Comparison of the equivalent width, the autocorrelation width, and the variance as figures of merit for XPS narrow scans (English)
- New search for: Singh, Bhupinder
- New search for: Velázquez, Daniel
- New search for: Terry, Jeff
- New search for: Linford, Matthew R.
- New search for: Singh, Bhupinder
- New search for: Velázquez, Daniel
- New search for: Terry, Jeff
- New search for: Linford, Matthew R.
In:
Journal of Electron Spectroscopy and Related Phenomena
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197
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112-117
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2014
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ISSN:
- Article (Journal) / Electronic Resource
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Title:Comparison of the equivalent width, the autocorrelation width, and the variance as figures of merit for XPS narrow scans
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Contributors:Singh, Bhupinder ( author ) / Velázquez, Daniel ( author ) / Terry, Jeff ( author ) / Linford, Matthew R. ( author )
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Published in:Journal of Electron Spectroscopy and Related Phenomena ; 197 ; 112-117
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Publisher:
- New search for: Elsevier B.V.
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Publication date:2014-10-19
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Size:6 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 197
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Predicting the electronic structure and magnetic properties of UO, UO2(CO) and UO2(Ar) using wavefunction based methodsPáez-Hernández, Dayán et al. | 2014
- 1
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Predicting the electronic structure and magnetic properties of UO, UO2(CO) and UO2(Ar) using wavefunction based methodsPáez-Hernández, Dayán et al. | 2014
- 7
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Electrostatic afocal-zoom lens design using computer optimization techniqueSise, Omer et al. | 2014
- 13
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Temperature and polarization dependence of Fe L3-edge X-ray absorption spectra of LuFe2O4Agui, A. / Mizumaki, M. / Kuroda, T. / Kawai, M. / Nagata, T. / Ikeda, N. / Uozumi, T. et al. | 2014
- 17
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Maximum probing depth of low-energy photoelectrons in an amorphous organic semiconductor filmOzawa, Yusuke / Nakayama, Yasuo / Machida, Shin’ichi / Kinjo, Hiroumi / Ishii, Hisao et al. | 2014
- 22
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Femtosecond photoelectron and photoion spectrometer with vacuum ultraviolet probe pulsesKoch, Markus / Wolf, Thomas J.A. / Grilj, Jakob / Sistrunk, Emily / Gühr, Markus et al. | 2014
- 30
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Acquisition of photoelectron diffraction patterns with a two-dimensional wide-angle electron analyzerGreif, Michael / Castiglioni, Luca / Becker-Koch, David / Osterwalder, Jürg / Hengsberger, Matthias et al. | 2014
- 37
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Thermal evolution of the band edges of 6H-SiC: X-ray methods compared to the optical band gapMiedema, P.S. / Beye, M. / Könnecke, R. / Schiwietz, G. / Föhlisch, A. et al. | 2014
- 43
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Photoelectron spectra and electronic structure of some spiroborate complexesVovna, V.I. / Tikhonov, S.A. / Lvov, I.B. / Osmushko, I.S. / Svistunova, I.V. / Shcheka, O.L. et al. | 2014
- 50
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Fully differential cross sections for low to intermediate energy perpendicular plane ionization of xenon atomsPurohit, G. / Singh, P. / Patidar, V. et al. | 2014
- 56
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The equivalent width as a figure of merit for XPS narrow scansSingh, Bhupinder / Velázquez, Daniel / Terry, Jeff / Linford, Matthew R. et al. | 2014
- 64
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Influence of host matrices on krypton electron binding energies and KLL Auger transition energiesInoyatov, А.Kh. / Perevoshchikov, L.L. / Kovalík, A. / Filosofov, D.V. / Yushkevich, Yu.V. / Ryšavý, M. / Lee, B.Q. / Kibédi, T. / Stuchbery, A.E. / Zhdanov, V.S. et al. | 2014
- 72
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Investigation of luminescent properties of Ca0.3Sr0.7Al2O4:Tb3+,Eu3+ excited using different excitation sourcesShaat, Samy K.K. / Swart, Hendrik C. / Ntwaeaborwa, Odireleng M. et al. | 2014
- 80
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New method for the determination of the correction function of a hemisperical electron analyser based on elastic electron imagesMahjoub, Mohamed Aymen / Monier, Guillaume / Robert-Goumet, Christine / Bideux, Luc / Gruzza, Bernard et al. | 2014
- 88
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L subshell and total L shell photoeffect cross-sections of Sn, Sb, Te and I elements at 5.96keVAylikci, V. et al. | 2014
- 93
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On the choice of tuning parameters for use with Robust GCV, Modified GCV and the Discrepancy Principle in the inversion of ARXPS dataPeykov, D. / Paynter, R.W. et al. | 2014
- 102
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X-ray photoelectron spectroscopy study of BaWO4 and Ba2CaWO6Capece, Angela M. / Polk, James E. / Shepherd, Joseph E. et al. | 2014
- 106
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Inverse photoemission and photoemission spectroscopic studies on sputter-annealed Ni–Mn–Sn and Ni–Mn–In surfacesManiraj, M. / D'Souza, S.W. / Singh, Sandeep / Biswas, C. / Majumdar, S. / Barman, S.R. et al. | 2014
- 112
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Comparison of the equivalent width, the autocorrelation width, and the variance as figures of merit for XPS narrow scansSingh, Bhupinder / Velázquez, Daniel / Terry, Jeff / Linford, Matthew R. et al. | 2014
- 118
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Developing soft X-ray spectroscopy for in situ characterization of nanocatalysts in catalytic reactionsZhang, Hui / Wang, Wei-Cheng / Glans, Per-Anders / Liu, Yi-Sheng / Kapilashrami, Mukes / Chen, Jeng-Lung / Chang, Chinglin / Salmeron, Miquel / Escudero, Carlos / Pach, Elzbieta et al. | 2014
- IFC
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IFC Editorial Board| 2014