Testing and Analysis Method of Low Remanence Materials for Magnetic Shielding Device (Unknown)
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- New search for: Yuan Cheng
- New search for: Yaozhi Luo
- New search for: Ruihong Shen
- New search for: Deyu Kong
- New search for: Weiyong Zhou
- New search for: Yuan Cheng
- New search for: Yaozhi Luo
- New search for: Ruihong Shen
- New search for: Deyu Kong
- New search for: Weiyong Zhou
In:
Materials, Vol 16, Iss 2, p 681 (2023)
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2023
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ISSN:
- Article (Journal) / Electronic Resource
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Title:Testing and Analysis Method of Low Remanence Materials for Magnetic Shielding Device
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Contributors:Yuan Cheng ( author ) / Yaozhi Luo ( author ) / Ruihong Shen ( author ) / Deyu Kong ( author ) / Weiyong Zhou ( author )
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Published in:
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Publisher:
- New search for: MDPI AG
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Publication date:2023
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:Unknown
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Keywords:magnetic shielding device , low remanence material , extremely weak magnetic field , Technology , T , Electrical engineering. Electronics. Nuclear engineering , TK1-9971 , Engineering (General). Civil engineering (General) , TA1-2040 , Microscopy , QH201-278.5 , Descriptive and experimental mechanics , QC120-168.85
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Source:
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