Comparison of different discretization methods for semiconductor drift-diffusion problems: Data (English)
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- New search for: Farrell, Patricio
- New search for: Peschka, Dirk
- New search for: Farrell, Patricio
- New search for: Peschka, Dirk
2018
- Research Data / Electronic Resource
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Title:Comparison of different discretization methods for semiconductor drift-diffusion problems: Data
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Contributors:Farrell, Patricio ( author ) / Peschka, Dirk ( author )
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Publication date:2018-01-01
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DOI:
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Type of media:Research Data
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Type of material:Electronic Resource
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Language:English
- New search for: 510
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Keywords:database , ddc:510 , 35Q99 , 82D37 , 65M08 , 65M06 , 65M60 , Finite volume method -- finite element method -- finite difference method -- comparison -- benchmark -- flux discretization -- Scharfetter-Gummel scheme -- semiconductors -- van Roosbroeck system -- device simulation -- nonlinear diffusion -- diffusion enhancement
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Classification:
DDC: 510 -
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