Capacitance–voltage study of SiO2/nanocrystalline silicon/SiO2 double-barrier structures (English)
National licence
- New search for: Wu, Liangcai
- New search for: Huang, Xinfan
- New search for: Shi, Jianjun
- New search for: Dai, Min
- New search for: Qiao, Feng
- New search for: Li, Wei
- New search for: Xu, Jun
- New search for: Chen, Kunji
- New search for: Wu, Liangcai
- New search for: Huang, Xinfan
- New search for: Shi, Jianjun
- New search for: Dai, Min
- New search for: Qiao, Feng
- New search for: Li, Wei
- New search for: Xu, Jun
- New search for: Chen, Kunji
In:
Thin Solid Films
;
425
, 1-2
;
221-224
;
2002
-
ISSN:
- Article (Journal) / Electronic Resource
-
Title:Capacitance–voltage study of SiO2/nanocrystalline silicon/SiO2 double-barrier structures
-
Contributors:Wu, Liangcai ( author ) / Huang, Xinfan ( author ) / Shi, Jianjun ( author ) / Dai, Min ( author ) / Qiao, Feng ( author ) / Li, Wei ( author ) / Xu, Jun ( author ) / Chen, Kunji ( author )
-
Published in:Thin Solid Films ; 425, 1-2 ; 221-224
-
Publisher:
- New search for: Elsevier Science B.V.
-
Publication date:2002-12-12
-
Size:4 pages
-
ISSN:
-
DOI:
-
Type of media:Article (Journal)
-
Type of material:Electronic Resource
-
Language:English
-
Keywords:
-
Source:
Table of contents – Volume 425, Issue 1-2
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
-
Retrieved optical properties of thin films on absorbing substrates from transmittance measurements by application of a spectral projected gradient methodVargas, W.E. / Azofeifa, D.E. / Clark, N. et al. | 2002
- 9
-
Comparison of depth profiling techniques using ion sputtering from the practical point of viewOswald, S. / Baunack, S. et al. | 2002
- 20
-
Microwave plasma oxidation of gallium nitridePal, S / Mahapatra, R / Ray, S.K / Chakraborty, B.R / Shivaprasad, S.M / Lahiri, S.K / Bose, D.N et al. | 2002
- 24
-
Microstructural analysis of selective C/Al2O3/Al solar absorber surfacesKonttinen, P / Kilpi, R / Lund, P.D et al. | 2002
- 31
-
Optical transmittance study of the thermal decomposition of sputtered Pt–Ag–O filmsShima, Takayuki / Tominaga, Junji et al. | 2002
- 35
-
Preparation of Mn-activated yttrium germanate phosphor thin films for electroluminescent devicesMinami, Tadatsugu / Kobayashi, Youhei / Miyata, Toshihiro / Yamazaki, Masashi et al. | 2002
- 41
-
Effect of ambient gas and pressure on fullerene synthesis in induction thermal plasmaWang, C / Inazaki, A / Shirai, T / Tanaka, Y / Sakuta, T / Takikawa, H / Matsuo, H et al. | 2002
- 49
-
Siloxane-anchored thin films on silicon dioxide-modified stainless steelMeth, Sergio / Sukenik, Chaim N et al. | 2002
- 59
-
Structural analysis of chalcogenide waveguides using Rutherford backscattering spectroscopyRivero, C / Sharek, P / Li, W / Richardson, K / Schulte, A / Braunstein, G / Irwin, R / Hamel, V / Turcotte, K / Knystautas, E et al. | 2002
- 68
-
Hafnium silicate formation by ultra-violet/ozone oxidation of hafnium silicidePunchaipetch, P / Pant, G / Quevedo-Lopez, M / Zhang, H / El-Bouanani, M / Kim, M.J / Wallace, R.M / Gnade, B.E et al. | 2002
- 72
-
Study of plasma polymerization from acetylene in pulsed r.f. dischargesZajı́čková, L. / Rudakowski, S. / Becker, H.-W. / Meyer, D. / Valtr, M. / Wiesemann, K. et al. | 2002
- 85
-
Preparation of [002] oriented AlN thin films by mid frequency reactive sputtering techniqueCheng, Hsyi-En / Lin, Tien-Chai / Chen, Wen-Chien et al. | 2002
- 85
-
Preparation of (002) oriented Al thin films by mid frequency reactive sputtering techniqueCheng, Hsyi-En / Lin, Tien-Chai / Chen, Wen-Chien et al. | 2003
- 90
-
Continuous wave laser-induced temperature rise in the thin films of silicon nanocrystals using Raman scatteringMavi, H.S. / Prusty, Sudakshina / Shukla, A.K. / Abbi, S.C. et al. | 2002
- 97
-
Preparation of (001)- and (114)-oriented epitaxial thin films of Bi2VO5.5 by a coating pyrolysis processTsukada, Kenichi / Nagahama, Tsutomu / Sohma, Mitsugu / Yamaguchi, Iwao / Manabe, Takaaki / Tsuchiya, Tetsuo / Suzuki, Shigeru / Shimizu, Tadao / Mizuta, Susumu / Kumagai, Toshiya et al. | 2002
- 103
-
Preparation and characterization of lithium-ion-conductive Li1.3Al0.3Ti1.7(PO4)3 thin films by the solution depositionWu, Xian Ming / Li, Xin Hai / Wang, Shao Wei / Wang, Zhuo / Zhang, Yun He / Xu, Ming Fei / He, Ze Qiang et al. | 2002
- 108
-
Generalized simulated annealing algorithm applied in the ellipsometric inversion problemZhaoxian, Yu / Dang, Mo et al. | 2002
- 113
-
Nitriding of tetragonal zirconia in a high current d.c. plasma sourceDelachaux, T. / Hollenstein, Ch. / Lévy, F. / Verdon, C. et al. | 2002
- 117
-
A one-solution layer-by-layer method to fabricate ultrathin organic filmsJiang, Siguang / Chen, Xiaodong / Zhang, Li / Liu, Minghua et al. | 2002
- 121
-
Sn deposition onto Cu and alloy layer growth by a contact immersion processFujiwara, Yutaka et al. | 2002
- 127
-
Nanostructured vs. polycrystalline CdS/ZnS thin films for photocatalytic applicationsRincón, M.E / Martı́nez, M.W / Miranda-Hernández, M et al. | 2002
- 135
-
Effect of temperature on the incident angle-dependence of the sensitivity for surface plasmon resonance spectroscopyChiang, H.-P. / Wang, Y.-C. / Leung, P.T. et al. | 2002
- 139
-
Initial growth and coverage determination of Ni ultrathin films on Pt(111)Su, C.W. / Ho, H.Y. / Shern, C.S. / Chen, R.H. et al. | 2002
- 145
-
Residual stress induced atomic scale buckling of diamond carbon coatings on silicon substrateMylvaganam, K / Zhang, L.C et al. | 2002
- 150
-
A theoretical and numerical study of a thin clamped circular film under an external load in the presence of a tensile residual stressWan, Kai-Tak / Guo, Shu / Dillard, David A. et al. | 2002
- 163
-
Chemical vapor deposited RuOx films: annealing effectsGopal Ganesan, P. / Shpilman, Z. / Eizenberg, M. et al. | 2002
- 171
-
Luminescence of erbium-implanted dielectric filmsLu, F / Carius, R / Alam, A / Heuken, M / Rizzi, A / Buchal, Ch et al. | 2002
- 175
-
The effect of annealing conditions on the red photoluminescence of nanocrystalline Si/SiO2 filmsWu, Xiaochun / Bek, Alpan / Bittner, Alexander M / Eggs, Ch / Ossadnik, Ch / Veprek, S et al. | 2002
- 175
-
The effect of annealing conditions on the rod photoluminescence of nanocrystalline Si/SiO2 filmsWu, Xiaochun / Bek, A. / Bittner, A.M. / Eggs, C. / Ossadnik, C. / Veprek, S. et al. | 2003
- 185
-
Optimization of ITO layers for applications in a-Si/c-Si heterojunction solar cellsPlá, J. / Tamasi, M. / Rizzoli, R. / Losurdo, M. / Centurioni, E. / Summonte, C. / Rubinelli, F. et al. | 2002
- 193
-
Design of 25 GHz thin film filter with a third high refractive index materials as cavity layersYang, Minghong / Liu, Jinsong / Chen, Qingming / Zhang, Bo et al. | 2002
- 196
-
Optical investigation of silicon nitride thin films deposited by r.f. magnetron sputteringXu, Gang / Jin, Ping / Tazawa, Masato / Yoshimura, Kazuki et al. | 2002
- 203
-
A method for determining thickness and optical constants of absorbing thin filmsPekker, David / Pekker, Leonid et al. | 2002
- 210
-
The interface state energy distribution from capacitance–frequency characteristics of gold/n-type Gallium arsenide Schottky barrier diodes exposed to airÖzdemir, A.F. / Türüt, A. / Kőkçe, A. et al. | 2002
- 216
-
Crystallization behavior of thin ALD-Al2O3 filmsJakschik, Stefan / Schroeder, Uwe / Hecht, Thomas / Gutsche, Martin / Seidl, Harald / Bartha, Johann W. et al. | 2002
- 221
-
Capacitance–voltage study of SiO2/nanocrystalline silicon/SiO2 double-barrier structuresWu, Liangcai / Huang, Xinfan / Shi, Jianjun / Dai, Min / Qiao, Feng / Li, Wei / Xu, Jun / Chen, Kunji et al. | 2002
- 225
-
Preparation and structural properties of thin films and multilayers of the Heusler compounds Cu2MnAl, Co2MnSn, Co2MnSi and Co2MnGeGeiersbach, U / Bergmann, A / Westerholt, K et al. | 2002
- 233
-
Preparation and characterization of electroconductive polypyrrole copolymer Langmuir–Blodgett filmsPark, Yun Heum / Kim, Sang Jin / Lee, Jun Young et al. | 2002
- 239
-
Langmuir–Blodgett layers of metal complexes of 4,4′-bis-(1-butyl-pentyl)-[2,2′]bipyridinyl-6,6′-diamineOertel, U / Böhme, F / Friedel, P / Jehnichen, D / Pilch, B et al. | 2002
- 239
-
Langmuir-Blodgett layers of metal complexes of 4,4prime-bis-(1-butyl-pentyl)-[2,2prime]bipyridinyl-6,6prime-diamineOertel, U. / Bohme, F. / Friedel, P. / Jehnichen, D. / Pilch, B. et al. | 2003
- 248
-
Spontaneous two-dimensional crystallization and photochemical reaction of a novel bolaamphiphilic naphthol ester in the spreading Langmuir film at the air/water interface and transferred Langmuir–Blodgett filmLu, Qing / Liu, Minghua et al. | 2002
- 255
-
High sensitivity chlorine gas sensors using Cu–phthalocyanine thin filmsMiyata, Toshihiro / Kawaguchi, Seiji / Ishii, Makoto / Minami, Tadastugu et al. | 2002
- 260
-
Fabrication of vanadium oxide thin film with high-temperature coefficient of resistance using V2O5/V/V2O5 multi-layers for uncooled microbolometersHan, Yong-Hee / Choi, In-Hoon / Kang, Ho-Kwan / Park, Jong-Yeon / Kim, Kun-Tae / Shin, Hyun-Joon / Moon, Sung et al. | 2002
- 265
-
Effects of the high-pressure annealing process on the reflow phenomenon of copper interconnections for large scale integrated circuitsOnishi, Takashi / Fujii, Hideo / Yoshikawa, Tetsuya / Munemasa, Jun / Inoue, Takao / Miyagaki, Aki et al. | 2002
- 275
-
Structural investigation of Si-rich amorphous silicon oxynitride filmsScopel, W.L / Fantini, M.C.A / Alayo, M.I / Pereyra, I et al. | 2002
- 282
-
Effect of gas phase composition cycling on diamond nucleation densityKim, S.-H / Bae, E.-J / Park, J.C / Kim, T.-G / Lee, S.K / Hosomi, T / Maki, T / Kobayashi, T et al. | 2002
- 287
-
Diffusion and Kirkendall effect in PbSe–EuS multilayerFedorov, A. / Sipatov, A. / Volobuev, V. et al. | 2002
- 292
-
Emission enhancement in chlorogallium phthalocyanine-N,N′-bis(neopentyl)-3,4,9,10-perylenebis(dicarboximide) mixed filmsCaño, Teodosio Del / de Saja, Jose Antonio / Aroca, Ricardo et al. | 2002
- 292
-
Emission enhancement in chlorogallium phthalocyanine-N,Nprime-bis(neopentyl)-3,4,9,10-perylenebis(dicarboximide) mixed filmsCano, T. D. / de Saja, J. A. / Aroca, R. et al. | 2003
- 297
-
Upper size limit of complete contact epitaxyMeinander, K. / Frantz, J. / Nordlund, K. / Keinonen, J. et al. | 2002
- 304
-
Monte Carlo study of adsorption of heteronuclear dimers on heterogeneous surfacesRżysko, W. / Borówko, M. et al. | 2002
- 312
-
Author Index| 2003
- 314
-
Subject Index| 2003