Extended cross-ratio reflection correction at microwave frequencies using waveguide air-lines (English)
- New search for: Stumper, U.
- New search for: Stumper, U.
In:
IEEE Transactions on Instrumentation and Measurement
;
50
, 2
;
364-367
;
2001
- Article (Journal) / Electronic Resource
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Title:Extended cross-ratio reflection correction at microwave frequencies using waveguide air-lines
-
Contributors:Stumper, U. ( author )
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Published in:IEEE Transactions on Instrumentation and Measurement ; 50, 2 ; 364-367
-
Publisher:
- New search for: IEEE
-
Publication date:2001-04-01
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Size:93269 byte
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ISSN:
-
DOI:
-
Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 50, Issue 2
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 177
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ForewordInglis, B.D. et al. | 2001
- 179
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Guest editorialRicketts, B.W. et al. | 2001
- 181
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PAPERS - Josephson Effect - AC and DC Voltages from a Josephson Arbitrary Waveform SynthesizerBenz, S.P. et al. | 2001
- 181
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AC and DC voltages from a Josephson arbitrary waveform synthesizerBenz, S.P. / Burroughs, C.J. / Dresselhaus, P.D. / Christina, L.A. et al. | 2001
- 185
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PAPERS - Josephson Effect - Application of Josephson Series Arrays to a DC Quantum VoltmeterBehr, R. et al. | 2001
- 185
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Application of Josephson series arrays to a DC quantum voltmeterBehr, R. / Grimm, L. / Funck, T. / Kohlmann, J. / Schulze, H. / Muller, F. / Schumacher, B. / Warnecke, P. / Niemeyer, J. et al. | 2001
- 188
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High precision comparison between SNS and SIS Josephson voltage standardsJeanneret, B. / Rufenacht, A. / Burroughs, C.J. et al. | 2001
- 188
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PAPERS - Josephson Effect - High Precision Comparison Between SNS and SIS Josephson Voltage StandardsJeanneret, B. et al. | 2001
- 192
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PAPERS - Josephson Effect - 10 V SINIS Josephson Junction Series Arrays for Programmable Voltage StandardsKohlmann, J. et al. | 2001
- 192
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10 V SINIS Josephson junction series arrays for programmable voltage standardsKohlmann, J. / Schulze, H. / Behr, R. / Muller, F. / Niemeyer, J. et al. | 2001
- 195
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SIS junctions with frequency dependent damping for a programmable Josephson voltage standardHassel, J. / Seppa, H. / Gronberg, L. / Suni, I. et al. | 2001
- 195
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PAPERS - Josephson Effect - SIS Junctions with Frequency Dependent Damping for a Programmable Josephson Voltage StandardHassel, J. et al. | 2001
- 199
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PAPERS - Josephson Effect - Interlaboratory Comparison of Josephson Voltage StandardsDeaver, D. et al. | 2001
- 199
-
Interlaboratory comparison of Josephson voltage standardsDeaver, D. / Miller, W.B. / Pardo, L. / Jaeger, K. / Plowman, D. / Hamilton, C.A. et al. | 2001
- 203
-
PAPERS - Josephson Effect - Comparison of the Josephson Voltage Standards of VNIIM and PTBBehr, R. et al. | 2001
- 203
-
Comparison of the Josephson voltage standards of VNIIM and PTBBehr, R. / Niemeyer, J. / Katkov, A.S. et al. | 2001
- 206
-
Recent developments in BIPM voltage standard comparisonsReymann, D. / Witt, T.J. / Vrabcek, P. / Yi-Hua Tang, / Hamilton, C.A. / Katkov, A.S. / Jeanneret, B. / Power, O. et al. | 2001
- 206
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PAPERS - Josephson Effect - Recent Developments in BIPM Voltage Standard ComparisonsReymann, D. et al. | 2001
- 210
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PAPERS - Josephson Effect - Interlaboratory Comparison of Josephson Voltage Standards Between NIST and Lockheed Martin AstronauticsTang, Y. et al. | 2001
- 210
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Interlaboratory comparison of Josephson voltage standards between NIST and Lockheed Martin AstronauticsYi-Hua Tang, / Miller, W.B. et al. | 2001
- 214
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PAPERS - Quantized Hall Effect - Loss Phenomena in the AC Quantum Hall EffectSchurr, J. et al. | 2001
- 214
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Loss phenomena in the AC quantum Hall effectSchurr, J. / Melcher, J. / von Campenhausen, A. / Pierz, K. / Hein, G. / Ahlers, F.-J. et al. | 2001
- 218
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PAPERS - Quantized Hall Effect - Optimization of QHE-Devices for Metrological ApplicationsJeckelmann, B. et al. | 2001
- 218
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Optimization of QHE-devices for metrological applicationsJeckelmann, B. / Rufenacht, A. / Jeanneret, B. / Overney, F. / Pierz, K. / von Campenhausen, A. / Hein, G. et al. | 2001
- 223
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Derivation of an electronic equivalent of QHE devicesSosso, A. et al. | 2001
- 223
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PAPERS - Quantized Hall Effect - Derivation of an Electronic Equivalent of QHE DevicesSosso, A. et al. | 2001
- 227
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PAPERS - Single Electron Tansport - Recent Measurements of Single Electron Transport of Surface Acoustic Wave Devices at the NPLJanssen, J.-T. et al. | 2001
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- 231
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- 231
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- 235
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- 235
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- 238
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- 238
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PAPERS - Resistance, Current, and Voltage Measurements - Comparison of Four QHR Systems Within One Month Using a Temperature and Pressure Satbilized 100-O ResistorSatrapinsi, A. et al. | 2001
- 242
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PAPERS - Resistance, Current, and Voltage Measurements - Transport Behavior of Commercially Available O Standard ResistorsSchumacher, B. et al. | 2001
- 242
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Transport behavior of commercially available 100-/spl Omega/ standard resistorsSchumacher, B. / Warnecke, P. / Poirier, W. / Delgado, I. / Msimang, Z. / Boella, G. / Hetland, P.O. / Elmquist, R.E. / Williams, J. / Inglis, D. et al. | 2001
- 245
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Traceability of the 10-k/spl Omega/ standard at IENBoella, G. / Capra, P.P. / Cassiago, C. / Cerri, R. / Reedtz, G.M. / Sosso, A. et al. | 2001
- 245
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PAPERS - Resistance, Current, and Voltage Measurements - Traceability of the 10-kO Standard at IENBoella, G. et al. | 2001
- 249
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PAPERS - Resistance, Current, and Voltage Measurements - Analysis of a Dual-Balance High-Resistance Bridge at 10 TOJarrett, D.G. et al. | 2001
- 249
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Analysis of a dual-balance high-resistance bridge at 10 T/spl Omega/Jarrett, D.G. et al. | 2001
- 255
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Current dependence measurement of 1 /spl Omega/ standard resistors using a cryogenic current source with linear outputNakanishi, M. / Kinoshita, J. / Sakamoto, Y. / Endo, T. et al. | 2001
- 255
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PAPERS - Resistance, Current, and Voltage Measurements - Current Dependence Measurement of 1 O Standard Resistors Using a Cryogenic Current Source with Linear OutputNakanishi, M. et al. | 2001
- 259
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- 263
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PAPERS - Resistance, Current, and Voltage Measurements - Complete Characterization of Zener Standards at 10 V for Measurement Assurance Program (MAP)Tang, Y. et al. | 2001
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Complete characterization of Zener standards at 10 V for measurement assurance program (MAP)Yi-Hua Tang, / Sims, J.E. et al. | 2001
- 267
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PAPERS - Resistance, Current, and Voltage Measurements - Characterization of Four-Terminal-Pair Resistance Standards: A Comparison of Measurements and TheoryElmquist, R.E. et al. | 2001
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- 272
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- 275
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PAPERS - Resistance, Current, and Voltage Measurements - Comparison of Nonsinusoidal Calibration Systems at NRC Canada and SP SwedenArseneau, R. et al. | 2001
- 275
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Comparison of nonsinusoidal calibration systems at NRC Canada and SP SwedenArseneau, R. / Sutherland, M.E. / Zelle, J.J. / Svensson, S. et al. | 2001
- 278
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Simple absolute method for current transformer calibrationCorney, A.C. et al. | 2001
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PAPERS - Resistance, Current, and Voltage Measurements - Simple Absolute Method for Current Transformer CalibrationCorney, A.C. et al. | 2001
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PAPERS - Impedance Measurements - A New Four Terminal-Pair Bridge for Traceable Impedance Measurements at Frequencies up to 1 MHzAwan, S.A. et al. | 2001
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A new four terminal-pair bridge for traceable impedance measurements at frequencies up to 1 MHzAwan, S.A. / Kibble, B.P. / Robinson, I.A. / Giblin, S.P. et al. | 2001
- 286
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From the calculable AC resistor to capacitor dissipation factor determination on the basis of time constantsRamm, G. / Moser, H. et al. | 2001
- 286
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- 290
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Measurement of frequency dependence of standard capacitors based on the QHR in the range between 1 kHz and 1.592 kHzNakamura, Y. / Nakanishi, M. / Endo, T. et al. | 2001
- 290
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PAPERS - Impedance Measurements - Measurement of Frequency Dependence of Standard Capacitors Based on the QHR in the Range Between 1 kHz and 1.592 kHzNakamura, Y. et al. | 2001
- 294
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New stable 10 pF gas-dielectric capacitorsRae Duk Lee, / Han Jun Kim, / Semenov, Yu.P. et al. | 2001
- 294
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PAPERS - Impedance Measurements - New Stable 10 pF Gas-Dielectric CapacitorsLee, R.D. et al. | 2001
- 298
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PAPERS - Impedance Measurements - Precise Measurement of the Dielectric Constants of Liquids Using the Principle of Cross CapacitanceLee, R.D. et al. | 2001
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- 302
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PAPERS - Cryogenic Current Comparators - Ion Beam Measurement with a High-Temperature Superconductor Squid and Current ComparatorHao, L. et al. | 2001
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PAPERS - Cryogenic Current Comparators - Development of a Split-Toroid High-Temperature Superconducting Cryogenic Current ComparatorEarly, M.D. et al. | 2001
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Development of a split-toroid high-temperature superconducting cryogenic current comparatorEarly, M.D. / Jones, K. / Staines, M.P. / Exley, R.R. et al. | 2001
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Development of miniature DC SQUID devices for the detection of single atomic spin-flipsPakes, C.I. / Josephs-Franks, P.W. / Reed, R.P. / Corner, S.G. / Colclough, M.S. et al. | 2001
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PAPERS - Cryogenic Electronics - Characterization of YBCO-Au-YBCO Resistors for HTS Josephson Noise ThermometryHao, L. et al. | 2001
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Characterization of YBCO/Au/YBCO resistors for HTS Josephson noise thermometryLing Hao, / Peden, D.A. / Macfarlane, J.C. / Gallop, J.C. et al. | 2001
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PAPERS - AC-DC Transfer - Evaluation of AC-DC Difference of Thermal Converters Using an SFQ-Based D-A ConverterSasaki, H. et al. | 2001
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Fast reversed DC measurements on thermal converters using a SINIS Josephson junction arrayFunck, T. / Behr, R. / Klonz, M. et al. | 2001
- 322
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PAPERS - AC-DC Transfer - Fast Reversed DC Measurements on Thermal Converters Using a SINIS Josephson Junction ArrayFunck, T. et al. | 2001
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Improvements in the NIST cryogenic thermal transfer standardLipe, T.E. / Kinard, J.R. / Reintsema, C.D. et al. | 2001
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PAPERS - AC-DC Transfer - Improvements in the NIST Cryogenic Thermal Transfer StandardLipe, T.E. et al. | 2001
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A new fabrication process for planar thin-film multijunction thermal convertersWunsch, T.F. / Kinard, J.R. / Manginell, R.P. / Solomon, O.M. / Lipe, T.E. / Jungling, K.C. et al. | 2001
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PAPERS - AC-DC Transfer - A New Fabrication Process for Planar Thin-Film Multijunction Thermal ConvertersWunsch, T.F. et al. | 2001
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PAPERS - AC-DC Transfer - New Thin-Film Multijunction Thermal Converters with Negligible Low Frequency AC-DC Transfer DifferencesLiaz, H. et al. | 2001
- 333
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New thin-film multijunction thermal converters with negligible low frequency AC-DC transfer differencesLaiz, H. / Klonz, M. / Kessler, E. / Spiegel, T. et al. | 2001
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PAPERS - AC-DC Transfer - Development of an AC-DC Thermal Converter at Millivolt Level Operating at Cryogenic TemperatureMonticone, E. et al. | 2001
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Development of an AC-DC thermal converter at millivolt level operating at cryogenic temperatureMonticone, E. / Pogliano, U. / Lacquaniti, V. / Serazio, D. et al. | 2001
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PAPERS - AC-DC Transfer - Current AC-DC Transfer Measurements in the Microampere RangeRydler, K.-E. et al. | 2001
- 342
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Current AC-DC transfer measurements in the microampere rangeRydler, K.-E. / Tarasso, V. et al. | 2001
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Calibration of HF thermal voltage converters using an asymmetrical teeFilipski, P.S. / Clark, R.F. / Paulusse, D.C. et al. | 2001
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PAPERS - AC-DC Transfer - Calibration of HF Thermal Voltage Converters Using an Asymmetrical TeeFilipski, P.S. et al. | 2001
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PAPERS - AC-DC Transfer - Comparison of High-Frequency AC-DC Voltage Transfer Standards at NRC, VSL, PTB, and NISTFilipski, P.S. et al. | 2001
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Comparison of high-frequency AC-DC voltage transfer standards at NRC, VSL, PTB, and NISTFilipski, P.S. / van Mullem, C.J. / Janik, D. / Klonz, M. / Kinard, J.R. / Lipe, T.E. / Waltrip, B.C. et al. | 2001
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NRC-NIST comparison of power meter calibrations at 60 Hz and ranges up to 600 V, 100 ASo, E. / Angelo, D. / Nelson, T. / Snider, L. et al. | 2001
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PAPERS - Power and Energy Measurement - NRC-NIST Comparison of Power Meter Calibrations at 60 Hz and Ranges up to 600 V, 100 ASo, E. et al. | 2001
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PAPERS - Power and Energy Measurement - An International Comparison of 50-60 Hz Power (1996-1999)Oldham, N. et al. | 2001
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An international comparison of 50/60 Hz power (1996-1999)Oldham, N. / Nelson, T. / Bergeest, R. / Ramm, G. / Carranza, R. / Corney, A.C. / Gibbes, M. / Kyriazis, G. / Laiz, H.M. / Liu, L.X. et al. | 2001
- 361
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Efficient broadband method for equivalent source reflection coefficient measurementsTorok, A. / Janik, D. / Peinelt, W. / Stumpe, D. / Stumper, U. et al. | 2001
- 361
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PAPERS - Radiofrequency and Microwave Measurements - Efficient Broadband Method for Equivalent Source Reflection Coefficient MeasurementsTörök, A. et al. | 2001
- 364
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Extended cross-ratio reflection correction at microwave frequencies using waveguide air-linesStumper, U. et al. | 2001
- 364
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PAPERS - Radiofrequency and Microwave Measurements - Extended Cross-Ratio Reflection Correction at Microwave Frequencies Using Waveguide Air-LinesStumper, U. et al. | 2001
- 368
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Stability measurements on noise sourcesRanda, J. / Dunleavy, L.P. / Terrell, L.A. et al. | 2001
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PAPERS - Radiofrequency and Microwave Measurements - Stability Measurements on Noise SourcesRanda, J. et al. | 2001
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PAPERS - Radiofrequency and Microwave Measurements - Cryogenic Noise Parameter Measurements of Microwave DevicesRolfes, I. et al. | 2001
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Cryogenic noise parameter measurements of microwave devicesRolfes, I. / Musch, T. / Schiek, B. et al. | 2001
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PAPERS - Radiofrequency and Microwave Measurements - Six-Port Based Wave-Correlator with Application to Beam Direction FindingYakabe, T. et al. | 2001
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Six-port based wave-correlator with application to beam direction findingYakabe, T. / Fengchao Xiao, / Iwamoto, K. / Ghannouchi, F.M. / Fujii, K. / Yabe, H. et al. | 2001
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- 486
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Portable I/sub 2/-stabilized Nd:YAG laser for international comparisonsHong, F.-L. / Ishikawa, J. / Zhi-Yi Bi, / Jing Zhang, / Seta, K. / Onae, A. / Yoda, J. / Matsumoto, H. et al. | 2001
- 490
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PAPERS - Stabilized Lasers - Frequency Stabilization of DBR Diode Laser Against Cs Absorption Lines at 852 nm Using the Modulation Transfer MethodBertinetto, F. et al. | 2001
- 490
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Frequency stabilization of DBR diode laser against Cs absorption lines at 852 nm using the modulation transfer methodBertinetto, F. / Cordiale, P. / Galzerano, G. / Bava, E. et al. | 2001
- 493
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PAPERS - Laser Spectroscopy - High-Frequency Modulation Transfer Technique for Ultra-High Resolution Spectroscopy of I2Burck, F.du et al. | 2001
- 493
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High-frequency modulation transfer technique for ultra-high resolution spectroscopy of I/sub 2/du Burck, F. / Wallerand, J.-P. / Goncharov, A.N. / Himbert, M. et al. | 2001
- 497
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PAPERS - Laser Spectroscopy - Nonlinear Spectroscopy of Isotopic Acetylene at lSvelto, C. et al. | 2001
- 497
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Nonlinear spectroscopy of isotopic acetylene at /spl lambda/=1.5 /spl mu/m for absolute frequency stabilization of diode-pumped Er-Yb: Glass lasersSvelto, C. / Galzerano, G. / Onae, A. / Bava, E. et al. | 2001
- 500
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Characterization of a cold cesium source for PARCS: Primary Atomic Reference Clock in SpaceHeavner, T.P. / Hollberg, L. / Jefferts, S.R. / Kitching, J. / Klipstein, W.M. / Meekhof, D.M. / Robinson, H.G. et al. | 2001
- 500
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PAPERS - Atomic Fountains and Clocks - Characterization of a Cold Cesium Source for PARCS: Primary Atomic Reference Clock in SpaceHeavner, T.P. et al. | 2001
- 503
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PAPERS - Atomic Fountains and Clocks - Cavity Frequency Pulling in Cold Atom FountainsBize, S. et al. | 2001
- 503
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Cavity frequency pulling in cold atom fountainsBize, S. / Sortais, Y. / Mandache, C. / Clairon, A. / Salomon, C. et al. | 2001
- 507
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Accuracy evaluation of a cesium fountain primary frequency standard at NISTMeekhof, D.M. / Jefferts, S.R. / Stepanovic, M. / Parker, T.E. et al. | 2001
- 507
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PAPERS - Atomic Fountains and Clocks - Accuracy Evaluation of a Cesium Fountain Primary Frequency Standard at NISTMeekhof, D.M. et al. | 2001
- 510
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First results with a cold cesium continuous fountain resonatorDudle, G. / Joyet, A. / Berthoud, P. / Mileti, G. / Thomann, P. et al. | 2001
- 510
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PAPERS - Atomic Fountains and Clocks - First Results with a Cold Cesium Continuous Fountain ResonatorDudle, G. et al. | 2001
- 515
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PAPERS - Cryogenic Resonators - Low-Phase Noise Temperature-Compensated Cryogenic Whispering Gallery Mode Resonator Operated at 63K in a Closed-Cycle CoolerHao, L. et al. | 2001
- 515
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Low-phase noise temperature-compensated cryogenic whispering gallery mode resonator operated at 63 K in a closed-cycle coolerHao, L. / Gallop, J.C. / Klein, N. / Winter, M. et al. | 2001
- 519
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PAPERS - Cryogenic Resonators - Cryogenic Sapphire Oscillator with Exceptionally High Frequency StabilityMann, A.G. et al. | 2001
- 519
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Cryogenic sapphire oscillator with exceptionally high frequency stabilityMann, A.G. / Sheng, C. / Luiten, A.N. et al. | 2001
- 522
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PAPERS - Cryogenic Resonators - Whispering Gallery Method of Measuring Complex Permittivity in Highly Anisotropic Materials: Discovery of a New Type of Mode in Anisotropic Dielectric ResonatorsTobar, M.E. et al. | 2001
- 522
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Whispering gallery method of measuring complex permittivity in highly anisotropic materials: discovery of a new type of mode in anisotropic dielectric resonatorsTobar, M.E. / Hartnett, J.G. / Ivanov, E.N. / Blondy, P. / Cros, D. et al. | 2001
- 526
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Applications of coupled dielectric resonators using SrTiO/sub 3/ pucks: tuneable resonators and novel thermometryGallop, J.C. / Hao, L. et al. | 2001
- 526
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PAPERS - Cryogenic Resonators - Applications of Coupled Dielectric Resonators Using SrTiO3 Pucks: Tuneable Resonators and Novel ThermometryGallop, J.C. et al. | 2001
- 531
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PAPERS - Celsium Frequency Standards - Toward a Cesium Frequency Standard Based on a Continuous Slow Atomic Beam: Preliminary ResultsLee, H.S. et al. | 2001
- 531
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Toward a cesium frequency standard based on a continuous slow atomic beam: preliminary resultsHo Seong Lee, / Sang Eon Park, / Taeg Yong Kwon, / Sung Hoon Yang, / Hyuck Cho, et al. | 2001
- 535
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Suppression of spurious phase shifts in an optical frequency standardTrebst, T. / Binnewies, T. / Helmcke, J. / Riehle, F. et al. | 2001
- 535
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PAPERS - Optical Frequency Standards - Suppression of Spurious Phase Shifts in an Optical Frequency StandardTrebst, T. et al. | 2001
- 539
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Progress toward absolute frequency measurements of the /sup 127/I/sub 2/-stabilized Nd:YAG laser at 563.2 THz/532 nmDucos, F. / Hadjar, Y. / Rovera, G.D. / Zondy, J.-J. / Acef, O. et al. | 2001
- 539
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PAPERS - Optical Frequency Standards - Progress Toward Absolute Frequency Measurements of the 127I2-Stabilized Nd:YAG Laser at 563.2 THz-532 nmDucos, F. et al. | 2001
- 543
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PAPERS - Optical Frequency Standards - Development of Optical Frequency Standards Based upon the 2S1-2-2D5-2 Transition in 88Sr+ and 87Sr+Barwood, G.P. et al. | 2001
- 543
-
Development of optical frequency standards based upon the /sup 2/S/sub 1/2/-/sup 2/D/sub 5/2/ transition in /sup 88/Sr/sup +/ and /sup 87/Sr/sup +/Barwood, G. / Gao, K. / Gill, P. / Huang, G. / Klein, H.A. et al. | 2001
- 548
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PAPERS - Optical Frequency Standards - A Phase-Locked Frequency Divide-by-3 Optical Parametric OscillatoDouillet, A. et al. | 2001
- 548
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A phase-locked frequency divide-by-3 optical parametric oscillatorDouillet, A. / Zondy, J.-J. / Santarelli, G. / Makdissi, A. / Clairon, A. et al. | 2001
- 552
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PAPERS - Optical Frequency Standards - Direct RF to Optical Frequency Measurements with a Femtosecond Laser CombDiddams, S.A. et al. | 2001
- 552
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Direct RF to optical frequency measurements with a femtosecond laser combDiddams, S.A. / Jones, D.J. / Ye, J. / Cundiff, S.T. / Hall, J.L. / Ranka, J.K. / Windeler, R.S. et al. | 2001
- 556
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Observation and temperature measurement of sympathetically cooled ions in an RF trapHasegawa, T. / Shimizu, T. et al. | 2001
- 556
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PAPERS - Ion Trap Standards - Observation and Temperature Measurement of Sympathetically Cooled Ions in an RF TrapHasegawa, T. et al. | 2001
- 559
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Two-way satellite time and frequency transfer networks in Pacific Rim regionImae, M. / Hosokawa, M. / Imamura, K. / Yukawa, H. / Shibuya, Y. / Kurihara, N. / Fisk, P.T.H. / Lawn, M.A. / Li Zhigang, / Li Huanxin, et al. | 2001
- 559
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PAPERS - Time Keeping and Time Transfer - Two-Way Satellite Time and Frequency Transfer Networks in Pacific Rim RegionImae, M. et al. | 2001
- 563
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PAPERS - Fundamental Constants - The Role of Fundamental Constants in the International System of Units (SI): Present and FutureTaylor, B.N. et al. | 2001
- 563
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The role of fundamental constants in the International System of Units (SI): present and futureTaylor, B.N. / Mohr, P.J. et al. | 2001
- 568
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PAPERS - Fundamental Constants - Improvement of the Fine-Structure Constant Obtained From the Electron g - 2Kinoshita, T. et al. | 2001
- 568
-
Improvement of the fine-structure constant obtained from the electron g-2Kinoshita, T. et al. | 2001
- 572
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Progress in linking the Farad and the R/sub K/ value to the SI units at BNM-LCIETrapon, G. / Thevenot, O. / Lacueille, J.-C. / Poirier, W. / Fhima, H. / Geneves, G. et al. | 2001
- 572
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PAPERS - Fundamental Constants - Progress in Linking the Farad and the RK Value to the SI Units at BNM-LCIETrapon, G. et al. | 2001
- 576
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PAPERS - Fundamental Constants - Accurate Nuclear Transition Data Determined by Prompt (n,g)-SpectrometryPaul, A. et al. | 2001
- 576
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Accurate nuclear transition data determined by prompt (n,/spl gamma/)-spectrometryPaul, A. / Rottger, S. / Zimbal, A. / Keyser, U. et al. | 2001
- 580
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PAPERS - Fundamental Constants - Mechanism for Levitated Superconductor ExperimentFujii, Y. et al. | 2001
- 580
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Mechanism for levitated superconductor experimentFujii, Y. / Miki, Y. / Shiota, F. / Morokuma, T. et al. | 2001
- 583
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PAPERS - Fundamental Constants - The OFMET Watt Balance: Progress ReportBeer, W. et al. | 2001
- 583
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The OFMET Watt balance: Progress reportBeer, W. / Eichenberger, A.L. / Jeanneret, B. / Jeckelmann, B. / Schneiter, P.R.H. / Pourzand, A.R. / Courteville, A. / Dandliker, R. et al. | 2001
- 587
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Precision determination of the density of a single crystal silicon sphere and evaluation of the Avogadro constantKenny, M.J. / Leistner, A.J. / Walsh, C.J. / Fen, K. / Giardini, W.J. / Wielunski, L.S. / Netterfield, R.P. / Ward, B.R. et al. | 2001
- 587
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PAPERS - Fundamental Constants - Precision Determination of the Density of a Single Crystal Silicon Sphere and Evaluation of the Avogadro ConstantKenny, M.J. et al. | 2001
- 593
-
A reassessment of the molar volume of silicon and of the Avogadro constantDe Bievre, P. / Valkiers, S. / Kessel, R. / Taylor, P.D.P. / Becker, P. / Bettin, H. / Peuto, A. / Pettorruso, S. / Fujii, K. / Waseda, A. et al. | 2001
- 593
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PAPERS - Fundamental Constants - A Reassessment of the Molar Volume of Silicon and of the Avogadro ConstantBièvre, P.De et al. | 2001
- 598
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A suspended laser interferometer for determining the Newtonian constant of gravitationParks, H.V. / Faller, J.E. / Robertson, D.S. et al. | 2001
- 598
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PAPERS - Fundamental Constants - A Suspended Laser Interferometer for Determining the Newtonian Constant of GravitationParks, H.V. et al. | 2001
- 601
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Silicon molar volume discrepancy: studies of the NRLM crystalNakayama, K. / Fujimoto, H. / Ishikawa, T. / Takeno, H. et al. | 2001
- 601
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PAPERS - Silicon Crystal Characterization - Silicon Molar Volume Discrepancy: Studies of the NRLM CrystalNakayama, K. et al. | 2001
- 604
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PAPERS - Silicon Crystal Characterization - Density Comparison Measurement of Silicon by Pressure of Flotation MethodWaseda, A. et al. | 2001
- 604
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Density comparison measurement of silicon by pressure of flotation methodWaseda, A. / Fujii, K. et al. | 2001
- 608
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PAPERS - Silicon Crystal Characterization - A Bragg Silicon Lattice ComparatorAlasia, F. et al. | 2001
- 608
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A Bragg silicon lattice comparatorAlasia, F. / Basile, G. / Becker, P. / Kuetgens, U. / Stuempel, J. / Servidori, M. / Hartwig, J. et al. | 2001
- 612
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PAPERS - Silicon Crystal Characterization - The Avogadro Problem: Summary of Tests on Crystal ImperfectionsBecker, P. et al. | 2001
- 612
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The Avogadro problem: summary of tests on crystal imperfectionsBecker, P. / Kuetgens, U. / Stumpel, J. et al. | 2001
- 616
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PAPERS - Silicon Crystal Characterization - Density Measurements of Silicon Crystals by Hydrostatic WeighingFujii, K. et al. | 2001
- 616
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Density measurements of silicon crystals by hydrostatic weighing [for Avogadro constant determination]Fujii, K. / Waseda, A. / Tanaka, M. et al. | 2001
- 622
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Contributors| 2001
- 656
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Information for Authors| 2001