In-situ synchrotron x-ray study of the crystallization behavior of $Ce_{0.9}La_{0.1}O_{2-x}$ thin films deposited on NiW alloy substrates by chemical solution method (English)
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Title:In-situ synchrotron x-ray study of the crystallization behavior of $Ce_{0.9}La_{0.1}O_{2-x}$ thin films deposited on NiW alloy substrates by chemical solution method
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Contributors:Zhao, Y. ( author ) / Grivel, J. C. ( author ) / Abrahamsen, A. B. ( author ) / Pallewatta, P. G. A. P. ( author ) / He, D. ( author ) / Bednarcik, J. ( author ) / v. Zimmermann, M. ( author )
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Publication date:2011-01-01
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Remarks:Materials letters 65, 2669-2672 (2011). doi:10.1016/j.matlet.2011.05.072
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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DDC: 530 -
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