Growth behaviors of ZnO nanostructure on SMAT Cu0.62Zn0.38 during oxidation (English)
- New search for: Wang, Jun Peng
- New search for: Xu, Chun Hua
- New search for: Zhu, Zhen Biao
- New search for: Wen, Chun Sheng
- New search for: Lu, Jian
- New search for: Shi, San Qiang
- New search for: Wang, Jun Peng
- New search for: Xu, Chun Hua
- New search for: Zhu, Zhen Biao
- New search for: Wen, Chun Sheng
- New search for: Lu, Jian
- New search for: Shi, San Qiang
In:
The European Physical Journal Applied Physics
;
62
, 2
;
2013
- Article (Journal) / Electronic Resource
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Title:Growth behaviors of ZnO nanostructure on SMAT Cu0.62Zn0.38 during oxidation
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Contributors:Wang, Jun Peng ( author ) / Xu, Chun Hua ( author ) / Zhu, Zhen Biao ( author ) / Wen, Chun Sheng ( author ) / Lu, Jian ( author ) / Shi, San Qiang ( author )
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Published in:
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Publisher:
- New search for: EDP Sciences
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Publication date:2013-05-01
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Size:5 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 62, Issue 2
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
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AlGaN/GaN/InGaN/GaN DH-HEMTs with GaN channel layer grown at high temperatureZhang, Lu / Wang, Xiaoliang / Xiao, Hongling / Chen, Hong / Feng, Chun / Shen, Guangdi / Wang, Zhanguo / Hou, Xun et al. | 2013
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Monte Carlo simulation of cutaneous absorption and reflectance for clear, matt and dark biological tissue with varicosities: an investigation for dermatological laserKlouch, Nawel / Riane, Houaria / Hamdache, Fatima / Addi, Djamel et al. | 2013
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Calorimetric study of thermal crystallization kinetics in Se78-xTe20Sn2Pbx (0 ≤ x ≤ 6) alloysKumar, H. / Mehta, N. et al. | 2013
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Fabrication and temperature-dependent band gap shrinkage of α-phase Bi2O3 thin films grown by atomic layer deposition methodShen, Yude / Li, Yawei / Jiang, Kai / Zhang, Jinzhong / Duan, Zhihua / Hu, Zhigao / Chu, Junhao et al. | 2013
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Selective plasma etching treatment of the screen-printed carbon nanotube cold cathodeYu, Jun et al. | 2013
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Growth behaviors of ZnO nanostructure on SMAT Cu0.62Zn0.38 during oxidationWang, Jun Peng / Xu, Chun Hua / Zhu, Zhen Biao / Wen, Chun Sheng / Lu, Jian / Shi, San Qiang et al. | 2013
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Organic field-effect transistors with a sandwich structure from inserting 2,2′,2″-(1,3,5-benzenetriyl)tris[1-phenyl-1H-benzimidazole] in the pentacene active layerYu, Xinge / Yu, Junsheng / Zhou, Jianlin / Huang, Wei / Lin, Hui et al. | 2013
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Phase transition and elastic properties of beryllium sulfide semiconductor under high pressureWang, Feng / Hu, Chenghua / Wu, Jinghe / Zhou, Ping / Zheng, Zhou / Hu, Chunlian et al. | 2013
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Study of structural and electrical properties of zinc oxide and Al-doped zinc oxide thin films deposited by DC sputteringBarhoumi, Amira / Yang, Liu / Sakly, Nawfel / Boughzala, Habib / Leroy, Gérard / Gest, Joël / Carru, Jean-Claude / Guermazi, Samir et al. | 2013
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Determination of the conduction mechanism and extraction of diode parameters of Au/PANI-TiO2/Al Schottky diodeAmrollahi Bioki, Hojjat et al. | 2013
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Liquid ingress recognition in honeycomb structure by pulsed thermographyChen, Dapeng / Zeng, Zhi / Tao, Ning / Zhang, Cunlin / Zhang, Zheng et al. | 2013
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The estimation of size and position of contaminating particle adhering to the insulating spacer surface in gas-insulated systemsKhan, Yasin / Budiman, Firmansiah Nur / Béroual, Abderrahmane / Malik, Nazar Hussain / Al-Arainy, Abdulrehman Ali et al. | 2013
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Effect of Ar annealing temperature on SiO2/SiC:SiO2 densification change causing leakage current reductionZhong, Zhi Qin / Sun, Zi Jiao / Wang, Shu Ya / Dai, Li Ping / Zhang, Guo Jun et al. | 2013
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Reverse leakage mechanisms of liquid metal contacts onto II–VI group semiconductor (Ga/p-WSe2)Bobby, Achamma / Gupta, Partha Sarathi / Antony, Bobby Kachappilly et al. | 2013