IEEE Transactions on Electron Devices publication information (English)
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IEEE Transactions on Electron Devices
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67
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2020
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Title:IEEE Transactions on Electron Devices publication information
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Published in:IEEE Transactions on Electron Devices ; 67, 6 ; C2
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Publication date:2020-06-01
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Table of contents – Volume 67, Issue 6
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2232
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Replacement Gate High-k/Metal Gate nMOSFETs Using a Self-Aligned Halo-Compensated Channel ImplantLee, Zhi-Cheng / Chin, Li-Feng / Lee, Kai-Lin / Cheng, Yao-Chin / Cheng, Osbert et al. | 2020
- 2238
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Design Principles of Self-Compensated NBTI-Free Negative Capacitor FinFETKarda, K. / Mouli, Chandra / Alam, M. A. et al. | 2020
- 2243
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Design and Simulation of Steep-Slope Silicon Cold Source FETs With Effective Carrier Distribution ModelGan, Weizhuo / Prentki, Raphael J. / Liu, Fei / Bu, Jianhui / Luo, Kun / Zhang, Qingzhu / Zhu, Huilong / Wang, Wenwu / Ye, Tianchun / Yin, Huaxiang et al. | 2020
- 2249
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A Vertical Combo Spacer to Optimize Electrothermal Characteristics of 7-nm Nanosheet Gate-All-Around TransistorLiu, Renhua / Li, Xiaojin / Sun, Yabin / Shi, Yanling et al. | 2020
- 2255
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A Predictive 3-D Source/Drain Resistance Compact Model and the Impact on 7 nm and Scaled FinFETsWu, Tao / Luo, Haowen / Wang, Xingsheng / Asenov, Asen / Miao, Xiangshui et al. | 2020
- 2263
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Highly Tunable High-Q Inversion-Mode MOS Varactor in the 1–325-GHz BandMargalef-Rovira, Marc / Saadi, Abdelhalim A. / Vincent, Loic / Lepilliet, Sylvie / Gaquiere, Christophe / Gloria, Daniel / Durand, Cedric / Barragan, Manuel J. / Pistono, Emmanuel / Bourdel, Sylvain et al. | 2020
- 2270
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Diamond Field-Effect Transistors With V2O5-Induced Transfer Doping: Scaling to 50-nm Gate LengthCrawford, Kevin G. / Weil, James D. / Shah, Pankaj B. / Ruzmetov, Dmitry A. / Neupane, Mahesh R. / Kingkeo, Khamsouk / Birdwell, A. Glen / Ivanov, Tony G. et al. | 2020
- 2276
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Drain Current Optimization in DIBS-Grown MgZnO/CdZnO HFETKhan, Md Arif / Kumar, Pawan / Das, Mangal / Htay, Myo Than / Agarwal, Ajay / Mukherjee, Shaibal et al. | 2020
- 2282
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Charge-Based Compact Drain Current Modeling of InAs-OI-Si MOSFET Including Subband Energies and Band NonparabolicityMaity, Subir Kumar / Haque, Anisul / Pandit, Soumya et al. | 2020
- 2290
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Modeling the Influence of the Acceptor-Type Trap on the 2DEG Density for GaN MIS-HEMTsShi, Yijun / Chen, Wanjun / Sun, Ruize / Liu, Chao / Xin, Yajie / Xia, Yun / Wang, Fangzhou / Xu, Xiaorui / Deng, Xiaochuan / Chen, Tangsheng et al. | 2020
- 2297
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Impact of AlGaN/GaN Interface and Passivation on the Robustness of Low-Noise AmplifiersHuang, Tongde / Axelsson, Olle / Bergsten, Johan / Thorsell, Mattias / Rorsman, Niklas et al. | 2020
- 2304
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Deep-Level Traps in AlGaN/GaN- and AlInN/GaN-Based HEMTs With Different Buffer Doping TechnologiesRaja, P. Vigneshwara / Bouslama, Mohamed / Sarkar, Sujan / Pandurang, Khade Ramdas / Nallatamby, Jean-Christophe / DasGupta, Nandita / DasGupta, Amitava et al. | 2020
- 2311
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Optimum Carbon Concentration in GaN-on-Silicon for Breakdown Enhancement in AlGaN/GaN HEMTsRemesh, Nayana / Mohan, Nagaboopathy / Raghavan, Srinivasan / Muralidharan, Rangarajan / Nath, Digbijoy N. et al. | 2020
- 2318
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Investigation of Read Disturb and Bipolar Read Scheme on Multilevel RRAM-Based Deep Learning Inference EngineShim, Wonbo / Luo, Yandong / Seo, Jae-Sun / Yu, Shimeng et al. | 2020
- 2324
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Effects of Charge Quantity Induced by Different Forming Methods in Solid Electrolyte GeSO-Based Resistance Switching Device With Copper ElectrodeChen, Po-Hsun / Hsieh, Chen-Yi / Yang, Hong-Yi et al. | 2020
- 2329
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Efficient and Robust Spike-Driven Deep Convolutional Neural Networks Based on NOR Flash Computing ArrayXiang, Yachen / Huang, Peng / Han, Runze / Li, Chu / Wang, Kunliang / Liu, Xiaoyan / Kang, Jinfeng et al. | 2020
- 2336
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Amorphous p-Type CuNiSnO Thin-Film Transistors Processed at Low TemperaturesCheng, Xiaohan / Lu, Bojing / Lu, Jianguo / Li, Siqin / Lu, Rongkai / Yue, Shilu / Chen, Lingxiang / Ye, Zhizhen et al. | 2020
- 2342
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Poly-Si Finlike Thin-Film Transistors With Various Wide Drain Designs for Radio Frequency and 3-D Integrated CircuitsHu, Hsin-Hui / Huang, Chun-Lin / Lee, Yao-Jen / Chen, Kun-Ming et al. | 2020
- 2346
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Enhancement-/Depletion-Mode TiO2 Thin-Film Transistors via O2/N2 PreannealingZhang, Jie / Lin, Guangyang / Cui, Peng / Jia, Meng / Li, Zhengxin / Gundlach, Lars / Zeng, Yuping et al. | 2020
- 2352
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Physical Insights Into the Mobility Enhancement in Amorphous InGaZnO Thin-Film Transistor by SiO2 Passivation LayerZhang, Panpan / Samanta, Subhranu / Fong, Xuanyao et al. | 2020
- 2359
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A Physical-Based Analytical Model for the Kink Current of Polycrystalline Silicon TFTsChen, Yanyan / Zhou, Xiaoliang / Zhang, Dongli / Wang, Huaisheng / Wang, Mingxiang et al. | 2020
- 2365
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High-Frequency Rectifiers Based on Organic Thin-Film Transistors on Flexible SubstratesIbrahim, Ghada H. / Zschieschang, Ute / Klauk, Hagen / Reindl, Leonhard et al. | 2020
- 2372
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Effects of Redundant Electrode Width on Stability of a-InGaZnO Thin-Film Transistors Under Hot-Carrier StressLin, Dong / Su, Wan-Ching / Chang, Ting-Chang / Chen, Hong-Chih / Tu, Yu-Fa / Yang, Jianwen / Zhou, Kuan-Ju / Hung, Yang-Hao / Lu, I-Nien / Tsai, Tsung-Ming et al. | 2020
- 2376
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Parametric Optimum Design and Performance Improvement of a Thermophotonic CellYang, Zhimin / Wang, Junyi / Guo, Juncheng / Lin, Guoxing / Chen, Jincan et al. | 2020
- 2381
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Design Optimization of Photovoltaic Cell Stacking in a Triple-Well CMOS ProcessHong, Geunhee / Han, Gunhee et al. | 2020
- 2386
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Synthesis of Silica-Coated Cs4PbBr6 and Cs4Pb(Br0.4I0.6)6 Quantum Dots With Long Lifetime and Enhancement in Quantum Efficiency for WLEDs Applications: Lightings With High CRI and Displays With Wide Color GamutLin, Ying-Tsuen / Huang, Chien-Hao / Hsieh, Chung-Hui / Chu, Sheng-Yuan et al. | 2020
- 2393
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Fully Depleted MAPS in 110-nm CMOS Process With 100–300-μm Active SubstratePancheri, Lucio / Giampaolo, Raffaele A. / Salvo, Andrea Di / Mattiazzo, Serena / Corradino, Thomas / Giubilato, Piero / Santoro, Romualdo / Caccia, Massimo / Margutti, Giovanni / Olave, Jonhatan E. et al. | 2020
- 2400
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Ring Remote Phosphor Structure for Laser-Driven White LightingChen, Bing-Mau / Ying, Shang-Ping / Tsai, Hui-Hsuan et al. | 2020
- 2406
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On-Wafer FinFET-Based EUV/eBeam Detector Arrays for Advanced Lithography ProcessesWang, Chien-Ping / Tsai, Yi-Pei / Lin, Burn Jeng / Liang, Zheng-Yong / Chiu, Po-Wen / Shih, Jiaw-Ren / Lin, Chrong Jung / King, Ya-Chin et al. | 2020
- 2414
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Analyzing the Effects of Aluminum-Doped ZnO and Ag Layers for the Transparent Electrode Vertical PCSSZheng, Zhong / Huang, Wei / Han, Wei-Wei / Shi, Er-Wei et al. | 2020
- 2418
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Study on the Photoluminescence Intensity, Thermal Performance, and Color Purity of Quantum Dot Light-Emitting Diodes Using a Pumping-Light AbsorberLi, Zong-Tao / Song, Cun-Jiang / Du, Xue-Wei / Xuan, Jie / Li, Jia-Sheng / Tang, Yong et al. | 2020
- 2425
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Optical Pixel Sensor Based on a-Si:H TFTs to Detect Combined Optical Signals for Multiuser Interactive DisplaysLin, Chih-Lung / Lee, Chia-Lun / Wu, Chia-En / Chen, Fu-Hsing / Liao, Wei-Sheng / Chuang, Ricky W. / Yu, Jian-Shen et al. | 2020
- 2432
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Ultrahigh-Speed Mid-Infrared Photodetectors With 2-D Electron Gas in a CdTe/PbTe HeterojunctionZhu, Jiaqi / Xu, Hanlun / Ma, Songsong / Wang, Zhenglai / Li, Kai / Ali, Nasir / Zhong, Jie / Zhou, Qiaohui / Zhu, Haiming / Lai, Weien et al. | 2020
- 2437
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N-Buffer Design for Silicon-Based Power Diode Targeting High Dynamic Robustness and High Operating Temperature Over 448 KNakamura, Katsumi / Nishizawa, Shin-Ichi / Furukawa, Akihiko et al. | 2020
- 2445
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Breakdown Voltage Walk-in Phenomenon and Optimization for the Trench-Gate p-Type VDMOS Under Single Avalanche StressTong, Xin / Liu, Qian / Lu, Li / Liu, Siyang / Wei, Jiaxing / Sun, Weifeng / Wu, Jianhui / Wang, Genyi / Yang, Zhuo / Zhu, Yuanzheng et al. | 2020
- 2451
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Bipolar AC (Bipac) Switch With Buried Layer for Specific AC Mains ApplicationsRizk, Hiba / Bourennane, Abdelhakim / Breil, Marie / Laur, Jean-Pierre et al. | 2020
- 2457
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Designing Beveled Edge Termination in GaN Vertical p-i-n Diode-Bevel Angle, Doping, and PassivationZeng, Ke / Chowdhury, Srabanti et al. | 2020
- 2463
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Optimization and Comparison of Drift Region Specific ON-Resistance for Vertical Power Hk MOSFETs and SJ MOSFETs With Identical Aspect RatioHuang, Haimeng / Xu, Shaodi / Xu, Wenjia / Hu, Ke / Cheng, Junji / Hu, Hao / Yi, Bo et al. | 2020
- 2471
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Influence of Different Surface Morphologies on the Performance of High-Voltage, Low-Resistance Diamond Schottky DiodesReinke, Philipp / Benkhelifa, Fouad / Kirste, Lutz / Czap, Heiko / Pinti, Lucas / Zurbig, Verena / Cimalla, Volker / Nebel, Christoph / Ambacher, Oliver et al. | 2020
- 2478
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Mechanisms of Asymmetrical Turn-On and Turn-Off and the Origin of Dynamic CGD Hysteresis for Hard-Switching Superjunction MOSFETsKang, H. / Findlay, E. M. / Udrea, F. et al. | 2020
- 2482
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A Trench-Field-Plate High-Voltage Power MOSFETXiao, Chao / Yang, Wentao / Liu, Yong / Zhou, Xianda / Feng, Hao / Sin, Johnny K. O. et al. | 2020
- 2489
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High-k HfxZr1-xO₂ Ferroelectric Insulator by Utilizing High Pressure AnnealDas, Dipjyoti / Jeon, Sanghun et al. | 2020
- 2495
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Integration, BEOL, and Thermal Stress Impact on CMOS-Compatible Titanium-Based Contacts for III–V Devices on a 300-mm PlatformBoyer, F. / Dabertrand, K. / Jany, C. / Gergaud, P. / Coudurier, N. / Nemouchi, F. / Gregoire, M. / Rafhay, Q. / Rodriguez, Ph. et al. | 2020
- 2503
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Experimental Study of 1/f1+α Noise in Transient Leakage Current of Metal–Insulator–Metal With Stacked High-k Polycrystalline FilmsLin, Hsin-Jyun / Akiyama, Koji / Hirota, Yoshihiro / Akasaka, Yasushi / Nakamura, Genji / Nagai, Hiroyuki / Morimoto, Tamotsu / Watanabe, Hiroshi et al. | 2020
- 2510
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Sublithographic Patterning of Spin-Coated SiARC Films Using Tilted Ion ImplantationRembert, Thomas R. / Sharma, Shalini / Garcia, Luis / Connelly, Daniel / Tomoya, Taji / Sakai, Tatsuya / Rubin, Leonard / Liu, Tsu-Jae King et al. | 2020
- 2516
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Impact of Electrical Stress on Defect Generation in Thin GeO2/Ge Gate Stacks Fabricated by Thermal OxidationYuan, Sicong / Chen, Zhuo / Li, Junkang / Tian, Minzhi / Zhang, Rui et al. | 2020
- 2522
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The Effect of Torsional Bending on Reliability and Lifetime of Printed Silver ConductorsHannila, Esa / Remes, Kari / Kurkela, Timo / Happonen, Tuomas / Keranen, Kimmo / Fabritius, Tapio et al. | 2020
- 2529
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Interesting Odd–Even Effect, Ohmic Contact, Negative Differential Resistance, and Current Stabilizer Behavior in All-Carbon Graphyne/Carbon-Chain JunctionsYun, Jiangni / An, Huan / Huang, Renjing / Guo, Mingzhi / Zhang, Yanni / Kang, Peng et al. | 2020
- 2536
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Analytical Model for Low-Frequency Noise in Junctionless Nanowire TransistorsTrevisoli, Renan / Pavanello, Marcelo Antonio / Capovilla, Carlos Eduardo / Barraud, Sylvain / Doria, Rodrigo Trevisoli et al. | 2020
- 2544
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Effect of Gate-Oxide Degradation on Electrical Parameters of Silicon Carbide MOSFETsKarki, Ujjwal / Gonzalez-Santini, Nomar S. / Peng, Fang Z. et al. | 2020
- 2553
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Thermal Brownian Motion of Skyrmion for True Random Number GenerationYao, Yong / Chen, Xing / Kang, Wang / Zhang, Youguang / Zhao, Weisheng et al. | 2020
- 2559
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Automated Mini-Platform With 3-D Printed Paper Microstrips for Image Processing-Based Viscosity Measurement of Biological SamplesB, Puneeth S / Munigela, Nikhil / Puranam, Sai Akhil / Goel, Sanket et al. | 2020
- 2566
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New Room Temperature Ammonia Gas Sensor Synthesized by a Tantalum Pentoxide (Ta2O5) Dielectric and Catalytic Platinum (Pt) MetalsLiu, Bo-You / Liu, Wen-Chau et al. | 2020
- 2573
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A V-Band Overmoded Coaxial Millimeter-Wave Oscillator Based on a New Method of Asymmetric Modes SuppressionChen, Siyao / Zhang, Jun / Zhang, Jiande / Wang, Haitao et al. | 2020
- 2580
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Influence of the Surface Tungsten Distribution on the Emission Properties of Barium Tungsten CathodeShang, Jihua / Yang, Xinyu / Wang, Ziyu / Hu, Mengyuan / Han, Cuiliu / Zhang, Jiuxing et al. | 2020
- 2585
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Multiple-GPU-Based Simulation of Ka-Band Helix Traveling Wave TubeWang, Xiaoyue / Chen, Qi / Li, Mingzhi et al. | 2020
- 2593
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Optimization of Negative-Capacitance Vertical-Tunnel FET (NCVT-FET)Hu, Vita Pi-Ho / Lin, Hung-Han / Lin, Yen-Kai / Hu, Chenming et al. | 2020
- 2600
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Simulation-Based Ultralow Energy and High-Speed LIF Neuron Using Silicon Bipolar Impact Ionization MOSFET for Spiking Neural NetworksKumar Kamal, Alok / Singh, Jawar et al. | 2020
- 2607
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Assessing the Role of a Semiconductor’s Anisotropic Permittivity in Hafnium Disulfide Monolayer Field-Effect TransistorsBennett, Robert K. A. / Yin, Demin / Yoon, Youngki et al. | 2020
- 2614
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Band-to-Band Tunneling Based Ultra-Energy-Efficient Silicon NeuronChavan, Tanmay / Dutta, Sangya / Mohapatra, Nihar R. / Ganguly, Udayan et al. | 2020
- 2621
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Compact Model of Dzyaloshinskii Domain Wall Motion-Based MTJ for Spin Neural NetworksWang, Chao / Wang, Zhaohao / Wang, Min / Zhang, Xueying / Zhang, Youguang / Zhao, Weisheng et al. | 2020
- 2627
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Deep Gate Field Penetration Au:ZrO2 Metal–Insulator Tunneling TransistorMcDermott, A. J. / Elezzabi, A. Y. et al. | 2020
- 2633
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Opportunities in Device Scaling for 3-nm Node and Beyond: FinFET Versus GAA-FET Versus UFETDas, Uttam Kumar / Bhattacharyya, Tarun Kanti et al. | 2020
- 2639
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Transformable Junctionless Transistor (T-JLT)Han, Jin-Woo / Kim, Jungsik / Meyyappan, M. et al. | 2020
- 2645
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Separation of Lateral Migration Components by Hole During the Short-Term Retention Operation in 3-D NAND Flash MemoriesKim, Shinkeun / Kim, Haesoo / Woo, Changbeom / Choi, Gil-Bok / Seo, Moon-Sik / Shim, Hyunyoung / Noh, Keum Hwan / Shin, Hyungcheol et al. | 2020
- 2648
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Investigation of Electrical Characteristic Behavior Induced by Channel-Release Process in Stacked Nanosheet Gate-All-Around MOSFETsKim, Sihyun / Kim, Munhyeon / Ryu, Donghyun / Lee, Kitae / Kim, Soyoun / Lee, Junil / Lee, Ryoongbin / Kim, Sangwan / Lee, Jong-Ho / Park, Byung-Gook et al. | 2020
- 2653
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Low Temperature Processing of Electronic Materials for Cuttung Edge Devices| 2020
- 2655
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Introducing IEEE Collabratec| 2020
- 2656
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IEEE Open Access Publishing| 2020
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Table of contents| 2020
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IEEE Transactions on Electron Devices publication information| 2020
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IEEE Transactions on Electron Devices information for authors| 2020