X-RAY INSPECTION DEVICE (Japanese)
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- New search for: KIKUCHI HISAAKI
- New search for: KANAI TAKASHI
- New search for: KIKUCHI HISAAKI
- New search for: KANAI TAKASHI
2016
- Patent / Electronic Resource
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Title:X-RAY INSPECTION DEVICE
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Additional title:X線検査装置
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Patent number:JP2016109622
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Patent applicant:
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Patent family:
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Contributors:KIKUCHI HISAAKI ( author ) / KANAI TAKASHI ( author )
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Publisher:
- New search for: Europäisches Patentamt
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Publication date:2016-06-20
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Type of media:Patent
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Type of material:Electronic Resource
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Language:Japanese
- New search for: G01N
- Further information on International Patent Classification
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Classification:
IPC: G01N Untersuchen oder Analysieren von Stoffen durch Bestimmen ihrer chemischen oder physikalischen Eigenschaften, INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES -
Source: