Foreword to the special issue low-voltage electron microscopy (English)
- New search for: Kaiser, Ute
- New search for: Stöger-Pollach, Michael
- New search for: Kaiser, Ute
- New search for: Stöger-Pollach, Michael
In:
Ultramicroscopy
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145
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1-2
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2014
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ISSN:
- Article (Journal) / Electronic Resource
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Title:Foreword to the special issue low-voltage electron microscopy
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Contributors:Kaiser, Ute ( author ) / Stöger-Pollach, Michael ( author )
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Published in:Ultramicroscopy ; 145 ; 1-2
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Publisher:
- New search for: Elsevier B.V.
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Publication date:2014-05-05
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Size:2 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 145
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Foreword to the special issue low-voltage electron microscopyKaiser, Ute / Stöger-Pollach, Michael et al. | 2014
- 3
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Electron dose dependence of signal-to-noise ratio, atom contrast and resolution in transmission electron microscope imagesLee, Z. / Rose, H. / Lehtinen, O. / Biskupek, J. / Kaiser, U. et al. | 2014
- 13
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Atomic structure from large-area, low-dose exposures of materials: A new route to circumvent radiation damageMeyer, J.C. / Kotakoski, J. / Mangler, C. et al. | 2013
- 22
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On artefact-free reconstruction of low-energy (30–250eV) electron hologramsLatychevskaia, Tatiana / Longchamp, Jean-Nicolas / Escher, Conrad / Fink, Hans-Werner et al. | 2013
- 28
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Lattice imaging at an accelerating voltage of 30kV using an in-lens type cold field-emission scanning electron microscopeKonno, Mitsuru / Ogashiwa, Takeshi / Sunaoshi, Takeshi / Orai, Yoshihisa / Sato, Mitsugu et al. | 2013
- 36
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A novel low energy electron microscope for DNA sequencing and surface analysisMankos, M. / Shadman, K. / Persson, H.H.J. / N’Diaye, A.T. / Schmid, A.K. / Davis, R.W. et al. | 2014
- 50
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Aberration-corrected STEM/TEM imaging at 15kVSasaki, Takeo / Sawada, Hidetaka / Hosokawa, Fumio / Sato, Yuta / Suenaga, Kazu et al. | 2014
- 56
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Successful application of Low Voltage Electron Microscopy to practical materials problemsBell, David C. / Mankin, Max / Day, Robert W. / Erdman, Natasha et al. | 2014
- 66
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Atomic resolution imaging and spectroscopy of barium atoms and functional groups on graphene oxideBoothroyd, C.B. / Moreno, M.S. / Duchamp, M. / Kovács, A. / Monge, N. / Morales, G.M. / Barbero, C.A. / Dunin-Borkowski, R.E. et al. | 2014
- 74
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Electron microscopy of organic–inorganic interfaces: Advantages of low voltageDrummy, Lawrence F. et al. | 2014
- 80
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Low-energy electron holographic imaging of gold nanorods supported by ultraclean grapheneLongchamp, Jean-Nicolas / Escher, Conrad / Latychevskaia, Tatiana / Fink, Hans-Werner et al. | 2014
- 85
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Choice of operating voltage for a transmission electron microscopeEgerton, R.F. et al. | 2013
- 94
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A short note on how to convert a conventional analytical TEM into an analytical Low Voltage TEMStöger-Pollach, M. et al. | 2014
- 98
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Low voltage EELS—How low?Stöger-Pollach, M. et al. | 2013
- IFC
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IFC (Editorial Board)| 2014
- iv
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Contents| 2014