Toward Monolithic GaN on Si Inter-Sub-Band Infrared Optoelectronics (English)
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In:
IEEE Transactions on Electron Devices
;
71
, 4
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2497-2502
;
2024
- Article (Journal) / Electronic Resource
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Title:Toward Monolithic GaN on Si Inter-Sub-Band Infrared Optoelectronics
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Contributors:Yokev, Idan ( author ) / Agrawal, M. ( author ) / Eyadat, B. ( author ) / Kostianovskii, V. ( author ) / Gal, L. ( author ) / Cohen, A. ( author ) / Kornblum, L. ( author ) / Dharmarasu, N. ( author ) / Radhakrishnan, K. ( author ) / Orenstein, M. ( author )
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Published in:IEEE Transactions on Electron Devices ; 71, 4 ; 2497-2502
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Publisher:
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Publication date:2024-04-01
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Size:6981441 byte
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 71, Issue 4
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2265
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Novel Reconfigurable Transistor With Extended Source/Drain Beyond 3 nm Technology NodeYe, Hongbo / Hu, Junfeng / Liu, Ziyu / Wang, Chao / Li, Xiaojin / Shi, Yanling / Mao, Zhigang / Sun, Yabin et al. | 2024
- 2271
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Intrinsic Gate Capacitance of Ultrathin Body Nanosheets Considering Quantum EffectsYao, Ching-Wang / Lee, Yu-Chieh / Lin, Hsin-Cheng / Chou, Tao / Chung, Tsai-Yu / Wang, Li-Kai / Yang, Jen-Wei / Jan, Sun-Rong / Liu, C. W. et al. | 2024
- 2278
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Impact of Sub-μm Wafer Thinning on Latch-Up Risk in DTCO/STCO Scaling EraSerbulova, Kateryna / Chen, Shih-Hung / Hellings, Geert / Veloso, Anabela / Jourdain, Anne / Boeck, Jo De / Groeseneken, Guido et al. | 2024
- 2284
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Symmetric BSIM-SOI—Part I: A Compact Model for Dynamically Depleted SOI MOSFETsDabhi, Chetan Kumar / Rajasekharan, Dinesh / Pahwa, Girish / Nandi, Debashish / Karumuri, Naveen / Turuvekere, Sreenidhi / Dutta, Anupam / Swaminathan, Balaji / Srihari, Srikanth / Chauhan, Yogesh S. et al. | 2024
- 2293
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Symmetric BSIM-SOI—Part II: A Compact Model for Partially Depleted SOI MOSFETsDabhi, Chetan Kumar / Nandi, Debashish / Nandan, Keshari / Rajasekharan, Dinesh / Pahwa, Girish / Karumuri, Naveen / Turuvekere, Sreenidhi / Dutta, Anupam / Swaminathan, Balaji / Srihari, Srikanth et al. | 2024
- 2301
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A Passive Hybrid Circuit Model for Electrostatic Discharge (ESD) CharacterizationWang, Yang / Yang, Jian / Liu, Yujie / Jin, Xiangliang / Wang, Yuan et al. | 2024
- 2309
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Inflection Points in GAA NS-FET to C-FET Scaling Considering Impact of DTCO BoostersYakimets, Dmitry / Bhuwalka, Krishna K. / Wu, Hao / Rzepa, Gerhard / Karner, Markus / Liu, Changze et al. | 2024
- 2315
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Determining the Performance Limits of LDMOS With Three Common Types of Field OxidesChuang, Ping-Ju / Saadat, Ali / Ghazvini, Sara / Edwards, Hal / Vandenberghe, William G. et al. | 2024
- 2322
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Device Modeling for Admittance Spectroscopy of PMOSFETs at Cryogenic TemperaturesJungemann, Christoph / Richstein, Benjamin / Linn, Tobias / Knoch, Joachim et al. | 2024
- 2329
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Preparation of High Conductivity Hydrogenated Silicon-Doped Diamond and MOSFETHe, Qi / Zhang, Jinfeng / Zhu, Zihui / Ren, Zeyang / Yu, Xinxin / Zhang, Jincheng / Su, Kai / Li, Yijiang / Xu, Qihui / Li, Junpeng et al. | 2024
- 2335
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Metal Boundary Effect Mitigation by HKMG Thermal Process Optimization in FinFET Integration TechnologyLi, Zhao-Yang / Wang, Xue-Jiao / Jiang, Yu-Long et al. | 2024
- 2342
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Analyzing the Changes in the Third Quadrant Characteristics of SiC MOSFET Induced by Threshold DriftTang, Lei / Jiang, Huaping / Liao, Ruijin / Zhong, Xiaohan / Zhao, Ke / Xiao, Nianlei / Huang, Yihan et al. | 2024
- 2349
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Analysis of Abnormal C–V Hump on Si3N4 MIS-HEMT With Mesa Isolation Under Negative Gate Bias StressLee, Ya-Huan / Chang, Kai-Chun / Lin, Hsin-Ni / Tai, Mao-Chou / Huang, Wei-Chen / Lin, Jia-Hong / Kuo, Hung-Ming / Lee, Jason / Huang, I-Yu / Chang, Ting-Chang et al. | 2024
- 2355
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Enhanced Gate Reliability of Ohmic-Like p-GaN Gate HEMT With a Built-in Reverse DiodeWang, Haodong / Gao, Hongwei / Chen, Xin / Zhong, Yaozong / Zhan, Xiaoning / Cao, Yunzhe / Li, Fangqing / Guo, Xiaolu / Ge, Xinchen / Zhi, Gaofei et al. | 2024
- 2361
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Development of Enhancement-Mode GaN p-FET With Post-Etch Wet Treatment on p-GaN Gate HEMT Epi-WaferLi, Teng / Zhang, Meng / Yu, Jingjing / Cui, Jiawei / Yang, Junjie / Wu, Yanlin / Yang, Han / Zhang, Yamin / Yang, Xuelin / Wang, Maojun et al. | 2024
- 2367
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Temperature-Dependent Thermal Impedance Measurement of GaN-Based HEMTs Using Transient ThermoreflectanceZheng, Xiang / Pomeroy, James W. / Jindal, Gautam / Kuball, Martin et al. | 2024
- 2373
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A Nanosheet Oxide Semiconductor FET Using ALD InGaOx Channel for 3-D Integrated DevicesHikake, Kaito / Li, Zhuo / Hao, Junxiang / Pandy, Chitra / Saraya, Takuya / Hiramoto, Toshiro / Takahashi, Takanori / Uenuma, Mutsunori / Uraoka, Yukiharu / Kobayashi, Masaharu et al. | 2024
- 2380
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FeFET-Based MirrorBit Cell for High-Density NVM StorageMeihar, Paritosh / Srinu, Rowtu / Saraswat, Vivek / Lashkare, Sandip / Mulaosmanovic, Halid / Singh, Ajay Kumar / Dunkel, Stefan / Beyer, Sven / Ganguly, Udayan et al. | 2024
- 2386
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A New Physical Model for Program Transients of Cylindrical Charge-Trap-Based NAND Flash MemoriesChoi, Haechan / Yoo, Jinil / Shin, Hyungcheol et al. | 2024
- 2393
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Atomic-Layer-Deposited Ultrathin InAlZnO FETs-Based 2T0C DRAM Cells With Long Data Retention and Multilevel StorageXiong, Wen / Luo, Binbin / Meng, Wei / Wu, Xiaohan / Zhu, Bao / Ding, Shi-Jin et al. | 2024
- 2399
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A New High Density 3D Stackable Via RRAM for Computing-in-Memory SOC ApplicationsSing, Siao-Ping / Wang, Ya-Ching / Lin, Wei-Hwa / Chih, Yue-Der / Wang, Yih / King, Ya-Chin / Lin, Chrong Jung et al. | 2024
- 2404
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Enabling Low-Power Charge-Domain Nonvolatile Computing-in-Memory (CIM) With Ferroelectric MemcapacitorWang, Xuepei / Cui, BoYao / Jing, Lingling / Wang, Xiaolin / Wu, Maokun / Wen, Yicheng / Wu, Yishan / Liu, Jinhao / Zhang, Feilong / Lin, Zidong et al. | 2024
- 2411
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Laminated Ferroelectric FET With Large Memory Window and High ReliabilityLee, Hyun Jae / Nam, Seunggeol / Lee, Yunseong / Kim, Kihong / Choe, Duk-Hyun / Yoo, Sijung / Park, Yoonsang / Jo, Sanghyun / Kim, Donghoon / Heo, Jinseong et al. | 2024
- 2417
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Design Guideline of Saddle-Fin-Based DRAM for Mitigating Rowhammer EffectSuh, Minki / Ryu, Minsang / Ha, Jonghyeong / Bang, Minji / Lee, Dabok / Kim, Jungsik et al. | 2024
- 2423
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Effect of Transistor Transfer Characteristics on the Programming Process in 1T1R ConfigurationLiu, Xiaohua / Bengel, Christopher / Cuppers, Felix / Solfronk, Oliver / Zhang, Bojian / Hoffmann-Eifert, Susanne / Menzel, Stephan / Waser, Rainer / Wiefels, Stefan et al. | 2024
- 2431
-
Optimizing a-IGZO Source-Gated Transistor Current by Structure Alteration via TCAD Simulation and ExperimentSihapitak, Pongsakorn / Bermundo, Juan Paolo / Bestelink, Eva / Sporea, Radu A. / Uraoka, Yukiharu et al. | 2024
- 2438
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Impact of AlSnO Back-Channel Layer on the Performance of AlSnO/InSnZnO Heterojunction Thin-Film TransistorsLiu, Han-Yin / Lin, Min-Kuan / Liao, Yu-Jie / Chen, Han-Wei / Song, Cheng-Yi et al. | 2024
- 2446
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Vapor-Phase Self-Assembled Monolayer With Functional Groups as a Copper Diffusion Barrier Layer for InSnZnO Thin-Film TransistorsLu, Haodong / Zhong, Wei / Lei, Dengyun / Chen, Yayi / Ni, Yao / Liu, Zhen / Lai, Canxiong / Chen, Rongsheng / Kwok, Hoi Sing / Liu, Yuan et al. | 2024
- 2452
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Extrinsic Degradation of Flexible Poly-Si Thin-Film Transistors Under Dynamic Bending StressZhou, Wenjuan / Wang, Mingxiang / Zhang, Dongli / Wang, Huaisheng / Shan, Qi et al. | 2024
- 2459
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Simulation and Characterization of the Modulation Transfer Function in Fully Delineated Type-II Superlattices Infrared DetectorsRamos, D. / Delmas, M. / Ivanov, R. / Zurauskaite, L. / Evans, D. / Rihtnesberg, D. / Bendrot, L. / Smuk, S. / Smuk, A. / Becanovic, S. et al. | 2024
- 2465
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Toward the Development of High-Performance Direct Electron Detectors by Means of TCAD SimulationsMarcelot, O. / Marcelot, C. / Goiffon, V. et al. | 2024
- 2472
-
Analytical Modeling of Epsilon-Near-Zero Effect in Indium Tin Oxide and Its Application as an Optical ModulatorQasaimeh, Omar et al. | 2024
- 2479
-
Light-Emitting Devices Attaining Theoretical Outcoupling Efficiency Exceeding 60% via Scattering ParticlesKong, Peng / Huang, Wenzhe / Kang, Jiachen / Zhao, Yu / An, Di / He, Gufeng et al. | 2024
- 2486
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Noncarrier Injection Mode for Realizing One Line-to-Three LEDs Driving MethodZhang, Shuqian / Li, Wenhao / Wang, Kun / Guo, Yanming / Gong, Zheng / Zhang, Zhipeng / Zhang, Yongai / Zhou, Xiongtu / Guo, Tailiang / Wu, Chaoxing et al. | 2024
- 2491
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High Selectivity and Wide Range UV Photodetection in PEDOT:PSS/ Lu₀.₂₇Sn₀.₇₃O/ZnO HeterojunctionZhang, Dan / Liang, Jiarong / Cai, Han / Lin, Zhuogeng / Tang, Guowu / Tang, Xingui / Sun, Qijun / Zheng, Wei et al. | 2024
- 2497
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Toward Monolithic GaN on Si Inter-Sub-Band Infrared OptoelectronicsYokev, Idan / Agrawal, M. / Eyadat, B. / Kostianovskii, V. / Gal, L. / Cohen, A. / Kornblum, L. / Dharmarasu, N. / Radhakrishnan, K. / Orenstein, M. et al. | 2024
- 2503
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Optothermal Performances Investigation of Phosphor-Converted White LDs With Alumina Substrate-Based PiGF ConvertersYu, Zikang / Liu, Xin / Zhang, Hongjin / Hao, Ziliang / Wang, Qing / Peng, Yang / Chen, Mingxiang et al. | 2024
- 2508
-
A Novel Trench IGBT With N-P-N Polysilicon Gate Structure for Low EMI Noise and High RobustnessZhao, Yishang / Li, Zehong / Zhu, Jixian / Yang, Yang / Chen, Kuangli / Wang, Tongyang / Xia, Ziming et al. | 2024
- 2517
-
A Snapback-Free and High-Performance Trench Gate Reverse-Conducting SOI-LIGBT With Self-Adaptive nMOSLi, Weidan / Huang, Mingmin / Gong, Min et al. | 2024
- 2524
-
Analysis of Gate Oxide Degradation Induced by Heavy Ion in SiC Power MOSFETsQiu, Leshan / Bai, Yun / Ding, Jieqin / Hao, Jilong / Tang, Yidan / Yang, Chengyue / Tian, Xiaoli / Li, Chengzhan / Liu, Xinyu et al. | 2024
- 2530
-
Ga₂O₃ Vertical FinFET With Integrated Schottky Barrier Diode for Low-Loss ConductionXu, Xiaorui / Deng, Yicong / Li, Titao / Xu, Xiaohui / Yang, Dan / Zhu, Minmin / Zhang, Haizhong / Lu, Xiaoqiang et al. | 2024
- 2536
-
Investigation of Threshold Voltage Instability of SiC MOSFETs Under Different Gate Voltage SequencesChen, Yuan / Rao, Yunliang / Wang, Mei / Gao, Rui / He, Zhiyuan / Chen, Yiqiang / Lai, Ping et al. | 2024
- 2543
-
Expansion Limitation of Current Channel in Avalanche Transistors Under Voltage Ramp Triggering ConditionsWen, Kaijun / Liang, Lin / Han, Lubin / Yang, Zewei / Shang, Hai et al. | 2024
- 2550
-
Comparative Investigation on the Repetitive Short-Circuit Capability of 100 V Commercial p-GaN Gate Power HEMTs With Different Processing and StructureLi, Xiangdong / Wang, Meng / Wang, Hongyue / Zhang, Jincheng / You, Shuzhen / Wang, Junbo / Han, Zhanfei / Yang, Weitao / Hao, Yue et al. | 2024
- 2557
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Impact of Device Parameters on the Performance of β-Ga2O3 Nanomembrane MESFETsSengupta, Anumita / Meshram, Ashvinee Deo / Bhattacharyya, Tarun Kanti / Dutta, Gourab et al. | 2024
- 2565
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Characterization and TCAD Modeling of the Lateral Space Charge Accumulation in Epoxy Molding Compound in Packaged HV-ICsBalestra, Luigi / Gnani, Elena / Rossetti, Mattia / Depetro, Riccardo / Reggiani, Susanna et al. | 2024
- 2570
-
Development of Wide-JFET Trench-Etched Double-Diffused MOS (TED-MOS) for High-Voltage ApplicationsSuto, Takeru / Suematsu, Tomoka / Mori, Yuki / Shimizu, Haruka / Shima, Akio et al. | 2024
- 2577
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Dynamic Thermal Management in SOI Transistors Using Holey Silicon-Based Thermoelectric CoolingLuo, Jiajian / Lim, Jungyun / Chen, Jingjing / Venugopal, Archana / Ren, Zongqing / Lee, Jaeho et al. | 2024
- 2585
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Combining of Anodic Oxidization With Zn-Ga Diffusion to Fabricate High-Efficiency GaSb Thermophotovoltaic CellsTang, Yili / Liu, Zhuming / Chen, Ximeng / Li, Jiapeng / Liu, Yonghui / Lv, Xiaoyu / Peng, Xincun / Tang, Liangliang / Shao, Jianxiong et al. | 2024
- 2592
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Electrothermal Modeling of Multi-Nanosheet FETs With Various LayoutsKwon, Wookyung / Yoo, Changhyun / Jeon, Jongwook et al. | 2024
- 2598
-
Experimental Analysis and Modeling of Self-Heating and Thermal Coupling in 28 nm FD-SOI CMOS Transistors Down to Cryogenic TemperaturesBergamaschi, Flavio Enrico / Frutuoso, Tadeu Mota / Paz, Bruna Cardoso / Billiot, Gerard / Jansen, Aloysius G. M. / Galy, Phillipe / Vincent, Emmanuel / Gaillard, Fred / Duriez, Blandine / Casse, Mikael et al. | 2024
- 2605
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Ultralow Voltage Floating Film Transferred DPP-DTT-Based Near-Infrared PhototransistorKumar, Prashant / Mishra, Vishwambhar Nath / Prakash, Rajiv et al. | 2024
- 2612
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Study of a New Hydrogen Sensor Based on the Synthesis of a Sputtered In–Sn–Zn-O Thin Film and Evaporated Palladium NanoparticlesYao, Pao-Chi / Kuo, Chi-Kang / Wang, Jung-Chuan / Chu, Pai-Yi / Hsu, Wei-Chou / Liu, Wen-Chau et al. | 2024
- 2618
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A Fast Hierarchical Cascade Technique Simulation Method for Surface Acoustic Wave DevicesFan, Yanping / Shi, Yidian / Gao, Zihang / Kong, Chao / Xiao, Qiang / Wang, Weibiao et al. | 2024
- 2624
-
Operating Temperature Dependency of Power Generation Capacity in Silicon Planar-Integrated Microthermoelectric GeneratorsHoshina, Takumi / Tomita, Motohiro / Matsuki, Takeo / Watanabe, Takanobu et al. | 2024
- 2631
-
Theoretical and Experimental Study of Over-Mode Windows for High-Frequency TWTsZhou, Kangcheng / Zhang, Changqing / Feng, Jinjun et al. | 2024
- 2638
-
A Genetically Based Algorithm to Improve Execution Speed in Multipactor Simulations in Parallel-Plate WaveguidesCervera-Marin, Raul / Jodar, Miguel Rodriguez / Alcaide Guillen, Carlos / Soto, Pablo / Morro, Jose V. / Boria, Vicente / Espana, Cesar Miquel / Raboso, David et al. | 2024
- 2645
-
Analysis of the Thickness of Multilayered Porous Silicon in the Cold Emission PropertyLi, He / Sailei, Li / Wei, Luo et al. | 2024
- 2651
-
Effect of Electrode Spacing in a Single-Gap Multi-Aperture Pseudospark SwitchMisra, Shikha / Mishra, Akhilesh / Mishra, Alok / Lamba, Ram Prakash / Pal, Udit Narayan et al. | 2024
- 2656
-
Experimental Investigation of a Ku-Band Coaxial Transit Time Oscillator on Low Magnetic Field OperationYang, Chaochao / Meng, Jin / Wang, Haitao / Yuan, Yuzhang / Cui, Yancheng / Deng, Bingfang et al. | 2024
- 2662
-
Dispersion Characteristics From Simplified Dispersion Equation for Open Rectangular Planar Tape HelixBabu, G. Naveen / Chauhan, Nameesha et al. | 2024
- 2669
-
Study on Multipactor Mechanism in a Two-Sided Dielectric-Loaded Rectangular WaveguideZhang, Xue / Wang, Tao / Hu, Qianqian et al. | 2024
- 2676
-
Test and Analysis on the Gyromagnetic Nonlinear Transmission Lines With Different Magnetic CoresCui, Yancheng / Meng, Jin / Zhu, Danni / Wang, Haitao / Yuan, Yuzhang / Huang, Liyang / Chu, Xu et al. | 2024
- 2683
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Design of a 0.23-THz Extended Interaction Klystron With Ridge-Loaded Hughes StructureShi, Zongjun / Liu, Yubo / Xiang, Kui / Zhou, Lin / Wu, Zhenhua et al. | 2024
- 2690
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Ferroelectricity of Hf0.5Zr0.5O2 Thin Film Induced at 350°C by Thermally Accelerated Nucleation During Atomic Layer DepositionLee, Jaewook / Kim, Se Hyun / Choi, Hyojun / Jeong, Hyun Woo / Yang, Kun / Park, Ju Yong / Cho, Yong Hyeon / Park, Sang-Youn / Lee, Younghwan / Park, Min Hyuk et al. | 2024
- 2696
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DMI Influence on the Integration, Leakage, and Threshold Property of Domain Wall Based NeuronsGaggio, Enrico / Graziano, Mariagrazia / Riente, Fabrizio et al. | 2024
- 2702
-
Low-Voltage Synaptic Transistors Based on PrOx/ZrO2 Bilayer Dielectric for Neuromorphic ComputingMiao, Guangtan / Chen, Limeng / Ci, Ranran / Yin, Zezhong / Hao, Dandan / Liu, Guoxia / Shan, Fukai et al. | 2024
- 2708
-
Unleashing Endurance Limits of Emerging Memory: Multi-Level FeRAM Recovery Array Empowered by a Coordinated Inverting Amplifier CircuitHsiang, K.-Y. / Chang, F.-S. / Lou, Z.-F. / Aich, A. / Senapati, A. / Lee, J.-Y. / Li, Z.-X. / Chen, J.-H. / Liu, C.-H. / Liu, C. W. et al. | 2024
- 2714
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Revisiting Lateral-BTBT Gate-Induced Drain Leakage in Nanowire FETs for 1T-DRAMBashir, Md Yasir / Jaiswal, Anupam Kumar / Patel, Sharang Dhar / Sahay, Shubham et al. | 2024
- 2721
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In-Depth Analysis of Transistor Influence on OxRAM Performance in Memory Bitcell, With Technology Scaling PerspectivesBerthaud, F. / Martin, S. / Rottner, J. / Meli, V. / Nodin, J.-F. / Grenouillet, L. / Ricavy, S. / Casse, M. / Castellani, N. et al. | 2024
- 2729
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Self-Powered Photodetector With High Polarization Sensitivity Enabled by Ta2PdS6/MoTe2 HeterojunctionXiong, Rui / Chen, Quan / Zheng, Tao / Pan, Zhidong / Huo, Nengjie / Liu, Meizhuang / Chen, Jiapeng / Li, Jingbo / Hao, Derek / Chen, Zuxin et al. | 2024
- 2736
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Enhance the Electrical and Photoelectrical Performance of MoS2 Transistor With Polyimide Gate Dielectric by Microwave AnnealingZhang, Yifei / Su, Xing / Cui, Siwei / Yang, Hui / Wu, Dongping et al. | 2024
- 2742
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Enabling Normally-Off In Situ Computing With a Magneto-Electric FET-Based SRAM DesignNajafi, Deniz / Morsali, Mehrdad / Zhou, Ranyang / Roohi, Arman / Marshall, Andrew / Misra, Durga / Angizi, Shaahin et al. | 2024
- 2749
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Device Engineering of Dual Metal Gate-Based Artificial Synapse for Enhanced Plasticity Utilizing Al₂O₃-Based Ion Conducting ElectrolyteBhadra, Reetwik / Kumar, Ramesh / Kumar, Amitesh et al. | 2024
- 2755
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Magnetization Reversal of Magnetic Tunnel Junctions by Low-Current PulsesPashen'kin, Igor Yu. / Gusev, Nikita S. / Tatarskiy, Dmitry A. / Sapozhnikov, Maksim V. et al. | 2024
- 2760
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Wafer-Scale, Efficient In2S3-Based Optical Memory Devices for Neuromorphic ComputingB, Sharmila / Dwivedi, Priyanka et al. | 2024
- 2766
-
A Specific Contact Resistivity Extraction Scheme With Strong Variation Immunity Customized for Thin-Film Semiconductors: Bridge Transmission Line MethodHan, Kaizhen / Kang, Yuye / Chen, Yue / Gong, Xiao et al. | 2024
- 2774
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Machine Learning-Based Prediction of Antiferromagnetic Skyrmion FormationSaini, Shipra / Shukla, Alok Kumar / Nehete, Hemkant / Bindal, Namita / Kaushik, Brajesh Kumar et al. | 2024
- 2781
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Quantum Transport Simulations of Sub-60-mV/Decade Switching of Silicon Cold Source TransistorsZhou, Hang / Dong, Xiping / Prentki, Raphael J. / Cao, Ronggen / Wang, Jian / Guo, Hong / Liu, Fei et al. | 2024
- 2789
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UV-Ozone-Assisted Solution-Processed High-k ZrO₂for MoS₂ Field-Effect TransistorsShi, Yepeng / Liu, Guoxia / Wu, Xiaomin / Zhou, Chengjie / Yang, Chengzhi / Yang, Zhenyu / Shan, Fukai et al. | 2024
- 2794
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Ultrafast ~7 Mbps True Random Number Generator Based on SNGCT SelectorGuy, Jeremy / Ambrosi, Elia / Wu, Cheng-Hsien / Bao, Xinyu et al. | 2024
- 2801
-
High-Pressure Deuterium Annealing for Trap Passivation for a 3-D Integrated StructureLee, Jung-Woo / Han, Joon-Kyu / Wang, Dong-Hyun / Yun, Seong-Yun / Oh, Jeong-Seob / Bang, Byeong-Chan / Cha, Won-Hyo / Park, Jun-Young / Choi, Yang-Kyu et al. | 2024
- 2805
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Lagging Thermal Annealing for Barrier Height Uniformity Evolution of Ni/4H-SiC Schottky ContactsPristavu, Gheorghe / Brezeanu, Gheorghe / Dan-Theodor, Oneata / Pascu, Razvan / Draghici, Florin / Serbanescu, Matei / Enache, Andrei et al. | 2024
- 2810
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Concave and Convex Structures for Advanced 3-D NAND Flash Memory TechnologySong, Jiho / Sim, Jae-Min / Kim, Beomsu / Song, Yun-Heub et al. | 2024
- 2815
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3-D Spatial Optical Crosstalk Characterization of Mini-LED Array by Hyperspectral Imaging and Spectrum-Based Ray TracingLi, Zhen / Cao, Xiong-Jun / Chen, Guo-Long / Guo, Wei-Jie / Zhu, Li-Hong / Chen, Zhong / Lu, Yi-Jun et al. | 2024
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