X-RAY INSPECTION DEVICE (Japanese)
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2015
- Patent / Electronic Resource
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Title:X-RAY INSPECTION DEVICE
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Additional title:X線検査装置
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Patent number:JP2015200620
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Patent applicant:
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Patent family:
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Contributors:SAITO NAOYA ( author ) / KANAI TAKASHI ( author )
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Publisher:
- New search for: Europäisches Patentamt
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Publication date:2015-11-12
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Type of media:Patent
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Type of material:Electronic Resource
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Language:Japanese
- New search for: G01N / G01B
- Further information on International Patent Classification
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Classification:
IPC: G01N Untersuchen oder Analysieren von Stoffen durch Bestimmen ihrer chemischen oder physikalischen Eigenschaften, INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES / G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS, Messen der Länge, der Dicke oder ähnlicher linearer Abmessungen -
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