfaces: Incident kinetic energy dependence and the characteristics of the potential energy surfaceLee, Chyuan‐Yih / DePristo, Andrew E. et al. | 1987
- 488
-
Adsorption kinetics of H2/Ni and its dependence on surface structure, surface impurities, gas temperature, and angle of incidenceRendulic, K. D. / Winkler, A. / Karner, H. et al. | 1987
- 492
-
Dynamics of dissociative adsorption and vibrational excitation in molecule–surface collisionsGadzuk, J. W. et al. | 1987
- 496
-
Molecular‐beam scattering of O2 and Ar from Ag(111)Spruit, M. E. M. / Kuipers, E. W. / Tenner, M. G. / Kimman, J. / Kleyn, A. W. et al. | 1987
- 501
-
Effect of translational and vibrational energy on adsorption: The dynamics of molecular and dissociative chemisorptionCeyer, S. T. / Beckerle, J. D. / Lee, M. B. / Tang, S. L. / Yang, Q. Y. / Hines, M. A. et al. | 1987
- 508
-
Dynamics of gas–surface energy transfer: Inelastic scattering of NO from Ag(111)Rettner, C. T. / Kimman, J. / Fabre, F. / Auerbach, D. J. / Barker, J. A. / Tully, J. C. et al. | 1987
- 513
-
Population and alignment of N2 scattered from Ag(111)Sitz, Greg O. / Kummel, Andrew C. / Zare, Richard N. et al. | 1987
- 518
-
Summary Abstract: The decomposition kinetics of methanol on Ru(001) studied using laser induced thermal desorptionDeckert, A. A. / Brand, J. L. / Mak, C. H. / Koehler, B. G. / George, S. M. et al. | 1987
- 519
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Summary Abstract: Surface photofragmentation of physisorbed CH3Br on Ni(111)Marsh, Eugene P. / Tabares, Francisco L. / Schneider, Mark R. / Cowin, James P. et al. | 1987
- 520
-
Summary Abstract: The dynamics of alkane activation on Ni(100) and Ir(110)Hamza, A. V. / Steinrück, H.‐P. / Madix, R. J. et al. | 1987
- 522
-
Summary Abstract: The dynamics of scattering and formation of NO at Ge surfacesMödl, A. / Budde, F. / Gritsch, T. / Chuang, T. J. / Ertl, G. et al. | 1987
- 523
-
Summary Abstract: Studies of OH radical formation in the H2+O2 reaction on noble‐metal catalystsHall, J. / Kasemo, B. / Ljungström, S. / Rosén, A. / Wahnström, T. et al. | 1987
- 525
-
Summary Abstract: Time‐resolved study of oxygen reaction on Si(100) surfaces using pulsed molecular beam reactive scatteringYu, Ming L. / Eldridge, Benjamin N. et al. | 1987
- 527
-
Thermodynamic and kinetic parameters of molecular nitrogen adsorption on Fe{111}Grunze, M. / Strasser, G. / Golze, M. / Hirschwald, W. et al. | 1987
- 535
-
Measurements of weakly bound hydrogen on Pd(111) between 5 and 80 KStulen, Richard H. / Kubiak, Glenn D. et al. | 1987
- 538
-
Summary Abstract: The kinetics of CO dissociation on Fe(111)Whitman, L. J. / Gurney, B. A. / Richter, L. J. / Villarrubia, J. S. / Ho, W. et al. | 1987
- 539
-
Summary Abstract: Bonding of oxygenated fluorocarbons to metal surfaces: Steric effects versus electronic effectsWalczak, M. M. / Leavitt, P. K. / Thiel, P. A. et al. | 1987
- 541
-
Photoemission study of nitric oxide adsorption on (110) gallium arsenideBermudez, V. M. / Williams, R. T. / Long, J. P. / Rife, J. C. / Wilson, R. M. / Tuttle, A. E. / Williams, G. P. et al. | 1987
- 546
-
Reflectance–difference spectroscopy of (110) GaAs and InPAspnes, D. E. / Studna, A. A. et al. | 1987
- 550
-
Occupied and empty surface states of monocrystalline (100) aluminum studied by low electron energy‐loss spectroscopy and inverse photoemissionGautier, M. / Marteaux, E. / Duraud, J. P. / Baptist, R. / Brénac, A. / Spanjaard, D. et al. | 1987
- 555
-
Bulk and surface optical absorption in molybdenum disulfideRoxlo, C. B. / Chianelli, R. R. / Deckman, H. W. / Ruppert, A. F. / Wong, P. P. et al. | 1987
- 558
-
Entropy‐driven surface segregation of Pt in PtRh alloysvan Langeveld, A. D. / Niemantsverdriet, J. W. et al. | 1987
- 562
-
Electron stimulated desorption of H+, O+, and OH+ from H2O adsorbed on niobiumRey, S. / Román, E. / de Segovia, J. L. et al. | 1987
- 568
-
High‐coverage surface phases of tellurium on Ni(111)Samanta, P. / Unertl, W. N. et al. | 1987
- 572
-
The mechanism and kinetics of the oxidation of Cr(100) single‐crystal surfaces studied by reflection high‐energy electron diffraction, x‐ray emission spectroscopy, and secondary ion mass spectrometry/Auger sputter depth profilingArlow, J. S. / Mitchell, D. F. / Graham, M. J. et al. | 1987
- 577
-
The gettering theory approach to reactive scattering on surfacesBrivio, G. P. / Grimley, T. B. et al. | 1987
- 581
-
A description of the high‐pressure ammonia synthesis reaction based on surface scienceStoltze, P. / No/rskov, J. K. et al. | 1987
- 586
-
Catalytic hydrogenation activity of a ZrNi3 intermetallic alloyWright, R. B. / Jolley, J. G. / Owens, M. S. / Cocke, D. L. et al. | 1987
- 590
-
Oxygen induced surface segregation of Fe in Fe–18Cr–3Mo(100)Polak, M. / Schiffmann, B. et al. | 1987
- 593
-
X‐ray photoelectron spectroscopy and Auger studies of selected Zr/Ni intermetallic alloy catalystsWright, R. B. / Hankins, M. R. / Owens, M. S. / Cocke, D. L. et al. | 1987
- 598
-
Surface characterization of clean polyimide films by high‐resolution electron energy‐loss spectroscopyPireaux, J. J. / Gregoire, C. / Thiry, P. A. / Caudano, R. / Clarke, T. C. et al. | 1987
- 603
-
Investigation of InAs and GaSb by high‐resolution electron energy‐loss spectroscopyThiry, P. A. / Longueville, J. L. / Pireaux, J. J. / Caudano, R. / Munekata, H. / Liehr, M. et al. | 1987
- 607
-
Lattice location of chemisorbed bromine on Si(111) thin crystal by mega‐electron‐volt 4He+ transmission channelingCheng, H.‐S. / Luo, Li / Okamoto, Masako / Thundat, T. / Hashimoto, Shin / Gibson, W. M. et al. | 1987
- 611
-
Surface disorder induced Kikuchi features in reflection high‐energy electron diffraction patterns of static and growing GaAs(001) filmsLarsen, P. K. / Meyer‐Ehmsen, G. / Bölger, B. / Hoeven, A.‐J. et al. | 1987
- 615
-
Atomic steps on Si(100) surfacesMartin, J. A. / Aumann, C. E. / Savage, D. E. / Tringides, M. C. / Lagally, M. G. / Moritz, W. / Kretschmar, F. et al. | 1987
- 619
-
Filled and empty states of H:GaAs(110) through electron energy‐loss and photoemission spectroscopiesNannarone, S. / Astaldi, C. / Sorba, L. / Colavita, E. / Calandra, C. et al. | 1987
- 623
-
Photoemission extended x‐ray absorption fine structure of oxidized Al filmsKim, S. T. / Choudhary, K. M. / Shah, S. N. / Lee, J. H. / Rothberg, G. M. / denBoer, M. L. / Williams, G. P. et al. | 1987
- 627
-
Summary Abstract: Simulation of photoactive semiconductor/electrolyte interfaces in the ultrahigh vacuum by adsorption of H2O and halogens on layered semiconductorsJaegermann, W. / Schmeisser, D. et al. | 1987
- 628
-
Summary Abstract: Chemisorption of silanes on the Si(111)‐(7×7) surfaceGates, S. M. / Scott, B. A. / Beach, D. B. / Imbihl, R. / Demuth, J. E. et al. | 1987
- 630
-
Summary Abstract: Interpretation of Auger line shapes on systems with half‐filled valence bandsRamaker, D. E. / Hutson, F. L. et al. | 1987
- 631
-
Summary Abstract: Core‐level binding energies of surface atoms in ordered binary alloys obtained from ordered bimetallic surfacesGraham, G. W. et al. | 1987
- 632
-
Summary Abstract: Formate production from coadsorbed CO, H2O, and O on Rh(100)Gurney, Bruce A. / Ho, W. et al. | 1987
- 634
-
Summary Abstract: The chemisorption of organosulfur compounds on gold surfaces: Construction of well‐defined organic solidsDubois, L. H. / Zegarski, B. R. / Nuzzo, R. G. et al. | 1987
- 635
-
Summary Abstract: Electronic factors in thiophene adsorption and hydrodesulfurization on MoS2 surfacesZonnevylle, Marjanne C. / Hoffmann, Roald et al. | 1987
- 637
-
Summary Abstract: A theoretical analysis of the deactivation of metal surfaces upon carburizationJansen, S. A. / Hoffmann, R. et al. | 1987
- 640
-
Summary Abstract: The oxidation of carbon monoxide on the Pt(110)‐(1×2) surface: The influence of the adlayer composition on the reaction dynamicsEngstrom, J. R. / Weinberg, W. H. et al. | 1987
- 642
-
Summary Abstract: Adsorption and reaction of oxygen on Si(100): A modulated molecular beam and time‐resolved x‐ray photoelectron spectroscopy studyD’Evelyn, Mark P. / Nelson, Mark M. / Engel, Thomas et al. | 1987
- 644
-
Summary Abstract: The effect of premelting studied by molecular dynamicsSchommers, W. / von Blanckenhagen, P. et al. | 1987
- 646
-
Summary Abstract: The interaction of nonaqueous solvents with alkali metal surfacesHerrera‐Fierro, Pilar / Scherson, D. A. / Chottiner, G. S. et al. | 1987
- 647
-
Summary Abstract: Structure factors of two‐dimensional lattice gases: Theoretical investigation of some aspects of the capability of low‐energy electron diffraction to measure critical phenomena of surface phase transitionsEinstein, T. L. / Bartelt, N. C. / Roelofs, L. D. et al. | 1987
- 649
-
Summary Abstract: Temperature dependence of the structure of the Al(110) surfacevon Blanckenhagen, P. / Schommers, W. / Voegele, V. et al. | 1987
- 650
-
Summary Abstract: Surface segregation and low‐temperature oxidation of Ni–Cr alloysJeng, S.‐P. / Holloway, P. H. / Batich, C. D. / Hofmann, S. et al. | 1987
- 651
-
Summary Abstract: Soft x‐ray photoemission studies of CO on Pt3Ti(111) and Pt(111)Cameron, S. D. / Dwyer, D. J. et al. | 1987
- 653
-
Summary Abstract: On the geometric and electronic structure of K on Si(100)2×1Oellig, E. M. / Miranda, R. et al. | 1987
- 654
-
Summary Abstract: Low‐energy electron diffraction, Auger electron spectroscopy, and electron energy‐loss spectroscopy studies of (511) and (711) GaAs surfacesYoung, K. / Kahn, A. et al. | 1987
- 656
-
Summary Abstract: Rainbow scattering, charge exchange, and implantation of Na on Ag(111)Horn, T. C. M. / Haochang, Pan / Kleyn, A. W. et al. | 1987
- 657
-
Summary Abstract: Momentum resolved inverse photoemission and total current spectra of W(110)Funnemann, D. / Merz, H. et al. | 1987
- 658
-
Summary Abstract: Off‐normal and azimuthal photoelectron diffraction studies of the system C(2×2)S–Ni(001) by the multiple‐scattering methodTang, Jing‐Chang et al. | 1987
- 660
-
Summary Abstract: C–S bond activation on Mo(110)Roberts, Jeffrey T. / Friend, C. M. et al. | 1987
- 661
-
Summary Abstract: X‐ray photoelectron diffraction with high angular resolutionOsterwalder, J. / Stewart, E. / Saiki, R. / Cyr, D. / Fadley, C. S. et al. | 1987
- 664
-
Alkali overlayers on aluminum, alumina, and aluminum carbidePaul, J. et al. | 1987
- 671
-
Coverage dependence in the electron‐stimulated desorption of neutral NO from Pt(111)Burns, A. R. / Jennison, D. R. / Stechel, E. B. et al. | 1987
- 675
-
A theoretical study of CO on NiAl(110) and (111) surfaces using cluster modelsTatar, R. C. / Messmer, R. P. et al. | 1987
- 679
-
Electronic structure of cesium adsorbed on Al(111)Hohlfeld, A. / Sunjic, M. / Horn, K. et al. | 1987
- 684
-
The rehybridization of CO with K coadsorption on Ru(001)Jennison, D. R. et al. | 1987
- 688
-
Summary Abstract: Studies of the interaction of CO with the interface states for strained‐layer Cu on Ru(0001)Houston, J. E. / Peden, C. H. F. / Feibelman, P. J. / Hamann, D. R. et al. | 1987
- 689
-
Summary Abstract: Adsorption and reaction of SO2 on titanium oxide surfacesSmith, Kevin E. / Mackay, Janet L. / Henrich, Victor E. et al. | 1987
- 690
-
Summary Abstract: Second‐harmonic generation of adsorbates/Ag(110)Heskett, D. / Song, K.‐J. / Urbach, L. / Plummer, E. W. / Burns, A. / Dai, H.‐L. et al. | 1987
- 692
-
Summary Abstract: Structural and electronic properties of monolayer p(1×1) Si on W(001)Hong, Soon C. / Fu, C. L. / Freeman, A. J. et al. | 1987
- 692
-
Summary Abstract: Coadsorption structures of benzene and carbon monoxide on Rh(111) and Pt(111) by high‐resolution electron energy loss spectroscopy and low‐energy electron diffractionVan Hove, M. A. / Lin, R. F. / Ogletree, D. F. / Blackman, G. S. / Mate, C. M. / Somorjai, G. A. et al. | 1987
- 694
-
Summary Abstract: Evidence for subsurface carbon on Mo(111) by low energy alkali ion scatteringOverbury, S. H. et al. | 1987
- 695
-
Summary Abstract: Local density functional theory of alkali adsorption on transition metal surfaces: Work function lowering and catalytic promotionWimmer, E. / Chubb, S. R. / Fu, C.‐L. / Freeman, A. J. et al. | 1987
- 696
-
Summary Abstract: H2O adsorption on clean and oxygen‐dosed stepped Ni(s)(111)Benndorf, Carsten / Nöbl, Christa et al. | 1987
- 698
-
Summary Abstract: Theoretical picture of the adsorption of H2 on metal surfacesHarris, J. / Andersson, S. / Nordlander, P. / Holmberg, C. et al. | 1987
- 700
-
Summary Abstract: Heats of adsorption of atomic C, N, and O on Ni(100) and Cu(100) from a (Z+1) core‐level shift analysisEgelhoff, W. F. et al. | 1987
- 701
-
Summary Abstract: The interaction of NO with a metal surface: NO/Cu(100)Bagus, P. S. / Nelin, C. J. / Avouris, Ph. et al. | 1987
- 703
-
Discrimination between domain wall and uniformly incommensurate structures by surface extended x‐ray absorption fine structure: Adsorption of chlorine on Ag{110}Holmes, D. J. / Panagiotides, N. / Dus, R. / Norman, D. / Lamble, G. M. / Barnes, C. J. / Della Valle, F. / King, D. A. et al. | 1987
- 708
-
Summary Abstract: Energetics of surface roughening: A comparison of step formation on Ni(100), Ni(113), and Ni(115)Conrad, Edward H. / Allen, Lynn R. / Blanchard, David L. / Engel, Thomas et al. | 1987
- 709
-
Summary Abstract: Grazing incidence x‐ray crystallography from surfaces and interfacesAls‐Nielsen, J. et al. | 1987
- 710
-
Summary Abstract: Incommensurate phases of H2, HD, and D2 monolayers on graphiteCui, Jinhe / Fain, Samuel C. et al. | 1987
- 711
-
Summary Abstract: Low‐energy electron diffraction studies of incommensurate xenon layers on Cu(110)Berndt, Werner et al. | 1987
- 713
-
An ion scattering spectroscopy and temperature‐programed desorption study of the interaction of N2 with Si(111)Corallo, Cheryl F. / Hoflund, Gar B. et al. | 1987
- 718
-
Adsorption of CO on Fe, Cu, and Cu–Fe surface alloysGijzeman, O. L. J. / Vink, T. J. / van Pruissen, O. P. / Geus, J. W. et al. | 1987
- 722
-
Summary Abstract: Adsorption and interaction of O2, H2O, and CO on the NiO(100) surfaceMcKay, Jeffrey M. / Henrich, Victor E. et al. | 1987
- 723
-
Summary Abstract: On the difference of NO chemisorption on W(100) and (110)Miki, H. / Kawana, A. / Kioka, T. / Sugai, S. / Kawasaki, K. et al. | 1987
- 724
-
Summary Abstract: Infrared reflection absorption spectroscopy at high pressures: CO/H on single‐crystal Ru(001)Hoffmann, F. M. / Robbins, J. L. et al. | 1987
- 725
-
Summary Abstract: The desorption of simple gases from small platinum particlesAltman, E. I. / Gorte, R. J. et al. | 1987
- 727
-
Image potential at metal surfacesOssicini, Stefano / Bertoni, C. M. et al. | 1987
- 731
-
Two‐photon photoelectron spectroscopy of Pd(111)Kubiak, Glenn D. et al. | 1987
- 735
-
Inverse photoemission studies of the (100) surface of tungsten: Clean and with adsorbed submonolayers of hydrogenKrainsky, Isay L. et al. | 1987
- 739
-
Summary Abstract: Observation of final‐state screening in inverse photoemission from adsorbed xenon layersHorn, K. / Frank, K.‐H. / Wilder, J. / Reihl, B. et al. | 1987
- 740
-
Summary Abstract: Magnetic order at (100)p(1×1) surfaces of bulk and thin‐film vanadiumRau, C. / Liu, C. / Xing, G. / Jin, C. et al. | 1987
- 742
-
The reconstruction and relaxation of Ir(110) and Au(110) surfacesCopel, M. / Fenter, P. / Gustafsson, T. et al. | 1987
- 747
-
Field ion microscope observations of the reconstruction of platinum and iridium surfacesKellogg, G. L. et al. | 1987
- 751
-
Surface structure determination using alkali and noble gas ion scatteringNiehus, H. et al. | 1987
- 757
-
Iridium surface reconstruction: A field ion microscopy studyMüller, K. / Witt, J. / Schütz, O. et al. | 1987
- 761
-
Direct observation of atomic steps and atomic structures in the reconstruction of Pt and Ir surfacesGao, Q. J. / Tsong, T. T. et al. | 1987
- 766
-
Summary Abstract: The elastic properties and the reconstruction of Au and Pt (011) surfacesDregia, S. A. / Bauer, C. L. / Wynblatt, P. et al. | 1987
- 768
-
The effect of interaction range on the W(001) surface reconstruction phase transitionRoelofs, Lyle D. / Wendelken, J. F. et al. | 1987
- 771
-
Theory of the W(100) surface reconstruction and hydrogen adsorption effectsSugibayashi, T. / Hara, M. / Yoshimori, A. et al. | 1987
- 777
-
Impact of step edges on W(001) surface reconstructionZuo, J.‐K. / Lu, T.‐M. / Wang, G.‐C. / Wendelken, J. F. et al. | 1987
- 782
-
Removal of surface relaxation of Cu(110) by hydrogen adsorptionBaddorf, A. P. / Lyo, I.‐W. / Plummer, E. W. / Davis, H. L. et al. | 1987
- 787
-
Electronically driven reconstruction of TaC(100)Noonan, J. R. / Davis, H. L. / Gruzalski, G. R. et al. | 1987
- 790
-
Summary Abstract: Helium scattering from W(001)Elliott, G. / Jonsson, H. / Miller, D. R. et al. | 1987
- 791
-
Summary Abstract: Reconstruction, adsorbate bonding, and desorption kinetics of H/Mo(100)Prybyla, J. A. / Estrup, P. J. / Chabal, Y. J. et al. | 1987
- 793
-
Summary Abstract: Strong vertical intralayer distortions as a key structural feature in the (1×2)H reconstructed Ni(110) surfaceKleinle, G. / Behm, R. J. / Ertl, G. / Moritz, W. / Penka, V. et al. | 1987
- 794
-
Summary Abstract: Potassium on Ni(110) and Au(110): Adlayer ordering and/or surface reconstructionFlynn, D. K. / Jamison, K. D. / Thiel, P. A. / Ertl, G. / Behm, R. J. et al. | 1987
- 796
-
Summary Abstract: Influence of atomic corrugations on alkali chemisorptionShinn, Neal D. / Szuromi, Phillip D. et al. | 1987
- 798
-
Investigation of oxidation of CO on Pd with a mixed molecular beamXi, Guangkang / Shao, Jun / Shao, Shumin / Li, Shenglin / He, Tianxi / Wang, Junrong et al. | 1987
- 801
-
Real‐time study of self‐sustained oscillations in the CO oxidation rate on PtBurrows, V. A. / Sundaresan, S. / Chabal, Y. J. et al. | 1987
- 805
-
Synchrotron radiation photoemission studies of CO chemisorption on Pt/Ta(110) and Ni/Ta(110)Ruckman, M. W. / Strongin, Myron / Pan, Xiaohe et al. | 1987
- 810
-
Surface science studies of the water–gas shift reaction on a model Cu(111) catalystCampbell, Charles T. / Koel, Bruce E. / Daube, K. A. et al. | 1987
- 814
-
An elastic recoil detection analysis investigation of the temperature dependence of the adsorption of ethylene and acetylene on Pt(111)Yu, R. / Gustafsson, T. et al. | 1987
- 818
-
Summary Abstract: The low‐temperature reactivity of Si(100) with NH3 and NO: Rate determining steps and rate enhancement via electronic excitationsBozso, F. / Avouris, Ph. et al. | 1987
- 819
-
Summary Abstract: Oxygen coverage dependence in the water forming reaction from ammonia and hydrogen on a palladium surfacePetersson, L.‐G. / Fogelberg, J. / Dannetun, H. / Lundström, I. et al. | 1987
- 820
-
Summary Abstract: Photoenhancement of the catalytic methanation reactionMoshfegh, A. Z. / Ignatiev, A. et al. | 1987
- 821
-
Summary Abstract: Oscillations of CO oxidation on Pt(210)Ehsasi, M. / Block, J. H. / Christmann, K. / Hirschwald, W. et al. | 1987
- 823
-
Summary Abstract: The catalytic, structural, and electronic properties of Cu on Ru(0001)Goodman, D. W. / Houston, J. E. / Peden, C. H. F. et al. | 1987
- 824
-
Summary Abstract: The effects of aluminum oxide on the ammonia synthesis over iron single crystalsStrongin, D. R. / Bare, S. R. / Somorjai, G. A. et al. | 1987
- 825
-
Summary Abstract: The hydrogenolysis of alkanes over single‐crystalline surfaces of iridium: The influence of surface structure on the catalytic selectivityEngstrom, J. R. / Goodman, D. W. / Weinberg, W. H. et al. | 1987
- 828
-
Summary Abstract: Evidence for unusual dissociative adsorption of benzene on Ru(001)Polta, J. A. / Thiel, P. A. et al. | 1987
- 829
-
Summary Abstract: Reactions of n‐butane on clean and carbided W(100)Liu, A. C. / Friend, C. M. et al. | 1987
- 831
-
Summary Abstract: Ethylene adsorption on (5×20) and (1×1) Pt(100)Hatzikos, G. H. / Masel, R. I. et al. | 1987
- 834
-
Atomic structure of GaAs(100)‐(2×1) and (2×4) reconstructed surfacesChadi, D. J. et al. | 1987
- 838
-
Imaging electronic surface states in real space on the Si(111) 2×1 surfaceStroscio, Joseph A. / Feenstra, R. M. / Fein, A. P. et al. | 1987
- 842
-
Adsorption of H2O on planar and stepped Si(100): Structural aspectsLarsson, C. U. S. / Johnson, A. L. / Flodström, A. / Madey, T. E. et al. | 1987
- 847
-
Reaction and structure of Ti on Si probed by surface extended energy‐loss fine structure and extended appearance potential fine structureIdzerda, Y. U. / Williams, E. D. / Einstein, T. L. / Park, R. L. et al. | 1987
- 852
-
The effect of alkali metals on the interaction of O2 and CO with some transition‐metal surfacesKiskinova, M. et al. | 1987
- 858
-
Interaction of boron with Mo(100) and its effect on surface chemistryFryberger, T. B. / Grant, J. L. / Stair, P. C. et al. | 1987
- 863
-
Summary Abstract: Interaction of NO with potassium and boron contaminated Rh surfacesBugyi, L. / Kiss, J. / Solymosi, F. et al. | 1987
- 864
-
Summary Abstract: The adsorption of simple molecules (H2, O2, CO) on Mn/Ru(001) surfacesHrbek, Jan et al. | 1987
- 865
-
Summary Abstract: Effects of sulfur on the kinetics of methoxy decomposition on Ni(111)Hall, R. B. / DeSantolo, A. M. / Grubb, S. G. et al. | 1987
- 867
-
Summary Abstract: The influence of sulfur on methanation over W(110)Szuromi, P. D. / Kelley, R. D. / Madey, T. E. et al. | 1987
- 869
-
Structural characterization of surfaces by extended energy‐loss fine‐structure spectroscopyDe Crescenzi, Maurizio et al. | 1987
- 875
-
Thermal desorption of strained monoatomic Ag and Au layers from Ru(001)Niemantsverdriet, J. W. / Dolle, P. / Markert, K. / Wandelt, K. et al. | 1987
- 879
-
Study of polycrystalline boron and boron‐containing metallic glasses by surface extended energy‐loss fine structureFei, L. / Zheng, Y. / Zhang, Q. J. / Hua, Z. Y. et al. | 1987
- 882
-
Surface electronic behavior of face‐centered‐cubic iron on copperFernando, Gayanath W. / Lee, Y. C. / Montano, Pedro A. / Cooper, Bernard R. / Moog, E. R. / Naik, H. M. / Bader, S. D. et al. | 1987
- 887
-
Summary Abstract: A multitechnique study of surface segregation of Sn on the (111) surface of an Fe–1.3 at. % Sn crystalHsiao, R. / McMahon, C. J. / Plummer, E. W. / Buck, T. M. et al. | 1987
- 888
-
Summary Abstract: Helium scattering study of the initial stages of growth of Pb overlayers on Cu(100)Sánchez, A. / de Miguel, J. J. / Ibáñez, J. / Miranda, R. / Ferrer, S. et al. | 1987
- 889
-
Summary Abstract: Calculation of the surface segregation of Pd–Cu, Pd–Ag, and Pd–Au alloysFoiles, Stephen M. et al. | 1987
- 892
-
Surface phase transitionsThiry, P. / Jezequel, G. / Petroff, Y. et al. | 1987
- 898
-
Inverse photoemission study of the Si(100)‐(2×1) K surfaceBatra, Inder P. / Nicholls, J. M. / Reihl, B. et al. | 1987
- 902
-
Roughness effect upon oxygen adsorption on Si(100) surfacesAndriamanantenasoa, I. / Lacharme, J. P. / Sébenne, C. A. et al. | 1987
- 906
-
Theoretical calculations for the dimer–adatom–stacking‐fault model of Si(111)‐7×7 surfaceQian, Guo‐Xin / Chadi, D. J. et al. | 1987
- 910
-
Electronic structure of oxygen vacancies on TiO2(110) and SnO2(110) surfacesMunnix, S. / Schmeits, M. et al. | 1987
- 914
-
Adsorption site identification in surface extended x‐ray absorption fine structureCrapper, M. D. / Woodruff, D. P. et al. | 1987
- 919
-
Near edge x‐ray absorption fine‐structure studies of molecules and molecular chains bonded to surfacesStöhr, J. / Outka, D. A. et al. | 1987
- 927
-
Adsorbate orientation on platinum by polar‐angle x‐ray photoelectron diffractionWesner, D. A. / Coenen, F. P. / Bonzel, H. P. et al. | 1987
- 932
-
Surface structures for the O/Ni(001) system from c(2×2)O to saturated NiOSaiki, R. / Kaduwela, A. / Osterwalder, J. / Sagurton, M. / Fadley, C. S. / Brundle, C. R. et al. | 1987
- 936
-
Time‐dependent local‐density‐response theory for strongly charged metal surfacesGies, P. / Gerhardts, R. R. et al. | 1987
- 941
-
Adsorption of metal cations from aqueous solution onto tin oxide thin filmsTarlov, Michael J. / Evans, John F. et al. | 1987
- 944
-
Effect of chemisorbed sulfur on the electrochemical hydrogen adsorption and recombination reactions on Pt (111)Protopopoff, E. / Marcus, P. et al. | 1987
- 948
-
Structure‐property relations for surface processes at the metal/solution interfaceRoss, Philip N. et al. | 1987
- 954
-
Summary Abstract: Coadsorption of water and oxygen on Ag(110): A study of the interactions among H2O, OH, and OBange, K. / Madey, T. E. / Sass, J. K. / Stuve, E. M. et al. | 1987
- 981
-
Shadow‐cone enhanced desorption with angle‐resolved secondary ion mass spectrometry detectionChang, Che‐Chen / Malafsky, Geoffrey / Winograd, Nicholas et al. | 1987
- 985
-
Auger electron spectroscopy–electron energy‐loss spectroscopy–low‐energy electron diffraction study of a V6C5(100) surfaceUsami, S. / Nakai, H. / Yaguchi, T. / Kumashiro, Y. / Fujimori, A. et al. | 1987
- 989
-
Energy distribution of primary backscattered electrons in Auger electron spectroscopyJousset, D. / Langeron, J. P. et al. | 1987
- 996
-
The room‐temperature oxidation of Cu/Si(100) and Cu/Si(111) interfaces studied by Auger electron spectroscopy, electron energy‐loss spectroscopy, and high‐resolution electron energy‐loss spectroscopyMo/ller, Preben J. / He, Jian‐wei et al. | 1987
- 1003
-
Unusual kinetics due to interface hydride formation in the hydriding of Pd/Mg sandwich layersKrozer, A. / Kasemo, B. et al. | 1987
- 1006
-
Extended energy‐loss fine‐structure study of carbon and oxygen on cobaltAtrei, A. / Bardi, U. / Rovida, G. / Torrini, M. / Zanazzi, E. / Maglietta, M. et al. | 1987
- 1009
-
Effects of carbon and sulfur on the decomposition of hydrocarbons on nickelKikowatz, R. / Flad, K. / Hörz, G. et al. | 1987
- 1015
-
Carbon segregation to the low‐index surfaces of an Fe–10 at. % Si single crystalViljoen, P. E. / du Plessis, J. / Bezuidenhout, F. et al. | 1987
- 1019
-
Adsorption of atomic oxygen on the Si(110)5×1 surface via interaction with N2OKeim, E. G. / van Silfhout, A. / Wolterbeek, L. et al. | 1987
- 1024
-
Hydrogen–oxygen interrelations on a niobium surfaceShamir, N. / Atzmony, U. / Schultz, J. A. / Mintz, M. H. et al. | 1987
- 1028
-
Reduction of oxidized Fe(110) by hydrogenVink, T. J. / Sas, S. J. M. / Gijzeman, O. L. J. / Geus, J. W. et al. | 1987
- 1032
-
Surface imaging by carbon monoxide field desorptionPanitz, J. A. / Hren, J. J. et al. | 1987
- 1036
-
Thermal decomposition of lubricant oil adsorbed on gold and oxidized iron foilsPan, Fu‐Ming / Stair, Peter C. et al. | 1987
- 1040
-
Structure and diffracted intensity in a model for irreversible island‐forming chemisorption with domain boundariesEvans, J. W. / Nord, R. S. et al. | 1987
- 1045
-
Phase transformations of the H/W(110) and H/Mo(110) surfacesAltman, M. / Chung, J. W. / Estrup, P. J. / Kosterlitz, J. M. / Prybyla, J. / Sahu, D. / Ying, S. C. et al. | 1987
- 1049
-
The scattering of thermal helium atoms from Ag(110): A semiclassical Gaussian wave‐packet studyCapozzi, C. / Francis, S. M. / Roscoe, D. / Richardson, N. V. / Holloway, S. et al. | 1987
- 1053
-
A comparison of the interaction of CO, N2, and OC with Cu(100)Müller, W. / Bagus, P. S. et al. | 1987
- 1057
-
The effects of Na on the interaction of CO with Ta(110)Shek, M. L. / Pan, Xiaohe / Strongin, Myron et al. | 1987
- 1061
-
K–CO on transition metals: A local ionic interactionSchultz, Peter A. / Patterson, Charles H. / Messmer, Richard P. et al. | 1987
- 1065
-
Potassium promotion of carbon reactivity: 104‐fold increase of oxidation rate in O2Sjövall, P. / Hellsing, B. / Keck, K.‐E. / Kasemo, B. et al. | 1987
- 1070
-
X‐ray photoelectron spectroscopy and ultraviolet photoelectron spectroscopy study on the CO chemisorbed over amorphous FeNiB alloysGuczi, L. / Zsoldos, Z. / Schay, Z. et al. | 1987
- 1076
-
Crack initiation and crack growth in polymers induced by electron bombardmentDickinson, J. T. / Tonyali, K. / Klakken, M. L. / Jensen, L. C. et al. | 1987
- 1082
-
Summary Abstract: Spin‐polarized photoelectron diffraction: A new probe of surface magnetic orderHermsmeier, B. / Sinkovic, B. / Osterwalder, J. / Fadley, C. S. et al. | 1987
- 1083
-
Summary Abstract: Dehydrogenation of some unsaturated hydrocarbons on oxygen covered palladiumDannetun, H. / Lundström, I. / Petersson, L.‐G. et al. | 1987
- 1085
-
Summary Abstract: Photon‐stimulated desorption and electron‐stimulated desorption of H+ from solid H2O and NH3Rosenberg, R. A. / Rehn, Victor / Knotek, M. L. / Stulen, R. H. et al. | 1987
- 1086
-
Summary Abstract: Isotope effect in water desorption from Ru(001)Schmitz, P. J. / Polta, J. A. / Chang, S.‐L. / Thiel, P. A. et al. | 1987
- 1088
-
Summary Abstract: The adsorption and decomposition of molybdenum hexacarbonyl on Mo and Si surfacesCho, C.‐C. / Bernasek, S. L. et al. | 1987
- 1090
-
Summary Abstract: Observation of 2H‐NbSe2 surface by scanning tunneling microscopyTokumoto, H. / Bando, H. / Kajimura, K. / Mizutani, W. / Murakami, H. / Okano, M. / Okayama, S. / Ono, M. / Ono, Y. / Sakai, F. et al. | 1987
- 1092
-
Summary Abstract: Electron scattering from a polar solid: High‐resolution electron energy‐loss spectra of HCN filmsKordesch, M. E. / Stenzel, W. / Conrad, H. / Sunjić, M. et al. | 1987
- 1093
-
Summary Abstract: Surface phonon dynamics of 2H–TaSe2(001)Benedek, G. / Miglio, L. / Skofronick, J. G. / Brusdeylins, G. / Heimlich, C. / Toennies, J. P. et al. | 1987
- 1094
-
Summary Abstract: Phase transitions and critical phenomena of physisorbed films on metal surfaces. I. Krypton on cadmiumDericbourg, Jacques et al. | 1987
- 1096
-
Summary Abstract: Influence of film melting characteristics on the wetting behavior of multilayer oxygen films adsorbed on graphiteKrim, J. / Coulomb, J. P. / Bouzidi, J. et al. | 1987
- 1097
-
Summary Abstract: Cohesive forces and dissipation in monolayer filmsGregory, Stephen et al. | 1987
- 1099
-
Summary Abstract: Anderson–Hamiltonian model of adsorbate inverse and direct photoemission and electronic excitation spectroscopiesNordlander, P. / Avouris, Ph. et al. | 1987
- 1101
-
Summary Abstract: Local bonding and stability of the excited and ionic states of chemisorbed CO and NOAvouris, Ph. / Bagus, P. S. / Nelin, C. J. / Rossi, A. R. et al. | 1987
- 1103
-
Summary Abstract: Isotopic differences in low‐temperature sorption and desorption of hydrogen by Pd(111)Gdowski, G. E. / Stulen, R. H. / Felter, T. E. et al. | 1987
- 1104
-
Summary Abstract: The adsorption of thiophene and tetrahydrothiophene on several faces of platinumLang, J. F. / Masel, R. I. et al. | 1987
- 1106
-
Summary Abstract: Methylamine adsorption and decomposition on (5×20) and (1×1) Pt(100)Thomas, P. A. / Masel, R. I. et al. | 1987
- 1108
-
Summary Abstract: Adsorption and decomposition of formic acid on clean and potassium‐dosed Rh(111) surfacesSolymosi, F. / Kiss, J. / Kovács, I. et al. | 1987
- 1110
-
Summary Abstract: Face specificity of CO2 adsorption on iron surfacesBauer, R. / Behner, H. / Borgmann, D. / Pirner, M. / Spiess, W. / Wedler, G. et al. | 1987
- 1111
-
Summary Abstract: Photon stimulated desorption induced by core exciton states in MgOKurtz, Richard L. / Stockbauer, Roger / Nyholm, Ralf / Flodström, S. Anders / Senf, Friedmar et al. | 1987
- 1115
-
Optical characterization of SiO1.1 silicon oxide layers on InSbRemond, G. / Caye, R. / Holloway, P. H. / Ruzakowski, P. et al. | 1987
- 1120
-
The interaction of O2 and CO with polycrystalline ZrHoflund, Gar B. / Corallo, Gregory R. / Asbury, Douglas A. / Gilbert, Richard E. et al. | 1987
- 1124
-
An x‐ray photoelectron spectroscopy investigation of the incorporation of surface oxides into bulk zirconiumWest, Paul E. / George, Patricia M. et al. | 1987
- 1128
-
An investigation of the chemistry of the dielectric/FeCoTb interface by x‐ray photoelectron spectroscopy and Auger electron spectroscopyStickle, W. F. / Coulman, D. et al. | 1987
- 1132
-
A surface study of the oxidation of polycrystalline tinAsbury, Douglas A. / Hoflund, Gar B. et al. | 1987
- 1136
-
Initial adsorption kinetics of oxygen on a Cu0.82Li0.18 alloy surface studied by combined Auger electron spectroscopy, x‐ray photoelectron spectroscopy, and time‐of‐flight spectrometry of direct recoilsMintz, M. H. / Atzmony, U. / Schultz, J. A. / Shamir, N. et al. | 1987
- 1142
-
Near‐surface disorder studied with slow positronsVehanen, A. / Huttunen, P. / Mäkinen, J. / Hautojärvi, P. et al. | 1987
- 1147
-
Surface analysis and electrochemical studies of sulfur enhanced corrosion of nickelBaer, D. R. / Danielson, M. J. et al. | 1987
- 1152
-
Corrosion/passivation of aluminum in dilute sulfate solutions: A comparison of Pourbaix and surface behavior diagramsDavis, G. D. / Moshier, W. C. / Ahearn, J. S. / Hough, H. F. / Cote, G. O. et al. | 1987
- 1158
-
A high‐resolution Auger electron spectroscopy study of the intergranular fracture of a temper‐embrittled steelMenyhard, M. / McMahon, C. J. / Yoshioka, Y. et al. | 1987
- 1162
-
Neutral molecule emission from the fracture of crystalline MgODickinson, J. T. / Jensen, L. C. / McKay, M. R. et al. | 1987
- 1169
-
Summary Abstract: X‐ray photoelectron spectroscopy and ion scattering spectroscopy of submonolayer coverage of Ag on SiO2Pitts, J. R. / Thomas, T. M. / Czanderna, A. W. / Passler, M. et al. | 1987
- 1170
-
Summary Abstract: Surface properties of clean and gas‐dosed SnO2(110)Cox, David F. / Fryberger, Teresa B. / Erickson, Jon W. / Semancik, Steve et al. | 1987
- 1172
-
Summary Abstract: Passivation of metals in thionyl‐chloride electrolytes for lithium batteriesPeebles, D. E. / Rogers, J. W. / Cieslak, W. R. / Delnick, F. M. et al. | 1987
- 1173
-
Summary Abstract: Effects of temperature on the surface contamination of LiF: An electron stimulated desorption studyKelber, J. A. et al. | 1987
- 1175
-
Summary Abstract: A study of room‐temperature Cu–Al2O3 and Cu–AlN interfacial reactionsOhuchi, F. S. / French, R. H. / Kasowski, R. V. et al. | 1987
- 1177
-
Summary Abstract: High‐temperature oxidation of Pd15Rh in air: X‐ray photoelectron spectroscopy and Raman resultsBaird, R. J. / Graham, G. W. et al. | 1987
- 1179
-
Summary Abstract: Chemical analysis of in situ fractured materials by x‐ray photoelectron spectroscopy, Auger electron spectroscopy, and ion scattering spectroscopyStucki, F. / Brüesch, P. / Greuter, F. / Gisler, E. et al. | 1987
- 1181
-
On the use of nonresonant multiphoton ionization of desorbed species for surface analysisBecker, C. H. et al. | 1987
- 1186
-
Calibration of secondary neutral and secondary ion mass spectrometry: A comparative studyTümpner, J. / Wilsch, R. / Benninghoven, A. et al. | 1987
- 1191
-
Detection of neutral atoms sputtered from ion‐bombarded single‐crystal surfaces Rh{111} and p(2×2) O/Rh{111}: Ejection mechanism and surface structure determinations from energy‐ and angle‐resolved measurementsSingh, J. / Reimann, C. T. / Baxter, J. P. / Schick, G. A. / Kobrin, P. H. / Garrison, B. J. / Winograd, N. et al. | 1987
- 1194
-
Quantitative analysis of He in solids by sputtered neutral mass spectrometryGnaser, H. / Bay, H. L. / Hofer, W. O. et al. | 1987
- 1198
-
Oxygen interaction with Pd3Sn: X‐ray photoelectron spectroscopy and secondary ion mass spectrometryRotermund, H. H. / Penka, V. / De Louise, L. A. / Brundle, C. R. et al. | 1987
- 1203
-
X‐ray and Auger‐electron yields for quantitative element analysisJitschin, W. / Werner, U. et al. | 1987
- 1206
-
Low‐energy ion induced Auger electron spectra and energy thresholds for some pure elements, compounds, and alloysFan, Chuizhen / Yu, Zhenjiang / Chen, Xuekang et al. | 1987
- 1209
-
Superposition of Auger electron spectroscopy depth profiles obtained on Cr/Ni multilayer samples with different roughnessesZalar, A. / Hofmann, S. et al. | 1987
- 1213
-
Sputter profiling of passive films in Fe–Cr alloys: A quantitative approach by Auger electron spectroscopyLorang, G. / Da Cunha Belo, M. / Langeron, J. P. et al. | 1987
- 1220
-
Summary Abstract: On the quantitative aspects of oxygen enhancement in secondary ion mass spectrometryYu, Ming L. et al. | 1987
- 1221
-
Summary Abstract: Calibration of Auger electron spectrometers for energy and intensity measurementSeah, M. P. / Smith, G. C. / Anthony, M. T. et al. | 1987
- 1222
-
Summary Abstract: Observation of Auger electron channeling pattern and eliminating method of crystal orientation dependency in quantitative Auger electron spectroscopySakai, Y. / Mogami, A. et al. | 1987
- 1224
-
Summary Abstract: Anisotropy of equilibrium surface composition of alloysSteigerwald, Daniel A. / Wynblatt, Paul et al. | 1987
- 1226
-
Quantitative x‐ray photoelectron spectroscopy analysis of inorganic mixturesPaparazzo, E. et al. | 1987
- 1230
-
Inelastic background removal in x‐ray excited photoelectron spectra from homogeneous and inhomogeneous solidsTougaard, S. et al. | 1987
- 1235
-
On angle resolved x‐ray photoelectron spectroscopy of oxides, serrations, and protusions at interfacesDarlinski, A. / Halbritter, J. et al. | 1987
- 1241
-
Summary Abstract: Synchrotron radiation as a source for quantitative x‐ray photoelectron spectroscopy: Advantages and consequencesRosseel, T. M. / Carlson, T. A. / Negri, R. E. / Beall, C. E. / Taylor, J. W. et al. | 1987
- 1243
-
Design and performance of a reflectron based time‐of‐flight secondary ion mass spectrometer with electrodynamic primary ion mass separationNiehuis, E. / Heller, T. / Feld, H. / Benninghoven, A. et al. | 1987
- 1247
-
New data system for depth profiling of inhomogeneous samples by secondary ion mass spectrometryScholze, Chr. / Frenzel, H. / Maul, J. L. et al. | 1987
- 1250
-
Composite thin‐film production by ion bombardmentCarr, W. / Seidl, M. / Tompa, G. S. / Souzis, A. et al. | 1987
- 1254
-
High spatial resolution secondary ion mass spectrometry with parallel detection systemNihei, Y. / Satoh, H. / Tatsuzawa, S. / Owari, M. / Ataka, M. / Aihara, R. / Azuma, K. / Kammei, Y. et al. | 1987
- 1258
-
Electron energy‐loss microscopy of oxide filmsMitchell, D. F. / Graham, M. J. et al. | 1987
- 1262
-
Surface resonance effects in high‐ and low‐energy electron diffraction patterns in molybdeniteSmith, Andrew E. / Lynch, D. F. et al. | 1987
- 1266
-
A simple mirror electron microscope–low‐energy electron diffraction apparatus for surface studiesShern, C. S. / Unertl, W. N. et al. | 1987
- 1271
-
An experimental study of microarea analysis of insulators by secondary ion mass spectrometry using charge compensationFan, Chui‐zhen / Chen, Xue‐kang / Yu, Zhen‐jiang et al. | 1987
- 1275
-
X‐ray photoelectron spectroscopy peak shape analysis for the extraction of in‐depth composition informationTougaard, Sven et al. | 1987
- 1279
-
Change of surface composition of B4C single crystal due to heat treatmentInoue, S. / Fukuda, S. / Hino, T. / Yamashina, T. et al. | 1987
- 1283
-
Auger electron spectroscopy studies of silicon nitride, oxide, and oxynitride thin films: Minimization of surface damage by argon and electron beamsChao, S. S. / Tyler, J. E. / Tsu, D. V. / Lucovsky, G. / Mantini, M. J. et al. | 1987
- 1288
-
Interaction of Ti with fused silica and sapphire during metallizationChaug, Y. S. / Chou, N. J. / Kim, Y. H. et al. | 1987
- 1292
-
Surface segregation in donor and acceptor graphite intercalation compoundsLaguës, M. / Marchand, D. / Frétigny, C. et al. | 1987
- 1295
-
Investigation of the mechanism of the activation of GaAs negative electron affinity photocathodesGao, Huai‐rong et al. | 1987
- 1299
-
Impregnated cathode coated with tungsten thin film containing Sc2O3Yamamoto, Shigehiko / Taguchi, Sadanori / Watanabe, Isato / Kawase, Susumu et al. | 1987
- 1303
-
Studies of layered thin films of Prussian‐blue‐type compoundsSiperko, Lorraine M. / Kuwana, Theodore et al. | 1987
- 1307
-
Surface analysis of electrochromic displays of iron hexacyanoferrate films by x‐ray photoelectron spectroscopyEmrich, R. J. / Traynor, L. / Gambogi, W. / Buhks, E. et al. | 1987
- 1311
-
Summary Abstract: Scattered ion yields from 0.2 to 2 keV helium neutral or ion bombardment of solidsThomas, T. M. / Neumann, Herschel / Czanderna, A. W. / Pitts, J. R. et al. | 1987
- 1312
-
Summary Abstract: Noble gas ion bombardment of the basal plane surface of MoS2Lince, Jeffrey R. / Fleischauer, Paul D. et al. | 1987
- 1314
-
Summary Abstract: The dependence of the electrical properties of ion‐beam sputtered indium tin oxide on its composition and structureGessert, T. A. / Williamson, D. L. / Coutts, T. J. / Nelson, A. J. / Jones, K. M. / Dhere, R. G. / Aharoni, H. / Zurcher, P. et al. | 1987
- 1316
-
Summary Abstract: Applications of a system for real‐time imaging of analyzed areas in surface analysisGrazulis, L. / Tomich, D. H. / Koenig, M. F. / Grant, J. T. et al. | 1987
- 1317
-
Summary Abstract: Preliminary experiments on a new type of metastable‐atom‐beam sourceKanaji, T. / Yamanishi, A. / Urano, T. / Fujimoto, F. et al. | 1987
- 1318
-
Summary Abstract: Some optical and electron‐spin‐resonance properties of germanium rich a‐Ge1−xCx:H prepared by radio frequency sputtering in Ar/H2/C3H8Shinar, J. / Wu, H. S. / Shinar, R. / Seaverson, L. M. / Shanks, H. R. et al. | 1987
- 1319
-
Summary Abstract: The characterization of Cu(I) ions in Y zeolites by Fourier transform infrared spectroscopy and CO adsorptionNicol, J. M. / Howard, J. et al. | 1987
- 1321
-
X‐ray photoelectron and infrared spectroscopy of microwave plasma etched polyimide surfacesChou, N. J. / Paraszczak, J. / Babich, E. / Heidenreich, J. / Chaug, Y. S. / Goldblatt, R. D. et al. | 1987
- 1327
-
Infrared reflection–absorption spectroscopy of surface modified polyester filmsDunn, D. S. / McClure, D. J. et al. | 1987
- 1331
-
Summary Abstract: The application of secondary ion mass spectrometry to the study of thin polymer filmsBriggs, D. et al. | 1987
- 1332
-
Summary Abstract: Ion beam studies of polymer surfacesHook, K. J. / Gardella, J. A. et al. | 1987
- 1335
-
Kinetics and initial stages of oxidation of aluminum nitride: Thermogravimetric analysis and x‐ray photoelectron spectroscopy studyKatnani, A. D. / Papathomas, K. I. et al. | 1987
- 1341
-
Formations of TiN and TiC in titanium coated stainless steel by heat treatmentMachida, O. / Hashiba, M. / Hino, T. / Yamashina, T. et al. | 1987
- 1345
-
Nitrogen sorption on titanium: Reconstruction of the subsurface composition profile using low‐ and high‐energy Auger dataDawson, P. T. / Tzatzov, K. K. et al. | 1987
- 1352
-
Surface analysis in fusion devicesTaglauer, E. / Staudenmaier, G. et al. | 1987
- 1358
-
Ion beam effects on surface and subsurface composition of near‐noble silicidesValeri, S. / Ottaviani, G. et al. | 1987
- 1362
-
Surface analysis of palladium boride liquid metal ion beam deposition on silicon single‐crystal solid surfaceHiguchi‐Rusli, R. H. / Corelli, J. C. / Steckl, A. J. / Jin, H.‐S. et al. | 1987
- 1367
-
Formation of tungsten borides studied by field ion microscopyOhmae, N. / Nakamura, A. / Koike, S. / Umeno, M. et al. | 1987
- 1371
-
Summary Abstract: High energy resolution Auger electron spectroscopy of Ti and TiNPellerin, F. / Bodin, C. / Pech, T. et al. | 1987
- 1375
-
Ultrafine particlesHayashi, Chikara et al. | 1987
- 1385
-
Summary Abstract: Progress in magnetic fusion researchFurth, H. P. et al. | 1987
- 1387
-
Ultrahigh speed high electron mobility transistor large scale integration technologyAbe, Masayuki / Mimura, Takashi / Notomi, Seishi / Odani, Koichiro / Kondo, Kazuo / Kobayashi, Masaaki et al. | 1987
- 1393
-
Summary Abstract: Seeded lateral epitaxy in silicon‐on‐insulator structuresWarabisako, T. / Tokuyama, T. / Tamura, M. / Miyao, M. et al. | 1987
- 1394
-
Summary Abstract: Materials and physics issues in scaling bipolar devicesNing, Tak H. et al. | 1987
- 1396
-
Formation of self‐aligned TiSi2 for very large scale integrated contacts and interconnectsHo, V. Q. / Poulin, D. et al. | 1987
- 1402
-
Formation of silicides in the Ti, Ti(Ox)/Si(111), and Ti/SiO2/Si(111) systemsHsu, C. C. / Wang, You‐Xiang / Yin, Shi‐Duan / Li, Bao‐Qi / Ji, Ming‐Ron / Wu, Jian‐Xin et al. | 1987
- 1407
-
Resistive synaptic interconnects for electronic neural networksLamb, J. L. / Thakoor, A. P. / Moopenn, A. / Khanna, S. K. et al. | 1987
- 1412
-
Oxidation of thin WSi2 overlayers on Si(111)Nguyen Tan, T. A. / Azizan, M. / Derrien, J. et al. | 1987
- 1417
-
Summary Abstract: Some aspects of ion beam induced metal–silicon reactionsColligon, J. S. / Kheyrandish, H. / Stephens, G. A. et al. | 1987
- 1418
-
Summary Abstract: Electron spectroscopy for chemical analysis results relating titanium silicide formation to gas puritySherman, Robert / Berger, Henry et al. | 1987
- 1419
-
Summary Abstract: Interactions of Co thin films with Si substratesCoulman, Betty / Broadbent, Eliot K. et al. | 1987
- 1421
-
Low‐energy ion doping of GaAsCavalieri, S. / Gaucherel, Ph. / Monnom, G. / Paparoditis, C. / Roustan, J. C. et al. | 1987
- 1425
-
Desorption of the catalyst agent after catalytic oxidation of semiconductorsBakshi, M. H. / Soukiassian, P. / Gentle, T. M. / Hurych, Z. et al. | 1987
- 1428
-
Contrast enhancement techniques for submicron optical lithographyMack, Chris A. et al. | 1987
- 1432
-
Correlations between the chemical and electronic structure of thermally treated anodized InSbBregman, J. / Shapira, Yoram / Calahorra, Z. et al. | 1987
- 1437
-
Rapid thermal annealing of indium phosphide compound semiconductorsBiedenbender, Michael D. / Kapoor, Vik J. / Williams, W. D. et al. | 1987
- 1442
-
Determining metal–semiconductor interface structure by optical second‐harmonic generationMcGilp, J. F. et al. | 1987
- 1447
-
Metal induced crystallization of amorphous siliconRobertson, A. E. / Hultman, L. G. / Hentzell, H. T. G. / Hörnström, S.‐E. / Shaofang, G. / Psaras, P. A. et al. | 1987
- 1451
-
The stability and decomposition of gaseous chloroferrocenesBarfuss, S. / Grade, M. / Hirschwald, W. / Rosinger, W. / Boag, N. M. / Driscoll, D. C. / Dowben, P. A. et al. | 1987
- 1456
-
An Auger electron spectroscopy/electron energy‐loss spectroscopy study on the oxidation of WSi2 thin filmHe, Jian‐Wei / Mo/ller, Preben J. / Chen, Jiann‐Ruey et al. | 1987
- 1459
-
The Si/GaAs(110) heterojunction discontinuity: Amorphous versus crystalline overlayersList, R. S. / Woicik, J. / Mahowald, P. H. / Lindau, I. / Spicer, W. E. et al. | 1987
- 1464
-
Variations of energies and line shapes of the electroreflectance spectra of epitaxial AlxGa1−xAsWrobel, J. M. / Bassett, L. C. / Aubel, J. L. / Sundaram, S. / Davis, John L. / Comas, James et al. | 1987
- 1470
-
Depth profile analysis of hydrogenated carbon layers on silicon by x‐ray photoelectron spectroscopy, Auger electron spectroscopy, electron energy‐loss spectroscopy, and secondary ion mass spectrometrySander, P. / Kaiser, U. / Altebockwinkel, M. / Wiedmann, L. / Benninghoven, A. / Sah, R. E. / Koidl, P. et al. | 1987
- 1474
-
Electron energy‐loss spectroscopy investigation of core levels and valence excitations of Pd2SiNannarone, S. / Fiorello, A. M. / del Pennino, U. / Mariani, C. / Betti, M. G. / De Crescenzi, M. et al. | 1987
- 1479
-
Summary Abstract: Growth of Ge overlayers onto (HgCd)Te: A comparison between cleaved and ion‐sputtered surfacesDavis, G. D. / Beck, W. A. / Kelly, M. K. / Mo, Y. W. / Margaritondo, G. et al. | 1987
- 1480
-
Summary Abstract: Optical monitoring of laser heating and interfacial reaction in Si/AuSu, J. C. / Meng, Q. K. / Allen, S. D. et al. | 1987
- 1482
-
Summary Abstract: Charging effects and the silicon‐on‐sapphire interface width during an Auger electron spectroscopy sputter profileRichmond, Eliezer Dovid / Turner, Noel H. et al. | 1987
- 1484
-
Summary Abstract: Chemically deposited Ni on Si(111) investigated with x‐ray standing wavesThundat, T. / Zegenhagen, J. / Gibson, W. M. et al. | 1987
- 1485
-
Summary Abstract: Transmission electron microscopy studies of the microstructure of AuNiGe ohmic contact to n‐type GaAsShih, Yih‐Cheng / Wilkie, E. L. / Murakami, Masanori et al. | 1987
- 1487
-
Summary Abstract: Surface morphology and electromigrationHuang, Huei Li / Yang, Jyh Shinn et al. | 1987
- 1489
-
Summary Abstract: Fundamental properties of superlatticesDöhler, Gottfried H. et al. | 1987
- 1493
-
Schottky barriers and band lineups at interfacesKane, Evan O. et al. | 1987
- 1500
-
Raman scattering in GaSb/AlSb strained‐layer latticesSchwartz, G. P. / Gualtieri, G. J. / Sunder, W. A. / Farrow, L. A. / Aspnes, D. E. / Studna, A. A. et al. | 1987
- 1503
-
Metal penetration and dopant redistribution beneath alloyed Ohmic contacts to n‐GaAsShappirio, J. R. / Lareau, R. T. / Lux, R. A. / Finnegan, J. J. / Smith, D. D. / Heath, L. S. / Taysing‐Lara, M. et al. | 1987
- 1508
-
Summary Abstract: Silicide formation at the Ti/Si(111) interfaceChambers, S. A. / del Giudice, M. / Hill, D. M. / Xu, F. / Joyce, J. J. / Ruckman, M. W. / Weaver, J. H. et al. | 1987
- 1509
-
Summary Abstract: Bridging the gap between solid–solid and solid–vacuum interfaces: A study of buried Si/αSi interfacesGossmann, H.‐J. / Gibson, J. M. / Bean, J. C. / Tung, R. T. / Feldman, L. C. et al. | 1987
- 1511
-
Study of the structure and properties of the Ti/GaAs interfaceKniffin, Margaret / Helms, C. R. et al. | 1987
- 1516
-
Optical emission properties of metal/InP and GaAs interface statesViturro, R. E. / Slade, M. L. / Brillson, L. J. et al. | 1987
- 1521
-
A chemical and structural investigation of Schottky and ohmic Au/GaAs contactsCoulman, D. / Newman, N. / Reid, G. A. / Liliental‐Weber, Z. / Weber, E. R. / Spicer, W. E. et al. | 1987
- 1526
-
Summary Abstract: Schottky barrier formation studies by temperature‐dependent high‐resolution electron energy loss spectroscopyKelly, M. K. / Margaritondo, G. / Papagno, L. / Lapeyre, G. J. et al. | 1987
- 1527
-
Summary Abstract: Kinetics of Schottky barrier formation: Au on low‐temperature GaAs(110)Stiles, K. / Kahn, A. / Kilday, D. G. / Margaritondo, G. et al. | 1987
- 1528
-
Summary Abstract: Metal‐induced impurity states at the InP/transition‐metal interfaceSchäffler, F. / Drube, W. / Hughes, G. / Ludeke, R. / Rieger, D. / Himpsel, F. J. et al. | 1987
- 1530
-
Summary Abstract: Binding energy shifts from alloying at metal/II–VI compound semiconductor interfacesNogami, J. / Friedman, D. J. / Kendelewicz, T. / Lindau, I. / Spicer, W. E. et al. | 1987
- 1532
-
Summary Abstract: Reactivity of Au with GaAsYeh, Liu Lu‐Min / Xie, Yu‐Jun / Mueller, Carl / Holloway, P. H. et al. | 1987
- 1534
-
Summary Abstract: Low‐energy argon implantation studies on Au/GaAs Schottky diodesWang, Y. G. / Ashok, S. / Dietrich, H. et al. | 1987
- 1535
-
Summary Abstract: Semiconductor composition during metal/mercury–cadmium–telluride interface formationWall, A. / Raisanen, A. / Chang, S. / Philip, P. / Troullier, N. / Franciosi, A. / Peterman, D. J. et al. | 1987
- 1537
-
The effect of beam emittances on x‐ray lithography exposure line resolutionSo, D. / Lai, B. / Wells, G. M. / Cerrina, F. et al. | 1987
- 1544
-
Silicon cold cathodes as possible sources in electron lithography systemsvan Gorkom, G. G. P. / Hoeberechts, A. M. E. et al. | 1987
- 1549
-
Summary Abstract: Synchrotron lithography for high resolutionHeuberger, Anton et al. | 1987
- 1552
-
Summary Abstract: Focused ion beam implantation doping in GaAs/AlGaAs molecular‐beam epitaxy growthHashimoto, H. / Miyauchi, E. et al. | 1987
- 1554
-
Thin‐gate low‐pressure chemical vapor deposition oxidesFreeman, Dean W. et al. | 1987
- 1559
-
Kinetics of high‐temperature thermal decomposition of SiO2 on Si(100)Liehr, M. / Lewis, J. E. / Rubloff, G. W. et al. | 1987
- 1563
-
On dielectric breakdown in oxidized siliconWolters, D. R. / Zegers‐van Duijnhoven, A. T. A. et al. | 1987
- 1569
-
Characterization of ultrathin SiO2 films formed by direct low‐energy ion‐beam oxidationYu, C. F. / Todorov, S. S. / Fossum, E. R. et al. | 1987
- 1572
-
Gallium arsenide thin films by low‐temperature photochemical processesNishizawa, J. / Kurabayashi, T. / Abe, H. / Sakurai, N. et al. | 1987
- 1578
-
Relation of polymer structure to plasma etching behavior: Role of atomic fluorineCain, S. R. / Egitto, F. D. / Emmi, F. et al. | 1987
- 1585
-
Reactive ion etching related Si surface residues and subsurface damage: Their relationship to fundamental etching mechanismsOehrlein, Gottlieb S. / Lee, Young H. et al. | 1987
- 1595
-
Time‐of‐flight and surface residence time measurements for ion‐enhanced Si–Cl2 reaction productsRossen, Rebecca A. / Sawin, Herbert H. et al. | 1987
- 1600
-
Dry etching of n‐ and p‐type polysilicon: Parameters affecting the etch rateBerg, S. / Nender, C. / Buchta, R. / Norström, H. et al. | 1987
- 1604
-
Summary Abstract: A study of gallium arsenide and aluminum gallium arsenide reactive ion etching parametersScherer, A. / Beebe, E. / Craighead, H. G. et al. | 1987
- 1605
-
Summary Abstract: Silicon etching with a hot SF6 molecular beamSuzuki, Keizo / Ninomiya, Ken / Nishimatsu, Shigeru / Okada, Osami et al. | 1987
- 1606
-
Summary Abstract: Nanosecond ultraviolet laser induced etching of Si and Cu exposed to Cl2van Veen, G. N. A. / Baller, T. / Dieleman, J. / de Vries, A. E. et al. | 1987
- 1608
-
Summary Abstract: Mechanisms of laser interaction with metal carbonyls on Si(111)7×7: Identification of solely photochemical and solely thermal processesYing, Z. / Bartosch, C. E. / Gluck, N. S. / Ho, W. et al. | 1987
- 1617
-
An x‐ray photoelectron spectroscopy/Auger electron spectroscopy study of titanium–palladium thin films on silicon(111)Thomas, J. H. / Hoffman, D. M. / McGinn, J. T. / Tams, F. J. et al. | 1987
- 1621
-
An x‐ray photoelectron spectroscopy study on ozone treated InP surfacesIngrey, S. / Lau, W. M. / McIntyre, N. S. / Sodhi, R. et al. | 1987
- 1625
-
The growth and stability of Ag layers on Cu(110)Taylor, T. N. / Hoffbauer, M. A. / Maggiore, C. J. / Beery, J. G. et al. | 1987
- 1630
-
AlN thin films with controlled crystallographic orientations and their microstructureOhuchi, F. S. / Russell, P. E. et al. | 1987
- 1635
-
A study of O2 and CO adsorption on thin evaporated chromium filmsThurner, G. / Abermann, R. et al. | 1987
- 1640
-
The electronic structure of cubic SiC grown by chemical vapor deposition on Si(100)Hoechst, Hartmut / Tang, Ming / Johnson, B. C. / Meese, J. M. / Zajac, G. W. / Fleisch, T. H. et al. | 1987
- 1644
-
Structural order in Si–N and Si–N–O films prepared by plasma assisted chemical vapor deposition processBudhani, R. C. / Prakash, S. / Doerr, H. J. / Bunshah, R. F. et al. | 1987
- 1649
-
Sources of surface contamination affecting electrical characteristics of semiconductorsSlusser, G. J. / MacDowell, L. et al. | 1987
- 1652
-
Correlation of microstructure and composition of sputtered titanium nitride films with electrical and optical propertiesThorpe, T. P. / Elam, W. T. / Morrish, A. et al. | 1987
- 1655
-
Photoelectronic properties of a‐Si:H and a‐Ge:H thin films in surface cell structuresParsons, G. N. / Kusano, C. / Lucovsky, G. et al. | 1987
- 1661
-
Interference structure in optical scattering from oxide/metal interfacesBergkvist, M. / Roos, A. / Ribbing, C.‐G. et al. | 1987
- 1666
-
Molybdenum and tungsten–10% titanium deposition characterizationDawson, R. et al. | 1987
- 1671
-
Examination of thin films in the ZrO2–SiO2 system by transmission electron microscopy and x‐ray diffraction techniquesFarabaugh, E. N. / Feldman, A. / Sun, J. / Sun, Y. N. et al. | 1987
- 1675
-
Preparation and characterization of plasma enhanced chemical vapor deposited silicon nitride and oxynitride filmsVuillod, J. et al. | 1987
- 1680
-
Oxidation of microcrystalline Si:H:Cl filmsGrossman, E. / Grill, A. / Polak, M. et al. | 1987
- 1684
-
Summary Abstract: The importance of multiple scattering in x‐ray photoelectron and Auger electron diffraction in crystalsEgelhoff, W. F. et al. | 1987
- 1685
-
Summary Abstract: Characterization of ultrathin polyimide films (d∼11 Å) formed by vapor deposition of 4,4‐oxidianiline and 1,2,4,5‐benzenetetracarboxylic anhydrideGrunze, M. / Lamb, R. N. et al. | 1987
- 1686
-
Summary Abstract: Surface and structural characterization of thin films formed on aluminum alloysHomma, T. / Kobayashi, M. / Fujita, D. / Uda, M. et al. | 1987
- 1687
-
Summary Abstract: In situ surface and interface magnetic characterization of thin filmsKay, Eric et al. | 1987
- 1688
-
Summary Abstract: Characterization of sprayed antimony doped tin oxide filmsReddy, P. Sreedhara / Uthanna, S. / Reddy, P. Jayarama et al. | 1987
- 1690
-
Summary Abstract: Structure and electrical properties of grain boundaries in semiconductor crystalsMaurice, J.‐L. / Laval, J.‐Y. et al. | 1987
- 1691
-
Summary Abstract: Effect of grain boundaries on the electrical properties of a Schottky junctionCroitoru, N. / Mudrik, M. et al. | 1987
- 1693
-
Summary Abstract: Determination of electrical potential as a function of position on semi‐insulating polycrystalline silicon thin films using a scanning Auger microprobeComizzoli, R. B. / Opila, R. L. et al. | 1987
- 1694
-
Summary Abstract: Study of niobia–silica interfacial phenomena with model thin filmsWeissman, J. G. / Ko, E. I. / Wynblatt, P. et al. | 1987
- 1696
-
Formation of ceramic thin films by solid‐state interface reactionsHesse, D. et al. | 1987
- 1703
-
Selective deposition of Ti: An interface studyNender, C. / Berg, S. / Gelin, B. / Stridh, B. et al. | 1987
- 1708
-
Analysis of indium nitride surface oxidationFoley, C. P. / Lyngdal, J. et al. | 1987
- 1713
-
Oxidation kinetics for thin rare‐earth metal filmsBurnham, Alan K. / Jameson, Glen T. et al. | 1987
- 1717
-
Effects of Au film on the kinetics of platinum silicide formationSong, Jerng‐Sik / Chang, Chin‐An et al. | 1987
- 1721
-
Insulator interface effects in sputter‐deposited NbN/MgO/NbN (superconductor–insulator–superconductor) tunnel junctionsThakoor, S. / Leduc, H. G. / Stern, J. A. / Thakoor, A. P. / Khanna, S. K. et al. | 1987
- 1726
-
Near‐eutectic Si–Cr alloy formation with electron‐beam and laser pulsesD’Anna, E. / Leggieri, G. / Luches, A. / Majni, G. / Ottaviani, G. et al. | 1987
- 1730
-
Structural and electronic effects of the solid‐state amorphization and recrystallization of Cu–Ho thin filmsVenkert, A. / Shamir, N. / Talianker, M. / Atzmony, U. / Dariel, M. P. et al. | 1987
- 1733
-
Crystalline and quasicrystalline phases formed by interdiffusion in evaporated Al–Mn thin filmsCsanády, Á. / Urban, K. / Mayer, J. / Barna, P. B. et al. | 1987
- 1735
-
Reflection electron microscope study of Pt(111) surfacesOgawa, S. / Tanishiro, Y. / Takayanagi, K. / Yagi, K. et al. | 1987
- 1739
-
Summary Abstract: Mechanisms for selectivity loss during tungsten chemical vapor deposition on Si and SiO2Creighton, J. R. et al. | 1987
- 1740
-
Summary Abstract: Effects of a cesium ion beam on GaAs, InP, and SiGries, W. H. / Miethe, K. et al. | 1987
- 1741
-
Summary Abstract: Preparation and surface study of high‐Tc superconducting Nb–Ge filmChen, L. F. / Cao, Z. X. / Meng, S. Z. / Lin, Y. F / Li, Y. X. / Kuo, Y. H. et al. | 1987
- 1742
-
Summary Abstract: A comprehensive explanation of existing gold on NaCl nucleation dataGates, A. D. / Robins, J. L. et al. | 1987
- 1743
-
Summary Abstract: Heterocluster motion on solids: W–Si2 on W(110)Wrigley, John D. / Ehrlich, Gert et al. | 1987
- 1745
-
Summary Abstract: Precursor and chemisorption of CO on polycrystalline surfaces of NiBarber, R. / Glover, R. E. et al. | 1987
- 1746
-
Summary Abstract: The segregation of gold at copper/silver interphase boundariesDregia, S. A. / Wynblatt, P. / Bauer, C. L. et al. | 1987
- 1748
-
Summary Abstract: Evolution of hole shape in {100}, {110}, and {111} monocrystalline thin films of goldLanxner, M. / Bauer, C. L. / Scholz, R. et al. | 1987
- 1750
-
Spatial distribution of sputtered atoms from magnetron sourceSwann, S. et al. | 1987
- 1755
-
Crystallographic target effects in magnetron sputteringWickersham, C. E. et al. | 1987
- 1759
-
Summary Abstract: The use of electron and laser beams in processing microelectronic filmsYu, Z. / Moore, C. A. / Collins, G. J. et al. | 1987
- 1760
-
Summary Abstract: A new technique for in situ thin‐film chemical analysis in sputtering depositionHecq, Michel / Leleux, Jacques et al. | 1987
- 1762
-
Influence of ion beam parameters on the electrical and optical properties of ion‐assisted reactively evaporated vanadium dioxide thin filmsCase, F. C. et al. | 1987
- 1767
-
New oxidation state of tantalum oxide formed by reactive ion‐beam cosputtering of Ta and SiMorisaki, H. / Masaki, S. / Watanabe, S. et al. | 1987
- 1771
-
Formation of high‐quality, magnetron‐sputtered Ta2O5 films by controlling the transition region at the Ta2O5/Si interfaceSeki, Shunji / Unagami, Takashi / Kogure, Osamu / Tsujiyama, Bunjiro et al. | 1987
- 1775
-
Electrical and optical properties of thin Ta and W oxide films produced by reactive direct current magnetron sputteringHichwa, B. P. / Caskey, G. / Betz, D. F. / Harlow, J. D. et al. | 1987
- 1778
-
Growth and properties of radio frequency reactively sputtered titanium nitride thin filmsKumar, N. / Pourrezaei, K. / Fissel, M. / Begley, T. / Lee, B. / Douglas, E. C. et al. | 1987
- 1783
-
Preparation of Ge–Pb–O thin films by radio frequency reactive sputteringUmezawa, T. / Sasaki, K. et al. | 1987
- 1786
-
Effect of oxygen contamination on the deposition of hydrogenated amorphous silicon films by tetrode radio frequency sputteringGekka, Yasuo / Fukuda, Tadashi / Yasumura, Yoh‐ichi / Kezuka, Hiroshi / Akimoto, Makio et al. | 1987
- 1791
-
Summary Abstract: Resputtering during ion beam sputter depositionHoffman, D. W. / Badgley, J. S. et al. | 1987
- 1792
-
Summary Abstract: Theory of thin‐film orientation by ion bombardment during depositionBradley, R. Mark / Harper, James M. E. / Smith, David A. et al. | 1987
- 1793
-
Summary Abstract: Hydrogen‐free SiN films prepared by ion‐beam sputter depositionKitabatake, M. / Wasa, K. et al. | 1987
- 1795
-
Influence of thickness and hydrogen concentration on optical and electrical properties of a‐Si:H thin filmsRava, P. / Demichelis, F. / Kaniadakis, G. / Mpawenayo, P. / Tagliaferro, A. / Tresso, E. et al. | 1987
- 1798
-
Thermal annealing effects on amorphous radio frequency sputtered Cd0.95Fe0.05Te thin filmsAlvarez‐F., Octavio / Mendoza‐Alvarez, J. G. / Sanchez‐Sinencio, F. / Romero, Saul / Vidal, Miguel Angel et al. | 1987
- 1802
-
Silicide thickness calculations and phase identificationsChen, Jiann‐Ruey et al. | 1987
- 1806
-
Surface roughness for metallic thin films deposited upon various dielectric coatingsVarnier, F. / Mayani, N. / Rasigni, G. / Rasigni, M. / Llebaria, A. et al. | 1987
- 1809
-
Auger sputter profiling and factor analysis of thermally treated Ni–GaAs structures: The influence of oxygen on compounding and diffusionSolomon, J. S. / Smith, S. R. et al. | 1987
- 1816
-
Properties of nitrogen implanted nickel foilsEhni, P. D. / Unertl, W. N. et al. | 1987
- 1819
-
Junction and ohmic contact formation in compound semiconductors by rapid isothermal processingSingh, R. / Radpour, F. / Chou, P. / Nguyen, Q. / Joshi, S. P. / Ullal, H. S. / Matson, R. J. / Asher, S. et al. | 1987
- 1824
-
Properties of silicon and aluminum oxide thin films deposited by dual ion beam sputteringEmiliani, G. / Scaglione, S. et al. | 1987
- 1828
-
Organic films containing metal prepared by plasma polymerizationKashiwagi, K. / Yoshida, Y. / Murayama, Y. et al. | 1987
- 1831
-
Laser annealing of copper and silicon thin filmsBloch, J. / Zeiri, Y. et al. | 1987
- 1836
-
Effects of oxygen in ion‐beam sputter deposition of vanadium oxideChain, E. E. et al. | 1987
- 1840
-
Growth of ultrathin single‐crystal NiSi2 layers on Si(111)Tung, R. T. et al. | 1987
- 1845
-
The influence of the mica surface composition on the growth morphology of discontinuous epitaxial palladium vapor depositsKoch, R. / Poppa, H. et al. | 1987
- 1849
-
Development of a direct current reactively sputtered black chromium oxide coating for use in a high‐resolution color cathode‐ray tube applicationKulkarni, Sudhakar / Miller, Paul / Wagner, Michael et al. | 1987
- 1856
-
In situ transmission electron microscopy annealing of NiCr thin films with simultaneous Hall‐voltage measurementTóth, L. / Barna, Á. / Sáfrán, G. et al. | 1987
- 1860
-
Friction measurement of coated surfaces with a vibrated diamond stylusBaba, S. / Kikuchi, A. / Kinbara, A. et al. | 1987
- 1863
-
Isothermal desorption spectroscopy of CO from epitaxial (111) Pd/mica filmsGotoh, Y. / Vook, R. W. / Morales De La Garza, L. / Pan, Y. et al. | 1987
- 1867
-
Spot deposition by focusing in Penning discharge sputteringSugita, T. / Nishikawa, E. / Ebisawa, S. et al. | 1987
- 1870
-
Preparation of CoCr thin films on polymer substrates by ion beam sputteringSuzuki, Y. / Takiguchi, K. / Yoshitake, M. / Yotsuya, T. / Ogawa, S. et al. | 1987
- 1874
-
Plasma‐enhanced chemical vapor deposition SiN films: Some electrical propertiesLing, C. H. / Kwok, C. Y. / Prasad, K. et al. | 1987
- 1879
-
Radio frequency sputter deposition of SiO2 films at high rateLogan, J. S. / Jones, F. / Costable, J. / Lucy, J. E. et al. | 1987
- 1883
-
Nucleation and initial growth of In deposited on Si3N4 using low‐energy (≤300 eV) accelerated beams in ultrahigh vacuumHasan, M.‐A. / Barnett, S. A. / Sundgren, J.‐E. / Greene, J. E. et al. | 1987
- 1888
-
Metastable amorphous and crystalline (α,σ) phase in physical vapor deposited Fe–(Cr)–Ni–(C) depositsMalavasi, S. / Oueldennaoua, A. / Foos, M. / Frantz, C. et al. | 1987
- 1892
-
Stress control in reactively sputtered AlN and TiN filmsEste, G. / Westwood, W. D. et al. | 1987
- 1898
-
Heteroepitaxy of Ge on (100) Si substratesBaribeau, J. M. / Jackman, T. E. / Maigné, P. / Houghton, D. C. / Denhoff, M. W. et al. | 1987
- 1903
-
Summary Abstract: Comparative study of polycrystalline silicon thin films deposited by very low pressure chemical vapor deposition with and without plasma enhancementHajjar, J.‐J. J. / Reif, R. / Adler, D. et al. | 1987
- 1905
-
Summary Abstract: Molecular dynamics studies of dynamical processes on the silicon {100} reconstructed surfaceBrenner, Donald W. / Garrison, Barbara J. et al. | 1987
- 1906
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Summary Abstract: An optical, infrared, electron‐spin‐resonance, and Auger study of a‐Si:H films prepared by radio frequency sputtering in He/H2, Ar/H2, and Xe/H2Shinar, J. / Albers, M. L. / Bevolo, A. J. / Shanks, H. R. et al. | 1987
- 1907
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Summary Abstract: Glass and metal thin‐film interlayers for low‐temperature field assisted bondingLee, W. Y. / Sequeda, F. / Salem, J. / Chapman, D. et al. | 1987
- 1909
-
Summary Abstract: Optical properties of Cu films deposited using ion assisted depositionAl‐Jumaily, G. A. / Wilson, S. R. / DeHainaut, L. L. / McNally, J. J. / McNeil, J. R. et al. | 1987
- 1910
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Summary Abstract: Realization of antiparallel‐magnetized ferromagnetic double layer and the observation of spin‐wave modes by Brillouin scatteringZhang, P. X. / Zinn, W. et al. | 1987
- 1911
-
Summary Abstract: Germanium thin films deposited by the ionized‐cluster beam techniqueMcCalmont, Jonathan S. / Shanks, Howard R. / Lakin, Kenneth M. et al. | 1987
- 1913
-
Summary Abstract: Properties of hydrocarbon polymer films containing metal clustersKay, Eric / Laurent, Christian et al. | 1987
- 1914
-
Summary Abstract: Dramatic variation of the physical microstructure of a vapor deposited organic thin filmKam, K. K. / Debe, M. K. / Poirier, R. J. / Drube, A. R. et al. | 1987
- 1917
-
The effect of fluorine atoms on silicon and fluorocarbon etching in reactive ion beam etchingCheeks, Teresa L. / Ruoff, Arthur L. et al. | 1987
- 1921
-
Ion enhanced reactive etching of tungsten single crystals and films with XeF2Bensaoula, A. / Strozier, J. A. / Ignatiev, A. / Yu, J. / Wolfe, J. C. et al. | 1987
- 1925
-
Electrode separation and convex electrode surfaces in plasma etchingEisele, Konrad M. et al. | 1987
- 1928
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Summary Abstract: Etching with directed beams of ions or radicalsGeis, M. W. / Efremow, N. N. / Lincoln, G. A. et al. | 1987
- 1929
-
Summary Abstract: Spectroscopic diagnostics of photoresist erosion in an aluminum etch plasmaKrogh, Ole / Slomowitz, Harry / Melaku, Yosias / Blom, Hans‐Olof et al. | 1987
- 1931
-
Graphoepitaxy of Bi, In, and SnKlews, P.‐M. / Anton, R. / Harsdorff, M. et al. | 1987
- 1935
-
New phases of manganese achieved by epitaxial depositionHeinrich, B. / Arrott, A. S. / Liu, C. / Purcell, S. T. et al. | 1987
- 1941
-
Effect of thin titanium interfacial layers on the formation of palladium silicide on siliconHoffman, D. M. / McGinn, J. T. / Tams, F. J. / Thomas, J. H. et al. | 1987
- 1946
-
Summary Abstract: Ion‐beam crystallography of semiconductor interfaces and heteroepitaxial filmsvan der Veen, J. F. et al. | 1987
- 1947
-
Summary Abstract: Crystal growth, atomic ordering, and physical properties of epitaxial metastable semiconductorsGreene, J. E. et al. | 1987
- 1949
-
Preparation of a magneto‐optical disk using a rare earth–transition metal alloy targetAsari, S. / Asaka, T. / Ota, Y. / Nakamura, K. / Itoh, A. et al. | 1987
- 1952
-
Properties of Sn‐doped In2O3 by reactive magnetron sputtering and subsequent annealingYamamoto, S. / Yamanaka, T. / Ueda, Z. et al. | 1987
- 1956
-
Morphology and electrical properties of In doped CdS thin filmsDhere, Neelkanth G. / Moutinho, Helio R. / Dhere, Ramesh G. et al. | 1987
- 1960
-
Optical properties of Cs2O and Ag–Cs2O thin filmsWu, Quan‐De / Xue, Zeng‐Quan / Li, Jian‐Ping et al. | 1987
- 1965
-
Summary Abstract: Thin films for optical recording applicationsThomas, G. E. et al. | 1987
- 1966
-
Summary Abstract: The correlation of pit shape with the valence state of Ti in Te–Se–Ti alloy thin films for optical recording disksAbe, S. / Kobayashi, T. / Tsukane, N. / Tsukada, H. / Ikematsu, K. / Toba, H. et al. | 1987
- 1968
-
Effects of argon pressure and substrate heating on the chromium underlayer used for high‐density longitudinal CoNiCr mediaRavipati, Durga P. / Haines, William G. / Dockendorf, James L. et al. | 1987
- 1971
-
Sputtering target for production of CoNiCr/Cr sputtered hard diskYamada, T. / Higuchi, Y. / Tani, N. / Ishikawa, M. / Ota, Y. / Nakamura, K. / Itoh, A. et al. | 1987
- 1975
-
Summary Abstract: Perpendicular magnetic anisotropy in Co/Pd and Co/Pt superlatticesCarcia, Peter F. et al. | 1987
- 1976
-
Summary Abstract: Scanning electron microscope with polarization analysis studies of magnetic materialsUnguris, J. / Hembree, G. G. / Celotta, R. J. / Pierce, D. T. et al. | 1987
- 1979
-
Quantitative analysis of chemical vapor deposition refractory metal silicidesStreit, Lori A. / Williams, Peter et al. | 1987
- 1984
-
Study of the Ti/Si interface using x‐ray photoelectron and Auger electron appearance potential spectroscopiesChopra, D. R. / Chourasia, A. R. / Dillingham, T. R. / Peterson, Keith L. / Gnade, B. et al. | 1987
- 1988
-
Homogenization of tantalum pentoxide reference materials and the establishment of a reference standard for sputtering fluxes and for cross section measurements in nuclear instrumentsSeah, M. P. / Holbourn, M. W. / Davies, J. A. / Ortega, C. et al. | 1987
- 1994
-
Evidence for the neutralization of boron in silicon using surface analysis techniquesKazmerski, L. L. / Nelson, A. J. / Dhere, R. G. et al. | 1987
- 1998
-
Deposition of silicon oxynitride thin films by remote plasma enhanced chemical vapor depositionTsu, D. V. / Lucovsky, G. / Mantini, M. J. / Chao, S. S. et al. | 1987
- 2003
-
Growth mechanisms of anodic oxide and sulfide films on HgCdTeStrong, R. L. et al. | 1987
- 2007
-
The effect of lattice mismatch on the dynamical microstructure of III–V compound surfacesEbner, J. T. / Arthur, J. R. et al. | 1987
- 2011
-
High‐resolution electron energy‐loss spectroscopy measurements on hydrophilic silicon (100) wafers: Temperature and aging effectsGrundner, M. et al. | 1987
- 2016
-
Electron energy‐loss spectroscopy study of hydrogenated amorphous siliconBurnham, N. A. / Fisher, R. F. / Asher, S. E. / Kazmerski, L. L. et al. | 1987
- 2019
-
Systematics of electronic structure and local bonding for metal/GaAs(110) interfacesJoyce, J. J. / Grioni, M. / del Giudice, M. / Ruckman, M. W. / Boscherini, F. / Weaver, J. H. et al. | 1987
- 2024
-
Summary Abstract: Growth kinetics of thermally nitrided Si(100) by N2H4Peden, Charles H. F. / Van Deusen, Stuart B. et al. | 1987
- 2025
-
Summary Abstract: X‐ray photoelectron spectroscopy, ultraviolet photoelectron spectroscopy, and Auger electron spectroscopy study of (Cs–O) activated GaAs(100) surfacesBesançon, M. / Landers, R. / Jupille, J. et al. | 1987
- 2027
-
Summary Abstract: Application of reflection high‐energy electron diffraction to thin‐film growth and characterizationCohen, P. I. / Pukite, P. R. et al. | 1987
- 2028
-
Summary Abstract: Extended x‐ray absorption fine‐structure features in the reflectivity of x‐ray multilayersvan Brug, H. / van der Wiel, M. J. / Bruijn, M. P. / Verhoeven, J. et al. | 1987
- 2030
-
Summary Abstract: Interface formation in IV–IV heterostructures: Tin on siliconZinke‐Allmang, M. / Gossmann, H.‐J. / Feldman, L. C. / Fisanick, G. J. et al. | 1987
- 2032
-
Topics in inverse photoemissionDose, V. et al. | 1987
- 2038
-
Experimental studies of the electronic structure of I–II and I–III intermetallic compounds with B32 (Zintl) structureCurelaru, I. M. / Din, K.‐S. / Jang, G.‐E. / Chen, L.‐G. / Wall, E. / Susman, S. / Brun, T. O. / Volin, K. J. / Koch, E.‐E. / Horn, K. et al. | 1987
- 2042
-
Angle resolved ultraviolet photoemission spectroscopy study of the electronic structure of InSb(111) surfaces along the [110] azimuthHernández‐Calderón, I. / Höchst, H. / Mazur, A. / Pollmann, J. et al. | 1987
- 2046
-
Angle resolved ultraviolet photoelectron spectroscopy study of ultrathin iron films on Si(111) surfacesUrano, T. / Ogawa, T. / Kanaji, T. / Fujimoto, F. et al. | 1987
- 2051
-
A photoemission survey of the electronic properties of ternary semimagnetic semiconductor alloysWall, A. / Chang, S. / Philip, P. / Caprile, C. / Franciosi, A. / Reifenberger, R. / Pool, F. et al. | 1987
- 2057
-
Straightforward experimental evidence against the electron affinity ruleNiles, D. W. / Tang, Ming / Höchst, H. / Margaritondo, G. et al. | 1987
- 2060
-
Nonlinear optical response of [111] growth axis strained‐layer superlatticesSmith, D. L. / Mailhiot, C. et al. | 1987
- 2065
-
Summary Abstract: Low‐energy electron transmission through Cu/Ni quantum wellsZhu, Qi‐Gao / Yang, Yunong / Williams, Ellen D. / Park, Robert L. et al. | 1987
- 2067
-
Advances in vacuum contamination control for electronic materials processingO’Hanlon, John F. et al. | 1987
- 2073
-
Development of test bed system for high melting temperature alloy fabrication and mass spectroscopy analysis of liquid metal ion beam sourceHiguchi‐Rusli, R. H. / Corelli, J. C. / Steckl, A. J. / Cadien, K. C. et al. | 1987
- 2077
-
Automatic process control for artificially layered structuresGogol, C. A. / Deutschman, R. A. / Bean, J. C. et al. | 1987
- 2081
-
End‐Hall ion sourceKaufman, Harold R. / Robinson, Raymond S. / Seddon, Richard Ian et al. | 1987
- 2085
-
Stabilization of tetragonal ZrO2 with Al2O3 in reactive magnetron sputtered thin filmsGilmore, C. M. / Quinn, C. / Qadri, S. B. / Gossett, C. R. / Skelton, E. F. et al. | 1987
- 2088
-
Substrate temperature dependence of hillock, grain, and crystal orientation in sputtered Al–alloy filmsKobayashi, Tsukasa / Kitahara, Hiroaki / Hosokawa, Naokichi et al. | 1987
- 2092
-
The structure and electroluminescent characteristics of ZnS:Mn thin filmsNakanishi, Yoichiro / Shimaoka, Goro et al. | 1987
- 2098
-
Summary Abstract: Integrated system for studies of thin‐film chemical growth processes on silicon wafersRenier, M. / Liehr, M. / Gates, S. M. / O’Sullivan, J. / Rubloff, G. W. / Meyerson, B. S. et al. | 1987
- 2100
-
Epitaxial photochemical deposition of II–VI semiconductorsIrvine, S. J. C. / Mullin, J. B. et al. | 1987
- 2106
-
Ion beam sputter deposition and epitaxy of CdTe and HgCdTe filmsKrishnaswamy, S. V. / Rieger, J. H. / Doyle, N. J. / Francombe, M. H. et al. | 1987
- 2111
-
Thin metallic silicide films epitaxially grown on Si(111) and their role in Si–metal–Si devicesDerrien, J. / d’Avitaya, F. Arnaud et al. | 1987
- 2121
-
Crystalline intermediate phases in the formation of epitaxial NiSi2 on Si(111)Bennett, P. A. / Halawith, B. N. / Johnson, A. P. et al. | 1987
- 2127
-
Conductivity and mobility in very thin epitaxial NiSi2 layersHenzler, M. / Adamski, C. / Rönner, K. et al. | 1987
- 2131
-
Electrical properties of vacuum annealed Si surfacesLiehr, M. / Renier, M. / Wachnik, R. A. / Werner, J. / Scilla, G. S. / Ho, P. S. et al. | 1987
- 2135
-
Low‐temperature epitaxy of Si and Ge by direct ion beam depositionZuhr, R. A. / Appleton, B. R. / Herbots, N. / Larson, B. C. / Noggle, T. S. / Pennycook, S. J. et al. | 1987
- 2140
-
Summary Abstract: Epitaxial growth of ZnS and ZnSe on the low index faces of GaAs using atomic layer epitaxyNelson, Jeffrey G. et al. | 1987
- 2141
-
Summary Abstract: Core level spectroscopy of the GaAs‐on‐Si interfaceBringans, R. D. / Olmstead, M. A. / Uhrberg, R. I. G. / Bachrach, R. Z. et al. | 1987