Heterojunction interface formation: Si on Ge, GaAs, and CdS (English)
- New search for: Katnani, A. D.
- New search for: Stoffel, N. G.
- New search for: Daniels, R. R.
- New search for: Zhao, Te‐Xiu
- New search for: Margaritondo, G.
- New search for: Katnani, A. D.
- New search for: Stoffel, N. G.
- New search for: Daniels, R. R.
- New search for: Zhao, Te‐Xiu
- New search for: Margaritondo, G.
In:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
;
1
, 2
;
692-694
;
1983
- Article (Journal) / Electronic Resource
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Title:Heterojunction interface formation: Si on Ge, GaAs, and CdS
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Additional title:Heterojunction interface formation
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Contributors:Katnani, A. D. ( author ) / Stoffel, N. G. ( author ) / Daniels, R. R. ( author ) / Zhao, Te‐Xiu ( author ) / Margaritondo, G. ( author )
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Published in:
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Publisher:
- New search for: American Vacuum Society
-
Publication date:1983-04-01
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Size:3 pages
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ISSN:
-
DOI:
-
Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 1, Issue 2
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 111
-
The role of the professional society in scientific and technological discoveryThornton, John et al. | 1983
- 119
-
The element of luck in research—photocathodes 1930 to 1980Sommer, A. H. et al. | 1983
- 126
-
Canadarm and the space shuttleAikenhead, Bruce A. / Daniell, Robert G. / Davis, Frederick M. et al. | 1983
- 133
-
Solar‐powered magnetron pump/gageChapman, R. / Hobson, J. P. et al. | 1983
- 136
-
Calculation of the pumping speed of turbomolecular vacuum pumps by means of simple mechanical dataBernhardt, K.‐H. et al. | 1983
- 140
-
A new sputter ion‐pump elementPierini, M. / Dolcino, L. et al. | 1983
- 143
-
New developments in the calculation of the molecular flow conductance of a straight cylinderCarette, J.‐D. / Pandolfo, L. / Dubé, D. et al. | 1983
- 147
-
Developments in the transmission for mechanical booster pumpsBudgen, L. J. et al. | 1983
- 150
-
Summary Abstract: Pumping speed measurements for water vaporLandfors, A. A. / Hablanian, M. H. / Herrick, R. F. / Vaccarello, D. M. et al. | 1983
- 152
-
Reliability of high vacuum measurementsTilford, Charles R. et al. | 1983
- 163
-
Theoretical determination of ionization efficiency for an orbitron device and variation with the main working parametersPetit, B. / Feidt, M. L. et al. | 1983
- 168
-
Calibration of molecular drag vacuum gagesMcCulloh, K. E. et al. | 1983
- 172
-
A system for vacuum gauge calibration using the comparison techniqueNash, P. J. / Thompson, T. J. et al. | 1983
- 175
-
Computer uses in vacuum equipment and processesKline, F. M. et al. | 1983
- 181
-
Application of a microcomputer to automatic testing of production rotary vane pumpsBalfour, D. / Livesey, R. G. / Salmon, A. / Snell, E. J. et al. | 1983
- 184
-
Summary Abstract: Computer software package for residual gas analyzerShoemaker, L. / Farden, J. / Holkeboer, D. / Wilson, T. et al. | 1983
- 185
-
Summary Abstract: A microprocessor‐controlled surface analysis system for fracture‐related and other surface studiesMcDonnell, L. / Lawless, B. et al. | 1983
- 187
-
The Fermilab Tevatron: Vacuum for a superconducting storage ringBartelson, C. L. / Jöstlein, H. / Lee, G. M. / Limon, P. J. / Sauer, L. D. et al. | 1983
- 196
-
Final design and status of the NSLS vacuum systemSchuchman, Joseph C. et al. | 1983
- 201
-
Vacuum system design for a neutral beam injection systemTanabe, J. et al. | 1983
- 206
-
Alpha particle simulation and diagnostics using 3He++ minority ICRF heatingPost, D. / Hwang, D. / Mikkelsen, D. / Seidl, F. et al. | 1983
- 211
-
Sealing mechanisms in bakeable vacuum sealsRoth, A. et al. | 1983
- 220
-
Thermal cycling and torque analysis of an ultrahigh vacuum flangeFuente, A. O. et al. | 1983
- 224
-
A new type of turbomolecular vacuum pump bearingOsterstrom, Gordon E. et al. | 1983
- 228
-
Vacuum systems for microelectronicsO’Hanlon, John F. et al. | 1983
- 233
-
Pumping chlorinated gases in plasma etchingDuval, Pierre et al. | 1983
- 237
-
Use of vibration‐isolated cryopumps to improve electron microscopes and electron beam lithography unitsVenuti, Guy S. et al. | 1983
- 241
-
Ion plating in a system with a hot cathodeTańcula, M. / Oleszkiewicz, W. / Zdanowski, J. et al. | 1983
- 244
-
Ion milling source with slot extraction systemRangel/ow, I. W. / Radzimski, Z. / Czarczyński, W. et al. | 1983
- 248
-
Sub‐PPMA gas analysis in 40 μl volumes by rf mass spectrometrySchubert, Rudolf / Augis, J. A. et al. | 1983
- 252
-
A performance comparison of vacuum deposition monitors employing atomic absorption (AA) and electron impact emission spectroscopy (EIES)Gogol, C. A. / Reagan, S. H. et al. | 1983
- 257
-
Summary Abstract: New vacuum pumping techniques in sputter coating thin film applicationsEhmann, John / de Rijke, Johan et al. | 1983
- 258
-
Summary Abstract: A hollow cathode for ion beam processing plasma sourcesAston, Graeme et al. | 1983
- 260
-
Measurement of oxide growth stress on thin iron filmsAbel, P. B. / Heuer, A. H. / Hoffman, R. W. et al. | 1983
- 263
-
Thermal stability and pore sizes of microporous zirconia gelsRahman, A. A. et al. | 1983
- 267
-
Surface properties of attapulgiteMikhail, R. Sh. / Guindy, N. M. / Hanafi, S. et al. | 1983
- 271
-
Influence of composition and substrate bias on structure and inert gas content of sputter‐deposited Ni–La alloysKnoll, R. W. / McClanahan, E. D. et al. | 1983
- 275
-
Effect of magnetic field and bias potential on the distribution of plasma luminosity during rf sputteringAuner, G. / Hsieh, Y. F. / Padmanabhan, K. R. et al. | 1983
- 279
-
Modifications to the microhardness, adhesion, and resistivity of sputtered TiN films by ion implantationPadmanabhan, K. R. / Hsieh, Y. F. / Chevallier, J. / So/rensen, G. et al. | 1983
- 284
-
Summary Abstract: Measurement of deposited masses by means of a spiral centrifuge with quartz sensorsMönig, F. J. / Flachsbart, H. et al. | 1983
- 287
-
Thin film electrodes for an artificial earWhite, R. L. / Roberts, L. A. / Kwon, O. / Cotter, N. et al. | 1983
- 296
-
The effects of palladium–gold on the chemisorptive activities of thin film tin oxideChang, Shih‐Chia et al. | 1983
- 301
-
The effect of oxygen and substrate temperature on the growth of Ti thin films on stainless‐steel substratesSundgren, J.‐E. / Hibbs, M. K. / Helmersson, U. / Jacobson, B. E. / Hentzell, H. T. G. et al. | 1983
- 305
-
Low‐stress diamondlike carbon filmsZelez, Joseph et al. | 1983
- 308
-
Chemisorbed hydrogen on a‐carbon filmsNyaiesh, A. R. / Nowak, W. B. et al. | 1983
- 313
-
Local bonding of oxygen and hydrogen in a‐Si:H:O thin filmsLucovsky, G. / Pollard, W. B. et al. | 1983
- 317
-
Surface chemistry and friction behavior of Ti‐implanted 52100 steelSinger, I. L. / Jeffries, R. A. et al. | 1983
- 322
-
Summary Abstract: Rf‐sputter‐deposited multilayer thin film oxygen sensorsRay, M. A. / Greene, J. E. / Polack, A. J. / Welsh, L. B. et al. | 1983
- 323
-
Ion beam synthesis of cubic boron nitrideShanfield, S. / Wolfson, R. et al. | 1983
- 326
-
Ion‐beam deposition of Nb and Ta refractory superconducting filmsFace, D. W. / Ruggiero, S. T. / Prober, D. E. et al. | 1983
- 331
-
Internal contacts to photovoltaic structures using ion beam millingPotter, R. R. / Sites, J. R. et al. | 1983
- 334
-
Electrical, structural, and bonding changes induced in silicon by H, Ar, and Kr ion‐beam etchingSingh, Ranbir / Fonash, S. J. / Ashok, S. / Caplan, P.J. / Shappirio, J. / Hage‐Ali, M. / Ponpon, J. et al. | 1983
- 337
-
Summary Abstract: Developments in broad‐beam ion source technology and applicationsHarper, J. M. E. / Cuomo, J. J. / Kaufman, H. R. et al. | 1983
- 339
-
Summary Abstract: Ion‐beam‐enhanced diffusion at surfacesZomorrodian, A. / Tougaard, S. / Ignatiev, A. et al. | 1983
- 341
-
Fabrication and characterization of superconducting Pb alloy deposited at −80 °CYoung, P. L. / Josephs, R. M. / Stein, B. F. / Flannery, W. E. / Wang, T. C. / Sheppard, J. E. / Wetterskog, H. et al. | 1983
- 345
-
GeTe thin films: Amorphous and crystalline characteristicsTran, N. T. / Chang, Y. C. / Faragalli, D. A. / Roberts, S. S. / Josefowicz, J. Y. / Shing, Y. H. et al. | 1983
- 348
-
Enhancement of Ta+ flux by substrate biasing during sputter deposition of tantalum–nitrogen filmsAita, C. R. / Myers, T. A. et al. | 1983
- 352
-
High rate planar magnetron deposition of transparent, conducting, and heat reflecting films on glass and plasticBrett, M. J. / McMahon, R. W. / Affinito, J. / Parsons, R. R. et al. | 1983
- 356
-
Microstructure of dielectric thin films formed by e‐beam coevaporationFarabaugh, E. N. / Sanders, D. M. et al. | 1983
- 360
-
Process control of vacuum‐deposited CdS for the fabrication of reproducible 8% efficient solar cellsHench, T. L. / Bragagnolo, J. A. / Delgado, J. E. / Leyman, P. F. / Motta, P. F. et al. | 1983
- 364
-
Summary Abstract: Preparation and properties of granular aluminum in plasma‐polymerized matricesHecq, M. / Zieman, P. / Kay, E. et al. | 1983
- 365
-
Summary Abstract: Low temperature deposition and properties of superconducting NbN by reactive dc magnetron sputteringBacon, D. D. / English, A. T. / Nakahara, S. / Peters, F. G. / Schreiber, H. / Sinclair, W. R. / van Dover, R. B. et al. | 1983
- 366
-
Summary Abstract: Preparation of Pb–Bi film by alloy evaporation II. Microstructure and morphologyHuang, H.‐C. W. / Serrano, C. M. et al. | 1983
- 367
-
Summary Abstract: Crystallographic structure of coevaporated Ni–Al alloy filmsHentzell, H. T. G. / Andersson, B. / Karlsson, S.‐E. et al. | 1983
- 369
-
Summary Abstract: Kinetic theory of subsurface particulate monolayer formation during vacuum evaporation onto softenable substratesKovacs, G. J. / Vincett, P. S. et al. | 1983
- 371
-
Electric conduction in metallic Ag particles—Cs2O semiconductor thin filmsWu, Quan‐De / Liu, Xi‐Qing et al. | 1983
- 376
-
Chemically induced enhancement of nucleation in noble metal depositionAllara, D. L. / Hebard, A. F. / Padden, F. J. / Nuzzo, R. G. / Falcone, D. R. et al. | 1983
- 383
-
Effects of Bi2O3 dissociation on the electrical properties of thermally evaporated films of bismuth oxideDharmadhikari, Vineet S. / Goswami, A. et al. | 1983
- 388
-
Modifications of intrinsic disorder in amorphous siliconPilione, L. J. / Maley, N. / Lustig, N. / Lannin, J. S. et al. | 1983
- 392
-
Trilayer Raman scattering of variably ordered amorphous GeYehoda, Joseph E. / Lannin, Jeffrey S. et al. | 1983
- 395
-
Optical properties and grain boundary effects in CuInSe2Kazmerski, L. L. / Hallerdt, M. / Ireland, P. J. / Mickelsen, R. A. / Chen, W. S. et al. | 1983
- 399
-
Energy bands of thin films of diamond and zinc blende semiconductors (100)Shen, Yuyi et al. | 1983
- 403
-
The dependence of aluminum nitride film crystallography on sputtering plasma compositionAita, C. R. / Gawlak, C. J. et al. | 1983
- 407
-
Measurement of stresses generated in cured polyimide filmsGoldsmith, Charles / Geldermans, P. / Bedetti, F. / Walker, G. A. et al. | 1983
- 410
-
Computer simulation of line edge profiles undergoing ion bombardmentRangel/ow, I. W. et al. | 1983
- 415
-
Stress relief of basal orientation zinc oxide thin films by isothermal annealingGawlak, C. J. / Aita, C. R. et al. | 1983
- 419
-
Carburization of steel surfaces during implantation of Ti ions at high fluencesSinger, I. L. et al. | 1983
- 423
-
Electrical and optical properties of n‐CdS/P–Si and n(Znx– Cd1−x)S/P–Si heterojunction solar cellsAbou Elfotouh, F. A. et al. | 1983
- 426
-
Monte Carlo model of topography development during sputteringRossnagel, S. M. / Robinson, R. S. et al. | 1983
- 430
-
Screening energy involving electrons of remote atoms in photoelectric and Auger transitionsWagner, C. D. / Taylor, J. A. et al. | 1983
- 432
-
Regularities and irregularities in SIMS/FAB spectra of alkali halides analyzed via the bond‐breaking modelDunlap, Brett I. / Campana, Joseph E. / Green, Brian N. / Bateman, Robert H. et al. | 1983
- 437
-
Summary Abstract: Ion beam control of morphology during the growth of aSiHx thin filmsKasdan, A. / Goshorn, D. P. et al. | 1983
- 438
-
Summary Abstract: Cluster formation and the percolation threshold in thin Au filmsLaibowitz, R. B. / Alessandrini, E. I. / Guarnieri, C. R. / Voss, R. F. et al. | 1983
- 440
-
Summary Abstract: Superconducting studies of interfacial reactions in thin‐film alloy couplesMacchioni, C. V. / Rayne, J. A. / Bauer, C. L. et al. | 1983
- 441
-
Summary Abstract: Secondary ion mass spectrometry of organic adsorbates on carbon particles and liquid metal surfacesRoss, Mark M. / Colton, Richard J. et al. | 1983
- 443
-
Contact resistance: Al and Al–Si to diffused N+ and P+ siliconFaith, T. J. / Irven, R. S. / Plante, S. K. / O’Neill, J. J. et al. | 1983
- 449
-
Phase segregation of Cu in Al–Cu thin filmsBurkstrand, J. M. / Hovland, C. T. et al. | 1983
- 452
-
Phase separation in interactions of tantalum–chromium alloy on SiPalmström, C. J. / Gyulai, J. / Mayer, J. W. et al. | 1983
- 455
-
The effect of passivation thickness on the electromigration lifetime of Al/Cu thin film conductorsLloyd, J. R. / Smith, P. M. et al. | 1983
- 459
-
Thermal stability of diffusion barriers for aluminum alloy/platinum silicide contactsMerchant, P. / Amano, Jun et al. | 1983
- 463
-
Summary Abstract: Redistribution of dopants in TiSi2‐polycrystalline bilayers during heat treatmentNorström, H. / Runovc, F. / Buchta, R. / Wiklund, P. / Östling, M. / Petersson, C. S. et al. | 1983
- 465
-
Summary Abstract: Nondestructive electrical monitoring of thin film degradation in microelectronic circuits using pulse nonlinearity techniquesArzigian, J. S. et al. | 1983
- 466
-
Summary Abstract: Alloyed Ohmic contacts to p‐type InPValois, A. J. / Robinson, G. Y. et al. | 1983
- 467
-
Ni/Cr interface width dependence on sputtered depthDavarya, F. / Roush, M. L. / Fine, J. / Andreadis, T. D. / Goktepe, O. F. et al. | 1983
- 471
-
Auger depth profiling and preferential sputtering of platinum nickel silicideMorgan, A. E. / Ellwanger, R. C. et al. | 1983
- 475
-
Low‐temperature oxygen diffusion in alpha titanium characterized by Auger sputter profilingWittberg, T. N. / Wolf, J. Douglas / Keil, R. Gerald / Wang, Pu Sen et al. | 1983
- 479
-
X‐ray and XPS studies of evaporated CuxS thin filmsUppal, P. N. / Burton, L. C. et al. | 1983
- 483
-
AES study on the chemical composition of ferroelectric BaTiO3 thin films rf sputter‐deposited on siliconDharmadhikari, Vineet S. / Grannemann, W. W. et al. | 1983
- 486
-
Summary Abstract: Correlation of the surface composition of C‐ and Ti‐ion‐implanted layers in iron and stainless steel alloys with reduced friction and wearNelson, G. C. / Pope, L. E. / Yost, F. G. et al. | 1983
- 487
-
Sputtering of multicomponent materialsWehner, G. K. et al. | 1983
- 491
-
Influence of a multiple‐energy ion beam on the equilibrium profile of a binary alloyRoush, M. L. / Davarya, F. / Andreadis, T. D. / Goktepe, O. F. et al. | 1983
- 494
-
A review of compositional changes of multicomponent materials (especially biomaterials) induced by ion sputteringKowalski, Zbigniew W. et al. | 1983
- 497
-
A comparison of AES and RBS analysis of the composition of reactively sputtered TiSix filmsBlom, H. O. / Stridh, B. / Berg, S. / Sundgren, J.‐E. et al. | 1983
- 500
-
Effect of surface chemistry and work function in secondary ion mass spectrometryYu, Ming L. et al. | 1983
- 503
-
Sputtered Bi2Te3 and PbTe thin filmsShing, Y. H. / Chang, Y. / Mirshafii, A. / Hayashi, L. / Roberts, S. S. / Josefowicz, J. Y. / Tran, N. et al. | 1983
- 507
-
Summary Abstract: Kinetics of sputter‐enhanced surface segregation at a Ni/Ag interfaceFine, Joseph / Andreadis, T. D. / Davarya, F. et al. | 1983
- 508
-
Summary Abstract: Characteristics of magnetron‐sputtered high atomic number amorphous metal alloysBieg, K. W. / Hills, C. R. et al. | 1983
- 510
-
Summary Abstract: Characterization of rf‐sputtered CuInSe2 filmsKrishnaswamy, S. V. / Manocha, A. S. / Szedon, J. R. et al. | 1983
- 512
-
Correlation between the ion bombardment during film growth of Pd films and their structural and electrical propertiesZiemann, P. / Kay, E. et al. | 1983
- 517
-
Properties of a new molybdenum nitrogen phaseFuller, W. W. / Wolf, S. A. / Gubser, D. U. / Skelton, E. F. / Francavilla, T. L. et al. | 1983
- 520
-
Influence of the microstructure on the corrosion behavior of magnetron sputter‐quenched amorphous metallic alloysThakoor, A. P. / Khanna, S. K. / Williams, R. M. / Landel, R. F. et al. | 1983
- 524
-
Effects of ion implantation doping on electrical and chemisorptive properties of tin oxide thin filmsChang, Shih‐Chia et al. | 1983
- 529
-
Modification of vapor‐deposited WO3 electrochromic films by oxygen backfillingSun, Sey‐Shing / Holloway, Paul H. et al. | 1983
- 534
-
Vacuum ultraviolet driven chemical vapor deposition of localized aluminum thin filmsCalloway, A. R. / Galantowicz, T. A. / Fenner, W. R. et al. | 1983
- 537
-
Summary Abstract: Growth of metastable Cu1−xCrx solid solutions by ion mixing during depositionShin, S. M. / Ray, M. A. / Rigsbee, J. M. / Greene, J. E. / Barnett, S. A. et al. | 1983
- 540
-
Recent developments in silicon molecular beam epitaxyBean, John C. et al. | 1983
- 546
-
Disorder on GaAs(001) surfaces prepared by molecular beam epitaxyVan Hove, J. M. / Cohen, P. I. / Lent, C. S. et al. | 1983
- 551
-
Growth of epitaxial Fe on GaAs by metalorganic CVDKaplan, R. et al. | 1983
- 554
-
Orientation relationships between thin films of Au, {100} substrates of GaAs, and their reaction productsYoshiie, T. / Bauer, C. L. et al. | 1983
- 558
-
Properties of MBE grown InSb and InSb1−xBixNoreika, A. J. / Greggi, J. / Takei, W. J. / Francombe, M. H. et al. | 1983
- 562
-
Summary Abstract: MBE growth of (Hg, Cd, and Te) compoundsChow, P. P. / Greenlaw, D. K. / Johnson, D. et al. | 1983
- 563
-
Summary Abstract: Epitaxial growth of BaF2 on Ge and InPPhillips, J. M. / Feldman, L. C. / Gibson, J. M. / McDonald, M. L. et al. | 1983
- 564
-
Summary Abstract: CaF2 films vacuum deposited on single crystal Ge surfacesSloope, Billy W. et al. | 1983
- 566
-
Schottky barrier formation at Pd, Pt, and Ni/Si(111) interfacesPurtell, R. / Hollinger, G. / Rubloff, G. W. / Ho, P. S. et al. | 1983
- 570
-
Investigations on solid state reactions between tantalum thin films and oxidized silicon crystalsChen, Jiann‐Ruey / Liauh, Her‐Rern / Liu, Yuen‐Chung / Yeh, Fon‐Shan et al. | 1983
- 574
-
Valence band study of Mg2Si by Auger spectroscopyBevolo, A. J. / Shanks, H. R. et al. | 1983
- 578
-
Fabrication of optically enhanced thin film a‐SiHx solar cellsDeckman, H. W. / Wronski, C. R. / Witzke, H. et al. | 1983
- 583
-
Fermi level position and density of states of intrinsic, phosphorus‐doped, and boron‐doped a‐Si:H deposited on stainless steelNielsen, Paul / Gredin, Robert et al. | 1983
- 588
-
An AES–ELEED study of the Al/GaP(110) interfaceBonapace, C. R. / Kahn, A. et al. | 1983
- 592
-
Measuring intensity distributions in electron beams by scanning Auger micrographing of a‐Si:HSchade, H. / Hockings, E. F. et al. | 1983
- 596
-
Characterization of the initial growth of Si on cubic stabilized zirconiaLoebs, V. A. / Haas, T. W. / Solomon, J. S. et al. | 1983
- 600
-
Hydrogen‐related memory traps in thin silicon nitride filmsKapoor, Vikram J. / Bailey, Robert S. / Stein, Herman J. et al. | 1983
- 604
-
Patterning of poly‐para‐xylylenes by reactive ion etchingYeh, J. T. C. / Grebe, K. R. et al. | 1983
- 609
-
RHEED streaks and instrument responseVan Hove, J. M. / Pukite, P. / Cohen, P. I. / Lent, C. S. et al. | 1983
- 614
-
Summary Abstract: Tungsten rich silicide/polysilicon (polycide) for MOS gates and interconnectionsKing, E. M. / Gsteiger, K. E. et al. | 1983
- 615
-
Summary Abstract: Ion beam sputter deposition of molybdenum contacts for Schottky barrier diodesBojarczuk, N. A. / Paz, O. / Auret, F. D. et al. | 1983
- 617
-
Summary Abstract: Experiments on ultrathin Al overlayers on GaAs(110)Daniels, R. R. / Katnani, A. D. / Zhao, Te‐Xiu / Margaritondo, G. / Zunger, Alex et al. | 1983
- 618
-
Summary Abstract: p‐InP surface modification due to indium tin oxide depositionSheldon, P. / Russell, P. E. / Ahrenkiel, R. K. / Hayes, R. E. et al. | 1983
- 619
-
Summary Abstract: Multiple‐wavelength‐angle‐of‐incidence ellipsometry: Application to silicon nitride–gallium arsenide structuresBu‐Abbud, George H. / Alterovitz, Samuel A. / Bashara, N. M. / Woollam, John A. et al. | 1983
- 621
-
Summary Abstract: Surface topography of electronic materials following oxygen and cesium ion bombardmentDuncan, S. / Smith, R. / Sykes, D. E. / Walls, J. M. et al. | 1983
- 622
-
Summary Abstract: Laser‐induced fluorescence diagnostics of glow discharges: Spatially resolved concentration profilesGottscho, Richard A. / Davis, Glenn P. / Burton, Randolph H. et al. | 1983
- 624
-
Summary Abstract: Cathodoluminescence characterization of undoped ZnSe in the scanning electron microscopeChin, T. N. et al. | 1983
- 626
-
Plasma etching of III‐V compound semiconductorsDonnelly, V. M. / Flamm, D. L. / Ibbotson, D. E. et al. | 1983
- 629
-
Anisotropic plasma etching of polysilicon using SF6 and CFCl3Mieth, M. / Barker, A. et al. | 1983
- 636
-
Summary Abstract: Reactive ion etching of Al and Al–Si films with CCl4, N2, and BCl3 mixturesMaa, J.‐S. / O’Neill, J. J. et al. | 1983
- 637
-
Summary Abstract: Surface‐etching kinetics of hydrogen plasma on III‐V compound semiconductorsTu, C. W. / Chang, R. P. H. / Schlier, A. R. et al. | 1983
- 638
-
Summary Abstract: Loading effect curve and etching reactionNishimura, T. / Wani, E. / Tsukada, T. / Fox, R. / Nagasaka, M. et al. | 1983
- 640
-
Oxygen chemisorption and oxide formation on Si(111) and Si(100) surfacesHollinger, G. / Himpsel, F. J. et al. | 1983
- 646
-
The impact of surface analysis technology on the development of semiconductor wafer cleaning processesPhillips, B. F. / Burkman, D. C. / Schmidt, W. R. / Peterson, C. A. et al. | 1983
- 650
-
Influence of aluminum adatoms on the oxidation of germanium at room temperatureKatnani, A. D. / Perfetti, P. / Zhao, Te‐Xiu / Margaritondo, G. et al. | 1983
- 653
-
Surface and interface analysis of GaAs–oxyfluoridesIreland, P. J. / Jamjoum, O. / Kazmerski, L. L. / Ahrenkiel, R. K. / Russell, P. E. / Stanchina, W. / Wager, J. F. et al. | 1983
- 657
-
Thermal stability of oxide films on Cd0.2 Hg0.8Te: A combined SIMS, AES, and XPS studyKaiser, U. / Ganschow, O. / Wiedmann, L. / Benninghoven, A. et al. | 1983
- 662
-
High temperature annealing of InP anodic oxidesFathipour, M. / Makky, W. H. / McLaren, J. / Geib, K. M. / Wilmsen, C. W. et al. | 1983
- 667
-
Summary Abstract: Current problems in silicon oxidationPlummer, James D. et al. | 1983
- 668
-
Summary Abstract: Oxidation of CuInSe2Kazmerski, L. L. / Jamjoum, O. / Wager, J. F. / Ireland, P. J. / Bachmann, K. J. et al. | 1983
- 670
-
Summary Abstract: Composition study of photochemically grown oxides of Hg1−xCdxTeDavis, G. D. / Buchner, S. P. / Byer, N. E. et al. | 1983
- 672
-
Comparison of the atomic geometries of GaSb(110) and ZnTe(110): Failure of ionicity‐structure correlationsDuke, C. B. / Paton, A. / Kahn, A. et al. | 1983
- 676
-
Hydrogen chemisorption on the polar surfaces of GaAsBringans, R. D. / Bachrach, R. Z. et al. | 1983
- 679
-
Adsorption of O2 and CO on cleaved GaAs(110) at low temperaturesFrankel, D. J. / Yukun, Y. / Avci, R. / Lapeyre, G. J. et al. | 1983
- 684
-
Atomic geometries of compound semiconductor surfaces and interfacesKahn, A. et al. | 1983
- 692
-
Heterojunction interface formation: Si on Ge, GaAs, and CdSKatnani, A. D. / Stoffel, N. G. / Daniels, R. R. / Zhao, Te‐Xiu / Margaritondo, G. et al. | 1983
- 695
-
Photoemission determination of dipole layer and VB‐discontinuity formation during the MBE growth of GaAs on Ge(110)Zurcher, Peter / Bauer, Robert S. et al. | 1983
- 701
-
Chemically assisted ion beam etching of GaAs, Ti, and MoChinn, J. D. / Fernandez, A. / Adesida, I. / Wolf, E. D. et al. | 1983
- 705
-
Kinetics of electron‐stimulated oxidation of GaAs(1̄1̄1̄)Alonso, M. / Soria, F. / Sacedón, J. L. et al. | 1983
- 708
-
Plasma etching of niobium with CF4/O2 gasesChen, Mao‐Min / Wang, Run Han et al. | 1983
- 712
-
Aluminum plasma etch rate limitationsPurdes, A. J. et al. | 1983
- 716
-
Summary Abstract: Zone‐melting recrystallization of Si films with a movable strip‐heater ovenGeis, M. W. et al. | 1983
- 717
-
Summary Abstract: Plasma‐enhanced beam deposition of thin dielectric filmsChang, R. P. H. / Darack, S. et al. | 1983
- 718
-
Summary Abstract: Electron‐beam writing and development of inorganic CaF2 thin filmsHarrison, T. R. / Mankiewich, P. M. / Dayem, A. H. et al. | 1983
- 719
-
Summary Abstract: Trench isolation technology: Processing and implementationWenocur, D. W. / Chiang, S. Y. / Rung, R. D. / Cham, K. M. et al. | 1983
- 721
-
Microanalysis needs for device and package fabricationRamsey, J. N. et al. | 1983
- 732
-
Characterization of VLSI materialsMcGuire, G. E. / Church, L. B. / Jones, D. L. / Smith, K. K. / Tuenge, D. T. et al. | 1983
- 739
-
Direct measurement of temperature profiles induced by finely focused beamsIranmanesh, Ali A. / Pease, R. F. W. et al. | 1983
- 743
-
Summary Abstract: The use of backscattered electron imaging with Auger electron spectroscopyThomas, J. H. et al. | 1983
- 745
-
Chemical bonding and Schottky barrier formation at transition metal–silicon interfacesHo, Paul S. et al. | 1983
- 758
-
Silicide formation in lateral diffusion couplesZheng, L. R. / Hung, L. S. / Mayer, J. W. et al. | 1983
- 762
-
Photoemission studies of the Au–InP(110) interfaceBabalola, I. A. / Petro, W. G. / Kendelewicz, T. / Lindau, I. / Spicer, W. E. et al. | 1983
- 766
-
Investigation of InP surface and metal interfaces by surface photovoltage and Auger electron spectroscopiesShapira, Y. / Brillson, L. J. / Heller, A. et al. | 1983
- 771
-
Chemical bonding and reactions at Ti/Si and Ti/oxygen/Si interfacesButz, R. / Rubloff, G. W. / Ho, P. S. et al. | 1983
- 776
-
Interfacial chemistry of electrical contacts on GaAs and Al0.3Ga0.7AsBuonaquisti, A. D. / Wang, Y. ‐X. / Holloway, P. H. et al. | 1983
- 781
-
First spectroscopic investigation of the Yb/Si interface at room temperatureRossi, G. / Nogami, J. / Lindau, I. / Braicovich, L. / Abbati, I. / del Pennino, U. / Nannarone, S. et al. | 1983
- 785
-
Summary Abstract: Metal–amorphous Si interfaces: Structural and electrical propertiesTsai, C. C. / Thompson, M. J. / Nemanich, R. J. / Jackson, W. B. / Stafford, B. L. et al. | 1983
- 811
-
Measurement of plasma density using nuclear techniquesStrachan, J. D. / Chrien, R. E. / Heidbrink, W. W. et al. | 1983
- 818
-
Low energy neutral spectroscopy during pulsed discharge cleaning in PLTRuzic, D. / Cohen, S. / Denne, B. / Schivell, J. et al. | 1983
- 822
-
Laser fluorescence measurements of hydrogen and metal densities in the Doublet III tokamakMuller, C. H. / Eames, D. R. / Burrell, K. H. et al. | 1983
- 827
-
Plasma edge studies using carbon resistance probesWampler, W. R. / Manos, D. M. et al. | 1983
- 831
-
The far UV emission spectrum of H2Terry, J. L. et al. | 1983
- 837
-
Perturbation of tokamak edge plasma by laser blow‐off impurity injectionBudny, R. / Cavallo, A. / Cohen, S. / Daughney, C. / Efthimion, P. / Fonck, R. / Hulse, R. / Hwang, D. / Manos, D. / Pecquet, A‐L. et al. | 1983
- 841
-
Photography of impurity injection into PLT plasmasTimberlake, J. / Cohen, S. / Daughney, C. / Manos, D. et al. | 1983
- 845
-
TFTR prototype electrostatic‐calorimeter probe headManos, D. M. / Budny, R. V. / Cohen, S. A. et al. | 1983
- 849
-
Vacuum applications for the Tritium Systems Test AssemblyAnderson, James L. / Coffin, Don O. / Walthers, Charles R. et al. | 1983
- 856
-
Tritium storage/delivery and associated cleanup systems for TFTRGill, J. T. / Anderson, B. E. / Watkins, R. A. / Pierce, C. W. et al. | 1983
- 865
-
Process monitoring of tritium concentrationEllefson, R. E. et al. | 1983
- 869
-
Chemically polished stainless steel tubing for tritium serviceGill, J. T. / Moddeman, W. E. / Ellefson, R. E. et al. | 1983
- 874
-
Summary Abstract: Reaction rates for the formation of DT under various conditions from T2+D2McConville, G. T. / Menke, D. A. / Ellefson, R. E. et al. | 1983
- 875
-
Summary Abstract: Effect of tritium on accuracy of capacitance manometersEllefson, R. E. / Gibbs, G. E. / Baker, R. W. et al. | 1983
- 877
-
Biased magnetron sputtering of ICF target pusher layersGlocker, David et al. | 1983
- 881
-
The use of an arc plasma rotating in a magnetic field for metal coating glass substratesVukanovic, V. / Butler, S. / Kapur, Sh. / Krakower, E. / Allston, T. / Belfield, K. / Gibson, G. et al. | 1983
- 886
-
A technique for thick polymer coating of inertial‐confinement‐fusion targetsLee, Mark C. / Feng, I‐an / Wang, Taylor G. / Kim, Hyo‐gun et al. | 1983
- 890
-
High‐Z‐doped laser fusion target ablation layers using metal colloids and metal‐substituted‐sulfonated polystyreneKim, H. / Mason, J. / Miller, J. R. et al. | 1983
- 894
-
Fluorescers and filters of unusual chemical composition for low‐energy x‐ray measurementsJorgensen, B. / Liepins, R. / Geanangel, R. A. / Komm, R. et al. | 1983
- 897
-
Temperature effects on the formation of a uniform liquid layer of hydrogen isotopes inside a spherical cryogenic ICF targetMok, L. / Kim, K. / Bernat, T. P. / Darling, D. H. et al. | 1983
- 901
-
Analysis of hydrogen and deuterium by secondary ion mass spectrometry as applied to fusion technologyMagee, Charles W. et al. | 1983
- 907
-
Particle and energy transport in the plasma scrape‐off zone and its impact on limiter designUlrickson, M. / Post, D. E. et al. | 1983
- 911
-
Charge‐exchange wall physical erosion rates for a proposed INTOR/FED limiterHeifetz, D. / Schmidt, J. / Ulrickson, M. / Post, D. et al. | 1983
- 916
-
Initial wall conditioning for the TMX‐U fusion experimentAllen, S. L. / Clower, C. / Drake, R. P. / Hooper, E. B. / Hunt, A. L. / Munger, R. / Bastasz, R. J. / Bauer, W. / Hsu, W. L. et al. | 1983
- 920
-
Methane formation and surface modification of TiC coating by hydrogen ion bombardmentSukenobu, S. / Gomay, Y. et al. | 1983
- 924
-
Gibbsian and radiation‐induced segregation in Cu–Li and Al–Li alloysGruen, D. M. / Krauss, A. R. / Susman, S. / Venugopalan, M. / Ron, M. et al. | 1983
- 929
-
Plasma edge studies in ISX‐B and EBT‐S using surface probes and laser‐induced fluorescenceRoberto, J. B. / Clausing, R. E. / Dullni, E. / Emerson, L. C. / Heatherly, L. / Schweer, B. / Withrow, S. P. / Zuhr, R. A. et al. | 1983
- 933
-
Summary Abstract: Tritium imagingMalinowski, M. E. et al. | 1983
- 934
-
Summary Abstract: Initial wall conditioning in Doublet IIIJackson, G. L. / Clausing, R. E. / Lietzke, A. F. / Ejima, S. / Emerson, L. C. / Heatherly, L. et al. | 1983
- 935
-
Summary Abstract: Photoenhancement of the reaction of graphite with atomic hydrogen by ultraviolet radiationAshby, C. I. H. et al. | 1983
- 937
-
Information management data base for fusion target fabrication processesReynolds, J. et al. | 1983
- 941
-
Inertial fusion target mounting methods: New fabrication procedures reduce the mounting support perturbationBrinker, B. A. / Cavese, J. M. / Miller, J. R. / Noyes, S. G. / Sheble, S. / Whitaker, L. T. et al. | 1983
- 945
-
Rotational‐shearing interferometric characterization of inertial fusion targetsPowers, T. F. / Miller, J. R. et al. | 1983
- 949
-
X‐ray absorption in characterization of laser fusion targetsClement, X. / Coudeville, A. / Eyharts, P. / Perrine, J. P. / Rouillard, R. et al. | 1983
- 952
-
Solid deuterium centrifuge pellet injectorFoster, C. A. et al. | 1983
- 959
-
Performance characterization of pneumatic single pellet injection systemSchuresko, D. D. / Milora, S. L. / Hogan, J. T. / Foster, C. A. / Combs, S. K. et al. | 1983
- 964
-
Pellet injection in TFTRSinger, C. E. / Heifetz, D. B. / Post, D. E. et al. | 1983
- 969
-
Fusion fuel pellet injection with a railgunHawke, R. S. et al. | 1983
- 974
-
Negative ion sources for neutral beam systemsEhlers, K. W. et al. | 1983
- 981
-
Photoelectric work function measurement of a cesiated metal surface and its correlation with the surface‐produced H− ion fluxWada, M. / Berkner, K. H. / Pyle, R. V. / Stearns, J. W. et al. | 1983
- 985
-
Summary Abstract: Sputtering of negative carbon ions from cesiated graphite surfacesPargellis, A. / Seidl, M. et al. | 1983
- 987
-
The Si(111)/Cu interface studied with surface sensitive techniquesRossi, G. / Kendelewicz, T. / Lindau, I. / Spicer, W. E. et al. | 1983
- 991
-
SIMS investigation of very shallow implanted Si layersShepherd, F. R. / Robinson, W. H. / Brown, J. D. / Phillips, B. F. et al. | 1983
- 995
-
Auger line shape studies of carbon species on Rh and Ni surfacesHouston, J. E. / Peebles, D. E. / Goodman, D. W. et al. | 1983
- 1000
-
Interatomic Auger transitions in maximal valent V and Cr compoundsYin, Lo I / Tsang, Tung / Coyle, George J. / Yin, Way / Adler, Isidore et al. | 1983
- 1004
-
Auger analysis of iron–cobalt alloysBevolo, A. J. et al. | 1983
- 1006
-
Analysis of oxygen isotope interfaces using negative molecular ion SIMSMitchell, D. F. / Hussey, R. J. / Graham, M. J. et al. | 1983
- 1009
-
Summary Abstract: Interfacial analysis of metal–semiconductor structuresPoate, J. M. et al. | 1983
- 1010
-
Summary Abstract: Line shape changes of some surface sensitive ‘‘quasiatomic’’ Cu Auger spectra in alloysSundaram, V. S. / Landers, R. / Rogers, L. D. / Laks, B. / Kleiman, G. G. et al. | 1983
- 1011
-
Summary Abstract: Effect of changes in absorber concentration on infrared reflection absorbance of polymer films on metallic substratesWebb, John Day / Jorgensen, Gary / Schissel, Paul / Czanderna, A. W. / Chughtai, A. R. / Smith, D. M. et al. | 1983
- 1013
-
Simultaneous electron and x‐ray analysis and its application in corrosion scienceCastle, J. E. et al. | 1983
- 1021
-
Electron inelastic mean free path (IMFP) in single crystal BeO by Rutherford backscattering (RBS) and Auger electron spectroscopy (AES)Fowler, D. E. / Gyulai, J. / Palmstrom, C. et al. | 1983
- 1026
-
The oxidation of zinc in air studied by XPS and AESHammer, G. E. / Shemenski, R. M. et al. | 1983
- 1029
-
Interfacial layers in high‐temperature‐oxidized NiCrAlLarson, L. A. / Browning, R. / Poppa, H. / Smialek, J. et al. | 1983
- 1033
-
Summary Abstract: Oxidation of cobalt at room temperature, studied by combined static SIMS, static AES, XPS, and work function investigationsKaiser, U. / Ganschow, O. / Wang, N. L. / Wiedmann, L. / Benninghoven, A. et al. | 1983
- 1034
-
Summary Abstract: A low damage SIMS/AES/XPS study of structure inversion in the Ba–O–W systemLamartine, B. C. / Czarnecki, J. v. / Haas, T. W. et al. | 1983
- 1036
-
Summary Abstract: Comparison of thin passive and air‐oxidized iron films using EXAFS and MESFine, J. M. / Rusek, J. J. / Eldridge, J. / Kordesch, M. E. / Mann, J. A. / Hoffman, R. W. / Sandstrom, D. R. et al. | 1983
- 1037
-
Summary Abstract: Surface composition of Cu/Au alloysNelson, G. C. et al. | 1983
- 1039
-
Summary Abstract: The equilibrium surface composition of indium–lead alloysFrankenthal, R. P. / Siconolfi, D. J. et al. | 1983
- 1040
-
Summary Abstract: Surface segregation in liquid Ga–Sn alloys by AESHardy, Stephen / Fine, Joseph et al. | 1983
- 1043
-
Extended‐fine‐structure analysis of oxygen on titaniumMorar, John F. / Park, Robert L. et al. | 1983
- 1047
-
Surface geometries from channeling and blockingTromp, R. M. et al. | 1983
- 1055
-
The structure of atomic oxygen and carbon overlayers on the Mo(001) surface studied by low energy ion scatteringOverbury, S. H. / Stair, P. C. et al. | 1983
- 1059
-
Summary Abstract: Application of high energy ion channeling to GaAs(110)Gossmann, H.‐J. / Gibson, W. M. / Itoh, T. / Feldman, L. C. et al. | 1983
- 1060
-
Summary Abstract: Epitaxial growth of Au on Pd(111)Kuk, Y. / Feldman, L. C. / Silverman, P. J. et al. | 1983
- 1062
-
Summary Abstract: Quantum size effect in electron transmission through Cu and Ag films on W(110)Jonker, B. T. / Bartelt, N. C. / Park, Robert L. et al. | 1983
- 1063
-
Summary Abstract: Molecular orientation studies of adsorbed organic monolayers using angle‐resolved SIMSKarwacki, E. J. / Moon, D. W. / Winograd, N. et al. | 1983
- 1064
-
The molecular and atomic states of oxygen adsorbed on Rh(100): AdsorptionFisher, Galen B. / Schmieg, Steven J. et al. | 1983
- 1070
-
Carbon monoxide oxidation on the kinked Pt(321) surfaceGland, John L. / McClellan, Michael R. / McFeely, F. Read et al. | 1983
- 1074
-
Summary Abstract: Chemisorption on transition‐metal oxides and oxide‐supported noble metalsHenrich, Victor E. / Kurtz, Richard L. / Sadeghi, Hassan R. et al. | 1983
- 1075
-
Summary Abstract: Oxidation of the Ti(0001) surfaceBertel, Erminald / Stockbauer, Roger / Madey, Theodore E. et al. | 1983
- 1077
-
Summary Abstract: The influence of steps on the desorption of NO from Pt(111)Serri, J. A. / Tully, J. C. / Cardillo, M. J. et al. | 1983
- 1078
-
Summary Abstract: Molecular beam scattering from Pt(111) at initial stages of CO adsorptionPoelsema, B. / Palmer, R. L. / de Zwart, S. T. / Comsa, G. et al. | 1983
- 1080
-
Electronic states of ideal Ge–Al interfacesBatra, Inder P. / Herman, Frank et al. | 1983
- 1085
-
Angle‐resolved photoemission studies of the CdS band structureStoffel, N. G. / Margaritondo, G. et al. | 1983
- 1089
-
Self‐consistent surface electronic band structure calculations: Changes upon chemisorptionRichter, Roy / Wilkins, John W. et al. | 1983
- 1095
-
Theory of electronic structure of copper overlayers on transition metal substratesMa, C. Q. / Ramana, M. V. / Cooper, B. R. / Krakauer, H. et al. | 1983
- 1099
-
Summary Abstract: Reconstruction of semiconductor surfaces: Si(111)‐2×1, Si(111)‐7×7, and GaAs(110)Pandey, K. C. et al. | 1983
- 1100
-
Summary Abstract: Investigation of final state effects in the photoemission of inert gases adsorbed on W(110)Opila, R. / Gomer, R. et al. | 1983
- 1101
-
Summary Abstract: Comparison of calculated surface core‐level energy shifts with empirical heats of segregationFeibelman, Peter J. et al. | 1983
- 1102
-
Summary Abstract: Thermochemistry of interface and surface segregation and chemisorption from core level binding energy shiftsEgelhoff, W. F. et al. | 1983
- 1104
-
Inverse photoemissionWoodruff, D. P. / Johnson, P. D. / Smith, N. V. et al. | 1983
- 1111
-
Momentum‐resolved bremsstrahlung spectroscopy with a tunable photon detectorFauster, T. / Himpsel, F. J. et al. | 1983
- 1115
-
Inverse photoemission from Ni(100) and Ni(111) with oriented oxygen overlayersDose, V. / Glöbl, M. / Scheidt, H. et al. | 1983
- 1119
-
New insights from electron spin polarization studies of surfacesPierce, D. T. / Celotta, R. J. et al. | 1983
- 1125
-
The interaction of hydrogen with silicon surfaces: A field ion microscope and pulsed‐laser atom‐probe studyKellogg, G.L. et al. | 1983
- 1130
-
Current image diffraction (CID) of single crystal metal surfacesBargeron, C. B. / Nall, B. H. / Jette, A. N. et al. | 1983
- 1134
-
Summary Abstract: Spin polarization of secondary electrons from Ni(110)Hopster, H. / Raue, R. / Kisker, E. / Campagna, M. / Güntherodt, G. et al. | 1983
- 1135
-
Summary Abstract: Pulsed‐laser time of flight atom‐probe FIM study of surface reactivitiesTsong, T. T. / Kinkus, T. J. et al. | 1983
- 1137
-
Covalent interaction effects in electron/photon‐stimulated desorptionRamaker, David E. et al. | 1983
- 1145
-
Photon‐ and electron‐stimulated desorption from rare earth oxidesLoubriel, G. / Knotek, M. L. / Stulen, R. H. / Koel, B. E. / Parks, C. C. et al. | 1983
- 1149
-
Electron‐stimulated desorption in organic molecular solidsKelber, J. A. / Knotek, M. L. et al. | 1983
- 1154
-
Localization of surface excitations and stimulated desorptionJennison, D. R. / Emin, David et al. | 1983
- 1157
-
Summary Abstract: Surface processes in plasma‐assisted etching environmentsWinters, Harold F. / Coburn, J. W. / Chuang, T. J. et al. | 1983
- 1159
-
Summary Abstract: Ion beam angle dependence of collisionally excited Auger electron emission from Al and Si surfacesAndreadis, T. D. / Fine, Joseph / Matthew, J. A. D. et al. | 1983
- 1160
-
Summary Abstract: Correlations in time of electron and positive ion emission accompanying fractureDickinson, J. T. / Jensen, L. C. et al. | 1983
- 1162
-
Summary Abstract: Electron‐ and photon‐stimulated desorption of condensed molecular films: Relevance to the mechanisms of ion formation and desorptionStockbauer, Roger / Bertel, Erminald / Madey, Theodore E. et al. | 1983
- 1163
-
Summary Abstract: Electron‐stimulated desorption of ions and metastable neutrals from condensed H2O multilayersStulen, R. H. et al. | 1983
- 1165
-
Variation of the threshold energies for core‐electron excitation in electron energy‐loss spectra as a function of incident electron energyErickson, N. E. / Powell, C. J. et al. | 1983
- 1169
-
Threshold electron excitation of Auger‐electron and x‐ray emissions in CeChamberlain, M. B. / Burr, A. F. / Liefeld, R. J. et al. | 1983
- 1174
-
High‐resolution study of the influence of gas adsorption on LEED fine structuresBaribeau, J.‐M. / Carette, J.‐D. et al. | 1983
- 1178
-
Angle‐resolved measurements of the secondary‐electron emission spectrum of Cu(100)Graham, G. W. et al. | 1983
- 1181
-
Photoemission studies of the effect of temperature on the Au–GaAs(110) interfacePetro, W. G. / Babalola, I. A. / Kendelewicz, T. / Lindau, I. / Spicer, W. E. et al. | 1983
- 1185
-
CO interactions with copper‐covered Ru(0001)Bader, S. D. / Richter, L. / Cao, P.‐L. / Ellis, D. E. / Freeman, A. J. et al. | 1983
- 1188
-
A model for the saturated water bilayer on Ru(001) based on a comparison of experimental and calculated LEED patternsWilliams, Ellen D. / Doering, Dale L. et al. | 1983
- 1193
-
First phase nickel silicide nucleation and interface structure at Si(100) surfacesChang, Yu‐Jeng / Erskine, J. L. et al. | 1983
- 1198
-
Catalysis of carbon methanation by small platinum particlesSantiesteban, J. / Fuentes, S. / Yacaman, M. J. et al. | 1983
- 1201
-
Hydrogen‐induced features in the Auger spectra from amorphous siliconMadden, H. H. et al. | 1983
- 1205
-
Charge transfer at surfaces: A model for ionization in SIMSLin, J.‐H. / Garrison, B. J. et al. | 1983
- 1209
-
Summary Abstract: EXELFS in the reflection electron energy loss spectra of Cu and NiTeng, C. H. / Hitchcock, A. P. et al. | 1983
- 1210
-
Summary Abstract: A high‐resolution, low‐energy electron diffractometer based on a field emission sourceMartin, J. A. / Lagally, M. G. et al. | 1983
- 1212
-
Summary Abstract: The MoO3(010) surfaceCaruthers, E. B. / Ferretti, A. / Firment, L. E. / Kasowski, R. V. et al. | 1983
- 1213
-
Summary Abstract: Adsorptive and catalytic properties of zirconium overlayers on Pt(100)Bardi, U. / Somorjai, G. A. / Ross, P. N. et al. | 1983
- 1214
-
Summary Abstract: Transition metal chemisorption on transition metals—theoretical and experimental electronic structure for silver on palladium(100)Capehart, T. W. / Richter, R. / Gay, J. G. / Smith, J. R. / Buchholz, J. C. / Arlinghaus, F. J. et al. | 1983
- 1216
-
Summary Abstract: Detailed structure of acetylide carbon on the surface of lithiumGates, S. M. / Pedersen, L. G. / Jarnagin, R. C. et al. | 1983
- 1217
-
Summary Abstract: (2×2) phase transitions on honeycomb latticesBartelt, N. C. / Einstein, T. L. / Roelofs, L. D. et al. | 1983
- 1219
-
Summary Abstract: The reaction of saturated and unsaturated hydrocarbons with single crystalline surfaces of iridiumSzuromi, P. D. / Weinberg, W. H. et al. | 1983
- 1220
-
Summary Abstract: The adsorption and decomposition of N2O on Ru(001)Madey, T. E. / Avery, N. R. / Anton, A. B. / Toby, B. H. / Weinberg, W. H. et al. | 1983
- 1222
-
Summary Abstract: The formation and decomposition of methanol on Ru(001) studied by EELS, TDMS, and work function measurementHrbek, J. / dePaola, R. A. / Hoffmann, F. M. et al. | 1983
- 1223
-
Summary Abstract: The formation of a surface carbonate species on Ni(100) by reaction between oxygen and CO2Behm, R. J. / Brundle, C. R. et al. | 1983
- 1225
-
Summary Abstract: SIMS and TDS study of the reaction of water and oxygen on Pt(111)Creighton, J. R. / White, J. M. et al. | 1983
- 1226
-
Summary Abstract: Methyl isocyanide adsorption on Rh(111)Semancik, S. / Haller, G. L. / Yates, J. T. et al. | 1983
- 1227
-
Summary Abstract: Structure and bonding in very thin metal depositsLégaré, P. / Rhodin, T. N. / Brucker, C. F. et al. | 1983
- 1229
-
Summary Abstract: Evidence for core hole screening by 3d electrons in third row oxyanionsTurner, N. H. / Ramaker, D. E. et al. | 1983
- 1230
-
Summary Abstract: Angle‐resolved SIMS studies of O2 and CO chemisorption on Ni3Fe(111)Bleiler, R. J. / Diebold, A. C. / Winograd, N. et al. | 1983
- 1232
-
Surface phonons on clean‐ and adsorbate‐covered nickel disilicide (NiSi2) thin filmsDubois, L. H. / Rowe, J. E. et al. | 1983
- 1236
-
Infrared laser photoacoustic spectroscopy of adsorbed speciesChuang, T. J. / Coufal, H. / Träger, F. et al. | 1983
- 1240
-
Summary Abstract: Multichannel Raman spectroscopy of molecules on metal films and tunnel junctionsAvouris, Ph. / Tsang, J. C. / Kirtley, J. R. et al. | 1983
- 1241
-
Summary Abstract: Surface state optical absorption on the clean Si(100)2×1 surfaceChabal, Y. J. / Christman, S. B. / Chaban, E. E. / Yin, M. T. et al. | 1983
- 1242
-
Summary Abstract: Vibrational and rotational excitations of adsorbed moleculesAndersson, S. et al. | 1983
- 1244
-
Summary Abstract: Vibrational modes of acetylene on Ni(001): Angle‐resolved electron energy loss spectroscopy (EELS) studyDiNardo, N. J. / Demuth, J. E. / Avouris, Ph. et al. | 1983
- 1245
-
Summary Abstract: Neutron scattering from adsorbates on platinum blackRush, J. J. / Cavanagh, R. R. / Kelley, R. D. et al. | 1983
- 1247
-
Primary steps in catalytic synthesis of ammoniaErtl, G. et al. | 1983
- 1254
-
The effects of adsorbed sulfur on the adsorption and reaction of CO and methanol on Ni(100)Madix, R. J. / Lee, S. B. / Thornburg, M. et al. | 1983
- 1261
-
Molecular beam mass spectrometric studies of energy transfer and chemical reactions on heated surfacesFoner, S. N. / Hudson, R. L. et al. | 1983
- 1265
-
Summary Abstract: The role of potassium additives in nickel catalysts for CO hydrogenation: A surface science investigationCampbell, C. T. / Goodman, D. W. et al. | 1983
- 1266
-
Summary Abstract: The adsorption of CO on Fe(110)Kurz, Edward A. / Lassig, Stephan / Hudson, John B. et al. | 1983
- 1267
-
Summary Abstract: Internal energy distributions in thermally desorbed moleculesCavanagh, R. R. / King, D. S. et al. | 1983
- 1269
-
Summary Abstract: Rotational state population of NO scattered from clean and absorbate‐covered Pt surfacesDoyen, G. / Ertl, G. / Robota, H. / Segner, J. / Vielhaber, W. / Frenkel, F. / Häger, J. / Krieger, W. / Walther, H. et al. | 1983
- 1270
-
Summary Abstract: Kinetic energy dependence of nitrogen adsorption on W(110)Auerbach, D. J. / Schlaegel, J. E. / Lee, J. / Madix, R. J. et al. | 1983
- 1273
-
Enhanced selective hydrogen desorption from metalsKnize, R. J. / Cecchi, J. L. et al. | 1983
- 1276
-
Pressure dependence of Zr–Al pumping speed for H2Cecchi, J. L. / Knize, R. J. et al. | 1983
- 1279
-
Equilibrium pressures of H2 and D2 for different getter materials and the effect of CO impuritiesBoffito, C. / Ferrario, B. / Martelli, D. et al. | 1983
- 1283
-
Evaluation of Zr–V–Fe getter pump for UHV systemHseuh, H. C. / Lanni, C. et al. | 1983
- 1288
-
Dynamic gas flow during plasma operation in TMX‐UPickles, W. L. / Calderon, M. O. / Carter, M. R. / Clower, C. A. / Drake, R. P. / Hunt, A. L. / Lang, D. / Simonen, T. C. / Turner, W. C. et al. | 1983
- 1293
-
Fast pressure measurements for the TMX‐U fusion experimentHunt, A. L. / Coffield, F. E. / Pickles, W. L. et al. | 1983
- 1297
-
Conditioning of ion sources for mass spectrometry of plasmasDylla, H. F. / Blanchard, W. R. et al. | 1983
- 1302
-
Edge measurements of Te,Ti,n,Er on the DITE tokamak using a biased power bolometerStangeby, P. C. / McCracken, G. M. / Erents, S. K. / Vince, J. E. / Wilden, R. et al. | 1983
- 1306
-
Summary Abstract: Influence of sorbed gases on the oxygen gettering characteristics of Ti and Cr filmsSimpkins, J.E. / Emerson, L. C. / Mioduszewski, P. / Stratton, L. W. et al. | 1983
- 1308
-
The (changing) MFTF vacuum environmentMargolies, David / Valby, Lawrence et al. | 1983
- 1315
-
A continuous cryopump for steady state mirror fusion reactorsBatzer, Thomas H. / Call, Wayne R. et al. | 1983
- 1319
-
Design of a dee vacuum vessel for Doublet IIIDavis, Larry G. et al. | 1983
- 1325
-
The leak‐checking and testing of the first yin–yang magnet for the Mirror Fusion Test Facility (MFTF)Kozman, T. A. / Lathrop, G. H. / Podesta, D. L. et al. | 1983
- 1331
-
Seals for large ports on the Tokamak Fusion Test ReactorMullaney, D. H. / Mozeleski, M. A. / Fleming, R. B. et al. | 1983
- 1335
-
Calculations of gas density in a closely packed multichannel electrostatic quadrupole (MESQ) arrayBurrell, C. F. / Goldberg, D. A. et al. | 1983