Superresolution Metrology Methods based on Singular Distributions and Deep Learning (English)
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2024
- Patent / Electronic Resource
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Title:Superresolution Metrology Methods based on Singular Distributions and Deep Learning
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Patent number:US2024062562
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Contributors:SIRAT GABRIEL Y ( author )
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- New search for: Europäisches Patentamt
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Publication date:2024-02-22
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Type of media:Patent
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Type of material:Electronic Resource
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Language:English
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