X and X-UV multilayered optics: principles, fabrication methods, tests and applications (English)
- New search for: Dhez, P.
- New search for: Dhez, P.
In:
Annales de Physique
;
15
, 6
;
493-527
;
1990
- Article (Journal) / Electronic Resource
-
Title:X and X-UV multilayered optics: principles, fabrication methods, tests and applications
-
Contributors:Dhez, P. ( author )
-
Published in:Annales de Physique ; 15, 6 ; 493-527
-
Publisher:
- New search for: EDP Sciences
-
Publication date:1990-01-01
-
Size:35 pages
-
ISSN:
-
DOI:
-
Type of media:Article (Journal)
-
Type of material:Electronic Resource
-
Language:English
-
Keywords:X ray optics , evaporation methods , multilayered optical devices , reflectivity , X UV optical indices , periodic ultra thin layers , optical workshop techniques , mirrors , artificial Bragg reflectors , plasma physics , optical films , optical testing , X UV artificial interferential mirrors , XUV mirror fabrication , regular stacks , X UV multilayered optics , interface quality , layering regularity , XUV mirror testing , synchrotron radiation , X ray reflectivity measurements , X ray range
-
Source:
Table of contents – Volume 15, Issue 6
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 493
-
X and X-UV multilayered optics: principles, fabrication methods, tests and applicationsDhez, P. et al. | 1990
- 529
-
Modelling of recombination X-ray lasersKlisnick, A. / Sureau, A. / Guennou, H. / Möller, C. / Virmont, J. et al. | 1990