Assessing the stability of p+ and n+ polysilicon passivating contacts with various capping layers on p-type wafers (English)
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- New search for: Madumelu, Chukwuka
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- New search for: Hoex, Bram
- New search for: Hallam, Brett J.
- New search for: Soeriyadi, Anastasia H.
- New search for: Madumelu, Chukwuka
- New search for: Cai, Yalun
- New search for: Hollemann, Christina
- New search for: Peibst, Robby
- New search for: Hoex, Bram
- New search for: Hallam, Brett J.
- New search for: Soeriyadi, Anastasia H.
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Title:Assessing the stability of p+ and n+ polysilicon passivating contacts with various capping layers on p-type wafers
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Contributors:Madumelu, Chukwuka ( author ) / Cai, Yalun ( author ) / Hollemann, Christina ( author ) / Peibst, Robby ( author ) / Hoex, Bram ( author ) / Hallam, Brett J. ( author ) / Soeriyadi, Anastasia H. ( author )
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Publication date:2023-01-01
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Remarks:Solar Energy Materials and Solar Cells 253 (2023) ; Solar Energy Materials and Solar Cells
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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