Talbot- Lau interferometry with a non- binary phase grating for non-destructive testing (English)
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- New search for: Shashev, Yury
- New search for: Kupsch, Andreas
- New search for: Lange, Axel
- New search for: Britzke, Ralf
- New search for: Bruno, Giovanni
- New search for: Mueller, Bernd R.
- New search for: Hentschel, Manfred P.
- New search for: Shashev, Yury
- New search for: Kupsch, Andreas
- New search for: Lange, Axel
- New search for: Britzke, Ralf
- New search for: Bruno, Giovanni
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- Conference paper / Electronic Resource
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Title:Talbot- Lau interferometry with a non- binary phase grating for non-destructive testing
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Contributors:Shashev, Yury ( author ) / Kupsch, Andreas ( author ) / Lange, Axel ( author ) / Britzke, Ralf ( author ) / Bruno, Giovanni ( author ) / Mueller, Bernd R. ( author ) / Hentschel, Manfred P. ( author )
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Publication date:2016-01-01
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Type of media:Conference paper
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Type of material:Electronic Resource
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Language:English
- New search for: 620
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DDC: 620 -
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