Wavefront and Coherence Characteristics of Extreme UV and Soft X-ray Sources (English)
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- New search for: Schäfer, Bernd
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- New search for: Schäfer, Bernd
- New search for: Flöter, Bernhard
- New search for: Mey, Tobias
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Title:Wavefront and Coherence Characteristics of Extreme UV and Soft X-ray Sources
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Contributors:Schäfer, Bernd ( author ) / Flöter, Bernhard ( author ) / Mey, Tobias ( author ) / Mann, Klaus ( author )
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Publication date:2020-01-01
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Remarks:Cham : Springer International Publishing, Topics in Applied Physics 134, 531 - 548 (2020). doi:10.1007/978-3-030-34413-9_20 ; Nanoscale Photonic Imaging / Salditt, Tim (Editor) ; Cham : Springer International Publishing, 2020, Chapter 20 ; ISSN: 0303-4216=1437-0859 ; ISBN: 978-3-030-34412-2=978-3-030-34413-9 ; doi:10.1007/978-3-030-34413-9
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Type of media:Article/Chapter (Book)
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Type of material:Electronic Resource
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Language:English
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