Blind reconstruction of scanning probe image data (English)
- New search for: Williams, P. M.
- New search for: Shakesheff, K. M.
- New search for: Davies, M. C.
- New search for: Jackson, D. E.
- New search for: Roberts, C. J.
- New search for: Tendler, S. J. B.
- New search for: Williams, P. M.
- New search for: Shakesheff, K. M.
- New search for: Davies, M. C.
- New search for: Jackson, D. E.
- New search for: Roberts, C. J.
- New search for: Tendler, S. J. B.
In:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
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14
, 2
;
1557-1562
;
1996
- Article (Journal) / Electronic Resource
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Title:Blind reconstruction of scanning probe image data
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Additional title:Blind reconstruction of scanning probe image data
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Contributors:Williams, P. M. ( author ) / Shakesheff, K. M. ( author ) / Davies, M. C. ( author ) / Jackson, D. E. ( author ) / Roberts, C. J. ( author ) / Tendler, S. J. B. ( author )
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Published in:
-
Publisher:
- New search for: American Vacuum Society
-
Publication date:1996-03-01
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Size:6 pages
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ISSN:
-
DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 14, Issue 2
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 585
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Nanocluster formation by spin coating: Quantitative atomic force microscopy and Rutherford backscattering spectrometry analysisPartridge, A. / Toussaint, S. L. G. / Flipse, C. F. J. / van IJzendoorn, L. J. / van den Oetelaar, L. C. A. et al. | 1996
- 593
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Direct observation of fullerene‐adsorbed tips by scanning tunneling microscopyKelly, K. F. / Sarkar, Dipankar / Prato, Stefano / Resh, J. S. / Hale, G. D. / Halas, N. J. et al. | 1996
- 597
-
Microfabrication of near‐field optical probesRuiter, A. G. T. / Moers, M. H. P. / van Hulst, N. F. / de Boer, M. et al. | 1996
- 602
-
Scanning force microscopy for the study of domain structure in ferroelectric thin filmsGruverman, A. / Auciello, O. / Tokumoto, H. et al. | 1996
- 606
-
Electron trajectories and light emitting images of starlike thin‐film field emittersKaneko, Akira / Sumita, Isao et al. | 1996
- 612
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Fabrication of Si field emitters by dry etching and mask erosionRakhshandehroo, M. R. / Pang, S. W. et al. | 1996
- 617
-
Ballistic electron emission microscopy studies of electron scattering in Au/GaAs Schottky diodes damaged by focused ion beam implantationMcNabb, J. W. / Craighead, H. G. et al. | 1996
- 623
-
Atomic scale roughness of GaAs(001)2×4 surfacesFan, Y. / Karpov, I. / Bratina, G. / Sorba, L. / Gladfelter, W. / Franciosi, A. et al. | 1996
- 632
-
Application of phase‐sensitive photoreflectance spectroscopy to a study of undoped AlGaAs/GaAs quantum well structuresHughes, P. J. / Weiss, B. L. et al. | 1996
- 638
-
Nonlinear characteristics induced by carrier accumulation in InAs/GaAs superlattice cap layer on GaAs/GaAlAs multi‐quantum well structureMatsui, Y. / Kusumi, Y. et al. | 1996
- 642
-
Strain relaxation in compositionally graded epitaxial layersKim, Sam‐Dong / Lord, Susan M. / Harris, James S. et al. | 1996
- 647
-
Characterization of oxide desorption from InSb(001) substratesLiu, W. K. / Santos, M. B. et al. | 1996
- 652
-
Thermal stability and degradation mechanism of WSiN/InGaP Schottky diodesShiojima, Kenji / Nishimura, Kazumi / Hyuga, Fumiaki et al. | 1996
- 657
-
High‐temperature stable Ir–Al/n‐GaAs Schottky diodes: Effect of the barrier height controllingLalinský, T. / Osvald, J. / Machajdík, D. / Mozolová, Z̆. / S̆is̆olák, J. / Constantinidis, G. / Kobzev, A. P. et al. | 1996
- 662
-
Electron beam induced deposition from W(CO)6 at 2 to 20 keV and its applicationsHoyle, P. C. / Cleaver, J. R. A. / Ahmed, H. et al. | 1996
- 674
-
Properties of TaNx films as diffusion barriers in the thermally stable Cu/Si contact systemsTakeyama, Mayumi / Noya, Atsushi / Sase, Touko / Ohta, Akira / Sasaki, Katsutaka et al. | 1996
- 679
-
Simulation of uniformity and lifetime effects in collimated sputteringTait, R. N. / Dew, S. K. / Tsai, W. / Hodul, D. / Smy, T. / Brett, M. J. et al. | 1996
- 687
-
Number of voids formed on a line: Parameter for electromigration lifetimeHinode, Kenji / Kondo, Seiichi / Deguchi, Osamu et al. | 1996
- 691
-
Study of the H2 remote plasma cleaning of InP substrate for epitaxial growthLosurdo, M. / Capezzuto, P. / Bruno, G. et al. | 1996
- 698
-
Optical properties of reactive‐ion‐etched Si/Si1−xGex heterostructuresKöster, T. / Gondermann, J. / Hadam, B. / Spangenberg, B. / Schütze, M. / Roskos, H. G. / Kurz, H. / Brunner, J. / Abstreiter, G. et al. | 1996
- 707
-
Enhanced dry etching of silicon with deuterium plasmaIwakuro, Hiroaki / Kuroda, Tsukasa / Shen, Dian‐Hong / Lin, Zhangda et al. | 1996
- 710
-
SiO2 to Si selectivity mechanisms in high density fluorocarbon plasma etchingKirmse, K. H. R. / Wendt, A. E. / Disch, S. B. / Wu, J. Z. / Abraham, I. C. / Meyer, J. A. / Breun, R. A. / Woods, R. Claude et al. | 1996
- 716
-
MxP+: A new dielectric etcher with enabling technology, high productivity, and low cost‐of‐consumablesShan, Hongching / Lee, Evans / Welch, Michael / Pu, Bryan / Carducci, James / Ke, Kuang‐Han / Gao, Hua / Luscher, Paul / Crean, Gerard / Wang, Rynn et al. | 1996
- 724
-
Effect of fluorine concentration on the etch characteristics of fluorinated tetraethylorthosilicate filmsAllen, Lynn R. et al. | 1996
- 727
-
Effects of native oxide removal from silicon substrate and annealing on SiO2 films deposited at 120 °C by plasma enhanced chemical vapor deposition using disilane and nitrous oxideSong, Juho / Ajmera, P. K. / Lee, G. S. et al. | 1996
- 732
-
Inductively coupled plasma for polymer etching of 200 mm wafersForgotson, N. / Khemka, V. / Hopwood, J. et al. | 1996
- 738
-
Investigation of low temperature SiO2 plasma enhanced chemical vapor depositionDeshmukh, Shashank C. / Aydil, Eray S. et al. | 1996
- 744
-
Real time investigation of nucleation and growth of silicon on silicon dioxide using silane and disilane in a rapid thermal processing systemHu, Y. Z. / Diehl, D. J. / Zhao, C. Y. / Wang, C. L. / Liu, Q. / Irene, E. A. / Christensen, K. N. / Venable, D. / Maher, D. M. et al. | 1996
- 751
-
Rugged surface polycrystalline silicon film deposition and its application in a stacked dynamic random access memory capacitor electrodeIno, M. / Miyano, J. / Kurogi, H. / Tamura, H. / Nagatomo, Y. / Yoshimaru, M. et al. | 1996
- 757
-
Reliability of ultimate ultrathin silicon oxide films produced by the continuous ultradry processYamada, Hiroshi et al. | 1996
- 763
-
Quantitative depth profiling of boron in shallow BF+2‐implanted silicon by using laser‐ionization sputtered neutral mass spectrometryHigashi, Yasuhiro / Maruo, Tetsuya / Homma, Yoshikazu / Miyake, Masayasu et al. | 1996
- 768
-
Growth of copper nanocrystallites on copper seed cones: Evidence for the presence of a liquid phase on an ion‐impacting cone surfaceOkuyama, F. et al. | 1996
- 772
-
Role of gas phase reactions in subatmospheric chemical‐vapor deposition ozone/TEOS processes for oxide depositionShareef, I. A. / Rubloff, G. W. / Gill, W. N. et al. | 1996
- 789
-
Biosensor based on force microscope technologyBaselt, David R. / Lee, Gil U / Colton, Richard J. et al. | 1996
- 794
-
Scanning local‐acceleration microscopyBurnham, N. A. / Kulik, A. J. / Gremaud, G. / Gallo, P.‐J. / Oulevey, F. et al. | 1996
- 800
-
Scanning near‐field optical microscopy/spectroscopy of thin organic filmsNagahara, L. A. / Tokumoto, H. et al. | 1996
- 804
-
Characteristics of photon scanning tunneling microscope read‐outKobayashi, Kiyoshi / Watanuki, Osaaki et al. | 1996
- 809
-
Molecular orientation in polymers from near‐field optical polarization measurementsWilliamson, R. L. / Miles, M. J. et al. | 1996
- 812
-
Imaging of organic molecular films using a scanning near‐field optical microscope combined with an atomic force microscopeYamada, Hirofumi / Tokumoto, Hiroshi / Akamine, Shinya / Fukuzawa, Kenji / Kuwano, Hiroki et al. | 1996
- 816
-
Scattering of electromagnetic waves by silicon‐nitride tipsBouju, X. / Dereux, A. / Vigneron, J. P. / Girard, C. et al. | 1996
- 820
-
Heterostructure interface characterization using scanning tunneling microscope excited time‐resolved luminescenceHorn, J. / Vogt, A. / Aller, I. / Hartnagel, H. L. / Stehle, M. et al. | 1996
- 824
-
Study of luminescent porous polycrystalline silicon thin filmsHan, P. G. / Poon, M. C. / Ko, P. K. / Sin, J. K. O. / Wong, H. et al. | 1996
- 827
-
Design and performance analysis of a three‐dimensional sample translation device used in ultrahigh vacuum scanned probe microscopySchlittler, R. R. / Gimzewski, J. K. et al. | 1996
- 832
-
Thermal imaging of thin films by scanning thermal microscopeOesterschulze, E. / Stopka, M. / Ackermann, L. / Scholz, W. / Werner, S. et al. | 1996
- 838
-
Microwave tunneling current from the resonant interaction of an amplitude modulated laser with a scanning tunneling microscopeHagmann, Mark J. et al. | 1996
- 842
-
Voltage contrast in submicron integrated circuits by scanning force microscopyBöhm, Christoph / Sprengepiel, Jörg / Otterbeck, Markus / Kubalek, Erich et al. | 1996
- 845
-
Normal and lateral force images, sub‐angstrom height resolution, and midlevel lateral resolution with a phonograph cartridge as scanning force sensorMariani, Tullio / Frediani, Carlo / Ascoli, Cesare et al. | 1996
- 849
-
Shearing stress on the surface topography by scanning shearing stress microscopyIwata, Futoshi / Sasaki, Akira / Kawaguchi, Makoto / Katsumata, Akira / Aoyama, Hisayuki et al. | 1996
- 852
-
Gamble mode: Resonance contact mode in atomic force microscopyO’Connor, S. D. / Gamble, R. C. / Eby, R. K. / Baldeschwieler, J. D. et al. | 1996
- 856
-
Atomic force microscopy and lateral force microscopy using piezoresistive cantileversLinnemann, R. / Gotszalk, T. / Rangelow, I. W. / Dumania, P. / Oesterschulze, E. et al. | 1996
- 861
-
New optoelectronic tip design for ultrafast scanning tunneling microscopyGroeneveld, R. H. M. / Rasing, Th. / Kaufmann, L. M. F. / Smalbrugge, E. / Wolter, J. H. / Melloch, M. R. / van Kempen, H. et al. | 1996
- 864
-
Driven nonlinear atomic force microscopy cantilevers: From noncontact to tapping modes of operationSarid, Dror / Ruskell, Todd G. / Workman, Richard K. / Chen, Dong et al. | 1996
- 868
-
Direct measurement of laser momentum transfer to dense media by means of atomic force microscopy cantileversLabardi, M. / La Rocca, G. C. / Mango, F. / Bassani, F. / Allegrini, M. et al. | 1996
- 872
-
Scanning force microscopy with two optical levers for detection of deformations of the cantileverKawakatsu, Hideki / Saito, Takashi et al. | 1996
- 877
-
Acoustic and dynamic force microscopy with ultrasonic probesMurdfield, Th. / Fischer, U. C. / Fuchs, H. / Volk, R. / Michels, A. / Meinen, F. / Beckman, E. et al. | 1996
- 882
-
Strain‐imaging observation of a Pb(Zr,Ti)O3 thin filmTakata, Keiji et al. | 1996
- 887
-
Imaging mechanism and effects of adsorbed water in contact‐type scanning capacitance microscopyNakagiri, Nobuyuki / Yamamoto, Takuma / Sugimura, Hiroyuki / Suzuki, Yoshihiko et al. | 1996
- 892
-
Imaging conducting surfaces and dielectric films by a scanning capacitance microscopeLányi, Š. / Török, J. / Řehůřek, P. et al. | 1996
- 897
-
Scanning tunneling microscopy head having integrated capacitive sensors for calibration of scanner displacementsPicotto, G. B. / Desogus, S. / Lányi, Š. / Nerino, R. / Sosso, A. et al. | 1996
- 901
-
Scanning force microscopy in the dynamic mode using microfabricated capacitive sensorsBlanc, N. / Brugger, J. / de Rooij, N. F. / Dürig, U. et al. | 1996
- 906
-
Atomic structure of the steps on Si(001) studied by scanning tunneling microscopyKomura, T. / Yoshimura, M. / Yao, T. et al. | 1996
- 909
-
Scanning tunneling microscopy investigation of the dimer vacancy–dimer vacancy interaction on the Si(001) 2×n surfaceSmith, A. R. / Men, F. K. / Chao, K.‐J. / Zhang, Zhenyu / Shih, C. K. et al. | 1996
- 914
-
Variable low‐temperature scanning tunneling microscopy study of Si(001): Nature of the 2×1→c(2×4) phase transitionSmith, A. R. / Men, F. K. / Chao, K.‐J. / Shih, C. K. et al. | 1996
- 918
-
Laser desorption from and reconstruction on Si(100) surfaces studied by scanning tunneling microscopyXu, Jun / Overbury, S. H. / Wendelken, J. F. et al. | 1996
- 925
-
Low‐temperature scanning tunneling microscopy on vicinal Ge(100)Röttger, B. / Bertrams, Th. / Neddermeyer, H. et al. | 1996
- 929
-
Atomic structure of the diamond (100) surface studied using scanning tunneling microscopyStallcup II, R. E. / Villarreal, L. M. / Lim, S. C. / Akwani, I. / Aviles, A. F. / Perez, J. M. et al. | 1996
- 933
-
Scanning tunneling microscopy study of SiC(0001) surface reconstructionsOwman, Fredrik / Mårtensson, Per et al. | 1996
- 938
-
Surface structure of 3C–SiC(111) fabricated by C60 precursor: A scanning tunneling microscopy and high‐resolution electron energy loss spectroscopy studyHu, C.‐W. / Kasuya, A. / Suto, S. / Wawro, A. / Nishina, Y. et al. | 1996
- 943
-
(2×4)/c(2×8) to (4×2)/c(8×2) transition on GaAs(001) surfacesMoriarty, P. / Beton, P. H. / Ma, Y.‐R. / Dunn, A. W. / Henini, M. / Woolf, D. A. et al. | 1996
- 948
-
Application of scanning tunneling microscopy to determine the exact charge states of surface point defectsChao, K.‐J. / Smith, A. R. / Shih, C. K. et al. | 1996
- 953
-
Atomic resolution imaging of InP(110) surface observed with ultrahigh vacuum atomic force microscope in noncontact modeSugawara, Y. / Ohta, M. / Ueyama, H. / Morita, S. / Osaka, F. / Ohkouchi, S. / Suzuki, M. / Mishima, S. et al. | 1996
- 957
-
InSb(1̄ 1̄ 1̄)3×1: New surface reconstructionBjörkqvist, M. / Göthelid, M. / Olsson, L. Ö. / Kanski, J. / Karlsson, U. O. et al. | 1996
- 961
-
Intrinsic defects at TiO2(110) surfaces studied with scanning tunneling microscopyFischer, Stefan / Munz, Andreas W. / Schierbaum, Klaus‐Dieter / Göpel, Wolfgang et al. | 1996
- 966
-
Scanning tunneling microscopy of the UO2 (111) surfaceCastell, M. R. / Muggelberg, C. / Briggs, G. A. D. / Goddard, D. T. et al. | 1996
- 970
-
Layer‐by‐layer etching of HgI2 films and crystals by scanning force microscopyLang, H. P. / Erler, B. / Rossberg, A. / Piechotka, M. / Kaldis, E. / Güntherodt, H.‐J. et al. | 1996
- 974
-
Growth of a uniaxial incommensurate C60 lattice on Ge(100)2×1Klyachko, D. / Chen, Dongmin et al. | 1996
- 979
-
Adsorption and decomposition of C60 molecules on Si(111) surfacesChen, Dong / Workman, Richard K. / Sarid, Dror et al. | 1996
- 982
-
Low coverage adsorption of Sb4 on Si(113) studied by scanning tunneling microscopyMüssig, H.‐J. / Da̧browski, J. / Arabczyk, W. / Hinrich, S. / Wolff, G. et al. | 1996
- 988
-
Atomic‐hydrogen‐induced Ag cluster formation on Si(111)‐√3×√3–Ag surface observed by scanning tunneling microscopyOura, Kenjiro / Ohnishi, Hideaki / Yamamoto, Yasuji / Katayama, Itsuo / Ohba, Yasuyuki et al. | 1996
- 992
-
Ga‐induced restructuring of Si(112) and Si(337)Baski, A. A. / Whitman, L. J. et al. | 1996
- 995
-
Initial stages of In adsorption on Si(111) 7×7Lin, X. F. / Mai, H. A. / Chizhov, I. / Willis, R. F. et al. | 1996
- 1000
-
Scanning tunneling microscopy of Sr adsorption on the Si(100)‐2×1 surfaceBakhtizin, R. Z. / Kishimoto, J. / Hashizume, T. / Sakurai, T. et al. | 1996
- 1005
-
Pb/Si(111) investigation at the ultralow‐coverage rangeGómez‐Rodríguez, J. M. / Veuillen, J.‐Y. / Cinti, R. C. et al. | 1996
- 1010
-
Submonolayer Pb deposition on Si(100) studied by scanning tunneling microscopyVeuillen, J.‐Y. / Gómez‐Rodríguez, J.‐M. / Cinti, R. C. et al. | 1996
- 1015
-
Studies of low coverage adsorption of Li on Si(001): Observation of negative differential resistance and electron trappingJohansson, Mikael K.‐J. / Gray, Struan M. / Johansson, Lars S. O. et al. | 1996
- 1019
-
High‐temperature scanning tunneling microscopy study of the Li/Si(111) surfaceOlthoff, S. / Welland, M. E. et al. | 1996
- 1024
-
Island, trimer, and chain formation on the Sb‐terminated GaAs(111)B surfaceMoriarty, P. / Beton, P. H. / Henini, M. / Woolf, D. A. et al. | 1996
- 1029
-
Scanning tunneling microscopy study of the interfacial structure of nickel silicidesYoshimura, M. / Shinabe, S. / Yao, T. et al. | 1996
- 1032
-
Interaction of vinyltrimethylsilane with the Si(111)‐(7×7) surfaceAndersohn, L. / Kochanski, G. P. / Norman, J. A. T. / Hinch, B. J. et al. | 1996
- 1038
-
Combined scanning tunneling microscopy and infrared spectroscopy study of the interaction of diborane with Si(001)Wang, Yajun / Shan, Jun / Hamers, Robert J. et al. | 1996
- 1043
-
Nanoscale roughening of Si(001) by oxide desorption in ultrahigh vacuumGray, Struan M. / Johansson, Mikael K.‐J. / Johansson, Lars S. O. et al. | 1996
- 1048
-
Initial stages of the nitridation of the Si(111) surface observed by scanning tunneling microscopyYoshimura, M. / Takahashi, E. / Yao, T. et al. | 1996
- 1051
-
Adsorption and reaction of NO on Si(111) studied by scanning tunneling microscopyRöttger, B. / Kliese, R. / Neddermeyer, H. et al. | 1996
- 1055
-
Correlation between contact‐electrified charge groups on a thin silicon oxideUchihashi, Takayuki / Okusako, Takahiro / Sugawara, Yasuhiro / Yamanishi, Yoshiki / Oasa, Takahiko / Morita, Seizo et al. | 1996
- 1060
-
Structure and electronic states on reduced BaTiO3 (100) surface observed by scanning tunneling microscopy and spectroscopyBando, Hiroshi / Shimitzu, Tetsushi / Aiura, Yoshihiro / Haruyama, Yuichi / Oka, Kunihiko / Nishihara, Yoshikazu et al. | 1996
- 1064
-
Probing complex low‐dimensional solids with scanning probe microscopes: From charge density waves to high‐temperature superconductivityLiu, Jie / Huang, Jin‐Lin / Lieber, Charles M. et al. | 1996
- 1070
-
Spatial and energy variation of the local density of states in the charge density wave phase of 2H–NbSe2Mallet, P. / Sacks, W. / Roditchev, D. / Défourneau, D. / Klein, J. et al. | 1996
- 1075
-
Moiré patterns in scanning tunneling microscopy images of layered materialsKobayashi, Katsuyoshi et al. | 1996
- 1079
-
Scanning tunneling microscope investigations of lead–phthalocyanine on MoS2Strohmaier, R. / Ludwig, C. / Petersen, J. / Gompf, B. / Eisenmenger, W. et al. | 1996
- 1083
-
Atomic force microscopy of mercury iodide crystal growth from porous media at room temperatureHenderson, D. O. / Tung, Y. S. / Mu, R. / Ueda, A. / Collins, W. E. / Burger, A. / Chen, K. T. / Frazier, D. O. et al. | 1996
- 1090
-
Atomic force microscopy study of mercuric iodide surfacesTung, Y. S. / Henderson, D. O. / Mu, R. / Collins, W. E. / Chen, K. T. / George, M. A. / Burger, A. et al. | 1996
- 1096
-
Layered heavy metal iodides examined by atomic force microscopyGeorge, M. A. / Chen, K.‐T. / Collins, W. E. / Burger, A. / Nason, D. / Boatner, L. et al. | 1996
- 1105
-
Surface morphology of metalorganic vapor phase epitaxy grown InAs and InGaAs observed by atomic force microscopyHsu, C. C. / Xu, J. B. / Wilson, I. H. et al. | 1996
- 1109
-
Molecular arrangement of copper phthalocyanine on hydrogen‐terminated Si(111): Influence of surface roughnessNakamura, M. / Morita, Y. / Mori, Y. / Ishitani, A. / Tokumoto, H. et al. | 1996
- 1114
-
Atomic scale reaction regulated in one‐dimensional channels evidenced by scanning tunneling microscopyMatsumoto, Yuji / Tanaka, Ken‐ichi et al. | 1996
- 1117
-
Tip‐induced lifting of the Au{100} (hex)‐phase reconstruction in a low temperature ultrahigh vacuum scanning tunneling microscopeBuisset, J. / Rust, H.‐P. / Schweizer, E. K. / Cramer, L. / Bradshaw, A. M. et al. | 1996
- 1121
-
Comparative study of the interface roughness of Ag/Au and Cu/Au multilayers with scanning tunneling microscopy and x‐ray diffractionHeyvaert, I. / Temst, K. / Van Haesendonck, C. / Bruynseraede, Y. et al. | 1996
- 1126
-
Structure of epitaxial thin TiOx films on W(110) as studied by low energy electron diffraction and scanning tunneling microscopyHerman, G. S. / Gallagher, M. C. / Joyce, S. A. / Peden, C. H. F. et al. | 1996
- 1131
-
Equilibrium morphology of Au(111) vicinal surfaces revealed by scanning tunneling microscopyRousset, S. / Pourmir, F. / Gauthier, S. / Lacaze, E. / Sotto, M. / Klein, J. / Lecoeur, J. et al. | 1996
- 1136
-
Spatially and rotationally oriented adsorption of molecular adsorbates on Ag(111) investigated using cryogenic scanning tunneling microscopyChen, X. / Frank, E. R. / Hamers, R. J. et al. | 1996
- 1141
-
Growth of NiO(100) layers on Ag(100): Characterization by scanning tunneling microscopyBertrams, Th. / Neddermeyer, H. et al. | 1996
- 1145
-
Diffusion of atoms on Au(111) by the electric field gradient in scanning tunneling microscopyMéndez, J. / Gómez‐Herrero, J. / Pascual, J. I. / Sáenz, J. J. / Soler, J. M. / Baró, A. M. et al. | 1996
- 1149
-
Vicinal surfaces of Au(110) and Ag(110) investigated by scanning tunneling microscopyLi, J. T. / Berndt, R. / Gaisch, R. / Schneider, W.‐D. et al. | 1996
- 1153
-
Tapping mode atomic force microscopy observation of self‐affine fractal roughness in electrochemically roughened silver electrode surfacesOtsuka, I. / Iwasaki, T. et al. | 1996
- 1157
-
Atomic force microscopy investigations of loaded crack tips in NiAlGöken, M. / Vehoff, H. / Neumann, P. et al. | 1996
- 1162
-
In situ scanning tunneling microscope investigation of passivation and stainless steels and ironSchreyer, A. / Eng, L. / Böhni, H. et al. | 1996
- 1167
-
Vacuum plasma sprayed hydroxyapatite coatings on titanium alloy substrates: Surface characterization and observation of dissolution processes using atomic force microscopyCampbell, P. A. / Gledhill, H. C. / Brown, S. R. / Turner, I. G. et al. | 1996
- 1173
-
Scanning tunneling microscopy and spectroscopy on thin Fe3O4 (110) films on MgOJansen, R. / van Kempen, H. / Wolf, R. M. et al. | 1996
- 1176
-
Spatially resolved electron tunneling spectroscopy on single crystalline Rb3C60Jess, P. / Hubler, U. / Behler, S. / Thommen‐Geiser, V. / Lang, H. P. / Güntherodt, H.‐J. et al. | 1996
- 1180
-
Surface structure of ferroelectric domains on the triglycine sulfate (010) surfaceBluhm, H. / Wiesendanger, R. / Meyer, K.‐P. et al. | 1996
- 1184
-
Magnetic force microscopy analysis of the micromagnetization mode of double‐layered perpendicular magnetic recording mediaHomma, T. / Kurokawa, Y. / Nakamura, T. / Osaka, T. / Otsuka, I. et al. | 1996
- 1188
-
Growth structure of Fe on the Cu(001) surfaceNoh, H. P. / Choi, Y. J. / Park, J. Y. / Jeong, I. C. / Suh, Y. D. / Kuk, Y. et al. | 1996
- 1191
-
Deconvolution of topographic and ferroelectric contrast by noncontact and friction force microscopyEng, L. M. / Friedrich, M. / Fousek, J. / Günter, P. et al. | 1996
- 1197
-
Low‐temperature magnetic resonance force detectionWago, K. / Züger, O. / Kendrick, R. / Yannoni, C. S. / Rugar, D. et al. | 1996
- 1202
-
Scanning Hall probe microscopy of superconductors and magnetic materialsOral, A. / Bending, S. J. / Henini, M. et al. | 1996
- 1206
-
Scanning tunneling microscope for magneto‐optical imagingPrins, M. W. J. / Groeneveld, R. H. M. / Abraham, D. L. / Schad, R. / van Kempen, H. / van Kesteren, H. W. et al. | 1996
- 1210
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Vortex images in thin films of YBa2Cu3O7−x and Bi2Sr2Ca1Cu2O8+x obtained by low‐temperature magnetic force microscopyYuan, C. W. / Zheng, Z. / de Lozanne, A. L. / Tortonese, M. / Rudman, D. A. / Eckstein, J. N. et al. | 1996
- 1214
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Domain structure of Co/Pt multilayers studied by magnetic force microscopyLöhndorf, M. / Wadas, A. / Wiesendanger, R. / van Kesteren, H. W. et al. | 1996
- 1217
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Spectroscopic study of the CuO chains in YBa2Cu3O7−xEdwards, Hal / Derro, D. J. / Barr, A. L. / Markert, J. T. / de Lozanne, A. L. et al. | 1996
- 1221
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Schottky barrier height measurement on NiSi2/Si(100) by capacitance microscopeKhang, Y. / Mang, K. M. / Booh, K. H. / Kuk, Y. et al. | 1996
- 1224
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Scanning tunneling spectroscopy on low‐ and high‐Tc superconductorsMielke, F. / Memmert, U. / Golubov, A. A. / Hartmann, U. et al. | 1996
- 1229
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Observation of Coulomb staircase and negative differential resistance at room temperature by scanning tunneling microscopyRadojkovic, P. / Schwartzkopff, M. / Enachescu, M. / Stefanov, E. / Hartmann, E. / Koch, F. et al. | 1996
- 1234
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Charge injection and extraction on organic dot structures by atomic force microscopyHieda, Hiroyuki / Tanaka, Kuniyoshi / Gemma, Nobuhiro et al. | 1996
- 1238
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Role of interface microstructure in rectifying metal/semiconductor contacts: Ballistic electron emission observations correlated to microstructureMorgan, Brent A. / Ring, Ken M. / Kavanagh, Karen L. / Talin, A. Alec / Williams, R. Stanley / Yasuda, Takashi / Yasui, Takanari / Segawa, Yusaburo et al. | 1996
- 1243
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Energy band of manipulated atomic structures on an insulator substrateYamada, Toshishige / Yamamoto, Yoshihisa / Harrison, Walter A. et al. | 1996
- 1250
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Elastic deformations of tip and sample during atomic force microscope measurementsHeuberger, Manfred / Dietler, Giovanni / Schlapbach, Louis et al. | 1996
- 1255
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Friction forces on hydrogen passivated (110) silicon and silicon dioxide studied by scanning force microscopyScandella, L. / Meyer, E. / Howald, L. / Lüthi, R. / Guggisberg, M. / Gobrecht, J. / Güntherodt, H. ‐J. et al. | 1996
- 1259
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Study of plastic flow in ultrasmall Au contactsStalder, A. / Dürig, U. et al. | 1996
- 1264
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Influence of humidity on friction measurements of supported MoS2 single layersSchumacher, A. / Kruse, N. / Prins, R. / Meyer, E. / Lüthi, R. / Howald, L. / Güntherodt, H.‐J. / Scandella, L. et al. | 1996
- 1268
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Nanometer‐scale modification of tribomechanical properties of Si(111):H surfaces performed and investigated by a conducting‐probe scanning force microscopeTeuschler, T. / Mahr, K. / Miyazaki, S. / Hundhausen, M. / Ley, L. et al. | 1996
- 1272
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Study of molecular scale friction on stearic acid crystals by friction force microscopyTakano, Hajime / Fujihira, Masamichi et al. | 1996
- 1276
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Dewetting dynamics and nucleation of polymers observed by elastic and friction force microscopyOverney, R. M. / Leta, D. P. / Fetters, L. J. / Liu, Y. / Rafailovich, M. H. / Sokolov, J. et al. | 1996
- 1280
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Friction on the atomic scale: An ultrahigh vacuum atomic force microscopy study on ionic crystalsLüthi, R. / Meyer, E. / Bammerlin, M. / Howald, L. / Haefke, H. / Lehmann, T. / Loppacher, C. / Güntherodt, H.‐J. / Gyalog, T. / Thomas, H. et al. | 1996
- 1285
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Site‐specific friction force spectroscopyMeyer, E. / Lüthi, R. / Howald, L. / Bammerlin, M. / Guggisberg, M. / Güntherodt, H.‐J. et al. | 1996
- 1289
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Measurement of interfacial shear (friction) with an ultrahigh vacuum atomic force microscopeCarpick, R. W. / Agraït, N. / Ogletree, D. F. / Salmeron, M. et al. | 1996
- 1296
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Scanning force and friction microscopy at highly oriented polycrystalline graphite and CuP2(100) surfaces in ultrahigh vacuumMüller, T. / Kässer, T. / Labardi, M. / Lux‐Steiner, M. / Marti, O. / Mlynek, J. / Krausch, G. et al. | 1996
- 1302
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Tip–sample interactions: Extraction of single molecular pair potentials from force curvesUnger, Marc A. / O’Connor, Stephen D. / Baldeschwieler, John D. et al. | 1996
- 1308
-
Materials’ properties measurements: Choosing the optimal scanning probe microscope configurationBurnham, N. A. / Gremaud, G. / Kulik, A. J. / Gallo, P.‐J. / Oulevey, F. et al. | 1996
- 1313
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Transient response of tapping scanning force microscopy in liquidsChen, G. Y. / Warmack, R. J. / Oden, P. I. / Thundat, T. et al. | 1996
- 1318
-
Atomic force microscopy images obtained with C60 modified tipsKim, Sanghee / Park, Sang‐Kyu / Park, Chan / Jeon, Il Cheol et al. | 1996
- 1322
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Direct patterning of Si(001) surfaces by atomic manipulationSalling, Craig T. et al. | 1996
- 1327
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Low‐voltage electron‐beam lithography with scanning tunneling microscopy in air: A new method for producing structures with high aspect ratiosKragler, K. / Günther, E. / Leuschner, R. / Falk, G. / von Seggern, H. / Saemann‐Ischenko, G. et al. | 1996
- 1331
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Application of scanning tunneling microscopy nanofabrication process to single electron transistorMatsumoto, Kazuhiko / Ishii, Masami / Segawa, Kazuhito et al. | 1996
- 1336
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Electron‐stimulated desorption of hydrogen from the Si(111) surface by scanning tunneling microscopySchwartzkopff, M. / Radojkovic, P. / Enachescu, M. / Hartmann, E. / Koch, F. et al. | 1996
- 1341
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Imaging and manipulation of nanometer‐size liquid droplets by scanning polarization force microscopyHu, Jun / Carpick, Robert W. / Salmeron, Miquel / Xiao, Xu‐dong et al. | 1996
- 1344
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Scanning tunneling microscopy induced chemical‐vapor deposition of semiconductor quantum dotsSamara, D. / Williamson, J. R. / Shih, C. K. / Banerjee, S. K. et al. | 1996
- 1349
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Ultrahigh density data storage on Ag–TDCN thin films by scanning tunneling microscopyGao, H. J. / Wang, D. W. / Liu, N. / Xue, Z. Q. / Pang, S. J. et al. | 1996
- 1353
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Information storage using conductance change of Langmuir–Blodgett film and atomic force microscope/scanning tunneling microscopeYano, K. / Kuroda, R. / Shimada, Y. / Shido, S. / Kyogaku, M. / Matsuda, H. / Takimoto, K. / Eguchi, K. / Nakagiri, T. et al. | 1996
- 1356
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Critical humidity for removal of atoms from the gold surface with scanning tunneling microscopyLebreton, C. / Wang, Z. Z. et al. | 1996
- 1360
-
Morphology and dissolution processes of metal sulfide minerals observed with the electrochemical scanning tunneling microscopeHiggins, S. R. / Hamers, R. J. et al. | 1996
- 1365
-
Stability of surface atomic structures of ionic crystals studied by atomic force microscopy observation of various faces of CaSO4 crystal in solutionsShindo, H. / Seo, A. / Itasaka, M. / Odaki, T. / Tanaka, K. et al. | 1996
- 1369
-
Atomic structures and growth mechanisms of electrodeposited Ag and Te films as discerned by atomic force microscopyIkemiya, Norihito / Yamada, Koji / Hara, Shigeta et al. | 1996
- 1373
-
In situ studies of potassium hydrogen phthalate crystal dissolution using scanning probe microscopyCampbell, P. A. / Ester, G. R. / Halfpenny, P. J. et al. | 1996
- 1378
-
Effects of electric potentials on surface forces in electrolyte solutionsArai, Toyoko / Fujihira, Masamichi et al. | 1996
- 1383
-
Atomic force microscopy stress sensors for studies in liquidsO’Shea, S. J. / Welland, M. E. / Brunt, T. A. / Ramadan, A. R. / Rayment, T. et al. | 1996
- 1386
-
Approaching the liquid/air interface with scanning force microscopyEng, L. M. / Seuret, Ch. / Looser, H. / Günter, P. et al. | 1996
- 1390
-
Atomic force microscopy of biomoleculesHansma, Helen G. et al. | 1996
- 1395
-
Atomic force microscopy observation of native neurons and modifications induced by glutamateCricenti, A. / De Stasio, G. / Generosi, R. / Scarselli, M. A. / Perfetti, P. / Ciotti, M. T. / Mercanti, D. et al. | 1996
- 1399
-
Combination of fluorescence in situ hybridization and scanning force microscopy for the ultrastructural characterization of defined chromatin regionsFritzsche, W. / Takács, L. / Vereb, G. / Schlammadinger, J. / Jovin, T. M. et al. | 1996
- 1405
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Reconstruction of ribosomal subunits and rDNA chromatin imaged by scanning force microscopyFritzsche, Wolfgang / Martin, Linda / Dobbs, Drena / Jondle, Daniel / Miller, Richard / Vesenka, James / Henderson, Eric et al. | 1996
- 1410
-
Atomic force microscope imaging of ribosome and chromosomeLi, Min‐Qian / Xu, Lei / Ikai, Atsushi et al. | 1996
- 1413
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Atomic force microscopy reconstruction of G‐wire DNAa)Vesenka, James / Marsh, Thomas / Miller, Richard / Henderson, Eric et al. | 1996
- 1418
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Modified DNA immobilized on bioreactive self‐assembled monolayer on gold for dynamic force microscopy imaging in aqueous buffer solutionHegner, M. / Dreier, M. / Wagner, P. / Semenza, G. / Güntherodt, H. J. et al. | 1996
- 1422
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Covalent immobilization of immunoglobulins G and Fab′ fragments on gold substrates for scanning force microscopy imaging in liquidsDroz, Eric / Taborelli, Mauro / Descouts, Pierre / Wells, Timothy N. C. / Werlen, Raymond C. et al. | 1996
- 1427
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Dynamical and mechanical study of immobilized microtubules with atomic force microscopyVinckier, Anja / Dumortier, Chantal / Engelborghs, Yves / Hellemans, Louis et al. | 1996
- 1432
-
Hydrogen bonding molecules and their effect on scanning tunneling microscope image contrast of covalently immobilized protein moleculesParker, Marie‐Claire / Davies, Martyn C. / Tendler, Saul J. B. et al. | 1996
- 1438
-
Chromosome classification by atomic force microscopy volume measurementMcMaster, T. J. / Winfield, M. O. / Baker, A. A. / Karp, A. / Miles, M. J. et al. | 1996
- 1444
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Improvements in atomic force microscopy protocols for imaging fibrous proteinsHallett, P. / Tskhovrebova, L. / Trinick, J. / Offer, G. / Miles, M. J. et al. | 1996
- 1449
-
Studying membranes with scanning force microscopy and patch‐clamp techniqueMosbacher, J. / Häberle, W. / Hörber, J. K. H. et al. | 1996
- 1453
-
Butanethiol self‐assembly on Au(001): The 1×4 Au missing row, c(2×8) molecular latticePoirier, G. E. et al. | 1996
- 1461
-
Comparative scanning tunneling microscopy observation of a homologous series of n‐alkyloxy‐cyanobiphenylesWalzer, K. / Hietschold, M. et al. | 1996
- 1466
-
ω‐functionalized self‐assembled monolayers chemisorbed on ultraflat Au(111) surfaces for biological scanning probe microscopy in aqueous buffersWagner, Peter / Zaugg, Frank / Kernen, Peter / Hegner, Martin / Semenza, Giorgio et al. | 1996
- 1472
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Current imaging tunneling spectroscopy of an alkyl cyanobiphenyl liquid crystalRivera, M. / Williamson, R. L. / Miles, M. J. et al. | 1996
- 1476
-
Structural investigation of cytochrome f Langmuir–Blodgett films with scanning tunneling microscopy: Protein aggregationTazi, A. / Boussaad, S. / DeRose, J. A. / Leblanc, R. M. et al. | 1996
- 1481
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Atomic force microscope study of chromatic transitions in polydiacetylene thin filmsLio, A. / Reichert, A. / Nagy, J. O. / Salmeron, M. / Charych, D. H. et al. | 1996
- 1486
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Scanning thermal microscopy: Subsurface imaging, thermal mapping of polymer blends, and localized calorimetryHammiche, A. / Hourston, D. J. / Pollock, H. M. / Reading, M. / Song, M. et al. | 1996
- 1492
-
Characterization of mixed miscible and nonmiscible phospholipid Langmuir–Blodgett films by atomic force microscopySolletti, J. M. / Botreau, M. / Sommer, F. / Duc, Tran Minh / Celio, M. R. et al. | 1996
- 1498
-
Scanning tunneling microscopy based on the conductivity of surface adsorbed water. Charge transfer between tip and sample via electrochemistry in a water meniscus or via tunneling?Heim, M. / Eschrich, R. / Hillebrand, A. / Knapp, H. F. / Guckenberger, R. / Cevc, G. et al. | 1996
- 1503
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Combined scanning force, lateral force, and scanning surface potential microscopy on phase‐separated Langmuir–Blodgett filmsJacobi, S. / Chi, L. F. / Fuchs, H. et al. | 1996
- 1509
-
Scanning force microscopy of polyolefinic rubbers in homopolypropylene matricesLabardi, M. / Allegrini, M. / Marchetti, E. / Sgarzi, P. et al. | 1996
- 1513
-
Minimizing the size of force‐controlled point contacts on silicon for carrier profilingSnauwaert, J. / Blanc, N. / De Wolf, P. / Vandervorst, W. / Hellemans, L. et al. | 1996
- 1518
-
Scanned probe microscope tip characterization without calibrated tip characterizersVillarrubia, J. S. et al. | 1996
- 1522
-
In situ control and analysis of the scanning tunneling microscope tip by formation of sharp needles on the Si sample and W tipHeike, S. / Hashizume, T. / Wada, Y. et al. | 1996
- 1527
-
Pt:SnO2 thin films for gas sensor characterized by atomic force microscopy and x‐ray photoemission spectromicroscopyCricenti, A. / Generosi, R. / Scarselli, M. A. / Perfetti, P. / Siciliano, P. / Serra, A. / Tepore, A. / Almeida, J. / Coluzza, C. / Margaritondo, G. et al. | 1996
- 1531
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International intercomparison of scanning tunneling microscopyBarbato, G. / Carneiro, K. / Cuppini, D. / Garnaes, J. / Gori, G. / Hughes, G. / Jensen, C. P. / Jo/rgensen, J. F. / Jusko, O. / Livi, S. et al. | 1996
- 1536
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Direct imaging of SiO2 thickness variation on Si using modified atomic force microscopeMang, K. M. / Khang, Y. / Park, Y. J. / Kuk, Young / Lee, S. M. / Williams, C. C. et al. | 1996
- 1540
-
Increasing the value of atomic force microscopy process metrology using a high‐accuracy scanner, tip characterization, and morphological image analysisSchneir, J. / Villarrubia, J. S. / McWaid, T. H. / Tsai, V. W. / Dixson, R. et al. | 1996
- 1547
-
Kelvin probe force microscopy for characterization of semiconductor devices and processesTanimoto, Masafumi / Vatel, Olivier et al. | 1996
- 1552
-
Blind restoration method of scanning tunneling and atomic force microscopy imagesDongmo, Samuel / Troyon, Michel / Vautrot, Philippe / Delain, Etienne / Bonnet, Noél et al. | 1996
- 1557
-
Blind reconstruction of scanning probe image dataWilliams, P. M. / Shakesheff, K. M. / Davies, M. C. / Jackson, D. E. / Roberts, C. J. / Tendler, S. J. B. et al. | 1996
- 1563
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Neural network correction of nonlinearities in scanning probe microscope imagesHadjiiski, L. / Münster, S. / Oesterschulze, E. / Kassing, R. et al. | 1996