Real-space mapping of electronic orbitals (English)
- New search for: Löffler, Stefan
- Further information on Löffler, Stefan:
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https://orcid.org/0000-0003-0080-2495
- New search for: Bugnet, Matthieu
- New search for: Gauquelin, Nicolas
- New search for: Lazar, Sorin
- New search for: Assmann, Elias
- New search for: Held, Karsten
- New search for: Botton, Gianluigi A.
- New search for: Schattschneider, Peter
- New search for: Löffler, Stefan
- New search for: Bugnet, Matthieu
- New search for: Gauquelin, Nicolas
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- New search for: Held, Karsten
- New search for: Botton, Gianluigi A.
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In:
Ultramicroscopy
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177
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26-29
;
2017
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ISSN:
- Article (Journal) / Electronic Resource
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Title:Real-space mapping of electronic orbitals
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Contributors:Löffler, Stefan ( author ) / Bugnet, Matthieu ( author ) / Gauquelin, Nicolas ( author ) / Lazar, Sorin ( author ) / Assmann, Elias ( author ) / Held, Karsten ( author ) / Botton, Gianluigi A. ( author ) / Schattschneider, Peter ( author )
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Published in:Ultramicroscopy ; 177 ; 26-29
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Publisher:
- New search for: Elsevier B.V.
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Publication date:2017-01-29
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Size:4 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 177
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Publisher’s note| 2017
- 1
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Correlative micro-diffraction and differential phase contrast study of mean inner potential and subtle beam-specimen interactionWu, Mingjian et al. | 2017
- 14
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Electron-beam-induced-current and active secondary-electron voltage-contrast with aberration-corrected electron probesHan, Myung-Geun et al. | 2017
- 20
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Modified automatic term selection v2: A faster algorithm to calculate inelastic scattering cross-sectionsRusz, Ján et al. | 2017
- 26
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Real-space mapping of electronic orbitalsLöffler, Stefan / Bugnet, Matthieu / Gauquelin, Nicolas / Lazar, Sorin / Assmann, Elias / Held, Karsten / Botton, Gianluigi A. / Schattschneider, Peter et al. | 2017
- 30
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3D shaping of electron beams using amplitude masksShiloh, Roy / Arie, Ady et al. | 2017
- 36
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Depth sectioning combined with atom-counting in HAADF STEM to retrieve the 3D atomic structureAlania, M. / Altantzis, T. / De Backer, A. / Lobato, I. / Bals, S. / Van Aert, S. et al. | 2016
- 43
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Effects of accelerating voltage and specimen thickness on the spatial resolution of transmission electron backscatter diffraction in CuShih, Jhih-Wun / Kuo, Ka-Wei / Kuo, Jui-Chao / Kuo, Tsung-Yuan et al. | 2017
- 53
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Effects of small-angle mistilts on dopant visibility in ADF-STEM imaging of nanocrystalsHeld, Jacob T. / Duncan, Samuel / Mkhoyan, K. Andre et al. | 2017
- 58
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X-ray absorption in pillar shaped transmission electron microscopy specimensBender, H. / Seidel, F. / Favia, P. / Richard, O. / Vandervorst, W. et al. | 2017
- 69
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Hybrid statistics-simulations based method for atom-counting from ADF STEM imagesDe wael, Annelies / De Backer, Annick / Jones, Lewys / Nellist, Peter D. / Van Aert, Sandra et al. | 2017
- 78
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Streamlined approach to mapping the magnetic induction of skyrmionic materialsChess, Jordan J. / Montoya, Sergio A. / Harvey, Tyler R. / Ophus, Colin / Couture, Simon / Lomakin, Vitaliy / Fullerton, Eric E. / McMorran, Benjamin J. et al. | 2017
- 84
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Optimizing experimental parameters for the projection requirement in HAADF-STEM tomographyAveyard, R. / Zhong, Z. / Batenburg, K.J. / Rieger, B. et al. | 2017
- 91
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STEMsalabim: A high-performance computing cluster friendly code for scanning transmission electron microscopy image simulations of thin specimensOelerich, Jan Oliver / Duschek, Lennart / Belz, Jürgen / Beyer, Andreas / Baranovskii, Sergei D. / Volz, Kerstin et al. | 2017
- 97
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On the achievable field sensitivity of a segmented annular detector for differential phase contrast measurementsSchwarzhuber, Felix / Melzl, Peter / Zweck, Josef et al. | 2017
- 106
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Assessment of engineered surfaces roughness by high-resolution 3D SEM photogrammetryGontard, L.C. / López-Castro, J.D. / González-Rovira, L. / Vázquez-Martínez, J.M. / Varela-Feria, F.M. / Marcos, M. / Calvino, J.J. et al. | 2017
- IFC
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Editorial Board| 2015