Accelerator mass spectrometry—an overview (English)
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In:
Vacuum
;
70
, 2-3
;
365-372
;
2003
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ISSN:
- Article (Journal) / Electronic Resource
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Title:Accelerator mass spectrometry—an overview
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Contributors:Hellborg, R. ( author ) / Faarinen, M. ( author ) / Kiisk, M. ( author ) / Magnusson, C.E. ( author ) / Persson, P. ( author ) / Skog, G. ( author ) / Stenström, K. ( author )
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Published in:Vacuum ; 70, 2-3 ; 365-372
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Publisher:
- New search for: Elsevier Science Ltd
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Publication date:2003-01-01
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Size:8 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 70, Issue 2-3
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 73
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ION 2002Michalak, Leszek / Mączka, Dariusz / Żuk, Jerzy et al. | 2003
- 75
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Track formation in germanium crystals irradiated with superhigh-energy ionsKomarov, F.F. / Gaiduk, P.I. / Vlasukova, L.A. / Didyk, A.J. / Yuvchenko, V.N. et al. | 2003
- 81
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High-quality p–n junction fabrication by ion implantation using the LPCVD amorphous silicon filmsJaroszewicz, Bohdan / Budzyński, Tadeusz / Panas, Andrzej / Kociubinski, Andrzej / Słysz, Wojciech / Jung, Wojciech / Jakieła, Rafał / Barcz, Adam / Marczewski, Jacek / Grabiec, Piotr et al. | 2003
- 87
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Titanium surface after neutralized ion beam irradiationWilk, J. / Kowalski, Z.W. et al. | 2003
- 93
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Resistance to high-temperature oxidation in B+Si implanted TiN coatings on steelWerner, Z. / Piekoszewski, J. / Grötzschel, R. / Richter, E. / Szymczyk, W. et al. | 2003
- 97
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Diffusion and activation of Si implanted into GaAsJakieła, Rafał / Barcz, Adam et al. | 2003
- 103
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GaAs on Si: towards a low-temperature “smart-cut” technologyGawlik, Grzegorz / Jagielski, Jacek / Pi<math><rm><a><ac>a</ac><ac>̢</ac></a></rm></math>tkowski, Bronisław et al. | 2003
- 109
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Influence of anodic oxidation on the bioactivity and corrosion resistance of phosphorus-ion implanted titaniumKrupa, D. / Baszkiewicz, J. / Sobczak, J.W. / Biliński, A. / Barcz, A. / Rajchel, B. et al. | 2003
- 115
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X-Ray studies of AlxGA1−xAs Implanted with 1.5MeV As ionsWierzchowski, W. / Wieteska, K. / Graeff, W. / Turos, A. / Grötzschel, R. et al. | 2003
- 123
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High temperature behaviour of fission product analogues implanted into nuclear ceramicsGentils, A. / Thomé, L. / Jagielski, J. / Enescu, S.E. / Garrido, F. / Beauvy, M. / Blaise, G. et al. | 2003
- 131
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Thin film sputtered silicon for silicon wafer bonding applicationsHurley, R.E / Gamble, H.S et al. | 2003
- 141
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Formation of CxNy films by high dose nitrogen implantation in the layered structuresKomarov, A.F. / Komarov, F.F. / Mironov, A.M. / Nikiforenko, N.N. / M<math><rm><a><ac>a</ac><ac>̢</ac></a></rm></math>czka, D. / Kamyshan, A.F. et al. | 2003
- 147
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Effects of high dose nitrogen implantation into aluminumJagielski, J. / Piatkowska, A. / Aubert, P. / Legrand-Buscema, C. / Paven, C.Le / Gawlik, G. / Piekoszewski, J. / Werner, Z. et al. | 2003
- 153
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Influence of amorphization–recrystallization processes on distribution of selenium and oxygen atoms implanted in siliconTishkovsky, Eugene / Feklistov, Konstantin / Taskin, Alexey / Zatolokin, Maxim et al. | 2003
- 157
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Electron signal acquisition in HPSEMSlówko, Witold et al. | 2003
- 163
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Influence of the Ca- and P-enriched oxide layers produced on titanium and the Ti6Al4V alloy by the IBAD method upon the corrosion resistance of these materialsBaszkiewicz, J / Krupa, D / Kozubowski, J.A / Rajchel, B / Mitura, M / Barcz, A / Ślósarczyk, A / Paszkiewicz, Z / Puff, Z et al. | 2003
- 169
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The long-range influence of the ion and photon irradiation on the mechanical properties and on the composition of the permalloy-79Tetelbaum, D.I. / Azov, A.Yu. / Kuril’chik, E.V. / Bayankin, V.Ya. / Gilmutdinov, F.Z. / Mendeleva, Yu.A. et al. | 2003
- 175
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High-spin paramagnetic centers of irradiated elemental semiconductorsFedaruk, R. / Stelmach, C. / Yearchuck, D. / Zhukovski, P. / Partyka, J. / Wȩgierek, P. et al. | 2003
- 181
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Relations between deposition conditions, microstructure and mechanical properties of amorphous carbon-metal filmsUglova, V.V. / Anishchik, V.M. / Pauleau, Y. / Kuleshov, A.K. / Thièry, F. / Pelletier, J. / Dub, S.N. / Rusalsky, D.P. et al. | 2003
- 187
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The effect of diffusion treatments in a glow-discharge plasma in Ar+O2 atmosphere on friction and wear of Ti–6Al–4V alloyDudek, M. / Fouvry, S. / Wendler, B. / Kapsa, Ph. / Liskiewicz, T. et al. | 2003
- 187
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The effect of diffusion treatments in a glow-discharge plasma in Ar+O2 atmosphere on friction and wear of Ti-6Al-4VDudek, M. / Fouvry, S. / Wendler, B. / Kapsa, P. / Liskiewicz, T. et al. | 2003
- 193
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Study of the recombination properties of thermostable radiation defects in p–n structures manufactured in high resistivity neutron transmutation-doped siliconKorshunov, F.P. / Zhdanovich, N.E. / Marchenko, I.G. / Karas, V.I. / Troschinskii, V.T. et al. | 2003
- 197
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Investigation of radiation-induced defects in the electron irradiated power transistor structuresKorshunov, F.P. / Bogatyrev, Yu.V. / Lastovsky, S.B. / Kulgachev, V.I. / Anufriev, L.P. / Rubtsevich, I.I. / Golubev, N.F. et al. | 2003
- 201
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Ion beam modification of surface properties of polyethyleneTuros, Andrzej / Jagielski, Jacek / Piątkowska, Anna / Bieliński, Dariusz / Ślusarski, Ludomir / Madi, Nabil K. et al. | 2003
- 207
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Determination of hydrogen in GaMnN and GaMnMgN by nuclear reaction analysisPodsiadło, Sławomir / Szyszko, Tomasz / Warso, Grzegorz / Turos, Andrzej / Ratajczak, Renata / Kowalczyk, Anna / Gębicki, Wojciech / Strzałkowski, Ireneusz / Grambole, Dieter / Hermann, Folker et al. | 2003
- 215
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Ion beam assisted deposition of metal layers using a novel one beam systemKomarov, F.F. / Kamarou, A.A. / Żukowski, P. / Karwat, Cz. / Sielanko, J. / Kozak, Cz.M. / Kiszczak, K. et al. | 2003
- 221
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Electrical and mechanical properties of surface layers deposited on copper by the novel IBAD methodKarwat, Cz. / Komarov, F.F. / Kozak, Cz. / Łozak, M. / Romaniuk, F. / Żukowski, P. et al. | 2003
- 227
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Mechanical and thermal properties of gamma-ray irradiated polyethylene blendsAl-Ali, Mariam / Madi, N.K / Al Thani, Nora J. / El-Muraikhi, M. / Turos, A. et al. | 2003
- 237
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Photoelectric work function determination for the nanostructural carbonaceous filmsCzerwosz, E / Dłużewski, P / Kozłowski, M / Nowakowski, R / Stacewicz, T et al. | 2003
- 243
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Stress development during thin film growth and its modification under ion irradiationPieńkos, T. / Gładyszewski, L. / Prószyński, A. / Chocyk, D. / Gładyszewski, G. / Martin, F. / Jaouen, C. / Drouet, M. / Lamongie, B. et al. | 2003
- 249
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Reactive ion etching of novel materials—GaN and SiCSzczęsny, A. / Śniecikowski, P. / Szmidt, J. / Werbowy, A. et al. | 2003
- 255
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Fractal analysis of ion-sputtered stainless steel surfacePrzybylski, G. / Martan, J. / Kowalski, Z.W. et al. | 2003
- 263
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New types of multi-component hard coatings deposited by ARC PVD on steel pre-treated by pulsed plasma beamsWerner, Z. / Stanisławski, J. / Piekoszewski, J. / Levashov, E.A. / Szymczyk, W et al. | 2003
- 269
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Compressive plasma flows interaction with steel surface: structure and mechanical properties of modified layerAnishchik, V.M. / Uglov, V.V. / Astashynski, V.V. / Astashynski, V.M. / Ananin, S.I. / Kostyukevich, E.A. / Kuzmitski, A.M. / Kvasov, N.T. / Danilyuk, A.L. / Rumianceva, I.N. et al. | 2003
- 275
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Ti and Fe cathode sputtering by the glow discharge plasmaWroński, Z. / Sielanko, J. / Hereć, J. et al. | 2003
- 285
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Phase changes in steels irradiated with intense pulsed plasma beamsSartowska, B. / Piekoszewski, J. / Waliś, L. / Kopcewicz, M. / Werner, Z. / Stanisławski, J. / Kalinowska, J. / Prokert, F. et al. | 2003
- 293
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Growth of nitrided layer after cathode sputteringBaranowska, J. / Szczeciński, K. / Wysiecki, M. et al. | 2003
- 299
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Field emission from sintered CrSi2Czarczyński, Wojciech / Dobrzański, Bolesław / Znamirowski, Zbigniew / Kozłowski, Janusz et al. | 2003
- 303
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Snow plow model of IPD dischargeRabiński, Marek / Zdunek, Krzysztof et al. | 2003
- 307
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Brazing of alumina ceramics modified by pulsed plasma beams combined with arc PVD treatmentPiekoszewski, J. / Krajewski, A. / Prokert, F. / Senkara, J. / Stanisławski, J. / Waliś, L. / Werner, Z. / Włosiński, W. et al. | 2003
- 313
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RBS and ERD study of epitaxial RuO2 films deposited on different single crystal substratesMachajdı́k, Daniel / Kobzev, Alexander Pavlovich / Fröhlich, Karol / Cambel, Vladimı́r et al. | 2003
- 319
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Formation of polymeric layer during silicon etching in CF2Cl2 plasmaGrigonis, A. / Knizikevičius, R. / Rutkūnien≐, Ž. / Tribandis, D. et al. | 2003
- 323
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PECVD formation of ultrathin silicon nitride layers for CMOS technologyBeck, R.B. / Giedz, M. / Wojtkiewicz, A. / Kudła, A. / Jakubowski, A. et al. | 2003
- 331
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Mechanisms of forming the Cr–N composite in the unsteady-state stage of ion beam-assisted deposition processBendikov, V.I. / Guglya, A.G. / Marchenko, I.G. / Malykhin, D.G. / Neklyudov, I.M. et al. | 2003
- 339
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Light emission from the cathode zone of DC glow dischargeWroński, Z. et al. | 2003
- 347
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Characteristics of surface and film morphology in the IBAD deposition process: a Monte Carlo simulation studyOleszkiewicz, Waldemar / Romiszowski, Piotr et al. | 2003
- 353
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High-current and broad-beam ion implanterGuglya, A. / Drakin, V. / Lymar, A. / Stervoedov, N. et al. | 2003
- 359
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Energy loss effective charge for slow ions in electron gasMoneta, Marek / Czerbniak, Jerzy et al. | 2003
- 365
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Accelerator mass spectrometry—an overviewHellborg, R. / Faarinen, M. / Kiisk, M. / Magnusson, C.E. / Persson, P. / Skog, G. / Stenström, K. et al. | 2003
- 373
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A high-pressure mass spectrometric study of ion–molecule reactions of Ar+ with C3H6Bederski, Krzysztof et al. | 2003
- 381
-
The sputtering of light target material during implantation of heavy ionsSielanko, J. / Filiks, J. / Hereć, J. et al. | 2003
- 385
-
Core–shell morphology of welding fume micro- and nanoparticlesKonarski, P / Iwanejko, I / Ćwil, M et al. | 2003
- 391
-
High pressure mass spectrometric study of ion/molecule reactions in the carbon dioxide–methane mixturesWójcik, Leszek / Markowski, Artur et al. | 2003
- 397
-
Field electron emission from laser the engraved surfaceZnamirowski, Z. / Czarczynski, W. / Pawlowski, L. / Le Maguer, A. et al. | 2003
- 403
-
Formation of water dimers in expanding air flowsPtasińska, Sylwia / D<math><rm><a><ac>a</ac><ac>̢</ac></a></rm></math>bek, Józef / Michalak, Leszek et al. | 2003
- 411
-
Influence of nitrogen ion beam assisted deposition of Cr on tribological properties of tool steel NW1Budzynski, P. / Tarkowski, P. / Żukowski, P. / Kiszczak, K. / Kasietczuk, W. et al. | 2003
- 417
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Influence of nitrogen and titanium implantation on the tribological properties of steelBudzynski, P. / Youssef, A.A. / Kamienska, B. et al. | 2003
- 423
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Ion beam analysis methods in the studies of plasma facing materials in controlled fusion devicesRubel, M. / Wienhold, P. / Hildebrandt, D. et al. | 2003
- 429
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Electron attachment to simple organic acidsPelc, A. / Sailer, W. / Scheier, P. / Mason, N.J. / Illenberger, E. / Märk, T.D. et al. | 2003
- 435
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Vacuum selenization of metallic multilayers for CIS solar cellsPisarkiewicz, T. / Jankowski, H. et al. | 2003
- 439
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Influence of potassium chloride on the MALDI detection processPtasińska, Sylwia / Bajuk, Anna / Michalak, Leszek et al. | 2003
- 447
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An ion source for solid elements with mechanical sputteringMeldizon, J. / Drozdziel, A. / Latuszyński, A. / Prucnal, S. / Pyszniak, K. / M<math><rm><a><ac>a</ac><ac>̢</ac></a></rm></math>czka, D. et al. | 2003
- 451
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Plasma ion source with hollow cathodeLatuszyński, A. / Droździel, A. / Pyszniak, K. / Dupak, J. / Mączka, D. / Meldizon, J. et al. | 2003
- 457
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RBS and optical studies of ion-implanted amorphous silicon carbide layersRomanek, J. / Kobzev, A.P. / Kulik, M. / Tsvetkova, T. / Żuk, J. et al. | 2003
- 467
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Structural and optical properties modification of a-SiC:H by Ga+ ion implantationTsvetkova, T / Angelov, O / Sendova-Vassileva, M / Dimova-Malinovska, D / Bischoff, L / Adriaenssens, G.J / Grudzinski, W / Zuk, J et al. | 2003
- 471
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Ion implantation induced surface morphology changes in thin As3Se2 filmsTsvetkova, T. / Balabanov, S. / Skordeva, E. / Kitova, S. / Sielanko, J. / M<math><rm><a><ac>a</ac><ac>̢</ac></a></rm></math>czka, D. / Zuk, J. et al. | 2003
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Editorial Board and Publication Information| 2003