The node distribution for meshless methods* (English)
- New search for: Hérault, C.
- New search for: Leconte, V.
- New search for: Maréchal, Y.
- New search for: Meunier, G.
- New search for: Hérault, C.
- New search for: Leconte, V.
- New search for: Maréchal, Y.
- New search for: Meunier, G.
In:
The European Physical Journal Applied Physics
;
15
, 2
;
135-140
;
2001
- Article (Journal) / Electronic Resource
-
Title:The node distribution for meshless methods*
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Contributors:
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Published in:The European Physical Journal Applied Physics ; 15, 2 ; 135-140
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Publisher:
- New search for: EDP Sciences
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Publication date:2001-08-01
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Size:6 pages
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ISSN:
-
DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 15, Issue 2
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 79
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An investigation of martensitic volume fraction observed during martensitic phase transformation in some iron-based alloysDoğan, A. / Havvatoğlu, Y. / Arslan, A. et al. | 2001
- 85
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Comparison of several methods for the reproduction of the orientation distribution function from pole figures in medium to strong textured materialsCaleyo, F. / Baudin, T. / Mathon, M. H. / Penelle, R. et al. | 2001
- 97
-
Microwave dielectric relaxation of ferroelectric PLZT ceramics in the range of 300-900 KMouhsen, A. / Achour, M. E. / Miane, J. L. / Ravez, J. et al. | 2001
- 105
-
Modelling and control of a seven level NPC voltage source inverter. Application to high power induction machine driveGheraia, H. / Berkouk, E. M. / Manesse, G. et al. | 2001
- 117
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Simulation of 2D quantum effects in ultra-short channel MOSFETs by a finite element method*Poncet, A. / Faugeras, C. / Mouis, M. et al. | 2001
- 123
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Model of the homogeneous electrical dischargeVongphouthone, S. / Piquet, H. / Foch, H. et al. | 2001
- 135
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The node distribution for meshless methods*Hérault, C. / Leconte, V. / Maréchal, Y. / Meunier, G. et al. | 2001
- 141
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A virtual non contact-atomic force microscope (NC-AFM): Simulation and comparison with analytical modelsCouturier, G. / Aimé, J. P. / Salardenne, J. / Boisgard, R. et al. | 2001
- 149
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A very-low temperature tunnel microscope*Moussy, N. / Pannetier, B. / Courtois, H. et al. | 2001