International round robin test for tensile testing HTS wires at cryogenic temperatures (English)
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- New search for: Delgado, M. A.
- New search for: McRae, D. M.
- New search for: Nijhuis, A.
- New search for: Nishijima, G.
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- New search for: Shin, H. S.
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- Article (Journal) / Electronic Resource
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Title:International round robin test for tensile testing HTS wires at cryogenic temperatures
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Contributors:Bagrets, N. ( author ) / Anvar, V. A. ( author ) / Chiesa, L. ( author ) / Delgado, M. A. ( author ) / McRae, D. M. ( author ) / Nijhuis, A. ( author ) / Nishijima, G. ( author ) / Osamura, K. ( author ) / Shin, H. S. ( author ) / Walsh, R. P. ( author )
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Publication date:2019-04-01
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Remarks:Superconductor science and technology, 32 (2), Art. Nr.: 024005 ; ISSN: 0953-2048, 1361-6668
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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DDC: 530 -
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