Chip test program automatic import and comparison system (Chinese)
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- New search for: JIN FENG
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2023
- Patent / Electronic Resource
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Title:Chip test program automatic import and comparison system
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Additional title:一种芯片测试程序自动导入及对比系统
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Patent number:CN117251363
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Patent applicant:
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Patent family:
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Contributors:JIN FENG ( author )
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Publisher:
- New search for: Europäisches Patentamt
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Publication date:2023-12-19
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Type of media:Patent
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Type of material:Electronic Resource
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Language:Chinese
- New search for: G06F
- Further information on International Patent Classification
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Classification:
IPC: G06F ELECTRIC DIGITAL DATA PROCESSING, Elektrische digitale Datenverarbeitung -
Source: